JTAG / Boundary Scan. Multidimensional JTAG / Boundary Scan Instrumentation

Transcription

1 JTAG / Boundary Scan Multdmensonal JTAG / Boundary Scan Instrumentaton

2 2 GOEPEL electronc & JTAG / Boundary Scan COMPANY GOEPEL electronc GmbH GOEPEL electronc s a global company that has been developng and producng ground-breakng solutons for electronc and optcal test technologes snce the early 1990s. Already n 1991, the enterprse was the frst worldwde vendor of dedcated JTAG / Boundary Scan solutons. Today, a hghly qualfed team of more than 200 experts takes care to guarantee the best solutons for our customers test tasks. A consstent nnovaton management as well as a thorough ongong qualty approach emphasses our clam as technology poneer n the felds of electrc and optcal testng. Ths s valdated by a contnuous ISO-9001 certfcaton snce What s JTAG / Boundary Scan? Boundary Scan s a revolutonary technology substtutng the physcal access va nals and probes by means of specal on-chp electroncs (electronc nals) n conjuncton wth a dedcated four-wre bus. The method was developed as successor of the dgtal In-Crcut Test (ICT). It mplements the tester s pn electroncs drectly n the IC desgn. Boundary Scan provdes a multtude of opportuntes for structural or functonal tests and hardware debug as well as n-system programmng. Qualtatve trend n test access: Paradgm Change Access ICT / MDA Embedded System Access More about GOEPEL electronc goepel.com/goepel Natve access per connector 198x 199x 200x 201x 202x 198x 199x 200x 201x 202x JTAG/ Boudary Scan from GOEPEL eletronc s the soluton! IEEE ntegrated Boundary Scan tools Boundary Scan Controller wth PIO, A / D, D / A Gang Test Turbo Flash Programmng Ant Ground Bounce DIN EN ISO 9001 Zertfkat: PXI Controller Vrtual Scan Pn enhanced Flyng Prober Integraton TAP sgnal transmsson va large dstance Fast Ethernet Controller IEEE 1532 Bo

3 TECHNOLOGY Functonalty & benefts of JTAG / Boundary Scan 3 Ths s how t works: Smlar to In-Crcut Test (ICT), JTAG / Boundary Scan utlses thousands of test ponts wth only four test access ponts. Therefore, expensve bed-of-nal fxtures are redundant. The followng mage shows the archtecture of a typcal Boundary Scan IC. The Boundary Scan cells are ntegrated between core logc and physcal contact pns. They enable the test of connectons between the pns of ICs, even those wthout Boundary Scan cells. Save money wth JTAG / Boundary Scan Small nvestment and operatonal costs Extremely short test tmes but hgh effcency / productvty Versatle applcaton across the development and producton process Future-proof and sustanable nvestment JTAG / Boundary Scan s very versatle and can be utlsed n the entre producton process, e.g. for emulaton, desgn verfcaton, prototype and producton test as well as on-chp and n-system programmng. Decde for the Technology Leader! Most experenced GOEPEL electronc s the JTAG / Boundary Scan poneer and hghly reputed vendor snce 1991 Global presence Fve subsdares worldwde and a network of more than 350 sales and support experts Innovaton Contnuous market ntroductons of numerous awarded products Versatlty Bggest portfolo of more than 250 products for your ndvdual test soluton Market leader Over 8,000 system nstallatons Flexblty Integraton of JTAG / Boundary Scan n exstng systems of all ATE vendors Mehr about JTAG / Boundary Scan goepel.com/en/bscan More than 20 years of nnovatons a tme lne undary Scan ASIC CION Boundary Scan Probe JULIET SYSTEM CASCON Msson Assst RAPIDO CION LX

4 4 Easy applcaton development wth SYSTEM CASCON SOFTWARE Software that sets Qualty Standards The key for successfully utlsng JTAG / Boundary Scan s determned by the qualty of the appled software today more than ever. Grown wthn the nnovatons across nearly two decades, SYSTEM CASCON s the most utlsed JTAG / Boundary Scan software platform worldwde. More than 1,000 desgn and test engneers, qualty managers, servce techncans and system dagnostcans use ths unque ntegrated software envronment every day. Detals about SYSTEM CAS CON features & packages goepel.com/en/cascon SYSTEM CASCON : ntutve user gudance through Msson Assst Features that make the Dfference Powerful Scalable hgh-performance platform wth more than 50 ntegrated tools, central project database and ntutve user nterface Vsual Interactve Boundary Scan vsualsaton on layout, schematc and logc level for graphcal analysng and debuggng Intellgent Smple, fast and goal-orented project development by ntellgent tools and automated system processes Unversal Support of test and programmng strateges for nternal and external nstrumentatons beyond Boundary Scan Safe Test Integrated safety functons avod hardware damagng scan vectors and guarantee safe test programs Coverage Extended test coverage and precse fault dagnostc by complete ncluson of non-boundary Scan crcuts

