ATA8520D Production and EOL Testing. Features. Description ATAN0136 APPLICATION NOTE

Transcription

1 ATAN0136 ATA8520D Production and EOL Testing APPLICATION NOTE Features Test application for production and EOL testing of ATA8520-EK1-E/ EK2-E/ EK3-E evaluation kits PCB component tests, i.e., MCU, temperature sensor, button, LEDs, power switch ATA8520D device test for transmit RF frequency, power level, and receive RF functionality Crystal offset adjustment at room temperature (24 C) Configuration for 3V or 5V supply mode Description This application note explains the production and end-of-line (EOL) testing of the Atmel evaluation kits for the ATA8520D device. It can be used to adapt the ATA8520D to other production environments and other MCU host controllers, such as when the application is coded in C and uses the SPI command set for the ATA8520D device. The application tests the hardware components of the evaluation kit and extension boards. For the ATA8520D device the RF output power and RF receiving functionality are measured. In addition, the crystal frequency offset is measured and the corrected temperature coefficients for the crystal are stored in the device. These coefficients are used for the RF calibration of the temperature drift of the crystal. Finally, the configuration data is written into the device, i.e., to select 3V or 5V supply and to enable or disable the downlink operating mode (data reception).

2 Table of Contents Features... 1 Description ATAB0101A Rev3 PCB ATA8520-EK1-E Standalone Kit ATA8520-EK2-E Xplained Mini Extension Board ATA8520-EK3-E Xplained PRO Extension Board Crystal Frequency Compensation ATA8520D TX Operation Testing ATA8520D RX Operation Testing Test Software References

3 1. ATAB0101A Rev3 PCB The ATAB0101A Rev3 PCB is used for all ATA8520D kits and extension boards for the ETSI version of the ATA8520D device. The kits and extension boards differ only in their BOM with mounted MCU and connectors. The test points relevant for kit manufacturing are shown in Figure 1-1. All connections marked in green are relevant for: SPI connections for ATA8520-EK2-E/EK3-E testing Control signals for ATA8520-EK2-E/EK3-E testing UART signals for ATA8520-EK1-E testing Power supply for ATA8520-EK1-E testing RF performance testing The connections marked in red are used for ISP programming of the ATmega328P device (ISP-µC/ XISP1), test programs and EOL programming. The ATA8520D device is delivered preprogrammed and memory-locked, i.e., ISP connections (ISP-TRX/XISP2) are used for maintenance only. SPI commands have to be used to read out the ID and PAC codes for SIGFOX registration. These ID and PAC codes have to be printed on a label placed on the bottom of the PCB. 3

4 Figure 1-1 ATAB0101A-V3 PCB Layout with Test Points The following list summarizes the test points and their purpose. Table 1-1 Test Point Summary for PCB Test Point Type Description X3/2 Supply 5V supply voltage X3/4 Supply 3.3V supply voltage X3/6 Supply GND X3/7 Supply GND X5/7 Supply GND 4

5 Test Point Type Description X5/6 Digital SPI signal SCK/5V X5/5 Digital SPI signal MISO/5V X5/4 Digital SPI signal MOSI/5V X5/3 Digital SPI signal NSS/5V X5/2 Digital RF_NRES/5V X5/1 Digital RF_PWRON/5V X6/3 Digital RF_EVENT/5V X6/2 Digital MCU UART TxD X6/1 Digital MCU UART RxD X2/20 Supply 3.3V supply voltage X2/19 Supply GND X2/18 Digital SPI signal SCK/3.3V X2/17 Digital SPI signal MISO/3.3V X2/16 Digital SPI signal MOSI/3.3V X2/15 Digital SPI signal NSS/3.3V X2/9 Digital RF_EVENT/3.3V X2/6 Digital RF_PWRON/3.3V X2/5 Digital RF_NRES/3.3V Xant1 RF analog RF antenna TX/RX 1.1. ATA8520-EK1-E Standalone Kit The ATA8520-EK1-E kit is equipped with the ATmega328P and ATA8520D device. Figure 1-2 describes the test connections required for programming and testing. The ISP connector marked in red is used for programming the ATmega328P device using an Atmel-ICE JTAG debugger. The pins marked in green are used for power supply, for connection to a USB-2-COM port converter and for the RF signal. The components marked in purple are used for test flow control, i.e., the SW1 user button and the LEDs LED1 (red) and Power (green). The PCB used for the ATA8520-EK1-E kit is ATAB0101A-V3.1 according to the BOM. 5

