FREQUENCY COUNTERS TO 18 GHZ USING THE DATUM FREQUENCY STANDARD

Transcription

1 TECHNICAL MANUAL AF-166 INSTRUMENT CALIBRATION FREQUENCY COUNTERS TO 18 GHZ USING THE DATUM FREQUENCY STANDARD THIS PUBLICATION SUPERSEDES NAVAIR 17-20AF-166 DATED 1 FEBRUARY 2005 DISTRIBUTION STATEMENT C. DISTRIBUTION AUTHORIZED TO U.S. GOVERNMENT AGENCIES AND THEIR CONTRACTORS TO PROTECT PUBLICATIONS REQUIRED FOR FICIAL USE OR FOR ADMINISTRATIVE OR OPERATIONAL PURPOSES ONLY. OTHER REQUESTS FOR THIS DOCUMENT SHALL BE REFERRED TO MEASUREMENT SCIENCE DEPARTMENT, CORONA DIVISION, NAVAL SURFACE WARFARE CENTER, P.O. BOX 5000, CORONA, CA AF-166 DESTRUCTION NOTICE - FOR UNCLASSIFIED, LIMITED DOCUMENTS, DESTROY BY ANY METHOD THAT WILL PREVENT DISCLOSURE CONTENTS OR RECONSTRUCTION THE DOCUMENT. PUBLISHED BY DIRECTION COMMANDER NAVAL AIR SYSTEMS COMMAND 1 SEPTEMBER 2005

2 LIST EFFECTIVE PAGES The purpose of this list is to identify the pages in this document affected by any technical content changes made since the previous release of the document. NOTE: On a revised page, with the exception of the Title, the A, and the i pages, the technical changes are indicated by a vertical line in the outer margin of the page. Page Page Page Page No. Revision* No. Revision* No. Revision* No. Revision* Title to A 0 69 to to to i to to to A-1 to A to to to *Zero in this column indicates an original page. R in this column indicates a revised page. **All pages not listed are blank pages. A

3 TABLE CONTENTS Section Page 1 Introduction and Description Equipment Requirements Preliminary Operations Calibration Process Period and Time Interval Tests Direct Voltage Tests Peak Voltage Tests... 9 Navy Calibration Checklist Appendix A: Representative Test Instruments... A-1 ILLUSTRATIONS Figure Page 1 Frequency Accuracy and Sensitivity Test Configuration Period and Time Interval Test Configuration Time Base Accuracy Test Configuration Direct Voltage Test Configuration... 8 TABLES Table Page 1 Calibration Description Equipment Requirements... 2 i

4 SECTION 1 INTRODUCTION AND DESCRIPTION 1.1 This procedure describes the calibration of Frequency Counters to 18 GHz using the Datum Frequency Standard. The instrument being calibrated is referred to herein as the TI (Test Instrument). 1.2 All comments concerning this procedure should be directed to the Measurement Science Department, Corona Division, Naval Surface Warfare Center, P.O. Box 5000, Corona, CA This procedure includes tests of essential performance parameters only. Any malfunction noticed during calibration, whether specifically tested for or not, should be corrected. 1.4 This procedure tests the TIs time base to the manufacturer s 1 year specification. 1.5 A list of representative frequency counters is given in Appendix A. TI Characteristics Table 1. Calibration Description Performance Specifications Test Method Frequency sensitivity Frequency measurement Period/time interval measurement Time base oscillator accuracy Tolerance: Tested to the specified limits. A power meter is used to ensure the specified power level into the TI input for cases in which the TI is either out-of-tolerance or does not make a measurement Tolerance: Tested to the specified limits. Tested to accuracy specifications for the TI time base based on a 1 year aging rate, temperature, and line voltage variations. Most TI accuracy specifications are time base accuracy ±1 count Tolerance: Tested to specified limits. In many cases, this is a functional check of channel 2 (B channel) to ensure operation of channel 2 for counters that do not have frequency measurement capability on channel 2. The tolerances on the checklist are generally looser than the manufacturer specifications Tested to the TI accuracy specification based on a 1 year oscillator aging rate Tested with a signal source. Tested with a frequency standard and a signal source during the sensitivity test. Tested with a square wave generated by a function generator. Tested with a frequency standard and a frequency counter. DC voltage measurement Tolerance: Tested to the specified limits Tested with a DC source. Peak voltage test Tolerance: Tested to the specified limits Tested with a function generator. 1

5 SECTION 2 EQUIPMENT REQUIREMENTS NOTES Minimum use specifications are the principal parameters required for performance of the calibration, and are included to assist in the selection of alternate equipment, which may be used at the discretion of the using laboratory. Satisfactory performance of alternate items shall be verified prior to use. All applicable equipment must bear evidence of current calibration. The instruments utilized in this procedure were selected from those known to be available at Navy calibration facilities and the listing by make or model number carries no implication of preference, recommendation, or approval for use by other agencies. It is recognized that equivalent equipment produced by other manufacturers may be capable of equally satisfactory performance in this procedure. Item Table 2. Equipment Requirements Minimum Use Specifications Calibration Equipment 2.1 Frequency standard Frequency uncertainty: < ±1 x 10-9 Datum with or without satellite lock 2.2 Signal source Function generator Waveforms: Sine, Square Wave Square wave rise time: <20 nsec Frequency range: 1 Hz to 10 MHz Amplitude uncertainty: ±1% External frequency reference: 10 MHz Square wave asymmetry: <1% at 1 khz Microwave synthesizer Frequency range: 10 MHz to 18 GHz Amplitude uncertainty: ±1 db maximum External frequency reference: 10 MHz 2.3 Frequency counter Frequency range: 1 to 10 MHz External frequency reference: 10 MHz Display: 12 digits Gate time: Selectable from 100 msec to 500 msec Hewlett-Packard 33120AOPT001 Hewlett-Packard 83630AOPT001, 008, H53 Hewlett-Packard 53132AOPT010, Ω feedthrough termination DC resistance: 50 Ω ±1 Ω Tektronix or equivalent 2.5 BNC cable Type RG-58 cable Local supply 2.6 Coaxial cable Frequency range: 10 MHz to 18 GHz Length: 3 ft. maximum Insertion loss: 10 to 500 MHz: 0.05 db 1 to 3 GHz: 0.5 db 4 to 12 GHz: 1.0 db 13 to 18 GHz: 1.2 db Connectors: Type N male to Type N male 2.7 Coaxial adapters Frequency range: 0 to 18 GHz Used to adapt the coaxial cable type N male connectors to the various TI input connectors M/A-COM or equivalent Local supply 2

