Distance area image sensor
|
|
- Joel Stephens
- 6 years ago
- Views:
Transcription
1 Measures the distance to an object by TOF (Time-Of-Flight) method The distance image sensors are designed to measure the distance to an object by TOF method. When used in combination with a pulse modulated light source, this sensor outputs phase difference information on the timing that the light is emitted and received. The sensor output signals are arithmetically processed by an external signal processing circuit or a PC to obtain distance data. Features High-speed charge transfer structure Operates with minimal detection errors even under fluctuating (charge drain function) Real-time distance measurement Applications Obstacle detection (self-driving, robots, etc.) Security (intrusion detection, etc.) Shape recognition (logistics, robots, etc.) Motion capture Structure Parameter Specification Unit Image size mm Pixel size μm Pixel pitch 40 μm Number of pixels pixels Number of effective pixels pixels Package 48-pin PWB - Window material AR-coated glass - Note: This product is not hermetically sealed. Absolute maximum ratings Parameter Symbol Condition alue Unit Analog supply voltage dd(a) Ta=25 C -0.3 to +6 Digital supply voltage dd(d) Ta=25 C -0.3 to +6 Pixel amplifier sf Analog input terminal Pixel reset r voltage Output offset ref Ta=25 C -0.3 to dd(a) Photosensitive area pg Frame reset pulse reset Frame synchronous trigger pulse vst Digital input terminal Line synchronous trigger pulse voltage Pixel reset pulse ext_res Ta=25 C -0.3 to dd(d) Master clock pulse Charge transfer clock pulse voltage TX1, TX2, TX3 Ta=25 C -0.3 to dd(a) Operating temperature Topr No condensation -25 to +85 C Storage temperature Tstg No condensation -40 to +100 C Reflow soldering conditions* 1 Tsol 260 C max. 2 times (see P.10) - *1: JEDEC level 3 Note: Exceeding the absolute maximum ratings even momentarily may cause a drop in product quality. Always be sure to use the product within the absolute maximum ratings. 1
2 Recommended terminal voltage (Ta=25 C) Parameter Symbol Min. Typ. Max. Unit Analog supply voltage dd(a) Digital supply voltage dd(d) Pixel amplifier sf dd(a) Bias voltage Pixel reset r Output offset ref Photosensitive area pg Frame reset pulse voltage High level dd(d) reset Low level - - dd(d) 0.2 Frame synchronous trigger pulse High level dd(d) vst voltage Low level - - dd(d) 0.2 Line synchronous trigger pulse High level dd(d) voltage Low level - - dd(d) 0.2 Master clock pulse voltage High level dd(d) Low level - - dd(d) 0.2 Pixel reset pulse voltage High level dd(d) ext_res Low level - - dd(d) 0.2 Output signal effective period High level dd(d) oe pulse voltage Low level - - dd(d) 0.2 Output signal synchronous pulse High level dd(d) dclk voltage Low level - - dd(d) 0.2 High level dd(d) Non-readout period pulse voltage dis_read Low level - - dd(d) 0.2 Electrical characteristics [Ta=25 C, dd(a)=dd(d)=5 ] Parameter Symbol Condition Min. Typ. Max. Unit Clock pulse frequency f() 1 M - 10 M Hz ideo data rate R - f() - Hz Current consumption Ic Dark state ma Electrical and optical characteristics [Ta=25 C, dd(a)=dd(d)=5, sf=5, r=4.25, MCLK=5 MHz] Parameter Symbol Min. Typ. Max. Unit Spectral response range λ 400 to 1100 nm Peak sensitivity wavelength λp nm Photosensitivity* 2 S /W s Dark output d /s Random noise RN m rms Dark output voltage* 3 or ref ref Saturation output voltage sat ref ref Sensitivity ratio* 4 SR Photoresponse nonuniformity* 5 PRNU - - ±10 % *2: Monochromatic wavelength source (λ=805 nm) *3: Output voltage right after reset in dark state *4: Sensitivity ratio of out1 (TX1=3, TX2=TX3=0 ) to out2 (TX2=3, TX1=TX3=0 ) *5: Photoresponse nonuniformity (PRNU) is the output nonuniformity that occurs when the entire photosensitive area is uniformly illuminated by white light which is approx. 50% of the saturation level. PRNU is measured using the pixels excluding the pixels of the 4 outermost lines and defective pixels, and is defined as follows: PRNU= X/X 100 (%) X: average output of all pixels, X: standard deviation of pixel output 2
3 Spectral response 100 (Typ. Ta=25 C) 80 Relative sensitivity Wavelength (nm) KMPDB0375EA Block diagram GND dd(a) GND GND dd(a) TX1 TX2 TX3 GND dd(a) GND 33 dd(a) 32 GND ertical shift register Photodiode array pixels (number of effective pixels: pixels) 31 pg 30 sf 29 r 28 ref ext_res reset vst Timing generator CDS circuit Horizontal shift register Buffer amplifier 27 out1 26 out2 25 GND 23 dd(a) 22 GND oe dclk dis_read GND GND dd(d) GND dd(d) KMPDC0438EC Basic connection example out 1 Buffer amplifier out 2 Buffer amplifier KMPDC0486EA 3
4 Timing chart Using TX3 allows changing the light source duty ratio to increase the light emission power. When thp(tx3) is set to 0 ns, the light source can be driven with a duty ratio of 50%. Frame timing t13 (readout time) t14 (integration time) reset t1 t2 t3 t4 vst t5 t6 t7 t8 t9 t10 t11 t12 1 (1H) 2 N (1H) N (1H) 72 (1H) TX1, 2, 3 TX enable t16 TX enable t17 dis_read ext_res t18 t19 Pulsed light thp(tx1) TX1 tpi(tx) tlp(tx1) TX2 TX3 thp(tx2) tlp(tx2) thp(tx3) tlp(tx3) TX enable KMPDC0439EB tr(reset) tf(reset) tr() tf() reset tf(dclk) tr(dclk) dclk tr(vst) tf(vst) tr() tf() td(dclk) td(vout) vst out1 out2 0.1 tr(vout) tf(vout) tr (dis_read) tf(dis_read) tr(oe) tf(oe) dis_read oe td(dis_read) td(oe) td(ext_res) tf(ext_res) ext_res KMPDC0440EA 4
