TECHNICAL NOTE. What is Wander MEASUREMENT SOLUTIONS ANRITSU CORPORATION
|
|
- Osborne Wilkins
- 6 years ago
- Views:
Transcription
1 TECHNICAL NOTE What is Wander MEASUREMENT SOLUTIONS ANRITSU CORPORATION
2 CONFIDENTIAL Copyright 2002 by ANRITSU CORPORATION The contents of this manual shall not be disclosed in any way or reproduced in any media without the express written permission of Anritsu Corporation.
3 Technical note What is Wander Digital Communications Marketing Dept. Measurement Solutions Anritsu Corporation What is Wander Wander is a phase variation at slow frequency of DC to 0Hz. It requires wider measurement range than Jitter. (The required range is at least x 0 9 ns according to ITU-T Rec. O.72.) The measurement unit of Wander is shown in ns (nanosecond), where Jitter is shown in UI (Unit Interval). Example: MHz : UI = about 0.4ns
4 Wander Measurement Items TIE (Time Interval Error) MTIE (Maximum Time Interval Error) TDEV (Time Deviation) Please see the operation manual that explains the MX50002A Wander Application etc., using figures. TIE: Time Interval error The TIE is defined as a phase difference between the measured signal and the reference signal. The unit is typically shown in ns. The phase difference of measurement time T is measured from the start time defined 0. So, TIE shows the phase change from the measurement start. MTIE: Maximum Time Interval Error The MTIE measures characteristics of a frequency offset and a phase transient Wander. It is evaluated by using parameter called Observation time τ. MTIE (τ) is defined as a maximum TIE peak to peak value in Observation time τ. The time range of τ (length) is shifted in all TIE data as it is holding the peak value, in order to calculate MTIE based on the measured TIE. These calculated MTIE (τ) are MTIE values at τ, and it continue to calculate at each τ. TDEV: Time Deviation The TDEV measures characteristics of spectrum quantity in Wander. It is also evaluated by using parameter called Observation time τ. In TIE value, TDEV(τ ) is defined as RMS with BPF(Band Pass Filter) whose center frequency is at 0.42/ τ. Total measurement time T should require at least 2 τ for high-accuracy TDEV(τ). 2
5 Noise Wander Measurement Output Wander Wander Generation Input Noise Wander Tolerance Noise Wander Transfer The Output wander evaluates Noise Wander which is generated from NE connected in a network. It is evaluated by measuring MTIE and TDEV, and it confirms that nothing exceeds the specified mask line. The Noise Wander Generation measures noise wander generated from the device under test by itself. It corresponds to Jitter generation for Jitter, and it shows the amount of wander emergence when inputting Wander free signal. It is evaluated by measuring MTIE and TDEV, and it confirms that nothing exceeds the specified mask line. The Input noise wander tolerance measures tolerance of the device under test against noise wander. When inputting the standard clock added noise wander to the device under test, it confirms the followings: Not causing any alarms Not causing the clock to switch reference Not causing the clock to go into holdover It confirms that the device under test has tolerance against noise wander in accordance with specified MTIE and TDEV mask line. (At present, only TDEV can be measured.) The Noise wander transfer evaluates the transfer characteristic of the device under test by inputting Noise wander modulated by TDEV Noise to the device under test, and by evaluating TDEV when outputting from the device under test. It confirms that nothing exceed the specified mask line. The Noise Transfer evaluates characteristics of LPF (Low Pass Filter) in the device under test. 3
6 Connection with MP580A and MP570A Optical input ➄ Electrical TX Electrical RX Optical output ➅ ➃ GPIB cable Wander Ref. Input RS232C interface for Wander data communication with external PC When measured wander, please connect between Wander Ref output and Wander Ref input or apply signal from external Reference generator Wander Ref. CLK output This sheet shows connection with MP580A and MP570A. Combined with MP570A, need to connect, and ➃ cable. Optical interface for DUT is➄ and ➅ points, and also when start wander measurement, need to connection or apply signal from external reference generator to Wander reference input. 4
7 MP580A Block Diagram External Modulation Input External Clock Input Transmitter side Sinusoidal Jitter Generator Jitter Modulator Clock Output Internal Ref Reference Output DCS External 5/0M Reference input Reference Loop Noise Wander Generator Wander Reference Output Receiver side Clock Input Reference Clock Input Jitter Demodulator Jitter Filters HP LP Demodulation Clock Output Peak RMS Detector Wander Reference Input Wander Demodulator 0Hz LP Filter TIE Detector RS-232C for PC 5