6 Item Minimum Use Specifications Calibration Equipment 2.8 Coaxial attenuator set Frequency range: 10 Hz to 10 MHz Attenuation: 3 db and 6 db nom Weinschel AS Power meter Frequency range: 10 MHz to 18 GHz Hewlett-Packard 437B 2.10 Power sensor Power sensor #1 Power range: -10 to -25 dbm Hewlett-Packard 8481A Power sensor #2 Power range: -25 to -40 dbm Hewlett-Packard 8481D 2.11 DC source Output: 10 mv to 1000 V Uncertainty: ±0.003% iv ±40 µv Fluke 5700AAN SECTION 3 PRELIMINARY OPERATIONS 3.1 Set all auxiliary equipment controls as necessary to avoid damage to the equipment and so that dangerous voltages will not be present on the output terminals when power switches are turned on. 3.2 Frequency Standard Setup If the frequency standard (item 2.1) is being used in the mode where it is acquiring and using data from GPS satellites, the instrument must be in such a mode for a minimum of 24 hours. Ensure that the frequency standard front panel LOCKED and TRACKING lights are illuminated If the frequency standard (item 2.1) is not locked and tracking satellites, turn the instrument on and ensure it is in Flywheel Mode (FW Mode). This mode uses the internal rubidium frequency oscillator of the frequency standard. The warm-up time is 30 minutes. 3.3 Turn all other power switches on, and allow a sufficient warm-up time for the equipment (refer to the applicable checklist for the TI warm-up time). 3.4 Perform only those tests as indicated on the checklist for the TI. SECTION 4 CALIBRATION PROCESS NOTE Unless otherwise specified, verify the results of each test and take corrective action whenever the test requirement is not met, before proceeding. 4.1 FREQUENCY ACCURACY AND SENSITIVITY TESTS Set all TI channels to DC coupling. If the TI does not have selectable coupling for a channel, disregard this step. 3

7 4.1.2 Set all TI input attenuators, if any, for all TI input channels to the minimum setting. This may be X1 for some counters Place the signal sources in their default state, as applicable. NOTES The function generator, item 2.1, will be used for frequencies from 0 Hz to 10 MHz. The microwave synthesizer, item 2.2.2, will be used for frequencies from 10 MHz to 18.0 GHz. Use the BNC cable with the function generator and use the coaxial cable with the microwave synthesizer. For the Hewlett-Packard 33120A function generator, cycle the power to set it in its default state. For the Hewlett-Packard 83630A microwave synthesizer, press PRESET, to set it in its default state Connect a 10 MHz PUT from the frequency standard to the External Frequency Reference Input of the signal source as shown by the solid line in Figure MHz (Rear) 2.1 FREQUENCY STANDARD NOTE DO NOT CONNECT EQUIPMENT SHOWN BY DASHED LINES UNTIL INSTRUCTED. EXTERNAL FREQUENCY REFERENCE IN (Rear) 2.2 SIGNAL SOURCE PUT ATTEN TERM INPUT TI Figure 1. Frequency Accuracy and Sensitivity Test Configuration NOTE Both the function generator and the microwave synthesizer have 50 Ω outputs. If the TI input channel is 50 Ω, a feedthrough termination should not be used. If the TI input impedance is 1 MΩ, a 50 Ω feedthrough termination is required. If the TI input channel is selectable, then set the input impedance to 50 Ω and do not use a feedthrough termination, unless the TI checklist says otherwise If required, connect a 50 Ω feedthrough termination as shown by the dashed lines in Figure Connect the signal source output to the TI input channel specified on the checklist, using the attenuator and/or the termination if instructed. Set the function generator for sine wave and set the microwave synthesizer for a CW (continuous wave), as applicable If the checklist gives specific TI control settings, set the TI controls as indicated. 4