5 SOFTWARE JTAG / Boundary Scan software from GOEPEL electronc 5 Debugger and graphcal test coverage ESA Technologes (Embedded System Access) JTAG/Boundary Scan Test (BST) Processor Emulaton Test (PET) Chp Embedded Instruments (IJTAG) Embedded Dagnostcs Test (EDT) In-System Programmng (ISP) Core Asssted Programmng (CAP) In-Applcaton Programmng (IAP) FPGA Asssted Programmng (FAP) At-Speed Functonal Test Ggabt Connectons Dynamc Memory Access Hghly Complex Cluster Test Coverage Infrastructure Interconnectons Statc Memory Acess Complex Clusters Debugger, Vsualzer, Analyzer Boundary Scan Test Boundary Scan + VaroTAP Boundary Scan Project Progress External Instruments Control SYSTEM CASCON Platform Nucleus Processor Emulaton Test VaroTAP ncreases Test Coverage by Emulaton Tests Flash/PLD/MCU Programmng Chp embedded Instruments Control hgh-speed flash In-System Programmng hgh-speed access test of DDR-RAM unversal frequency and clock measurements bt error rate test (BERT) ChpVORX drves Flash ISP Performance Structural tests, Functonal/emulaton tests, Programmng Infrastructure test Connecton test RAM access Logc cluster test I/O connecton test Analog I/O test Flash programmng PLD/FPGA programmng Bult-n self-test Mcro controller programmng

6 6 Performance and relablty wth SCANFLEX and SCANBOOSTER HARDWARE Hardware Solutons wthout Compromse Just lke the software, GOEPEL electronc s hardware tradtonally meets hghest qualty and performance demands throughout the entre product lfe cycle. The avalable product lnes of SCANFLEX and SCANBOOSTER are the fourth generaton of GOEPEL electronc s Boundary Scan Hardware solutons. Coupled wth ntutve software, they enable applcatons far exceedng standard Boundary Scan to be quckly realsed. The support of external nstrumentatons plays a key role. SCANFLEX receved the prestgous Best n Test Award, rewarded by Test & Measurement World magazne, for ts outstandng archtecture concept. Detals about SCANFLEX and other hardware products goepel.com/en/scanflex Hardware SFX/COMBO SCANFLEX controller for Ggabt Ethernet & USB wth ntegrated TAP transcever for 4 ndependent ports SFX/ASL1149-x SCANFLEX controller for Ggabt LAN, USB 2.0 & Cabled PCIe SFX/PXI1149/C4-x SCANFLEX controller for PXI bus wth ntegrated TAP transcever for 4 ndependent ports SFX-6308 Wth 8 analog n- and outputs SFX-TAP6 & SFX-5296 SCANFLEX TAP transcever wth 6 ndependent ports & SCANFLEX I/O module wth 96 dgtal I/Os SFX/PCI1149 SCANFLEX controller for PCI or PCIe SCANFLEX redefnes Boundary Scan Powerful Scalable hgh-performance platform for scan operatons of 80 MHz wth up to eght parallel ndependent TAP nterfaces Unversal Broad support of a multtude of test, emulaton and programmng strateges complementng Boundary Scan Flexble Separately controlled I/O modules wth VaroCore technology for reconfgurable analogue, dgtal and Mxed-Sgnal functons Modular Freely confgurable controller, I/O modules, TAP transcever and TAP Interface Cards (TIC) enable scalable system confguratons Adaptve Best TAP sgnal transmsson qualty also over long dstances of up to ten metres wth full sgnal delay tme compensaton ATE ready Specal front-end hardware ensures seamless ntegraton nto In-Crcut Testers, Flyng Probe Testers, Functonal Testers and other ATE