8 T T Noise Wander Generation measurement MX50002AWander Meas. Measuring and comparing Wander Generation mask NE Application software Timing signal ➃ ➄ STM-N output interface Observation interval t [s] Wander free Ref signal ex MHz Wander Ref output ➃ Wander Ref input ➄ DCS input This shows an example of Noise wander generation measurement. NE measures by translating Reference signal, for example 2.048MHz, into timing signal after Clock Recovery, based on input STM-N signal. At this point, Input Reference is shown by using Wander free signal. This figure shows that the signal is output from the Wander Reference Output of the MP580A, but the frequency reference can be branched. In addition, The frequency reference signal should be input to both DCS input and Wander Reference input of the MP580A in Wander measurement. 6
9 Noise Wander Tolerance measurement () Error & Alarm Monitoring NE ➃ Ref signal with TDEV Wander ex MHz Modulated by Wander Tolerance mask Noise STM-N output interface Wander Ref output T ➃ DCS input This shows an example of Noise wander tolerance (). It explains that NE measures by translating Reference signal, for example, 2.048MHz, into Timing signal after Clock Recovery based on input STM-N signal. Reference signal modulated by TDEV Noise in accordance with TDEV Noise Tolerance is input to Wander reference output of the MP580A. Monitoring error with the MP570A in this condition, it confirms error free. 7
10 Noise Wander Tolerance measurement (2) Error & Alarm Monitoring Modulated by Wander Tolerance mask Noise NE 7 0 STM-N output interface DCS input ➃ Wander Ref output ➄ DCS input ➄ ➃ T Ref signal with TDEV Wander This shows an example of Noise Wander Tolerance (2). It explains that NE measures by transmitting data as timing signal after Clock Recovery, based on STM-N input signal. Multi- STM-N signal is gained by inputting Wander reference output of the MP580A, modulated by TDEV Noise in accordance with TDEV Noise Tolerance mask, to DCS input of the MP570A. This signal is input to NE, and it confirms error free while monitoring with the MP570A in this condition. 8
11 T Noise Wander Tolerance measurement (3) MX50002A Wander Meas. Application software NE Error & Alarm Monitoring STM-N output interface ➃ ➄ Ref signal with TDEV Wander ex MHz Modulated by Wander Tolerance mask Noise Wander Ref output T ➃ Wander Ref input ➄ DCS input This shows an example of Noise wander tolerance measurement (3). It explains that NE measures by translating Reference signal, for example 2.048MHz, into Timing signal after Clock Recovery based on input STM-N signal. Reference signal modulated by TDEV Noise in accordance with TDEV Noise Tolerance mask is input to Wander reference output of the MP580A. Monitoring error with the MP570A in this condition, it confirms error free. This example measurement is almost the same as the example (), but it can monitor TDEV Noise generated from the MP580A by using Wander application. The frequency reference signal should be input to both DCS input and Wander Reference input of the MP580A in Wander measurement. 9
12 T T Noise Wander Tolerance measurement(4) MX50002A Wander Meas. Application software 000 Modulated by Wander Tolerance mask Noise NE Error & Alarm Monitoring STM-N output interface ➃ ➄ ➅ Ref signal with TDEV Wander DCS input ➃ Wander Ref output ➄ Wander Ref input, ➅ DCS input This shows an example of Noise Wander Tolerance measurement (4). It shows that NE measures by transmitting data as timing data after Clock Recovery, based on STM-N signal. Multi-STM-N signal is gained by inputting Wander reference output of the MP580A, modulated by TDEV Noise in accordance with TDEV Noise Tolerance mask, to DCS input of the MP570A. In this case, clock output of the MP580A, Clock Recovery, cannot be used. (Jitter modulation can not be done at the same time). This signal is input to NE, and it confirms error free while monitoring error with the MP570A in this condition. This example measurement is almost the same as the example (2), but it can monitor TDEV Noise generated from the MP580A by using Wander application. The frequency reference signal should be input to both DCS input and Wander Reference input of the MP580A in Wander measurement. 0
13 T Noise Wander Transfer measurement Cal. () MX50002A Wander Meas. Application software ➃ ➄ Loop back Ref signal with TDEV Wander Loop back Observation interval τ Modulated by Wander Tolerance mask Noise [s] T STM-N output interface Wander Ref input ➃ Wander Ref output ➄ DCS input First of all, Calibration is required in Wander Transfer measurement. The measurement cannot be selected when there is no calibration data. This example shows Calibration for Noise Wander Transfer measurement. Example () shows that NE measures by translating Reference signal, for example 2.048MHz, into Timing signal after Clock Recovery based on input STM-N signal. As this figure explains, Wander reference output modulated by TDEV Noise input to DCS of the MP570A, and DCS abstracts synchronous signals from data then loops back these abstracted signals to In/Out of STM-N signal. In this case, Clock (Clock output) of the MP580A, Clock Recovery, cannot be used. ( Jitter modulation cannot be done at the same time.) Calibration data is loaded on PC by performing Calibration with the MX50002A Wander application. In addition, when selecting Estimated Calibration, it is possible to measure without calibration by calculating possible Noise Wander and by loading possible data as Calibration data.