8 NOTE A power meter is used to verify the power level into the TI for the cases in which the TI does not meet the sensitivity tolerance due to uncertainties associated with the input power level when using the microwave synthesizer. For example, a TI may have a -20 dbm sensitivity specification at 18 GHz. The microwave source is set for -20 dbm, but the source has a power level uncertainty and the microwave cable has insertion loss. Since the actual power level may be less than the value specified for the TI (-20 dbm in this example), a power meter is used to ensure the specified power level into the TI input for cases in which the TI is either out-of-tolerance or does not make a measurement Set the signal source frequency and output level controls for each of the settings indicated in column 2 of the checklist. Refer to the checklist and insert an attenuator by the dashed lines in Figure 1 if required on the TI checklist. At each test point, verify that the TI indication is within the tolerance limits specified on the checklist. If the TI is within tolerance, skip to step ; otherwise, proceed with step Some TIs have an adjustable sensitivity knob that may need to be adjusted to the maximum setting. NOTES It is not necessary that the TI display have exactly the same units or display as the values on the checklist. For example, the checklist may list 9 to 11 Hz for the TI tolerance, but the TI displays khz. The TI is within tolerance. The function generator is used for frequencies from 0 to 10 MHz. The microwave synthesizer is used for frequencies above 10 MHz. Use the appropriate signal source dependent on the test frequency indicated on the checklist Measure the output at the end of the microwave cable, at the TI interface, with the power meter and appropriate power sensor. Adjust the microwave synthesizer power as necessary to obtain the checklist power level specified in step 4.1.8, as measured on the power meter. With the power level now established using the power meter, verify that the TI indication is within the tolerance limits specified on the checklist for step Repeat steps through for each specified TI channel, TI setup instructions, and measurement points indicated on the checklist step If the TI is out-of-tolerance and does not have a time base output, maintenance is required. If the TI is out-of-tolerance and has a time base output, skip to Section 4.3 to test and adjust the TI time base. Return to the beginning of Section 4.1 after the adjustment. 4.2 PERIOD AND TIME INTERVAL TESTS If period and time interval tests are not required per the checklist, skip this section. NOTE The TI input channels may either be Channels A, B, C, etc or Channels 1, 2, 3, etc. The instructions are for Channels A, B, C, etc.; but are meant to be universal for counters with Channels 1, 2, 3, etc Connect a 10 MHz PUT from the frequency standard to the External Frequency Reference Input of the signal source as shown by the solid line in Figure 2. Only use a 50 Ω termination, shown by dashed lines, at the input of the TI if the TI input is high impedance (1 MΩ). 5

9 10 MHz (Rear) 2.1 FREQUENCY STANDARD EXTERNAL FREQUENCY REFERENCE IN (Rear) FUNCTION GENERATOR PUT 2.4 TERM TI INPUT, CH A Figure 2. Period and Time Interval Test Configuration Set the function generator as follows: Frequency: 1 khz Waveform: Square Wave Amplitude: 200 mv rms Connect the function generator output to the TI input channel specified on the checklist, using the termination if instructed Set the TI to measure Period on Channel A. (The TI checklist may instruct to measure the period on a different TI Channel, and may give specific TI control settings.) Verify that the TI indication is within the specified tolerance limits on the checklist. If the checklist does not have any more tests in this section, skip to Section Set the TI to the following settings for a time interval measurement. (The following settings are applicable for most TIs; however, the checklist may have specific instructions for the TI.) TIME INTERVAL MEASUREMENT A to B COMMON A Channel A and B to DC coupling SLOPE for Channel A to Positive (+) SLOPE for Channel B to Negative (-) Ensure that the TI indication is approximately 500 microseconds, and record this value. If the display is fluctuating, choose the lowest number. The sum of this value and the value in step will equal the period (1 msec) of the square wave. 6

10 4.2.9 Set the TI as follows (the following settings are applicable for most TIs; however, the checklist may have specific instructions for the TI): SLOPE for Channel A to Negative (-) SLOPE for Channel B to Positive (+) Ensure that the TI indication is approximately 500 microseconds, and record this value. If the display is fluctuating, choose the highest number. The sum of this value and the value in step will equal the period (1 msec) of the square wave Add the values from steps and and verify that the sum is within the specified tolerance limits. The tolerance on the checklist includes count error and trigger error for the time interval measurements. This is why the tolerance for the period value is different from the tolerance value for the period in step Disconnect all equipment. 4.3 TIME BASE OSCILLATOR ACCURACY TEST If the time base oscillator accuracy test is not shown on the checklist it is not required, skip this section Connect the equipment as shown in Figure MHz (REAR) 2.1 FREQUENCY STANDARD EXTERNAL FREQUENCY REFERENCE IN (REAR) 2.3 FREQUENCY COUNTER CHANNEL 1 FREQUENCY REFERENCE PUT (REAR) TI Figure 3. Time Base Accuracy Test Configuration Set the standard frequency counter as follows: Default state (Hewlett-Packard 53132A counter: Cycle the Power) Frequency Measurement, Channel 1 (Hewlett-Packard 53132A: already selected in default state) Select 50 Ω for Channel 1 7

11 Select external reference (Hewlett-Packard 53132A: automatically senses and uses an external reference) Gate Time 0.5 seconds (Hewlett-Packard counter: Press GATE&EXTARM, press GATE&EXTARM again when GATE:TIME is displayed, use UP ARROW to increase gate time to.500 seconds, press ENTER, press RUN.) Verify that the standard frequency counter indication is within the TI checklist tolerance values If the TI meets the requirement of step 4.3.4, skip to step Using an insulated tool, adjust the oscillator to the value on the TI checklist, if possible. The gate time of the standard frequency counter may be increased for added resolution, if necessary Allow 24 hours for the oscillator to stabilize. Repeat steps through until the oscillator is within the checklist tolerance If any adjustments are performed, repeat Section 4.1. Repeat Section 4.2 if required, per the checklist and then continue to Section Disconnect all equipment. 4.4 DIRECT VOLTAGE TESTS WARNING VOLTAGES HAZARDOUS TO LIFE MAY BE PRESENT. USE EXTREME CAUTION. NOTES Manually set the TI to the required voltage ranges to hold the measurement in the specified range. When measurements must be performed in the TI auto mode because the TI is not equipped with a manual range selector, the calibration test measurement values have been chosen to avoid any measurement problem which may arise as a result of the TI automatic down-ranging and up-ranging characteristics. Use only the function and ranges that are applicable to the TI being calibrated If the direct voltage test is not required per the checklist or the instrument does not have a DC voltage measurement capability, skip this section Connect the equipment as shown in Figure 4, observing proper polarity DC SOURCE TI Figure 4. Direct Voltage Test Configuration 8