5 Calculation method of frame rate Frame rate=1/(time per frame) =1/(Integration time + Readout time) Integration time: It is necessary to be changed by the required distance accuracy and usage environment factors such as fluctuating background light. 1 Readout time= Horizontal timing clock Number of vertical pixels Clock pulse frequency =Time per clock (Readout time per pixel) Horizontal timing clocks Number of vertical pixels Calculation example of readout time (clock pulse frequency: 5 MHz, horizontal timing clocks: 110, number of vertical pixels: 72) 1 Readout time= [Hz] =200 [ns] =1.584 [ms] Horizontal timing Frame timing 1 (1H) 110 (= ) oe dclk 38 t out1 out2 KMPDC0441EA 5
6 Parameter Symbol Min. Typ. Max. Unit Master clock pulse duty ratio % Master clock pulse rise and fall times tr(), tf() 0-20 ns Frame reset pulse rise and fall times tr(reset), tf(reset) 0-20 ns Frame synchronous trigger pulse rise and fall times tr(vst), tf(vst) 0-20 ns Line synchronous trigger pulse rise and fall times tr(), tf() 0-20 ns Pixel reset pulse rise and fall times tr(ext_res), tf(ext_res) 0-20 ns Time from falling edge of master clock pulse to rising edge of frame reset pulse t1 1/4 1/f() - 1/2 1/f() s Time from rising edge of frame reset pulse to falling edge of master clock pulse t2 1/4 1/f() - 1/2 1/f() s Time from falling edge of master clock pulse to falling edge of frame reset pulse t3 1/4 1/f() - 1/2 1/f() s Time from falling edge of frame reset pulse to falling edge of master clock pulse t4 1/4 1/f() - 1/2 1/f() s Time from falling edge of master clock pulse to rising edge of frame synchronous trigger pulse t5 1/4 1/f() - 1/2 1/f() s Time from rising edge of frame synchronous trigger pulse to falling edge of master clock pulse t6 1/4 1/f() - 1/2 1/f() s Time from falling edge of master clock pulse to falling edge of frame synchronous trigger pulse t7 1/4 1/f() - 1/2 1/f() s Time from falling edge of frame synchronous trigger pulse to falling edge of master clock pulse t8 1/4 1/f() - 1/2 1/f() s Time from rising edge of master clock pulse to rising edge of line synchronous trigger pulse t9 1/4 1/f() - 1/2 1/f() s Time from rising edge of line synchronous trigger pulse to rising edge of master clock pulse t10 1/4 1/f() - 1/2 1/f() s Time from rising edge of master clock pulse to falling edge of line synchronous trigger pulse t11 1/4 1/f() - 1/2 1/f() s Time from falling edge of line synchronous trigger pulse to rising edge of master clock pulse t12 1/4 1/f() - 1/2 1/f() s Readout time t13 (110/f() + t15) 72 + t18 + t s Integration time t ms Time from rising edge of master clock pulse (after reading signals from all pixels) to rising edge of master clock pulse (: high period) t15 10/f() - - s Time from falling edge of master clock pulse to rising edge of output signal synchronous pulse td(dclk) ns Output signal synchronous pulse output voltage rise time (10 to 90%)* 6 tr(dclk) ns Output signal synchronous pulse output voltage fall time (10 to 90%)* 6 tf(dclk) ns Time from rising edge of master clock pulse to rising edge of output signal effective period pulse td(oe) ns Output signal effective period pulse rise time (10 to 90%)* 6 tr(oe) ns Output signal effective period pulse fall time (10 to 90%)* 6 tf(oe) ns Settling time of output signal 1, 2 (10 to 90%)* 6 * 7 tr(out), tf(out) ns Time from rising edge of master clock pulse to output signal 1, 2 (output 50%)* 6 td(out) ns *6: CL=3 pf *7: Output voltage=0.1 6
7 Parameter Symbol Min. Typ. Max. Unit Charge transfer clock pulse interval tpi(tx) ns Charge transfer clock pulse (TX1) high period thp(tx1) ns Charge transfer clock pulse (TX1) low period tlp(tx1) - tpi(tx) - thp(tx2) - - ns thp(tx3) Charge transfer clock pulse (TX2) high period thp(tx2) ns Charge transfer clock pulse (TX2) low period tlp(tx2) - tpi(tx) - thp(tx1) - - ns thp(tx3) Charge transfer clock pulse (TX3) high period thp(tx3) ns Charge transfer clock pulse (TX3) low period tlp(tx3) - tpi(tx) - thp(tx1) - - ns thp(tx2) Charge transfer clock pulse voltage rise time tr(tx) ns Charge transfer clock pulse voltage fall time tf(tx) ns High level Charge transfer clock pulse voltage TX1, TX2, TX3 Low level Time from falling edge of pixel reset pulse to TX enable period=on t s Time from TX enable period=off to falling edge of frame reset pulse t s Time from rising edge of line synchronous trigger pulse (last pulse) to rising edge of pixel reset pulse t s Pixel reset pulse high period t μs Time from rising edge of line synchronous trigger pulse to rising edge of non-readout period pulse* 6 td(dis_read) ns Non-readout period pulse rise time (10 to 90%)* 6 tr(dis_read) ns Non-readout period pulse fall time (10 to 90%)* 6 tf(dis_read) ns Input terminal capacitance (Ta=25 C, dd=5 ) Parameter Symbol Min. Typ. Max. Unit Charge transfer clock pulse internal load capacitance CLTX pf 7
8 Dimensional outline (unit: mm) Recommended land pattern (unit: mm) Index mark ϕ Photosensitive area P0.6 11= Hole (3 ) ϕ P0.6 5=3.0 Photosensitive surface KMPDC0442EA P0.6 11= P0.6 5= (44 ) ϕ Electrode (48 ) 0.4 Tolerance unless otherwise noted: ±0.2, ±2 KMPDA0299EB 8