14 T Noise Wander Transfer measurement Meas. () MX50002A Wander Meas. Application software Measuring and comparing Wander Transfer mask 000 NE Timing signal ➄ ➃ STM-N output interface T Ref signal with TDEV Wander ex MHz Modulated by Wander Tolerance mask Noise Wander Ref output ➃ DCS input 7 T ➄ Wander Ref input This shows an example of Noise wander transfer measurement (2). It is possible to measure after calibration is performed. This is almost the same as Noise Wander Tolerance measurement (3). The MX50002A compares Calibration data and Measured result, and makes a graph (on the Application software), then compares these data and Mask. It can evaluates elimination of Noise Wander in LPF of NE. 2
15 T Noise Wander Transfer measurement Cal. (2) MX50002A Wander Meas. Application software STM-N output interface DCS input ➃ Wander Ref output ➄ Wander Ref input, ➅ DCS input ➃ ➄ ➅ Loop-back Ref signal with TDEV Wander Modulated by Wander Tolerance mask Noise T First of all, Calibration is required for Wander Transfer measurement. The measurement cannot be selected when there is no Calibration data. This example (2) shows that Calibration of Noise Wander Transfer measurement. It shows that NE measures by transmitting data as timing data after Clock Recovery, based on input STM-N signal. As this figure explains, Wander reference output modulated by TDEV Noise is input to DCS of the MP570A, and DCS abstracts synchronous signals from data then loops back these abstracted signals to In/Out of STM-N signal. In this case, Clock (Clock output) of the MP580A, Clock Recovery, cannot be used. (Jitter modulation cannot be done at the same time.) Calibration data is loaded on PC by performing Calibration with the MX50002A Wander application software. In addition, when selecting Estimated Calibration, it is possible to measure without calibration by calculating possible Noise Wander and by loading possible data as Calibration data. 3
16 [s] T Noise Wander Transfer Measurement Meas. (2) MX50002A Wander Meas. Application software Measuring and comparing Wander Transfer mask 000 NE Observation interval τ 0 T STM-N output interface ➃ ➄ ➅ Ref signal with TDEV Wander Modulated by Wander Tolerance mask Noise DCS input Observation interval τ T [s] ➃ Wander Ref output ➄ Wander Ref input, ➅ DCS input This shows an example of Noise Wander Transfer measurement (2). It is possible to measure after Calibration is performed. This is almost the same as Noise Wander Tolerance measurement (4). The MX50002A compares Calibration data and Measured result, and makes a graph (on the Application Software), then compares these data and Mask. It evaluates that NE doesn t amplify Noise Wander. 4
17 Confidential Wander TECHNICAL NOTE Specifications are subject to change without notice. ANRITSU CORPORATION MEASUREMENT SOLUTIONS , Minamiazabu, Minato-ku, Tokyo , Japan Phone: Telex: J34372 Fax: U.S.A. ANRITSU COMPANY North American Region Headquarters 55 East Collins Blvd., Richardson, Tx 7508, U.S.A. Toll Free: -800-ANRITSU ( ) Phone: Fax: Canada ANRITSU ELECTRONICS LTD. Unit 02, 25 Stafford Road West Nepean, Ontario K2H 9C, Canada Phone: Fax: Brasil ANRITSU ELETRÔNICA LTDA. Praia de Botafogo 440, Sala 240 CEP , Rio de Janeiro, RJ, Brasil Phone: Fax: U.K. ANRITSU LTD. 200 Capability Green, Luton, Bedfordshire LU 3LU, U.K. Phone: Fax: Germany ANRITSU GmbH Grafenberger Allee 54-56, Düsseldorf, Germany Phone: Fax: France ANRITSU S.A. 9, Avenue du Québec Z.A. de Courtabœuf 995 Les Ulis Cedex, France Phone: Fax: Italy ANRITSU S.p.A. Via Elio Vittorini, 29, 0044 Roma EUR, Italy Phone: Fax: Sweden ANRITSU AB Botvid Center, Fittja Backe Stockholm, Sweden Phone: Fax: Spain ANRITSU ELECTRÓNICA, S.A. Europa Empresarial Edificio Londres, Planta, Oficina 6 C/ Playa de Liencres, Las Rozas. Madrid, Spain Phone: Fax: Singapore ANRITSU PTE LTD. 0, Hoe Chiang Road #07-0/02, Keppel Towers, Singapore Phone: Fax: Hong Kong ANRITSU COMPANY LTD. Suite 79, 7/F., Chinachem Golden Plaza, 77 Mody Road, Tsimshatsui East, Kowloon, Hong Kong, China Phone: Fax: Korea ANRITSU CORPORATION 4F Hyun Juk Bldg , Yeoksam-dong, Kangnam-ku, Seoul, Korea Phone: Fax: Australia ANRITSU PTY LTD. Unit 3/70 Forster Road Mt. Waverley, Victoria, 349, Australia Phone: Fax: Taiwan ANRITSU COMPANY INC. 6F, 96, Sec. 3, Chien Kou North Rd. Taipei, Taiwan Phone: Fax: No. Wander-E-E--(.0) Printed in Japan AGKD
Optical Power Meter ML910B. Dual Inputs db Display Resolution Feed-Through Sensor Data Storage Function Traceable to NBS
Power Meter ML910B Dual Inputs 0.001 db Display Resolution Feed-Through Data Storage Function Traceable to NBS The Dual-Input Power Meter With a Large Memory The ML910B optical power meter provides two
More informationMS9720A. WDM Network Tester. High-Performance WDM Measurement
MS9720A WDM Network Tester High-Performance WDM Measurement Ideal for High-Performance WDM Measurement From R&D and production to installation and maintenance of WDM communications devices ±20 pm Wavelength
More informationMG9541A Tunable Laser Source ME7894A Optical Component Tester
MG9541A Tunable Laser Source ME7894A Optical Component Tester For Evaluating Passive Optical Devices such as WDM and Fiber Amplifiers MG9541A Tunable Laser Source The MG9541A features a wide wavelength
More informationData-Dependent Effects on Jitter Measurement
Data-Dependent Effects on Jitter Measurement By K. Mochizuki and K. Ishibe TABLE OF CONTENTS Abstract Introduction Simulation Model Simulation Results 2 Discussions Conclusion References Abstract Data-dependent
More informationMP1630B. Digital Data Analyzer. 16-Channel PPG and ED in One Cabinet Eye Diagram Measurement Based on BER. 10 khz to 200 MHz
MP1630B Digital Data Analyzer 10 khz to 200 MHz 16-Channel PPG and ED in One Cabinet Eye Diagram Measurement Based on BER Seamless Testing of Digital Equipment in Communications, Computing and Broadcasting
More informationDownconverter Insertion Gain/Loss
Application Note Downconverter Insertion Gain/Loss For High Frequency RF Downconverters Scorpion Introduction A common test for frequency downconverters or downconverting mixers is insertion gain or loss.