12 4.4.3 Set the TI controls to measure direct voltage, positive polarity, on the range indicated on the checklist Set the dc source controls for each of the nominal values listed on the checklist and verify that the TI indication is within the tolerance limits listed Set the dc source controls for minimum output Reverse the input leads to the TI for negative polarity Set the dc source output controls to indicate the absolute value of the nominal voltage listed for the negative polarity test. Verify that the TI indication is within the tolerance limits. (The TI indication will be a negative value only for TIs having an autopolarity capability.) Set the dc source output controls for minimum output (standby) and reverse the input leads to the TI for positive polarity Set the dc source controls to each calibration point indicated for each TI range listed on the checklist. At each setting, verify that the indication is within the tolerances listed Unless other measurements are to be performed, set all power switches to off and disconnect the equipment. 4.5 PEAK VOLTAGE TESTS If the peak voltage test is not required per the checklist or the instrument does not have a peak voltage measurement capability, skip to step Connect the function generator output to the TI input channel specified on the TI checklist. NOTE The function generator has a 50 Ω output impedance. If the TI input channel is 50 Ω, a feedthrough termination should not be used. If the TI input impedance is 1 MΩ, a 50 Ω feedthrough termination is required. If the TI input channel is selectable, then set the input impedance to 50 Ω and do not use a feedthrough termination, unless the TI checklist says otherwise Set the function generator for a sine wave output Set the TI to measure peak voltage. (The TI checklist may give specific TI control settings.) Set the function generator frequency and output level controls for each of the settings indicated in column 2 of the checklist. At each test point, verify that the TI indication is within the tolerance limits specified on the checklist Repeat steps and for each specified TI channel, TI setup instructions, and measurement points indicated on the checklist step Unless other measurements are to be performed, turn all power switches to off or standby, and disconnect the equipment from the TI. (10 blank) 9

13 TEST INST (S) AN/USM-207A or AN/USM-207B Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) FREQ A INPUT -- ck ( ) NA -- (use 50 Ω term) GATE TIME 1 SEC -- ck ( ) NA mv rms 10 Hz 9 to 11 Hz mv rms 10 khz to khz mv rms 100 khz to khz mv rms 1 MHz to 1, khz mv rms 10 MHz to MHz s Time Base 10 MHz 9,999,994 to10,000,006 MHz Time Base Adjustment 10 MHz 9,999, to10,000, Hz (12 blank) 11

14 TEST INST (S) Anadex CF500R and CF501R Counter/Timers PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour INPUT (use 50 Ω term) -- ck ( ) NA SECONDS -- ck ( ) NA -- DISPLAY TIME MAX -- ck ( ) NA -- RESET -- ck ( ) NA mv rms with 6 db attenuator 20 Hz 19 to 21 Hz RESET -- ck ( ) NA mv rms with 6 db attenuator 10 khz 9,998 to 10,002 Hz RESET -- ck ( ) NA mv rms with 6 db attenuator 200 khz to khz Time Base 100 khz 99,989 to 100,011 Hz Time Base Adjustment 100 khz 99, to 100, Hz (14 blank) 13

15 TEST INST (S): Anadex CF601R Counter/Timers PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES Unmarked rear panel input (use 50 Ω term) -- ck ( ) NA SECONDS X1 -- ck ( ) NA -- DISPLAY TIME MAX -- ck ( ) NA -- INPUT MULTIPLIER X1 -- ck ( ) NA -- Rear Panel RATE & EXT Switch F -- ck ( ) NA -- Rear Panel MEMORY Switch Off -- ck ( ) NA -- RESET -- ck ( ) NA mv rms with 6 db attenuator 20 Hz 19 to 21 Hz RESET -- ck ( ) NA mv rms with 6 db attenuator 10 khz 9,998.0 to 10,002.0 Hz RESET -- ck ( ) NA mv with 6 db attenuator 200 khz 199,979.0 to 200,021.0 Hz (16 blank) 15

16 TEST INST (S) Anadex CF QA2 Time Base Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour INPUT 1 (rear panel BNC) -- ck ( ) NA SECONDS INPUT 1A -- ck ( ) NA SECONDS INPUT 1B -- ck ( ) NA SECONDS INPUT 2A -- ck ( ) NA SECONDS INPUT 2B -- ck ( ) NA -- MULT 1A: 1 -- ck ( ) NA -- MULT 1B: 1 -- ck ( ) NA -- DISPLAY TIME MAX -- ck ( ) NA -- INPUT 1A -- ck ( ) NA -- RESET -- ck ( ) NA mv rms with 6 db attenuator 20 Hz 19 to 21 Hz mv rms with 6 db attenuator 10 khz 9,998.0 to 10,002.0 Hz mv rms with 6 db attenuator 200 khz 199,989.0 to 200,011.0 Hz INPUT 1B -- ck ( ) NA mv rms with 6 db attenuator 200 khz 199,989.0 to 200,011.0 Hz INPUT 2 (rear panel BNC) -- ck ( ) NA -- INPUT 2A -- ck ( ) NA -- RESET -- ck ( ) NA mv rms with 6 db attenuator 20 Hz 19 to 21 Hz mv rms with 6 db attenuator 10 khz 9,998.0 to 10,002.0 Hz mv rms with 6 db attenuator 200 khz 199,989.0 to 200,011.0 Hz Page 1 of 2 17