9 Pin connections Pin no. Symbol I/O Description 1 GND I Ground 2 dd(a) I Analog supply voltage 3 GND I Ground 4 NC - No connection 5 dis_read O Non-readout period pulse 6 ext_res I Pixel reset pulse 7 reset I Frame reset pulse 8 vst I Frame synchronous trigger pulse 9 oe O Output signal effective period pulse 10 I Line synchronous trigger pulse 11 I Master clock pulse 12 GND I Ground 13 NC - No connection 14 dclk O Output signal synchronous pulse 15 GND I Ground 16 dd(d) I Digital supply voltage 17 NC - No connection 18 NC - No connection 19 NC - No connection 20 GND I Ground 21 dd(d) I Digital supply voltage 22 GND I Ground 23 dd(a) I Analog supply voltage 24 NC - No connection 25 GND I Ground 26 out2 O Output signal 2 27 out1 O Output signal 1 28 ref I Bias voltage (output offset) 29 r I Bias voltage (pixel reset) 30 sf I Bias voltage (pixel amplifier) 31 pg I Bias voltage (photosensitive area) 32 GND I Ground 33 dd(a) I Analog supply voltage 34 NC - No connection 35 NC - No connection 36 GND I Ground 37 NC - No connection 38 NC - No connection 39 dd(a) I Analog supply voltage 40 GND I Ground 41 TX3 I Charge transfer clock pulse 3 42 TX2 I Charge transfer clock pulse 2 43 TX1 I Charge transfer clock pulse 1 44 dd(a) I Analog supply voltage 45 GND I Ground 46 NC - No connection 47 NC - No connection 48 NC - No connection Note: Leave the NC terminals open and do not connect them to GND. Connect impedance convering buffer amplifiers to out1/out2 so as to minimize the current flow. 9
10 Measured example of temperature profile with hot-air reflow oven for product testing 300 C 260 C max. 230 C Temperature 190 C 170 C Preheat 60 to 120 s Soldering 40 s max. Time KMPDB0381EA This product supports lead-free soldering. After unpacking, store it in an environment at a temperature of 30 C or less and a humidity of 60% or less, and perform soldering within 168 hours. The effect that the product receives during reflow soldering varies depending on the circuit board and reflow oven that are used. Before actual reflow soldering, check for any problems by testing out the reflow soldering methods in advance. Related information Precautions Notice Surface mount type products / Precautions Image sensors / Precautions Information described in this material is current as of July, Product specifications are subject to change without prior notice due to improvements or other reasons. This document has been carefully prepared and the information contained is believed to be accurate. In rare cases, however, there may be inaccuracies such as text errors. Before using these products, always contact us for the delivery specification sheet to check the latest specifications. Type numbers of products listed in the delivery specification sheets or supplied as samples may have a suffix "(X)" which means preliminary specifications or a suffix "(Z)" which means developmental specifications. The product warranty is valid for one year after delivery and is limited to product repair or replacement for defects discovered and reported to us within that one year period. However, even if within the warranty period we accept absolutely no liability for any loss caused by natural disasters or improper product use. Copying or reprinting the contents described in this material in whole or in part is prohibited without our prior permission. HAMAMATSU PHOTONICS K.K., Solid State Division Ichino-cho, Higashi-ku, Hamamatsu City, Japan, Telephone: (81) , Fax: (81) U.S.A.: Hamamatsu Corporation: 360 Foothill Road, Bridgewater, N.J , U.S.A., Telephone: (1) , Fax: (1) Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D Herrsching am Ammersee, Germany, Telephone: (49) , Fax: (49) France: Hamamatsu Photonics France S.A.R.L.: 19, Rue du Saule Trapu, Parc du Moulin de Massy, Massy Cedex, France, Telephone: 33-(1) , Fax: 33-(1) United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) , Fax: (44) North Europe: Hamamatsu Photonics Norden AB: Torshamnsgatan Kista, Sweden, Telephone: (46) , Fax: (46) Italy: Hamamatsu Photonics Italia S.r.l.: Strada della Moia, 1 int. 6, Arese (Milano), Italy, Telephone: (39) , Fax: (39) China: Hamamatsu Photonics (China) Co., Ltd.: B1201, Jiaming Center, No.27 Dongsanhuan Beilu, Chaoyang District, Beijing , China, Telephone: (86) , Fax: (86) Cat. No. KMPD1141E03 Jul DN 10
Distance area image sensor
Measures the distance to an object by TOF (Time-Of-Flight) method The distance image sensors are designed to measure the distance to an object by TOF method. When used in combination with a pulse modulated
More informationDistance linear image sensor
Measures the distance to an object by TOF (time-of-flight) method The distance image sensor is designed to measure the distance to an object by TOF method. When used in combination with a pulse modulated
More informationRGB color sensor. Effective photosensitive area. Green, Red: 2.25 Blue : 4.5
Si photodiodes S6428-01 S6429-01 S6430-01 RGB color sensor The S6428-01, S6429-01 and S6430-01 are color sensors designed to respectively detect monochromatic colors of blue (λp=460 nm), green (λp=540
More informationPeak emission wavelength: 4.3 μm