More informationComparative Analysis of Date-Dependent Jitter
By Ken Mochizuki Comparative Analysis of Date-Dependent Jitter -Cases for PRBS and SDH/SONET Frames- Kazuhiko Ishibe TABLE OF CONTENTS;. Introduction 2. Evaluation Procedure 3. Evaluation : Data Dependent
More informationExtended Digitizing Function MS269xA-050 HDD Digitizing Interface
Product Introduction Extended Digitizing Function MS269xA-050 HDD Digitizing Interface MS2690A/MS2691A/MS2692A Signal Analyzer MS2690A/MS2691A/MS2692A Signal Analyzer Extended Digitizing Function MS269xA-050
More informationThe complete WLAN test set from Anritsu
The complete WLAN test set from Anritsu The new Anritsu MT8860A WLAN Test Set is dedicated to testing WLAN devices conforming to the IEEE 802.11 standards. The new Anritsu MT8860A WLAN Test Set is designed
More information3.2 Gb/s PPG and ED in One Cabinet Eye Diagram Measurement and Burst Signal Measurement Supported
MP1632C Digital Data Analyzer 50 MHz to 3.2 GHz 3.2 Gb/s PPG and ED in One Cabinet Eye Diagram Measurement and Burst Signal Measurement Supported Sophisticated Low-Cost 3.2 GHz Digital Data Core networks
More informationMX370075A DFS (ETSI) Waveform Pattern
Product Introduction MX370075A DFS (ETSI) Waveform Pattern MG3710A Vector Signal Generator MG3710A Vector Signal Generator MX370075A DFS (ETSI) Waveform Pattern Product Introduction MG3710A Vector Signal
More informationMP1763C/MP1764C/MP1764D
Established 1981 Advanced Test Equipment Rentals www.atecorp.com 800-404-ATEC (2832) MP1763C/MP1764C/MP1764D Pulse Pattern Generator/Error Detector 50 Mbit/s to 12.5 Gbit/s High-Quality, Low-Jitter, Low-Distortion
More informationMS2717A Economy Spectrum Analyzer
MS2717A Economy Spectrum Analyzer TECHNICAL DATA SHEET Advanced Analysis Tool for General Purpose Test 100 khz to 7.1 GHz System Description The Anritsu MS2717A delivers affordable spectrum analysis with
More informationMD1230/MP1590 Family
Quick Reference MD1230/MP1590 Family Data Quality Analyzer/IP Network Analyzer/ Network Performance Tester MBP-1SG060367 1SG060367-0000 MD1230/MP1590 Family version 7.0 Quick Start Guide First edition
More informationCS5334 CS Bit, Stereo A/D Converter for Digital Audio &5<67$/6(0,&21'8& '8&76',9,6,21 352'8&7,1)250$7,21 DS237PP2 NOV 96
CS5334 CS5335 20-Bit, Stereo A/D Converter for Digital Audio The following information is based on the technical datasheet: DS237PP2 NOV 96 Please contact : Crystal Semiconductor Products Division for
More informationBluetooth Test Set MT8852B. Technical Data Sheet. Introduction
Technical Data Sheet Bluetooth Test Set MT8852B Introduction This document provides specifications for the MT8852B Bluetooth Test Set and lists ordering information and option and accessory codes. A color
More informationWhite Paper. Fundamentals of using an RF capture/replay analyzer in design verification. Since 1895
White Paper Fundamentals of using an RF capture/replay analyzer in design verification Since 1895 Technical trends in device and system characterization Modern development techniques exploit computer modelling
More informationBest Practical Jitter Tolerance Testing with MP1800A
Application Note Best Practical Jitter Tolerance Testing with MP1800A MP1800A Series Signal Quality Analyzer Contents 1. Introduction... 2 2. Definition of Jitter Component Types... 3 3. Tips for Jitter
More informationBERTWave MP2110A. Quick Start Guide
BERTWave MP2110A Quick Start Guide Table of contents 1 BERTWave MP2110A... 5 2 Position of Quick Start Guide... 5 3 Evaluating 100GBASE-LR4 QSFP28 Transceiver... 5 3.1 Evaluation Items... 5 3.2 Required
More informationMemory-Depth Requirements for Serial Data Analysis in a Real-Time Oscilloscope
Memory-Depth Requirements for Serial Data Analysis in a Real-Time Oscilloscope Application Note 1495 Table of Contents Introduction....................... 1 Low-frequency, or infrequently occurring jitter.....................
More informationKeysight Technologies N4974A PRBS Generator 44 Gb/s. Data Sheet
Keysight Technologies N4974A PRBS Generator 44 Gb/s Data Sheet Description The Keysight Technologies, Inc. N4974A PRBS generator 44 Gb/s is a self-contained pattern generator capable of operating at either
More informationVictoriaJitter/Wander. Jitter and Wander Test Set. Jitter/Wander. in Real-Time for SDH, SONET, PDH and T-Carrier
VictoriaJitter/Wander Jitter and Wander Test Set Jitter/Wander in Real-Time for SDH, SONET, PDH and T-Carrier DCXC Digital Networks and Phase Impairment Loss of synchronization The nodes of SDH and SONET
More informationCMA 3000 SPECIFICATIONS. SDH, E3 and E4 test options
CMA 3000 SDH, E3 and E4 test options SPECIFICATIONS Testing SDH networks has never been easier CMA 3000 is Anritsu s next-generation portable and future proof field tester for the installation and maintenance
More information1588/PTP Recovered Clock Wander Measurement Using PTP Slave Emulation to Estimate Clock Stability and Accuracy
SYNC SERIES 1588/PTP Recovered Clock Wander Measurement Using PTP Slave Emulation to Estimate Clock Stability and Accuracy (For VeEX TX300SM, TX320SM, RXT-3000 and MTTplus-320) December 2016 Rev. B00 P/N:
More information1588/PTP Recovered Clock Wander Measurement Using PTP Slave Emulation to Estimate Clock Stability and Accuracy
USER GUIDE 1588/PTP Recovered Clock Wander Measurement Using PTP Slave Emulation to Estimate Clock Stability and Accuracy (For VeEX TX300SM, TX320SM, RXT-3000 and MTTplus-320) October 2016 Rev. A00 P/N:
More informationAbout... D 3 Technology TM.