17 TEST INST (S) Anadex CF QA2 Time Base Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) INPUT 2B -- ck ( ) NA mv rms with 6 db attenuator 200 khz 199,989.0 to 200,011.0 Hz Page 2 of 2 18

18 TEST INST (S) Tektronix DC501 Electronic Counter P/I With or Without OPT02 PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour INPUT (use 50 Ω term) -- ck ( ) NA DISPLAY TIME 1 SEC -- ck ( ) NA mv rms 20 Hz to khz mv rms 1 MHz to 1, khz dbm 100 MHz to MHz Time Base 1 MHz 999,879 to 1,000,121 Hz Time Base Adjustment 1 MHz 999, to 1,000, Hz (20 blank) 19

19 TEST INST (S) Tektronix DC501OPT01 Digital Counter P/I With or Without OPT02 (OPT01: 1 x 10-7 /month time base) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour INPUT (use 50 Ω term) -- ck ( ) NA DISPLAY TIME 1 SEC -- ck ( ) NA mv rms 20 Hz to khz mv rms 1 MHz to 1, khz dbm 100 MHz to MHz Time Base 1 MHz 999,999 to 1,000,001 Hz Time Base Adjustment 1 MHz 999, to 1,000, Hz (22 blank) 21

20 TEST INST (S) Tektronix DC5010 Prog Universal Counter/Timer and DC510 Counter P/I PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CH A (no 50 Ω term) -- ck ( ) NA TERM 50 Ω -- ck ( ) NA -- FREQ A -- ck ( ) NA mv rms 9.9 to 10.1 Hz 1 25 mv rms 1 MHz khz to 1.000,006 MHz dbm 300 MHz ,499 to ,501 MHz 4.2 Period and Time Interval Tests Channel A -- ck ( ) NA PER A -- ck ( ) NA Period A 1,000 µsec µsec to msec Do not select TIME A to B -- ck ( ) NA -- Do not select COMMON A -- ck ( ) NA -- CH B slope doesn t matter -- ck ( ) NA -- Set WIDTH A -- ck ( ) NA Width CH A (Slope: +, -) -- ck ( ) NA Record Width CH A (Slope: -, +) -- ck ( ) NA Record Sum of and ,000 µsec to 1,001.0 µsec (24 blank) 23

21 TEST INST (S) Tektronix DC503 Counter/Timer P/I PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CH A (use 50 Ω term) -- ck ( ) NA FREQ A GATE TIME 1s -- ck ( ) NA mv rms 10 Hz 9.9 to 10.1 Hz mv rms 1 MHz khz to 1.000,011 MHz dbm 100 MHz to MHz 4.2 Period and Time Interval Tests CHANNEL B -- ck ( ) NA PER B -- ck ( ) NA -- 1 µsec clock rate -- ck ( ) NA Period B 1,000 µsec 998 to 1,002 µsec (26 blank) 25

22 TEST INST (S) Tektronix DC503OPT01 Electronic Counter P/I (OPT01: Time base temperature stability: ±5 x 10-7 /month) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CH A (use 50 Ω term) -- ck ( ) NA FREQ A GATE TIME 1s -- ck ( ) NA mv rms 10 Hz 9.9 to 10.1 Hz mv rms 1 MHz khz to 1, MHz dbm 100 MHz to MHz 4.2 Period and Time Interval Tests Period Channel B -- ck ( ) NA PERIOD B -- ck ( ) NA -- 1 µsec clock rate -- ck ( ) NA Period B 1,000 µsec 998 to 1,002 µsec (28 blank) 27

23 TEST INST (S) Tektronix DC503A Counter/Timer P/I PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CH A (use 50 Ω term) -- ck ( ) NA mv rms 10 Hz 9.9 to 10.1 Hz 1 20 mv rms 1 MHz khz to 1.000,002 MHz dbm 125 MHz to MHz 4.2 Period and Time Interval Tests CHANNEL B -- ck ( ) NA PER B -- ck ( ) NA -- 1 µsec CLOCK RATE -- ck ( ) NA Period B 1,000 µsec 998 to 1,002 µsec (30 blank) 29

24 TEST INST (S) Tektronix DC504 and DC504OPT01 Counter/Timer P/I (OPT01: 1 x 10-7 /month time base) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour (DC504) INPUT (use 50 Ω term) -- ck ( ) NA DISPLAY TIME 1 SEC -- ck ( ) NA mv rms 20 Hz to khz mv rms 10 MHz to MHz dbm 50 MHz to MHz (DC504OPT01) INPUT (use 50 Ω term) -- ck ( ) NA DISPLAY TIME 1 SEC -- ck ( ) NA mv rms 20 Hz to khz mv rms 10 MHz to MHz dbm 50 MHz to MHz (32 blank) 31

25 TEST INST (S) Tektronix DC504A Counter/Timer P/I PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour MΩ INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ to 10 MHz -- ck ( ) NA -- TIME/AVGS AUTO -- ck ( ) NA mv rms 20 Hz to khz 1 30 mv rms 1 MHz to khz mv rms 10 MHz to khz FUNCTION FREQ to 100 MHz -- ck ( ) NA dbm 10 MHz 9, to 10,000.1 khz dbm 100 MHz 99,999 to 100,001 khz Time Base 10 MHz 9,999,990 to 10,000,010 Hz Time Base Adjustment 10 MHz 9,999,999.5 to 10,000,000.5 Hz (only if necessary) (34 blank) 33