7 HARDWARE JTAG / Boundary Scan hardware by GOEPEL electronc 7 SCANBOOSTER /USB Controller for USB 2.0 wth 2 ndependent test access ports CION LX Confgurable ASIC for extended mxed sgnal test ChpVORX Module /FXT-X90 Test & programmng wth chp embedded nstruments CION Module /PCIe Structural test of PCIe nterface CION Module /FXT192A Test dgtalen & analog I/Os Bus Access Cables for extended functonal test of nterfaces Platform of hghest Flexblty SCANFLEX offers the unque opportunty to use varous knds of nstrumentaton based on a flexble platform In-system nstrumentaton wth external nstrumentaton s the key for hghest fault coverage and nearly unlmted flexblty wthn the defnton of a test strategy. In-System Instrumentaton 1 Dgtal Boundary Scan test (IEEE /6) Hgh-speed Flash programmng va IEEE PLD programmng (JAM / STAPL, SVF, IEEE 1532) Analogue Boundary Scan test (IEEE ) Functonal emulaton test va JTAG debug port Hgh-speed Flash programmng va emulaton Control of on-chp verfcaton and test IP Control of Bult-n self test (BIST) 1 Partly support also n the SCANBOOSTER economy product lne goepel.com/en/scanbooster External Instrumentaton 2 Dgtal I/O (statc / dynamc) Dgtal functonal modules Analogue I/O (statc / dynamc) Analogue functonal modules Programmer for seral Flash (SPI / I2C) Protocol based bus nterface tester Control of reconfgurable IP (VaroCore ) Control of thrd-party I/O (ICT, FPT, FCT) 2 Partly support also n the CION Module economy product lne goepel.com/en/conmodule

8 8 Flexblty of poducton tests PRODUCTION Flexbly defnng Producton Tests Nowadays, testng s an mportant ntegral part of any qualty assurance strategy. But each producton envronment and every product put dfferent demands on the test equpment. We have consstently taken up ths challenge and developed flexble system solutons, whch adapt to the producton process and can be ntegrated n exstng envronments wthout performance loss. Tests, already developed n the lab, can be drectly taken over nto the producton process for fast New Product Introducton (NPI). SYSTEM CASCON for JULIET Detals about our producton stage solutons and ntegrated packages goepel.com/en/ntegraton Perfectly equpped by all means Throughput Shortest test tme and hgh-speed programmng of Flash / PLD provde full n-lne capablty also at very hgh beat rate Integraton Standard nterface control va LabVIEW, TestStand, C / C++, Basc, Tcl / Tck, Python etc. down to vector level Precson Detecton, pn accurate dagnoss and layout dsplay of all defects such as shorts or open BGA solder jonts wthn one applcaton Modular Effcent system utlsaton by means of Floatng Lcense, fast project transfer through archve fles and onlne fault data tracng Synchronous Complete nteracton of Boundary Scan patterns wth test vectors of other ATE or AOI systems for hghest fault coverage Turn-key Avalablty of custom JTAG / Boundary Scan systems ncl. adaptaton based on platforms such as PXI, JULIET or RAPIDO

9 INTEGRATION Integrated productvty on command 9 RAPIDO RAPIDO represents a new generaton of system solutons for hgh-speed onboard programmng of non-volatle memores lke flashes, mcrocontrollers and PLDs. Based on advanced ntegrated In-System Programmng technologes t addresses not just the problems of contnuously ncreasng memory sze, but also offers a true alternatve compared to tradtonal devce programmers, due to ts excellent flexblty. JULIET The modular JULIET systems combne all test electroncs, as well as the basc mechancs n a compact desktop system. Furthermore, they are equpped wth a specal nterface to an exchangeable adaptor provdng fast changes to accommodate dfferent Unts Under Test (UUT). The JULIET test systems partcularly address the flexble low volume producton area, but are also utlsed for fault dagnoss n repar processes and specfc calbraton procedures. The new features help for a sgnfcant ncrease n the systems safety, productvty and fault coverage. Stand-alone or Integraton? It doesn t matter what varant you decde for, our product portfolo covers t. Wth the help of our powerful software and hardware, every PC can be transformed nto a JTAG / Boundary Scan tester wth extended fault coverage. However, ready-made testers lke JULIET & RAPIDO nclude Unt Under Test (UUT) power supply and are preconfgured professonal solutons for adaptng the UUT. As far as the analogue crcut parts are concerned, the hghest possble fault coverage can be acheved by combnng JTAG / Boundary Scan wth other methodologes. Numerous ntegraton packages of varous performance classes are avalable for such purposes. Typcally, they have been developed n close cooperaton wth, and are authorsed, by the respectve ATE vendor. Increased Test Coverage by Combnaton of C Boundary Scan and Flyng Probe Hgh flexblty wthout bedof-nals for hgh-mx Boundary Scan and Functonal Test Hgh fault coverage also n dynamc doman Boundary Scan and HASS / HALT Dynamc montorng for tests n envronmental chamber Boundary Scan and In-Crcut Test Hoher Durchsatz be bester Dagnose güte für Hgh-Volume Boundary Scan and AOI Hgh throughput wth best dagnoss for hgh-volume Boundary Scan and Gang Test Parallel programmng and test of several boards A couple of our ATE partners