About... D 3 Technology TM www.euresys.com Copyright 2008 Euresys s.a. Belgium. Euresys is a registred trademark of Euresys s.a. Belgium. Other product and company names listed are trademarks or trade
More information40 Gb/s PatternPro Programmable Pattern Generator PPG4001 Datasheet
40 Gb/s PatternPro Programmable Pattern Generator PPG4001 Datasheet Applications Semiconductor device testing Optical component testing Transceiver module testing The Tektronix PPG4001 PatternPro programmable
More informationDocument Copyrights. Disclaimer
Document Copyrights Copyright 00 by Kenwood Corporation. All rights reserved. No part of this manual may be reproduced, translated, distributed, or transmitted in any form or by any means, electronic,
More informationConfiguring the HP 4396B for O/E Testing. Application Note
Configuring the HP 4396B for O/E Testing Application Note 1288-2 Introduction The recent trend in cable television (CATV) is the need for more selections, or channels, and the possibility of having interactive
More information40 Gb/s PatternPro Programmable Pattern Generator PPG4001 Datasheet
40 Gb/s PatternPro Programmable Pattern Generator PPG4001 Datasheet The Tektronix PPG4001 PatternPro programmable pattern generator provides stressed pattern generation for high-speed Datacom testing.
More informationPrimary Reference Clocks (PRC/SSU)
Primary Reference Clocks (PRC/SSU) IEEE1588-2008 Compliant Grandmaster clock SyncE source with ESMC Up to 8 synchronizing inputs ( 6 in PW1008HGP ) Up to 32 outputs in one SSU subrack Up to 128 outputs
More informationNext Generation Ultra-High speed standards measurements of Optical and Electrical signals
Next Generation Ultra-High speed standards measurements of Optical and Electrical signals Apr. 2011, V 1.0, prz Agenda Speeds above 10 Gb/s: Transmitter and Receiver test setup Transmitter Test 1,2 : Interconnect,
More informationAgilent N4876A 28 Gb/s Multiplexer 2:1
Agilent N4876A 28 Gb/s Multiplexer 2:1 Data Sheet Revision 1.0 Features and Benefits Variable data rate up to 28.4 Gb/s Multiplexes two generator channels Front-end box for J-BERT or ParBERT Control via
More informationDigital Video Broadcast Options
Technical Data Sheet Digital Video Broadcast Options MS2721B-064, MT8222A-064 DVB-T/H Measurements 30 MHz to 990 MHz MS2721B-078, MT8222A-078 DVB-T/H SFN Field Measurements MS2721B-057 DVB-T/H BER Unit
More information2 MHz Lock-In Amplifier
2 MHz Lock-In Amplifier SR865 2 MHz dual phase lock-in amplifier SR865 2 MHz Lock-In Amplifier 1 mhz to 2 MHz frequency range Dual reference mode Low-noise current and voltage inputs Touchscreen data display
More informationR&S FSV-K40 Phase Noise Measurement Application Specifications
FSV-K40_dat-sw_en_5213-9705-22_cover.indd 1 Data Sheet 02.00 Test & Measurement R&S FSV-K40 Phase Noise Measurement Application Specifications 06.10.2014 14:51:49 CONTENTS Specifications... 3 Ordering
More informationMastering Phase Noise Measurements (Part 3)
Mastering Phase Noise Measurements (Part 3) Application Note Whether you are new to phase noise or have been measuring phase noise for years it is important to get a good understanding of the basics and
More informationInfiniBand Trade Association
InfiniBand Trade Association Revision 1.02 3/30/2014 IBTA Receiver MOI for FDR Devices For Anritsu MP1800A Signal Analyzer and Agilent 86100D with module 86108B and FlexDCA S/W for stressed signal calibration
More informationAgilent 87075C 75 Ohm Multiport Test Sets for use with Agilent E5061A ENA-L Network Analyzers
Agilent 87075C 75 Ohm Multiport Test Sets for use with Agilent E5061A ENA-L Network Analyzers Technical Overview Focus on testing, not reconnecting! Maximize production throughput of cable-tv multiport
More informationDIGITAL TRANSMISSION MEASURING INSTRUMENTS
DIGITAL DATA ANALYZER MP1630B 10 khz to 200 MHz NEW GPIB OPTION The MP1630B is a general-purpose bit error measuring instrument that can provide simultaneous measurements of multi-channel signals and burst
More informationKeysight Technologies High-Power Measurements Using the E5072A ENA Series Network Analyzer. Application Note
Keysight Technologies High-Power Measurements Using the E5072A ENA Series Network Analyzer Application Note Table of Contents Coniguration 1 Standard 2-port coniguration... 3 Coniguration 2 Measurements
More informationVideo Reference Timing with Tektronix Signal Generators
Using Stay GenLock Video Reference Timing with Tektronix Signal Generators Technical Brief Digital video systems require synchronization and test signal sources with low jitter and high stability. The
More informationMG3710A Vector Signal Generator. 100 khz to 2.7 GHz 100 khz to 4.0 GHz 100 khz to 6.0 GHz
Data Sheet MG3710A Vector Signal Generator 100 khz to 2.7 GHz 100 khz to 4.0 GHz 100 khz to 6.0 GHz Contents Definitions, Conditions of Specifications... 3 Frequency... 4 Output Level... 5 ATT Hold...