26 TEST INST (S) Tektronix DC505A and DC505AOPT01 Electronic Counters P/I (OPT01: 1 x 10-7 /month time base) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CH A (use 50 Ω term) -- ck ( ) NA CH A (for DC505A) -- ck ( ) NA -- FREQ A -- ck ( ) NA mv rms 10 Hz 9.9 to 10.1 Hz 1 50 mv rms 1 MHz to 1, khz dbm 250 MHz to MHz CH A (for DC505AOPT01) -- ck ( ) NA FREQ A -- ck ( ) NA mv rms 10 Hz 9.9 to 10.1 Hz 1 50 mv rms 1 MHz to 1, khz dbm 250 MHz to MHz (36 blank) 35

27 TEST INST (S) Tektronix DC508A Counter/Timer PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour DIRECT INPUT (no 50 Ω term) -- ck ( ) NA Ω -- ck ( ) NA -- RESOLUTION 1 Hz -- ck ( ) NA mv rms 10 Hz 9 to 11 Hz dbm 50 MHz ,949 to ,051 MHz dbm 100 MHz ,899 to ,101 MHz PRESCALE INPUT (no 50 Ω term) -- ck ( ) NA -- DISPLAY TIME 1 Hz -- ck ( ) NA dbm 100 MHz ,899 to ,101 MHz dbm 500 MHz ,499 to ,501 MHz DISPLAY TIME 10 Hz dbm 1.3 GHz ,69 to ,31 MHz (38 blank) 37

28 TEST INST (S) Tektronix DC509 and DC509OPT01 Counter/Timers P/I PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CHANNEL A (50 Ω term) -- ck ( ) NA FREQUENCY A -- ck ( ) NA -- AVERAGES AUTO -- ck ( ) NA -- All Pushbuttons Out -- ck ( ) NA -- AUTO LEVEL -- ck ( ) NA mv rms 10 Hz 9.9 to 10.1 Hz 1 20 mv rms 1 MHz ,0 khz to 1.000,002,0 MHz dbm 135 MHz ,86 to ,15 MHz 4.2 Period and Time Interval Tests Channel A -- ck ( ) NA Channel A, Level: AUTO -- ck ( ) NA -- Channel B, Level: AUTO -- ck ( ) NA -- AVERAGES ck ( ) NA Period A 1,000 µsec µsec to msec Do not select TIME A to B -- ck ( ) NA -- Do not select COMMON A -- ck ( ) NA -- CH B slope doesn t matter -- ck ( ) NA -- Set WIDTH A -- ck ( ) NA Width Channel A (slope: +,-) -- NA Record Width Channel A (slope: -,+) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec (40 blank) 39

29 TEST INST (S) Philips PM6670 and PM6671 Counter/Timer PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 15 minutes A INPUT (use 50 Ω term) -- ck ( ) NA FREQ A -- ck ( ) NA -- MEASURING TIME 1s -- ck ( ) NA mv rms with 6 db attenuator 10 Hz 9.9 to 10.1 Hz dbm 60 MHz ,63 to ,37 MHz dbm 120 MHz ,2 to ,8 MHz 4.2 Period and Time Interval Tests PERIOD A -- ck ( ) NA Period A 1,000 µsec to 1,000.1 µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Hz Time Base 10 MHz 9,999,940 to 10,000, Time Base Adjustment 10 MHz 9,999, to 10,000, (42 blank) 41

30 TEST INST (S) Philips PM6672 Counter/Timer PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time A INPUT (use 50 Ω term) -- ck ( ) NA FREQ A or C -- ck ( ) NA -- MEASURING TIME 1s -- ck ( ) NA mv rms with 6 db attenuator 10 Hz 9.9 to 10.1 Hz dbm 60 MHz ,63 to ,37 Hz dbm 120 MHz ,2 to ,8 MHz C INPUT (no 50 Ω term) -- ck ( ) NA MHz dbm 70 MHz ,57 to , dbm 500 MHz to dbm 1 GHz to 1.000,007 MHz GHz 4.2 Period and Time Interval Tests PERIOD A -- ck ( ) NA Period A 1,000 µsec to 1,000.1 µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Hz Time Base 10 MHz 9,999,940 to 10,000, Time Base Adjustment 10 MHz 9,999, to 10,000, (44 blank) 43

31 TEST INST (S) Philips PM6680 Electronic Counter With or Without OPTPM9621 (OPTPM9621: 1.3 GHz Input C PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (no 50 Ω term) -- ck ( ) NA INPUT 50 Ω -- ck ( ) NA MEASURING TIME 1 s -- ck ( ) NA mv 10 Hz 9.9 to 10.1 Hz dbm 50 MHz MHz ,750 to , dbm 110 MHz ,450 to , dbm 220 MHz ,900 to , B INPUT (no 50 Ω term) -- ck ( ) NA -- Set to measure FREQ B -- ck ( ) NA mv 10 Hz 9.9 to 10.1 Hz dbm 50 MHz MHz ,750 to , dbm 160 MHz ,200 to ,800 C INPUT (OPTPM9621 only) -- ck ( ) NA Set to measure FREQ C -- ck ( ) NA MHz 70 dbm 70 MHz ,650 to , dbm 500 MHz ,500 to ,500 GHz 1.3 dbm 1.3 GHz ,499 to ,501 Page 1 of 2 45