Peak emission wavelength: 4.3 μm The is a mid infrared LED with a 4.3 μm peak emission wavelength. It is a product that has been achieved using Hamamatsu unique crystal growth technology and process technology.
More informationMPPC (multi-pixel photon counter)
MPPC (multi-pixel photon counter) Low afterpulses, wide dynamic range, for high-speed measurement Photosensitive area: 1 1 mm These MPPCs utilize very small pixels arrayed at high densities to achieve
More informationSi photodiode. Applicable to lead-free solder reflow and wide temperature range. S9674. Absolute maximum ratings
Applicable to lead-free solder reflow and wide temperature range The is a photodiode that is applicable to lead-free solder reflow and has an extremely wide operating and storage temperature range (-40
More informationParameter Specification Unit Photosensitive area mm Package Glass epoxy - Seal material Epoxy resin -
COB type, applicable to lead-free solder reflow The is a Si PIN photodiode for visible to near infrared range and is compatible with lead-free solder reflow processes. The small and thin leadless package
More informationParameter Specification Unit Photosensitive area mm Package Glass epoxy - Seal material Silicone resin -
COB type, applicable to lead-free solder reflow The is a for visible to near infrared range and is compatible with lead-free solder reflow processes. The small and thin leadless package allows reducing
More informationM=100, RL=50 Ω λ=800 nm, -3 db
Low bias operation, for 800 nm band, small package Features Miniature and thin package:.8 3..0 t mm Stable operation at low bias High-speed response High sensitivity Low noise Applications Optical rangefinder
More informationPhoto IC diode. Wide operating temperature: -40 to +105 C. S MT. Absolute maximum ratings (Ta=25 C)
Wide operating temperature: -40 to +05 C The photo IC has a spectral response close to human eye sensitivity. Two active areas are made on a single chip. Almost only the visible range can be measured by
More informationPeak emission wavelength: 3.9 μm
Peak emission wavelength: 3.9 μm The is a high-output mid-infrared LED with a 3.9 µm peak emission wavelength. It is a product that has been achieved using Hamamatsu unique crystal growth technology and
More informationDriver circuit for MPPC
Simple evaluation starter kit for non-cooled s The is a starter kit designed for simple non-cooled evaluations. It consists of a sensor board and a power supply board. The sensor board includes an socket
More informationEffective photosensitive area (mm) Photosensitive area size
High UV resistance, photodiodes for UV monitor The are Si photodiodes that have achieved high reliability for monitoring ultraviolet light by employing a structure that does not use resin. They exhibit
More informationEffective photosensitive* 2 area size. Storage temperature Tstg (mm) ( C) ( C) S φ0.2 φ0.5 S φ to to +100 S9075
/-05/-10, S5344, S5345 Short wavelength type APD, for 600 nm band These are short wavelength APDs with improved sensitivity in the UV to visible range. They offer high gain, high sensitivity, and low noise
More informationPhoton counting module
Photon counting module Fiber coupling type, low-light-level detection The is a photon counting module that can detect low-level light. It consists of a TE-cooled single pixel photon counter (SPPC), signal
More informationCMOS linear image sensors
Built-in timing generator and signal processing circuit; 5 V single supply operation The is a family of CMOS linear image sensors designed for image input applications. These linear image sensors operate
More informationDriver circuit for CCD linear image sensor
For CCD image sensor (S11151-2048) The is a driver circuit designed for Hamamatsu CCD image sensor S11151-2048. The can be used in spectrometers when combined with the S11151-2048. The holds a CCD driver
More informationApplications. Photosensitive area size. Storage temperature Tstg (mm) (mm 2 ) (V) ( C) ( C) S
, etc. Photodiodes molded into clear plastic packages These are Si photodiodes molded into clear plastic packages. Two types are available with sensitivity in the visible range and in the visible to near
More informationDriver circuit for InGaAs linear image sensor
Driver circuit for InGaAs linear image sensor [G11620 series (non-cooled type)] The is a driver circuit developed for InGaAs linear image sensors [G11620 series (non-cooled type)]. The driver circuit consists
More informationSi PIN photodiodes. High-speed detectors with plastic package. Structure. Absolute maximum ratings
High-speed detectors with plastic package The and are high-speed APC (auto power control) detectors developed for monitoring laser diodes with a peak wavelength of 66 nm or 78 nm. The is designed for surface
More informationDriver circuit for CMOS linear image sensor
Driver circuit for CMOS linear image sensor C13015-01 For CMOS linear image sensor S11639-01, etc. The C13015-01 is a driver circuit developed for Hamamatsu CMOS linear image sensor S11639-01, etc. By
More informationMPPC modules. MPPC array modules for very-low-level light detection, 16 ch analog output. C13368/C13369 series (Analog output type)