10 10 Excellent support SUPPORT & SERVICE Support from the very Begnnng The credo of excellent customer and product support has been part of GOEPEL electronc s overall corporate phlosophy snce the very start. Fve technology centres n Europe, the USA and Asa as well as a global network of hghly qualfed and experenced applcaton engneers are avalable for support and servce at any tme. The scope of servces extends from pure Boundary Scan applcatons to turn-key solutons, complete process ntegratons and hardware/software developments. Our GATE allance partners (GOEPEL Assocated Techncal Experts) also play a decsve role n technology transfer. They nclude desgn and test houses as well as system ntegrators wth specal knowledge that supply valuable complementary servces for successful project mplementatons. In summary, we are well postoned to ndvdually support any type of customer such as OEM, ODM or EMS. Detals about GATE goepel.com/en/gate Detals about support and servce goepel.com/en/support Competence s our Passon Servces at a Glance Knowledge transfer n workshops, semnars and tranng on-ste, n our technology centres, at our partners premses, or va nternet Performance transfer by project engneerng n our technology centres or our partners premses Boundary Scan bascs Herarchc Desgn-for-Testablty analyss Advanced JTAG / Boundary Scan (ncl. emulaton) BSDL fle development / verfcaton Desgn-for-Testablty / n-system programmng Development of complete test programs Test strateges n practce (ncl. AOI, AXI, ICT) Defnton of test strateges (ncl. AOI, AXI) Project related applcaton tranng System ntegratons for ICT, FPT, MDA and FCT System tranng for test and repar personnel Custom development (hardware, software) Certfcaton

11 SUPPORT & SERVICE...throughout the entre product lfe cycle 11 Use from prototypng to volume producton No matter what stage of product development or manufacturng cycle you are currently n, JTAG/ Boundary Scan brngs forward your work. Beneft from numerous advantages lke easy program generaton, fast adaptaton to changes, best debug capabltes as well as easy transton from development to manufacturng. Smple troubleshootng va detaled and graphcal fault analyss In-system programmng of ICs from all vendors through one tool Access to all dgtal component pns va four-wre-bus Benefts as a Customer! Have you already purchased our JTAG / Boundary Scan equpment? Then you have full access to all customer benefts such as GENESIS, our support webste wth lbrary models, manuals, applcaton notes, software updates and much more Lbrary model development for new flash, RAM and addtonal non-boundary Scan devces BSDL fle verfcaton Support hotlne va phone, vdeo va nternet (Skype), desktop sharng (WebEx) and emal Attendance at our worldwde organsed Boundary Scan Days Informaton about product roadmap and nfluence on new developments Specal mantenance contracts for hardware and software Extended hardware warranty of 36 months Boundary Scan Probe SCANFLEX Board Grabber What do satsfed Customers say about GOEPEL electronc s Support We have been successfully applyng GOEPEL electronc s Boundary Scan test systems n our producton snce September The performance of the systems and the support by GOEPEL electronc have mpressed us. We are able to process the test applcaton regardng the techncal and tme specfcatons to the complete satsfacton of our customers. Ernst Neppl Zollner Elektronk AG Germany It s the best Boundary Scan system avalable that we have seen and GOEPEL electronc seem ntent on contnually takng t forwards. We ve always been satsfed. Anyway why would we use equpment from anyone else but the European market leader? Phl Randall ACW Technology Ltd. Unted Kngdom

12 Global presence CONTACT JTAG / Boundary Scan Support Locaton Hotlne Freephone E-Mal Europe +49 (0) bscan_support@goepel.com USA +1 (0) (0) GOEPEL support@goepelusa.com Unted Kngdom & Ireland +44 (0) bscan.support@goepel.co.uk Chna +852 (0) support@goepel.asa Dstrbutor GATE -Partner You wll fnd your local contact for product aalablty and support: goepel.com/en/contact Europe GOEPEL electronc GmbH Göschwtzer Straße 58 / Jena Deutschland Tel.: +49 (0) Fax: +49 (0) sales@goepel.com Amerca GOEPEL electroncs LLC 9737 Great Hlls Tral Sute 170 Austn, TX / USA Tel.: +1 (0) Fax: +1 (0) sales@goepelusa.com Unted Kngdom & Ireland GOEPEL electroncs Ltd Unt 1A, The Old Granary Westwck, Cambrdge CB24 3AR / UK Tel.: +44 (0) Fax: +44 (0) sales@goepel.co.uk Asa GOEPEL electroncs Asa Ltd 15/F OTB Buldng 160 Gloucester Road Hongkong / Chna Tel.: +852 (0) Fax: +852 (0) sales@goepel.asa BS / D /