32 TEST INST (S) Philips PM6680 Electronic Counter With or Without OPTPM9621 (OPTPM9621: 1.3 GHz Input C) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 4.2 Period and Time Interval Tests PERIOD A -- ck ( ) NA Period A 1,000 µsec to1,000.1 µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Time Base 10 MHz 9,999,950 to 10,000,050 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Page 2 of 2 46

33 TEST INST (S) Philips PM6680B Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (no 50 Ω term) -- ck ( ) NA INPUT 50 Ω -- ck ( ) NA -- MEASURING TIME 1 s -- ck ( ) NA mv 10 Hz 9.9 to 10.1 Hz dbm 50 MHz ,750 to , dbm 110 MHz ,450 to , dbm 220 MHz ,900 to , B INPUT (no 50 Ω term) -- ck ( ) NA -- Set to measure FREQ B -- ck ( ) NA mv 10 Hz 9.9 to 10.1 Hz dbm 50 MHz ,750 to , dbm 110 MHz ,450 to , dbm 220 MHz ,900 to ,100 MHz MHz 4.2 Period and Time Interval Tests PERIOD A -- ck ( ) NA Period A 1,000 µsec to 1,000.1 µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Hz Time Base 10 MHz 9,999,950 to 10,000, Time Base Adjustment 10 MHz 9,999, to 10,000, (48 blank) 47

34 TEST INST (S) Monsanto 100A Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 72 hours A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ -- ck ( ) NA -- TIME 1 SEC -- ck ( ) NA mv rms 10 Hz 9 to 11 Hz TIME 1 msec -- ck ( ) NA mv rms 5 MHz 4,998 to 5,002 khz mv rms 10 MHz 9,997 to 10,003 khz (50 blank) 49

35 TEST INST (S) Monsanto 100B Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ -- ck ( ) NA -- TIME 1 SEC -- ck ( ) NA mv rms 10 Hz 9 to 11 Hz TIME 1 msec -- ck ( ) NA mv rms 1 MHz to 1,000.1 khz dbm 40 MHz 39,998 to 40,002 khz (52 blank) 51

36 TEST INST (S) Fluke 1900A Multifunction Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ -- ck ( ) NA -- RESOLUTION AUTO -- ck ( ) NA mv rms 10 Hz 9 to 11 Hz mv rms 10 MHz to MHz dbm 80 MHz to MHz (54 blank) 53

37 TEST INST (S) Fluke 1910A Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ -- ck ( ) NA -- Rear panel CLOCK to INT -- ck ( ) NA -- TRIGGER LEVEL PRESET -- ck ( ) NA -- RESOLUTION AUTO -- ck ( ) NA mv rms 10 Hz to khz 1 15 mv rms 1 khz to khz mv rms 10 MHz 9, to 10, khz dbm 100 MHz to MHz dbm 125 MHz to MHz RESOLUTION 1 Hz -- ck ( ) NA dbm 10 MHz to khz OVERFLOW Period and Time Interval Tests A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION PER -- ck ( ) NA -- RESOLUTION AUTO Period 1,000 µsec to 1, µsec 1 If TI is out-of-tolerance, adjust the TI rear panel CLOCK ADJ for as close to a khz OVERFLOW indication as possible. (56 blank) 55

38 TEST INST (S) Fluke 1911A Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ -- ck ( ) NA -- Rear panel CLOCK to INT -- ck ( ) NA -- TRIGGER LEVEL PRESET -- ck ( ) NA -- RESOLUTION AUTO -- ck ( ) NA mv rms 10 Hz to khz 1 18 mv rms 1 khz to mv rms 10 MHz 9, to 10, dbm 100 MHz to MHz dbm 125 MHz to RESOLUTION 1 Hz -- ck ( ) NA dbm 10 MHz to khz OVERFLOW 1 B INPUT (no 50 Ω term) -- ck ( ) NA dbm 50 MHz to MHz 170 dbm 170 MHz to dbm 180 MHz to dbm 250 MHz to Period and Time Interval Tests A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION PER -- ck ( ) NA -- RESOLUTION AUTO -- ck ( ) NA Period 1,000 µsec to 1, µsec 1 If TI is out-of-tolerance, adjust the TI rear panel CLOCK ADJ for as close to a khz OVERFLOW indication as possible. (58 blank) 57

39 TEST INST (S) Fluke 1912A Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION FREQ -- ck ( ) NA -- Rear panel CLOCK to INT -- ck ( ) NA -- TRIGGER LEVEL PRESET -- ck ( ) NA -- RESOLUTION AUTO -- ck ( ) NA mv rms 10 Hz to khz 1 15 mv rms 1 khz to mv rms 10 MHz 9, to 10, dbm 100 MHz to MHz dbm 125 MHz to RESOLUTION 1 Hz -- ck ( ) NA dbm 10 MHz to khz OVERFLOW 1 B INPUT (no 50 Ω term) -- ck ( ) NA dbm 50 MHz to MHz dbm 170 MHz to dbm 180 MHz to dbm 520 MHz to Period and Time Interval Tests A INPUT (use 50 Ω term) -- ck ( ) NA FUNCTION PER -- ck ( ) NA -- RESOLUTION AUTO -- ck ( ) NA Period 1,000 µsec to 1, µsec 1 If TI is out-of-tolerance, adjust the TI rear panel CLOCK ADJ for as close to a khz OVERFLOW indication as possible. (60 blank) 59