MPPC modules C13368/C13369 series (Analog output type) MPPC array modules for very-low-level light detection, 16 ch analog output The C13368/C13369 series (analog output type) is an optical measurement
More informationShort wavelength type APD. Effective photosensitive area (mm) Effective photosensitive area size* 2
Short wavelength type APD Features High sensitivity at visible range Low noise High gain Low capacitance Applications Low-light-level measurement Analytical instrument Structure / Absolute maximum ratings
More informationSi PIN photodiodes. High-speed detectors with plastic package. Structure. Absolute maximum ratings
High-speed detectors with plastic package The and are high-speed APC (auto power control) detectors developed for monitoring laser diodes with a peak wavelength of 66 nm or 78 nm. The is designed for surface
More informationPhotosensitive area (mm) 4 4. Peak sensitivity wavelength (nm) Supply voltage Dark state. Max. Vcc max. Tstg Min. Max. (ma) (V)
Integrates a PSD for precision photometry or a 4-segment Si photodiode with low-noise amp in a compact case PSD modules contain a high-precision two-dimensional PSD (position sensitive detector) or a 4-segment
More informationPhoto IC diode. COB (chip on board) type, small package. S CT. Absolute maximum ratings
COB (chip on board) type, small package mm The photo IC has spectral response close to human eye sensitivity. Two photosensitive areas are made on a single chip. Almost only the visible range can be measured
More informationSignal processing circuit for 1-D PSD
Signal processing circuit for 1-D PSD Circuit board for easier 1-D PSD operation The is a DC signal processing circuit for one-dimensional PSD. It is suitable for displacement measurements using DC light.
More informationSignal processing circuit for 1-D PSD
Signal processing circuit for 1-D PSD Circuit board for easier 1-D PSD operation The is a DC signal processing circuit for one-dimensional PSD. It is suitable for displacement measurements using DC light.
More informationAPD modules. Operates an APD with single 5 V supply (standard type, short-wavelength type) C12702 series.
Operates an APD with single 5 V supply (standard type, short-wavelength type) Features Includes a high-sensitivity APD Uses a Hamamatsu high-sensitivity Si APD. Four types are available with different
More informationCMOS linear image sensor
Digital output, built-in 8/10-bit A/D converter, single power supply operation The is a CMOS linear image sensor designed for image input applications. The signal processing circuit has a charge amplifier
More informationThese Si photodiodes have sensitivity in the UV to near IR range. They are suitable for low-light-level detection in analysis and the like.
UV to near IR for precision photometry These Si photodiodes have sensitivity in the UV to near IR range. They are suitable for low-light-level detection in analysis and the like. Features High sensitivity
More informationReverse voltage VR max. Electrical and optical characteristics (Typ. Ta=25 C, unless otherwise noted) Short. Temp. S coefficient (A/W) of
Ceramic package photodiodes with low dark current The are ceramic package photodiodes that offer low dark current. Ceramic package used is light-impervious, so no stray light can reach the photosensitive
More informationPhotosensitive area size (mm) Reverse voltage VR max (V) R to +60
,, 6 to 37 mm resistance length PSD for precision distance measurement Hamamatsu provides various types of one-dimensional PSD (position sensitive detector) designed for precision distance measurement
More informationNMOS linear image sensor
Image sensor highly sensitive to X-rays from 0 k to 00 kev s are self-scanning photodiode arrays designed specifically as detectors for multichannel spectroscopy. The scanning circuit is made up of N-channel
More informationCMOS linear image sensor
High sensitivity, photosensitive area with minute pixels The is a high sensitivity CMOS linear image sensor using a photosensitive area with minute pixels. It has a long photosensitive area (effective
More informationLow bias operation, for 800 nm band
Low bias operation, for 800 nm band These are 800 nm band near-infrared Si APDs that can operate at low voltages, 200 V or less. They are suitable for applications such as FSO (free space optics) and optical
More information1-D PSD with small plastic package
1D PSD with small plastic package Hamamatsu offers a variety of 1D PSDs (position sensitive detectors) molded into plastic packages. These PSDs feature excellent position detection resolution, high resistance
More informationEffective photosensitive area. Photosensitive area size
High performance, high reliability Si PIN photodiodes The is a high-speed Si PIN photodiode having high sensitivity over a wide spectral range from visible to near infrared light. The provides high performance
More informationPeak sensitivity wavelength λp (nm) Photosensitive area (mm)
Integrates a -PSD for precision photometry or a 4-segment Si photodiode with low-noise amp in a compact case PSD modules contain a high-precision two-dimensional PSD (position sensitive detector) or a
More informationOptics modules. Absorbance measurement module with built-in photodiode array, optical elements, current-tovoltage. C13398 series.