6 Figure 1-2 ATA8520-EK1-E Test Points Table 1-2 summarizes the test points and their purpose. Table 1-2 ATA8520-EK1-E Test Point Summary Test Point Type Description X3/4 Supply 3.3V supply voltage X3/6 Supply GND X3/7 Supply GND X6/2 Digital MCU UART TxD 6

7 Test Point Type Description X6/1 Digital MCU UART RxD Xant1 RF analog RF antenna TX/RX ATA8520-EK1-E - ATMega328P Test Programming The ATmega328P is programmed using an Atmel-ICE JTAG debugger with a 6-pin ISP cable connection to the ISP-µC connector XISP1. The PCB is powered with 3V supply through pins X3/4 with +3.0V and X3/6 with GND. The following steps have to be performed for programming: 1. Connect the debugger ISP cable to the ISP-µC connector 2. Program the Flash application EK1_3V_TXRXProdTest.hex In addition to the 3V supply version, a 5V supply version EK1_5V_TXRXProdTest.hex is available which sets the 5V supply bit during configuration. The BR9 jumper has to be removed for 5V supply. To carry out a TX setup only, EK1_3V_TXTest.hex and EK1_5V_ TXTest.hex versions are included for testing the ATA8520 transmitter device without RX functionality ATA8520-EK1-E - Testing For testing the ATA8520-EK1-E, an RS232 3VTTL-to-USB converter and must be connected to the PCB and used as shown in Figure 1-3. A test fixture provides the connections to the pins marked in green and to the reset pin on the connector ISP-µC using an external 3.0V power supply and the RS232 (3VTTL)-to-USB converter. The PC terminal software application is used with the virtual COM port connection and the UART settings: 38.4Kbaud, 8bit, 1stop, no parity. When pressing the reset button, the terminal shows an initialization screen with the ID and PAC code of the ATA8520D device. Pressing the SW1 button starts the test sequence. 7

8 Figure 1-3 ATA8520-EK1-E Test Setup with RS232 3VTTL-to-USB Converter Table 1-3 shows the test sequence with areas which need to be checked in case a failure occurs. In Figure 1-4 an example of the PC Terminal output window is shown and Figure 1-5 shows the typical spectrum and settings used for the RF testing. Table 1-3 ATA8520D-EK1 Test Application Flow Test Step Action Description Terminal Output (Figure 1-4) Measurement Result (Figure 1-5) Checked PCB Areas 1 Press the Reset button ATA8520D device version ATA8520D-V01.03 U1, U2 SPI operation ATA8520D ID code for label ID=000BFA3F (example) U1, U2 SPI operation ATA8520D PAC code for label Supply voltage in mv PAC=B23456DFB8C7A39A (example) Usens=2970mV (example) or Vsup error! U1, U2 SPI operation U1, Q1, R21, R22 Temperature value in C Tsens=23 C (example) or T sensor error! LEDs are flashing Q1, U3 LD1, LD2 8