More informationReceiver Testing to Third Generation Standards. Jim Dunford, October 2011
Receiver Testing to Third Generation Standards Jim Dunford, October 2011 Agenda 1.Introduction 2. Stressed Eye 3. System Aspects 4. Beyond Compliance 5. Resources 6. Receiver Test Demonstration PCI Express
More informationGALILEO Timing Receiver
GALILEO Timing Receiver The Space Technology GALILEO Timing Receiver is a triple carrier single channel high tracking performances Navigation receiver, specialized for Time and Frequency transfer application.
More informationDA MHz Series of Narrowband or Wideband Distribution Amplifiers
DA1-100-10-10MHz Series of Narrowband or Wideband Distribution Amplifiers Key Features 1-10 MHz wideband Operation. Other band frequencies from 100 khz to 200 MHz are available AGC Level Controlled. Output
More informationBRR Tektronix BroadR-Reach Compliance Solution for Automotive Ethernet. Anshuman Bhat Product Manager
BRR Tektronix BroadR-Reach Compliance Solution for Automotive Ethernet Anshuman Bhat Product Manager anshuman.bhat@tektronix.com Agenda BroadR-Reach Automotive Market Technology Overview Open Alliance
More informationSynthesized Clock Generator
Synthesized Clock Generator CG635 DC to 2.05 GHz low-jitter clock generator Clocks from DC to 2.05 GHz Random jitter
More informationDA : Series of Narrowband or Wideband Distribution Amplifiers
DA1-100-10: Series of Narrowband or Wideband Distribution Amplifiers Key Features 1-100 MHz wideband Operation. Other band frequencies from 100 khz to 200 MHz are available AGC Level Controlled. Output
More informationDA E: Series of Narrowband or Wideband Distribution Amplifiers
DA1-150-10-E: Series of Narrowband or Wideband Distribution Amplifiers Key Features Dual A and B inputs. Automatic or manual switchover, configured by the Ethernet port. 1-150 MHz wideband operation. Other
More informationSDH Edition MP1577A. SONET/SDH/PDH/DSn Analyzer. Comprehensive Testing of Core Networks from One Compact Portable Analyzer
SDH Edition MP1577A SONET/SDH/PDH/DSn Analyzer Comprehensive Testing of Core Networks from One Compact Portable Analyzer Possible VC4-64c/OC-192c Measurements The MP1577A analyzer is designed for construction
More informationEvaluating Oscilloscope Mask Testing for Six Sigma Quality Standards
Evaluating Oscilloscope Mask Testing for Six Sigma Quality Standards Application Note Introduction Engineers use oscilloscopes to measure and evaluate a variety of signals from a range of sources. Oscilloscopes
More information100G EDR and QSFP+ Cable Test Solutions
100G EDR and QSFP+ Cable Test Solutions (IBTA, 100GbE, CEI) DesignCon 2017 James Morgante Anritsu Company Presenter Bio James Morgante Application Engineer Eastern United States james.morgante@anritsu.com
More informationCoherence Measurement between two Signals regarding Timing, Phase and Gain Application Note
Coherence Measurement between two Signals regarding Timing, Phase and Gain Application Note Products: R&S FS-Z10 R&S FSQ R&S FSG R&S SMU R&S SMIQ R&S SMBV This application note describes how to measure
More informationDriver circuit for MPPC
Simple evaluation starter kit for non-cooled s The is a starter kit designed for simple non-cooled evaluations. It consists of a sensor board and a power supply board. The sensor board includes an socket
More informationOptical Sampling Modules 80C01 80C02 80C07B 80C08C 80C10 80C11 80C12
Features & Benefits 10 Gb/sTelecom & Datacom 80C08C and 80C12 Lownoise, High Optical Sensitivity and Broad Wavelength Conformance Testing for 10GbE LAN, WAN, and FEC, 10G Fibre Channel, and 10 Gb/s Telecom
More informationDriver circuit for CMOS linear image sensor
Driver circuit for CMOS linear image sensor C13015-01 For CMOS linear image sensor S11639-01, etc. The C13015-01 is a driver circuit developed for Hamamatsu CMOS linear image sensor S11639-01, etc. By
More information32 G/64 Gbaud Multi Channel PAM4 BERT
Product Introduction 32 G/64 Gbaud Multi Channel PAM4 BERT PAM4 PPG MU196020A PAM4 ED MU196040A Signal Quality Analyzer-R MP1900A Series Outline of MP1900A series PAM4 BERT Supports bit error rate measurements
More informationElectrical Sampling Modules Datasheet 80E11 80E11X1 80E10B 80E09B 80E08B 80E07B 80E04 80E03 80E03-NV
Electrical Sampling Modules Datasheet 80E11 80E11X1 80E10B 80E09B 80E08B 80E07B 80E04 80E03 80E03-NV The DSA8300 Series Sampling Oscilloscope, when configured with one or more electrical sampling modules,
More informationAgilent 87405C 100 MHz to 18 GHz Preamplifier
Agilent 8745C 1 MHz to 18 GHz Preamplifier Technical Overview Key Features Rugged, portable design for ease of use in the field Probe-power bias connection eliminates the need for an additional power supply
More informationModel 7330 Signal Source Analyzer Dedicated Phase Noise Test System V1.02
Model 7330 Signal Source Analyzer Dedicated Phase Noise Test System V1.02 A fully integrated high-performance cross-correlation signal source analyzer from 5 MHz to 33+ GHz Key Features Complete broadband
More informationMS9740A Optical Spectrum Analyzer
Product Brochure MS9740A Optical Spectrum Analyzer 600 nm to 1750 nm Improved Production Efficiency Reduces Measurement and Inspection Times Reduce the manufacturing costs is a key issue for vendors of