Absorbance measurement module with built-in photodiode array, optical elements, current-tovoltage converter, etc. The is an optics module for absorbance measurement featuring high blocking performance
More informationSuppressed IR sensitivity
For UV to visible, precision photometry; suppressed IR sensitivity These Si photodiodes have suppressed IR sensitivity. They are suitable for low-light-level detection in analysis and the like. Features
More informationSignal processing circuit for 2-D PSD
Signal processing circuit for 2-D PSD Circuit board for easier 2-D PSD operation The is a DC signal processing circuit for two-dimensional PSD. It is suitable for displacement measurements using DC light.
More informationSignal processing circuit for 2-D PSD
Signal processing circuit for 2-D PSD Circuit board for easier 2-D PSD operation The is a DC signal processing circuit for two-dimensional PSD. It is suitable for displacement measurements using DC light.
More informationCMOS linear image sensor
High sensitivity, photosensitive area with vertically long pixels The is a high sensitivity CMOS linear image sensor using a photosensitive area with vertically long pixels (14 200 μm). Other features
More informationPbSe photoconductive detectors
PbSe photoconductive detectors P9696 series P327-8 Infrared detectors with fast response and high sensitivity in 5 μm wavelength band Compared to other detectors used in the same wavelength regions, PbSe
More informationNear infrared image sensor (0.9 to 1.7 µm) with high-speed data rate
IMAGE SENSOR InGaAs linear image sensor G99-56D/-5D Near infrared image sensor (.9 to.7 µm) with high-speed data rate HAMAMATSU provides high-speed, near infrared image sensors designed for detectors used
More informationPower supply for MPPC
Power supply for MPPC C1104-0 Bias power supply with built-in high precision temperature compensation for MPPCs The C1104-0 is a high voltage power supply that is optimized for MPPCs (multi-pixel photon
More informationBetween elements measure. Photosensitive area (per 1 element)
16, 35, 46 element Si photodiode array for UV to NIR The are Si photodiode linear array mounted in ceramic DIPs (Dual Inline Packages). These photodiode arrays are primarily developed for low-light-level
More informationParameter Symbol Specification Unit Photosensitive area - ɸ0.8 mm Package mm
Surface mount type, high-speed Si photodiode The is a Si PIN photodiode with sensitivities in the visible to near infrared range and is compatible with lead-free solder reflow. It features high-speed response
More informationDriver circuits for CCD image sensor
Driver circuit for CCD image sensor (S10420/S11071/S11510 series) The and are driver circuits designed for HAMAMATSU CCD image sensor S10420/S11071/S11510 series. The and can be used in spectrometer when
More informationPhoto IC diode. Plastic package shaped the same as metal package. S SB. Absolute maximum ratings (Ta=25 C)
Plastic package shaped the same as metal package The photo IC has spectral response close to human eye sensitivity. Two photosensitive areas are made on a single chip. Almost only the visible range can
More informationInGaAs multichannel detector head
Near infrared line camera (Line rate: 31.25 khz) The is a multichannel detector head suitable for applications where high-speed response is required, such as SD- OCT (spectral domain-optical coherence
More informationEffective photosensitive area (mm)
Chip carrier package for mount The, S5107, and S7510 are Si PIN photodiodes sealed in chip carrier packages suitable for mount using automated solder reflow techniques. These photodiodes have large photosensitive
More informationDriver circuit for CMOS linear image sensor
High-precision driver circuit with variable integration time function The is a driver circuit specifically designed for the Hamamatsu S10111 to S10114 series, S10121 to S10124 series (-01) current-output
More informationAPD modules. APD module integrated with peripheral circuits. C12703 series. Selection guide. Block diagram
APD module integrated with peripheral circuits Features Uses a high sensitivity APD Two types of APDs with different photosensitive areas (φ1.5 mm, φ3. mm) are provided. On-board high sensitivity circuit
More informationCMOS linear image sensors
High-speed video data rate: 50 MHz The is a CMOS linear image sensor that delivers a video data rate of 50 MHz. Two package styles are provided: a DIP type and a surface mount type. Features Video data
More informationInAsSb photovoltaic detector
InAsSb photovoltaic detector P2-2 High-speed response and high sensitivity in the 5 μm spectral band Thermoelectrically cooled infrared detector with no liquid nitrogen required The P2-2 is an infrared
More informationInfrared detector modules with preamp
Easy-to-use detector modules with built-in preamps Infrared detector modules operate just by connecting to DC power supplies. The detector element is selectable from among InGaAs, InAs, InSb, and InAsSb
More informationDriver circuit for CCD linear image sensor
Driver circuit for CCD linear image sensor C11165-02 For CCD image sensor (S11155/S11156-2048-02) The C11165-02 is a driver circuit designed for Hamamatsu CCD image sensor S11155/S11156-2048-02. The C11165-02
More informationApplications. l Image input devices l Optical sensing devices
IMAGE SENSOR CMOS linear image sensor S8377/S8378 series Built-in timing generator and signal processing circuit; single 5 V supply operation S8377/S8378 series is a family of CMOS linear image sensors
More informationMCT photoconductive detectors
MCT photoconductive detectors P3257 series P4249-08 0 μm band infrared detector with high sensitivity and high-speed response Features High-speed response, high sensitivity in the 0 μm band detection Photoconductive