9 Test Step Action Description Terminal Output (Figure 1-4) Measurement Result (Figure 1-5) Checked PCB Areas 2 Press SW1 Transmit RF CW test signal MHz and perform frequency offset compensation TX-Test: f = MHz measure 868.xxxMHz - <enter xxx> XTAL1, SW1, SAW2, U9 Enter RF freq. [khz] part 119 (example) (see Figure 1-5a) XTAL1, SW1, SAW2, U9 Check TX frequency after offset compensation Check TX: f = MHz P = 8 to 10dBm <press return>" (see Figure 1-5b) XTAL1, SW1, SAW2, U9 Receive RF signal from test transmitter RX-Test: f = MHz SAW1, Q3, Q2, U9 Show receive result RX data ok. RSSI = 88 (example) SAW1, Q3, Q2, U9 Test result Test PASSED or Test FAILED If one of the terminal output messages is missing or does not show a value or the measurement result is not correct, the listed PCB areas and components have to be checked in detail. Figure 1-4 ATA8520-EK1-E Test PC Terminal Output The spectrum during the RF TX testing is shown in Figure 1-5 as a conducted measurement while the RX testing is done with radiated measurement. Finally, both tests can be performed as a radiated measurement and the RF TX power has to be corrected based on the test setup. 9

10 Figure 1-5 ATA8520-EK1-E Test RF Spectrum a) Before Offset Compensation and b) After Offset Compensation ATA8520-EK1-E - ATmega328P EOL Programming and Kit Packaging For the ATmega328P EOL programming, apply 3V supply through pins X3/4 with +3.0V and X3/6 with GND. The following steps have to be performed for programming: 1. Connect the debugger ISP cable to the ISP-microcontroller connector 2. Program the Flash application ATA8520-EK1-E.hex 3. Print the sticker with the ID and PAC 4. Place the ID/PAC sticker on the bottom of the PCB 5. Affix the sticker with ATA8520-EK1-E printed on it to the bottom of the PCB 6. Package the PCB in the ESD bag 7. Put the 868MHz whip antenna into the box 8. Place two labels (Kit and Atmel) on the box 1.2. ATA8520-EK2-E Xplained Mini Extension Board The ATA8520-EK2-E kit is equipped with the ATA8520D device and requires an Xplained Mini kit with an ATmega328P for testing. Figure 1-6 shows the setup with the Xplained Mini. The pin marked in green is used for the RF signal and the components marked in purple are used for test flow control, i.e., the SW1 user button and the LEDs LED1 (red) and Power (green). The Xplained Mini kit has to be programmed with EK2_TXRXProdTest.hex before starting the testing. 10

11 Figure 1-6 ATA8520-EK2-E Test Setup with Xplained Mini ATA8520-EK2-E - Testing For testing the ATA8520-EK2-E, it must be connected on top of the Xplained Mini test kit as shown in Figure 1-6. After connecting to the USB cable, the PC Terminal has to be connected to the virtual COM port of the Xplained Mini using the UART settings: 38.4Kbaud, 8bit, 1stop, no parity. When pressing the SW1 button, the terminal shows an initialization screen with the ID and PAC code of the ATA8520D device. Pressing the SW1 button again starts the test sequence. Table 1-4 shows the test sequence with tested areas which need to be checked in case a failure occurs. Table 1-4 ATA8520-EK2-E Test Application Flow Test Step Action Description Terminal Output (Figure 1-4) Measurement Result (Figure 1-5) Checked PCB Areas 1 Press SW1 ATA8520D device version ATA8520D-V01.03 U8, U2 SPI operation ATA8520D ID code for label ID=000BFA3F (example) U8, U2 SPI operation 11