More informationSHF Communication Technologies AG,
SHF Communication Technologies AG, Wilhelm-von-Siemens-Str. 23 D 12277 Berlin Marienfelde Germany Phone ++49 30 / 772 05 10 Fax ++49 30 / 753 10 78 E-Mail: mail@shf.biz Web: http://www.shf.biz Datasheet
More informationPrecision testing methods of Event Timer A032-ET
Precision testing methods of Event Timer A032-ET Event Timer A032-ET provides extreme precision. Therefore exact determination of its characteristics in commonly accepted way is impossible or, at least,
More informationMN9320A. Optical Channel Drop Unit. Independent Test Access Tool for Comprehensive DWDM Measurements
MN9320A Optical Channel Drop Unit Independent Test Access Tool for Comprehensive DWDM Measurements MN9320A Access to DWDM Channels and Traffic at One Location The technique of Dense Wavelength Division
More information7000 Series Signal Source Analyzer & Dedicated Phase Noise Test System
7000 Series Signal Source Analyzer & Dedicated Phase Noise Test System A fully integrated high-performance cross-correlation signal source analyzer with platforms from 5MHz to 7GHz, 26GHz, and 40GHz Key
More informationDIGITAL TRANSMISSION MEASURING INSTRUMENTS
SDH/PDH/ATM ANALYZER MP1552A NEW GPIB OPTION The MP1552A is a portable analyzer designed specifically for troubleshooting SDH, PDH, and ATM network construction and maintenance as well as for evaluating
More informationElectrical Sampling Modules
Electrical Sampling Modules 80E11 80E11X1 80E10B 80E09B 80E08B 80E07B 80E04 80E03 80E03-NV Datasheet Applications Impedance Characterization and S-parameter Measurements for Serial Data Applications Advanced
More informationR&S ZVA-Zxx Millimeter-Wave Converters Specifications
R&S ZVA-Zxx Millimeter-Wave Converters Specifications Data Sheet Version 19.00 CONTENTS Definitions... 3 General information... 4 Specifications... 5 Test port... 5 Source input (RF IN)... 5 Local oscillator
More informationOscilloscope Display Quality Impacts Ability to View Subtle Signal Details
Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details Application Note Introduction The quality of your oscilloscope s display can make a big difference in your ability to troubleshoot
More informationR&S ZVA-Zxx Millimeter-Wave Converters Specifications
ZVA-Zxx_dat-sw_en_5214.2033.22_umschlag.indd 1 Data Sheet 13.00 Test & Measurement R&S ZVA-Zxx Millimeter-Wave Converters Specifications 28.01.2013 15:08:06 CONTENTS General information... 3 Definitions...
More informationHA11579 P-I-P Analog Signal Processing LSI (NTSC)
ADE-207-068 (Z) P-I-P Analog Signal Processing LSI (NTSC) Rev. Sep. 99 The is a main/sub Picture analog signal processing LSI for NTSC suited PIP systems. The has built-in the Band Pass Filter BPF and
More informationDatasheet SHF A
SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone +49 30 772051-0 Fax ++49 30 7531078 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF 19120 A 2.85 GSa/s
More informationAgilent Understanding the Agilent 34405A DMM Operation Application Note
Agilent Understanding the Agilent 34405A DMM Operation Application Note Introduction Digital multimeter (DMM) is a basic device in the electrical world and its functions are usually not fully utilized.
More informationAccuracy Delta Time Accuracy Resolution Jitter Noise Floor
Jitter Analysis: Reference Accuracy Delta Time Accuracy Resolution Jitter Noise Floor Jitter Analysis Jitter can be described as timing variation in the period or phase of adjacent or even non-adjacent
More informationCellular Parametric Test
Cellular Parametric Test Racal Instruments Wireless Solutions 6104 - Digital Radio Test Set Easy to use, fully integrated test set optimized for maintenance and servicing of GSM850, GSM900, GSM1800 and
More informationPhotosensitive area (mm) 4 4. Peak sensitivity wavelength (nm) Supply voltage Dark state. Max. Vcc max. Tstg Min. Max. (ma) (V)
Integrates a PSD for precision photometry or a 4-segment Si photodiode with low-noise amp in a compact case PSD modules contain a high-precision two-dimensional PSD (position sensitive detector) or a 4-segment
More informationR&S FPS-K18 Amplifier Measurements Specifications
R&S FPS-K18 Amplifier Measurements Specifications Data Sheet Version 02.00 Specifications The specifications of the R&S FPS-K18 amplifier measurements are based on the data sheet of the R&S FPS signal
More informationKeysight Technologies Achieve High-Quality Compliance Test Results Using A Top-Quality Test Fixture. Application Note
Keysight Technologies Achieve High-Quality Compliance Test Results Using A Top-Quality Test Fixture Application Note Introduction When you perform compliance testing, you require the test results to confirm
More informationDATA SHEET. Two (2) fibers Detachable HDMI 2.0 Extender,
DATA SHEET Two (2) fibers Detachable HDMI 2.0 Extender, HDFX-300-TR Contents Description Features Applications Technical Specifications Operating Conditions Drawing of Module Drawing of Cable Connection
More informationAmphenol. Circular Connector Series. easier & quicker. by Amphenol. Amphenol-Tuchel Electronics GmbH
Amphenol Circular Connector Series easier & quicker by Amphenol A successful connector program now available in a new design with new technology. 3 + PE Screw termination 6 + PE Solder termination 6 +