More information16-element Si photodiode arrays
S11212-421 S11212-321 S11212-021 S11212-121 Back-illuminated photodiode arrays for non-destructive inspection The is a back-illuminated type 16-element photodiode array specifically designed for non-destructive
More informationCMOS linear image sensor
CMOS linear image sensor S10226-10 Small, resin-sealed CMOS image sensor The S10226-10 is a resin-sealed CMOS linear image sensor to offer compact size and high cost-performance compared to our previous
More informationMCT photoconductive detectors
Non-cooled type and suitable for long, continuous operation Features Choice of spectral response (up to 12 μm) The band gap can be adjusted by controlling the composition ratio of HgTe and CdTe. Utilizing
More informationPhotosensor with front-end IC
Compact APD suitable for various light level detection The is a compact optical device that integrates a Si APD and preamp. It has a built-in DC feedback circuit for reducing the effects of background
More informationDriver circuit for InGaAs linear image sensor
(G11135 series, G14006-512DE) The is a driver circuit developed for InGaAs linear image sensors (G11135 series, G14006-512DE). The driver circuit consists of an analog video signal processing circuit (16-bit
More informationInGaAs PIN photodiode arrays
16/32/46 element InGaAs array for near IR detection The is one-dimensional InGaAs PIN photodiode array in a ceramic DIP (dual inline package). It can be used to perform simple spectroscopic analysis. Features
More informationNon-discrete position sensors utilizing photodiode surface resistance
Twodimensional PSD Nondiscrete position sensors utilizing photodiode surface resistance PSD (position sensitive detector) is an optoelectronic position sensor utilizing photodiode surface resistance. Unlike
More informationPower supply for MPPC
Power supply for MPPC C1104-0 Bias power supply with built-in high precision temperature compensation for MPPCs The C1104-0 is a high voltage power supply that is optimized for MPPCs (multi-pixel photon
More informationDriver circuit for CCD linear image sensor
Driver circuit for CCD linear image sensor C11165-01 For CCD image sensor (S11155/S11156-2048-01) The C11165-01 is a driver circuit designed for HAMAMATSU CCD image sensor S11155/S11156-2048-01. The C11165-01
More informationApplication OCT. Dimensions (mm) Weight (g) Operating temperature* 1 Storage temperature* 1 λ=1.55 μm (V) (mw)
Balanced detectors with reduced multiple reflections These are differential amplification type photoelectric conversion modules containing two Hamamatsu photodiodes with balanced characteristics. The photodiodes
More informationPhoto IC diode. Plastic package shaped the same as metal package. S SB. Features. Applications
Plastic package shaped the same as metal package The photo IC has spectral response close to human eye sensitivity. Two photosensitive areas are made on a single chip. Almost only the visible range can
More informationCMOS linear image sensor
CMOS linear image sensor S10227-10 Small, resin-sealed CMOS image sensor The S10227-10 is a resin-sealed CMOS linear image sensor to offer compact size and high cost-performance compared to our previous
More informationHigh-speed photodiodes (S5973 series: 1 GHz)
S5973 series High-speed photodiodes (S5973 series: 1 GHz), and S5973 series are high-speed Si PIN photodiodes designed for visible to near infrared light detection. These photodiodes provide wideband characteristics
More informationDriver circuits for photodiode array with amplifier
C98 series Compact, easytouse driver circuit The C98 series CMOS driver circuit is designed for photodiode arrays with amplifier. The C98 series operates a linear image sensor by just inputting two signals
More informationMPPC (Multi-Pixel Photon Counter) arrays
MPPC (Multi-Pixel Photon Counter) arrays MPPC arrays in a chip size package miniaturized through the adoption of TSV structure The is a MPPC array for precision measurement miniaturized by the use of TSV
More informationInAsSb photovoltaic detectors
High-speed response and high sensitivity in the spectral band up to 11 μm Infrared detectors The are photovoltaic type infrared detectors that have achieved high sensitivity in the spectral band up to
More informationMPPC (Multi-Pixel Photon Counter)
S13362-35DG Significantly reduced crosstalk, low afterpulses The can reduce dark count by cooling in addition to low afterpulses and low crosstalk of the S1336 series. The integrates the S1336 series with
More informationInAsSb photovoltaic detector
InAsSb photovoltaic detector P12691-21 High-speed response and high sensitivity in the 8 μm spectral band Thermoelectrically cooled infrared detector with no liquid nitrogen required The P12691-21 is an
More information16-element Si photodiode arrays
S11299-321 S11299-421 S11299-21 S11299-121 Back-illuminated photodiode arrays for X-ray non-destructive inspection, slender board type The is a back-illuminated type 16-element photodiode array specifically
More information12-bit digital output
S02-0C 2-bit digital output The S02-0C is a digital color sensor sensitive to red (λ=65 nm), green (λ= nm) and blue (λ=465 nm) regions of the spectrum. Detected signals are serially output as 2-bit digital
More informationCMOS linear image sensors
CMOS linear image sensors S11106-10 S11107-10 Compact size and high cost-performance The S11106-10 and S11107-10 are CMOS linear image sensors of resin sealing type that delivers a video data rate of 10
More informationAPD module. Variable gain, stable detection even at high gain. C Applications. Features. Sensitivity vs.