12 Test Step Action Description Terminal Output (Figure 1-4) Measurement Result (Figure 1-5) Checked PCB Areas ATA8520D PAC code for label Supply voltage in mv PAC=B23456DFB8C7A39A (example) Usens=2970mV (example) or Vsup error! U8, U2 SPI operation Q1, R21, R22 Temperature value in C Tsens=23 C (example) or T sensor error! LEDs are flashing Q1, U3 LD1, LD2 2 Press SW1 Transmit RF CW test signal MHz and perform frequency offset compensation TX-Test: f = MHz measure 868.xxxMHz - <enter xxx> XTAL1, SW1, SAW2, U9 Enter RF freq. [khz] part 119 (example) (see Figure 1-5a) XTAL1, SW1, SAW2, U9 Check TX frequency after offset compensation Check TX: f = MHz P = 8 to 10dBm <press return>" (see Figure 1-5b) XTAL1, SW1, SAW2, U9 Receive RF signal from test transmitter RX-Test: f = MHz SAW1, Q3, Q2, U9 Show receive result RX data ok. RSSI = 88 (example) SAW1, Q3, Q2, U9 Test result Test PASSED or Test FAILED If one of the terminal output messages is missing or does not show a value or the measurement result is not correct, the listed PCB areas and components have to be checked in detail. After completing testing successfully, do the following steps: 1. Print the sticker with the ID and PAC 2. Place the ID/PAC sticker on the bottom of the PCB 3. Affix the sticker with ATA8520-EK2-E printed on it to the bottom of the PCB 4. Package the PCB in the ESD bag 5. Put the 868MHz whip antenna into the box 6. Place two labels (Kit and Atmel) on the box 1.3. ATA8520-EK3-E Xplained PRO Extension Board The ATA8520-EK3-E kit is equipped with the ATA8520D device and requires an Xplained PRO kit with SAMD20 for testing. Figure 1-7 shows the setup with the Xplained PRO. The pin marked in green is used for the RF signal and the components marked in purple are used for test flow control, i.e., the SW1 user button and the LEDs LED1 (red) and Power (green). The SAMD20 Xplained PRO kit has to be programmed with EK3_TXRXProdTest.hex before starting the testing. 12

13 Figure 1-7 ATA8520-EK3-E Test Setup with Xplained PRO SAMD ATA8520-EK3-E - Testing For testing the ATA8520-EK3-E, it must be connected to the Xplained Pro test kit on the connector EXT1 as shown in Figure 1-7. After connecting to the USB cable, the PC Terminal has to be connected to the virtual COM port of the Xplained PRO using the UART settings: 38.4Kbaud, 8bit, 1stop, no parity. When pressing the SW1 button, the terminal shows an initialization screen with the ID and PAC code of the ATA8520D device. Pressing the SW1 button again starts the test sequence. Table 1-5 shows the test sequence with tested areas which need to be checked in case a failure occurs. Table 1-5 ATA8520-EK3-E Test Application Flow Test Step Action Description Terminal Output (Figure 1-4) Measurement Result (Figure 1-5) Checked PCB Areas 1 Connect USB cable Atmel Studio 6 identifies the ATA8520D-EK3 Atmel Studio 6 ATA8520D-EK3 page opens (Figure 1-8) D1, U4 2 Press RESET ATA8520D device version ATA8520D-V01.00 (example) U2 SPI operation ATA8520D ID code for label ID=000BFA3F (example) U2 SPI operation ATA8520D PAC code for label PAC=B23456DFB8C7A39A (example) U2 SPI operation 13

14 Test Step Action Description Terminal Output (Figure 1-4) Measurement Result (Figure 1-5) Checked PCB Areas Supply voltage in mv Temperature value in C LEDs are flashing 2 Press SW1 Transmit RF CW test signal MHz and perform frequency offset compensation U=2970mV (example) ( Vsup error! ) T=23 C (example) ( T sensor error! ) TX-Test: f = MHz measure 868.xxxMHz - <enter xxx>" Q1, R21, R22 Q1, U3 LD1, LD2 XTAL1, SW1, SAW2, U9 Enter RF freq. [khz] part 119 (example) (see Figure 1-5a) XTAL1, SW1, SAW2, U9 Check TX frequency after offset compensation Check TX: f = MHz P = 8-10dBm <press return> (see Figure 1-5b) XTAL1, SW1, SAW2, U9 Receive RF signal from test transmitter RX-Test: f = MHz SAW1, Q3, Q2, U9 Show receive result RX data ok. RSSI = 88 (example) SAW1, Q3, Q2, U9 Test result Test PASSED or Test FAILED If one of the terminal output messages is missing or does not show a value or the measurement result is not correct, the listed PCB areas and components have to be checked in detail. After completing testing successfully, do the following steps: 1. Print the sticker with the ID and PAC 2. Place the ID/PAC sticker on the bottom of the PCB 3. Affix the sticker with ATA8520-EK3-E printed on it to the bottom of the PCB 4. Package the PCB in the ESD bag 5. Put the 868MHz whip antenna into the box 6. Place two labels (Kit and Atmel) on the box Figure 1-8 shows the product page when the extension board is connected to Atmel Studio 7. This indicates the correct operation of the ID device U4. 14