More informationHP 70950B OPTICAL SPECTRUM ANALYZER
HP 71450B, 71451B, and 71452B Optical Spectrum Analyzers Technical Specifications Spectral Measurements from 600 to 1700 nm HP 70950B OPTICAL SPECTRUM ANALYZER OPTICAL INPUT The HP 71450B, 71451B, and
More informationKeysight Technologies ad Integrated RF Test Solution
Keysight Technologies 802.11ad Integrated RF Test Solution E7760A Wideband Transceiver M1650A mmwave Transceiver Data Sheet Introduction Design your 802.11ad device with confidence Evaluating devices at
More informationR&S SMBV-Z1 Reference Frequency Converter Specifications
Test & Measurement Data Sheet 01.01 R&S SMBV-Z1 Reference Frequency Converter Specifications Version 01.01, July 2011 CONTENTS Definitions... 3 Introduction... 4 Specifications... 4 Input signal...4 Output
More informationR&S FSQ-K91/K91n/K91ac WLAN a/b/g/j/n/ac Application Firmware Specifications
R&S FSQ-K91/K91n/K91ac WLAN 802.11a/b/g/j/n/ac Application Firmware Specifications Test & Measurement Data Sheet 03.00 CONTENTS OFDM analysis (IEEE 802.11a, IEEE 802.11g OFDM, IEEE 802.11j, )... 3 Frequency...3
More informationDVG MPEG-2 Measurement Generator
Data sheet Version 04.00 DVG MPEG-2 Measurement Generator October 2006 Digital TV test signals at a keystroke The DVG is a universal generator for digital TV signals. It generates in an endless loop a
More informationVariable gain and stable detection even at high gains
MODULE APD module C5 Variable gain and stable detection even at high gains Along with an APD, current-to-voltage conversion circuit, and high-voltage power supply circuit, the C5 contains a microcontroller
More informationR&S RT-Zxx High-Bandwidth Probes Specifications
R&S RT-Zxx High-Bandwidth Probes Specifications Test & Measurement Data Sheet 14.00 CONTENTS Definitions... 3 Probe/oscilloscope chart... 4 R&S RT-ZZ80 transmission line probe... 5 R&S RT-ZS10/-ZS10E/-ZS20/-ZS30
More informationR&S RT-Zxx High-Voltage and Current Probes Specifications
R&S RT-Zxx High-Voltage and Current Probes Specifications Test & Measurement Data Sheet 14.00 CONTENTS Definitions... 3 Probe/oscilloscope chart... 4 R&S RT-ZH10/-ZH11 high-voltage probes... 5 R&S RT-ZD01
More informationGFT Channel Digital Delay Generator
Features 20 independent delay Channels 100 ps resolution 25 ps rms jitter 10 second range Output pulse up to 6 V/50 Ω Independent trigger for every channel Fours Triggers Three are repetitive from three
More informationR&S EDS300 DME/Pulse Analyzer Specifications
R&S EDS300 DME/Pulse Analyzer Specifications year Data Sheet Version 04.01 CONTENTS Definitions... 3 Specifications... 4 Frequency... 4 Level... 4 DME signal analysis... 4 TACAN signal analysis (R&S EDS-K1
More informationHP 71910A and 71910P Wide Bandwidth Receiver Technical Specifications
HP 71910A and 71910P Wide Bandwidth Receiver Technical Specifications 100 Hz to 26.5 GHz The HP 71910A/P is a receiver for monitoring signals from 100 Hz to 26.5 GHz. It provides a cost effective combination
More informationQuartzlock Model A7-MX Close-in Phase Noise Measurement & Ultra Low Noise Allan Variance, Phase/Frequency Comparison
Quartzlock Model A7-MX Close-in Phase Noise Measurement & Ultra Low Noise Allan Variance, Phase/Frequency Comparison Measurement of RF & Microwave Sources Cosmo Little and Clive Green Quartzlock (UK) Ltd,
More informationAgilent ESA Series Spectrum Analyzers
Agilent ESA Series Spectrum Analyzers Demonstration Guide and Application Note This demo guide is a tool to gain familiarity with the basic functions and features of the Agilent Technologies ESA-L series
More information4 MHz Lock-In Amplifier
4 MHz Lock-In Amplifier SR865A 4 MHz dual phase lock-in amplifier SR865A 4 MHz Lock-In Amplifier 1 mhz to 4 MHz frequency range Low-noise current and voltage inputs Touchscreen data display - large numeric
More informationOPTICAL MEASURING INSTRUMENTS. MS9710C 600 to 1750 nm OPTICAL SPECTRUM ANALYZER GPIB. High Performance for DWDM Optical Communications
OPTICAL SPECTRUM ANALYZER 600 to 750 nm GPIB High Performance for DWDM Optical Communications The is a diffraction-grating spectrum analyzer for analyzing optical spectra in the 600 to 750 nm wavelength
More informationInGaAs multichannel detector head
Near infrared line camera (Line rate: 31.25 khz) The is a multichannel detector head suitable for applications where high-speed response is required, such as SD- OCT (spectral domain-optical coherence
More informationAdvanced Test Equipment Rentals ATEC (2832)
Established 1981 Advanced Test Equipment Rentals www.atecorp.com 800-404-ATEC (2832) For more information about Agilent Technologies test and measurement products, applications, services, and for a current
More informationLoop Bandwidth Optimization and Jitter Measurement Techniques for Serial HDTV Systems
Abstract: Loop Bandwidth Optimization and Jitter Measurement Techniques for Serial HDTV Systems Atul Krishna Gupta, Aapool Biman and Dino Toffolon Gennum Corporation This paper describes a system level
More informationEUTRA/LTE Downlink Specifications
Test & Measurement Data Sheet 03.00 EUTRA/LTE Downlink Specifications R&S FS-K100PC/-K102PC/-K104PC R&S FSV-K100/-K102/-K104 R&S FSQ-K100/-K102/-K104 R&S FSW-K100/-K102/-K104 CONTENTS Definitions... 3
More information