APD module C158-1 Variable gain, stable detection even at high gain The C158-1 consists of an APD, current-to-voltage converter, high-voltage power supply circuit as well as a microcontroller for compensating
More informationReduced color temperature errors
Reduced color temperature errors The is a photo IC diode with spectral response characteristics that closely resemble human eye sensitivity. Two active areas are formed on the same chip, and the outputs
More informationInAsSb photovoltaic detectors
High-speed response and high sensitivity in the spectral band up to 5 μm Infrared detectors The are photovoltaic type infrared detectors that have achieved high sensitivity in the spectral band up to 5
More informationCMOS linear image sensor
CMOS linear image sensor S14739-20 High sensitivity, photosensitive area with vertically long pixels The S14739-20 is a high sensitivity CMOS linear image sensor using a photosensitive area with vertically
More informationCMOS linear image sensors. CMOS linear image sensors. Built-in timing generator and signal processing circuit; 3.3 V single supply operation
CMOS linear image sensors Built-in timing generator and signal processing circuit; 3.3 V single supply operation The is a small CMOS linear image sensor designed for image input applications. The signal
More informationCMOS linear image sensors
Video data rate: 5 MHz max., simultaneous charge integration The is a small CMOS linear image sensor designed for image input applications. Signal charge is integrated on all pixels simultaneously and
More information16-element Si photodiode arrays
Back-illuminated photodiode arrays for X-ray nondestructive inspection (element pitch: mm) The is a back-illuminated type 16-element photodiode array specifically designed for non-destructive X-ray inspection.
More information16-element Si photodiode arrays
Back-illuminated photodiode arrays for X-ray nondestructive inspection (element pitch: mm) The is a back-illuminated type 16-element photodiode array specifically designed for non-destructive X- ray inspection.
More informationMini-spectrometer. SMD series C14384MA-01. High sensitivity in the near infrared region (to 1050 nm), ultra-compact grating type spectrometer
Mini-spectrometer SMD series C14384MA-01 High sensitivity in the near infrared region (to 1050 nm), ultra-compact grating type spectrometer The C14384MA-01 is a ultra-compact grating type spectrometer
More informationMPPC (Multi-Pixel Photon Counter)
MPPC (Multi-Pixel Photon Counter) MPPCs in a chip size package miniaturized through the adoption of TSV structure The are MPPCs for precision measurement miniaturized by the use of TSV (through-silicon
More informationInGaAs linear image sensors
Single video line (256/512 pixels) near infrared image sensor (0.95 to 1.7 μm) The G11135 series InGaAs linear image sensors designed for foreign object inspection equipment. These linear image sensors
More informationInGaAs linear image sensors
Near infrared image sensor (0.9 to 1.7 μm) with 1024 pixels and high-speed line rate The is a 1024-channel, high-speed infrared image sensor designed for applications such as foreign object screening and
More informationLCOS-SLM (Liquid Crystal on Silicon - Spatial Light Modulator)
POWER LCOS-SLM CONTROLLER RESET POWER OUTPUT ERROR LCOS-SLM (Liquid Crystal on Silicon - Spatial Light Modulator) Control your light! Shape your beam! Improve your image! The devices are a reflective type
More informationNMOS multichannel detector head
UV to near infrared range (200 to 1000 nm), For multichannel spectrophotometry The is a family of multichannel detectors developed for spectrophotometry in the UV to near infrared range (up to 1000 nm).
More informationDriver circuit for CCD image sensor
For CCD image sensor S11850-1106, S11511 series The is a driver circuit developed for CCD image sensors S11850-1106 and S11511 series. By connecting the to a PC through the USB 2.0 interface, you can use
More informationAccessories for infrared detector
Temperature controllers Heatsinks for TE-cooled detector Chopper, etc. Wide lineups of accessories for infrared detector HAMAMATSU provides temperature controllers, heatsinks for TE-cooled detector, chopper
More informationPhotodiode modules. C10439 series. Integrates photodiode for precision photometry with low-noise amp.
Integrates photodiode for precision photometry with low-noise amp The photodiode modules are high-precision photodetectors that integrate a photodiode and a current-to-voltage amplifier. The output from
More informationS P. Ultra-miniature, high performance Electromagnetically driven laser scanning MEMS mirror. Features.
Si MEMS photodiode mirror Ultra-miniature, high performance Electromagnetically driven laser scanning MEMS mirror The is an electromagnetically driven mirror that incorporates our unique MEMS (micro-electro-mechanical
More information