15 Figure 1-8 ATA8520-EK3-E Atmel Studio 7 Product Page 15

16 2. Crystal Frequency Compensation The ATA8520 and ATA8520D devices have built-in temperature drift compensation for the crystal frequency. The crystal required for SIGFOX operation is a MHz type [4], [5] with the following drift characteristics ±10ppm frequency tolerance at 25 C ±15ppm frequency drift between 40 C and +85 C ±5ppm frequency drift due to aging (5 years at 25 C) For the compensation, the temperature drift coefficients of the crystal are stored in EEPROM and calibration is performed with the internal temperature sensor. The SPI command Start Supply and Temperature Measurement performs this internal calibration process. During the production test with the application software described in the sections above, a compensation of the frequency tolerance at 25 C is performed. This is done at the center frequency of MHz. The deviation df of the measured peak frequency fmeas in [Hz] from this center frequency is df = fmeas [Hz] Hz (1) and the crystal correction values coeffr[i] (in ppm) are calculated according to coeffr[i] = coeffo[i] + df / Hz (2) with coeffo[i] crystal correction value from datasheet df frequency deviation to MHz in [Hz] The typical crystal correction values over temperature are listed in the following table. Table 2-1 Typical Crystal Temperature Compensation Values Compensatio n Value in [ppm] Temperature in [ C] A detailed description of the calibration process is available in [7]. 16

17 3. ATA8520D TX Operation Testing This section describes the measurements which need to be done with the ATA8520 or ATA8520D device for TX operation in the uplink direction. TX testing requires a spectrum analyzer to observe the transmitted test signal and to check the RF frequency and RF output power level. The TX test signal is a random data signal generated within the ATA8520D device and triggered by the 0x15 SPI command (see datasheet Section 2). A CW TX test signal without modulation can also be generated within the ATA8520D device using the 0x17 SPI command (see datasheet Section 2). Table 3-1 ATA8520D TX Testing Parameters Device TX Frequency SIGFOX Bandwidth RF Output Power ETSI ATA8520D MHz ±96kHz with ±10kHz guard band 13dBm radiated 10.5dBm conducted Figure 3-1 shows the spectrum measured for ATA8520D with random test data for a span of 50kHz and 5kHz. Figure 3-1 ATA8520D TX Spectrum at MHz with a) 50kHz Span and b) 5kHz Span For the ATA8520D TX testing the EK1_TX_Random_Test.hex Flash test application has to be programmed into the ATmega328P of an ATA8520-EK1-E kit. The test signal transmission starts immediately and is indicated by LED1 (red) and LED2 (green) at which edge of the band the transmission occurs: LED1 and LED2: lower edge at MHz LED2: center at MHz LED1: upper edge at MHz The rotating transmission occurs three times, with each transmission lasting 2s and separated by a 0.5s gap. 17

18 4. ATA8520D RX Operation Testing This section describes the measurements which need to be done with the ATA8520D device for RX operation in the downlink direction. RX testing requires a test transmitter which transmits an RF signal with payload data within a SIGFOX data frame similar to downlink operation. The RX test mode within the ATA8520D device is triggered by the 0x08 SPI command (enable test mode) followed by the 0x18 SPI command for starting the RX test mode (see internal Atmel test specification). In the future, this SPI command sequence is to be replaced by the SIGFOX library function called using the 0x16 SPI command (see datasheet Section 2). The test transmitter sends a SIGFOX data frame with a gap of 0.5s as indicated in Table 4-1. The output level is around 21dBm conducted with an FSK data signal at a data rate of 600bps. Table 4-1 ATA8520D RX Testing Parameters Device RX Frequency SIGFOX Bandwidth RF Sensitivity Level ETSI ATA8520D MHz ±96kHz with 121dBm device 126dBm with LNA Figure 4-1 shows the FSK-modulated spectrum of the test transmitter. For more information about the receiver and sensitivity testing, see [8]. Figure 4-1 RF Test Transmitter Output Signal For the ATA8520D RX testing the EK1_RX_Test.hex Flash test application has to be programmed into the ATmega328P of an ATA8520-EK1-E kit. The RS232 3VTTL-to-USB converter shown in Figure 1-3 must also be connected. Pressing the SW1 button starts the test signal reception, which is indicated by a blinking LED1 (red). It stops blinking when a valid RF signal is received; the LED1 (red) stays on when an error occurs. 18

19 5. Test Software An Atmel Studio 6 Solution EK1_ProdTest is available [6] for carrying out the tests with the ATA8520-EK1- E kit. This solution includes seven projects with the software mentioned in the previous sections. EK1_3V_TXRXProdTest production test software for the ATA8520D with 3V supply EK1_3V_TXTest production test software for the ATA8520 with 3V supply EK1_5V_TXRXProdTest production test software for the ATA8520D with 5V supply EK1_5V_TXTest production test software for ATA8520 with 5V supply EK1_TX_CW_Test test software for ATA8520/8520D for TX operation testing with continuous wave EK1_TX_Random_Test test software for ATA8520/8520D for TX operation testing with modulation EK1_RX_ Test test software ATA8520D for RX operation testing with test transmitter An EK2_ProdTest solution using an Xplained Mini board is available [6] for the ATA8520-EK1-E extension board EK2_TXRXProdTest production test software for the ATA8520D EK2_TXTest production test software for the ATA8520 An EK3_ProdTest solution using a SAMD20 XplainedPRO kit is available for the ATA8520-EK3-E [6] EK3_TXRXProdTest production test software for the ATA8520D EK3_TXTest production test software for the ATA8520 Figure 5-1 shows a screenshot of the EK1_ProdTest Atmel Studio 6 solution. 19

20 Figure 5-1 EK1_ProdTest Atmel Studio 6 Solution 20

21 6. References [1] ATA8520 transmitter datasheet [2] ATA8520D transceiver datasheet [3] ATAN ATA8520D reference designs [4] NDK crystal datasheet EXS10B for MHz (type EXS00A-CS08559) [5] KDS crystal datasheet 1C324305AB0B for MHz (type DSX321G) [6] ATAN0136_ToolPack_V1.0.zip [7] ATAN ATA8520D Crystal Calibration [8] ATAN ATA8520D Sensitivity Measurement 21

22 Atmel Corporation 1600 Technology Drive, San Jose, CA USA T: (+1)(408) F: (+1)(408) Atmel Corporation. / Rev.: Atmel, Atmel logo and combinations thereof, Enabling Unlimited Possibilities, AVR, and others are registered trademarks or trademarks of Atmel Corporation in U.S. and other countries. Other terms and product names may be trademarks of others. DISCLAIMER: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN THE ATMEL TERMS AND CONDITIONS OF SALES LOCATED ON THE ATMEL WEBSITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDENTAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS AND PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications and products descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel products are not intended, authorized, or warranted for use as components in applications intended to support or sustain life. SAFETY-CRITICAL, MILITARY, AND AUTOMOTIVE APPLICATIONS DISCLAIMER: Atmel products are not designed for and will not be used in connection with any applications where the failure of such products would reasonably be expected to result in significant personal injury or death ( Safety-Critical Applications ) without an Atmel officer's specific written consent. Safety-Critical Applications include, without limitation, life support devices and systems, equipment or systems for the operation of nuclear facilities and weapons systems. Atmel products are not designed nor intended for use in military or aerospace applications or environments unless specifically designated by Atmel as military-grade. Atmel products are not designed nor intended for use in automotive applications unless specifically designated by Atmel as automotive-grade.