40 TEST INST (S) Fluke 1920A Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour INPUT 5 Hz to 125 MHz (use 50 Ω term) -- ck ( ) NA FREQ 5 Hz to 125 MHz -- ck ( ) NA -- RESOLUTION 1 Hz -- ck ( ) NA mv rms 10 Hz to khz 1 15 mv rms 1 khz to khz mv rms 10 MHz 9.999,989 to ,011 MHz dbm 125 MHz ,874 to ,126 MHz FREQ 50 MHz to 520 MHz (no 50 Ω term) -- ck ( ) NA dbm 50 MHz ,949 to ,051 MHz dbm 260 MHz ,739 to ,261 MHz dbm 520 MHz ,479 to ,521 MHz Time Base 10 MHz 9,999,990 to 10,000,010 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (62 blank) 61

41 TEST INST (S) Fluke 1952A Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time NA 1 hour CH A (use 50 Ω term) -- ck ( ) NA MODE CONT -- ck ( ) NA -- RANGE GATE 1.0 S -- ck ( ) NA -- FUNCTION FREQ A -- ck ( ) NA -- TRIGGER LEVEL -- ck ( ) NA -- CH A PRESET -- ck ( ) NA mv rms 10 Hz to khz mv rms 100 khz to khz dbm 50 MHz 49, to 50, khz dbm 80 MHz 79,998,559 to 80,001,441 MHz 4.2 Period and Time Interval Tests CH A (use 50 Ω term) -- ck ( ) NA FUNCTION PERIOD A -- ck ( ) NA -- RANGE PERIOD AVGD ck ( ) NA Period A 1,000 msec to msec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 msec to msec Time Base 10 MHz 9,999,820 to 10,000,180 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (64 blank) 63

42 TEST INST (S) Fluke 1952B Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) CH A (use 50 Ω term) -- ck ( ) NA MODE CONT -- ck ( ) NA -- RANGE GATE 1.0 S -- ck ( ) NA -- FUNCTION FREQ A -- ck ( ) NA -- TRIGGER LEVEL CH A PRESET -- ck ( ) NA mv rms 10 Hz to khz mv rms 100 khz to khz dbm 50 MHz 49, to 50, khz dbm 80 MHz 79, to 80, khz 4.2 Period and Time Interval Tests CH A (use 50 Ω term) -- ck ( ) NA FUNCTION PERIOD A -- ck ( ) NA -- RANGE PERIOD ck ( ) NA Period A msec to msec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and msec to msec Time Base 10 MHz 9,999,940 to 10,000,060 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (66 blank) 65

43 TEST INST (S) Fluke 1953A Universal Counter/Timer With or Without OPT05 and OPT07 (OPT05: Time Base Multiplier) (OPT07: 520 MHz Channel C Input) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) CH A INPUT (50 Ω term) -- ck ( ) NA MODE CONT -- ck ( ) NA -- RANGE GATE 1.0 S -- ck ( ) NA -- FUNCTION FREQ A -- ck ( ) NA -- TRIGGER LEVEL CH A PRESET -- ck ( ) NA mv rms 10 Hz to khz mv rms 100 khz to khz dbm 70 MHz 69, to 70, khz dbm 125 MHz 124, to 125, khz OPT07 Channel C only CH C (no 50 Ω term) -- ck ( ) NA -- FUNCTION FREQ C -- ck ( ) NA dbm 50 MHz 49,999,949 to 50,000,051 MHz dbm 250 MHz 249,999,749 to 250,000,251 MHz dbm 520 MHz 519,999,479 to 520,000,521 MHz 4.2 Period and Time Interval Tests CH A (use 50 Ω term) -- ck ( ) NA FUNCTION PERIOD A -- ck ( ) NA -- RANGE PER AVGD ck ( ) NA Period A msec to msec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and msec to msec 9,999,990 to 10,000,010 Hz Time Base 10 MHz 9,999, to Time Base Adjustment 10 MHz 10,000, (only if step fails) (68 blank) 67

44 TEST INST (S) Fluke 1953AOPT20 Counter/Timer With or Without OPT05 and OPT07 (OPT05: Time Base Multiplier) (OPT07: 520 MHz Channel C) (OPT20: ±1.5 x 10-8 /month time base) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) CH A (use 50 Ω term) -- ck ( ) NA MODE CONT -- ck ( ) NA -- RANGE GATE 1.0 S -- ck ( ) NA -- FUNCTION FREQ A -- ck ( ) NA -- TRIGGER LEVEL CH A PRESET -- ck ( ) NA mv rms 10 Hz to khz mv rms 100 khz to khz dbm 70 MHz 69, to 70, khz dbm 125 MHz 124, to 125, khz OPT07 CHANNEL C only CH C (no 50 Ω term) -- ck ( ) NA -- FUNCTION FREQ C -- ck ( ) NA dbm 50 MHz 49,999,990 to 50,000,010 MHz dbm 250 MHz 249,999,954 to 250,000,046 MHz dbm 520 MHz 519,999,905 to 520,000,095 MHz 4.2 Period and Time Interval Tests CH A (use 50 Ω term) -- ck ( ) NA FUNCTION PERIOD A -- ck ( ) NA -- RANGE PER AVGD ck ( ) NA Period A µsec to msec Time Interval A to B (+, -) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and µsec to msec Page 1 of 2 69

45 TEST INST (S) Fluke 1953AOPT20 Counter/Timer With or Without OPT05 and OPT07 (OPT05: Time Base Multiplier) (OPT07: 520 MHz Channel C) (OPT20: ±1.5 x 10-8 /month time base) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) Time Base 10 MHz 9,999,997 to 10,000,003 Hz Time Base Adjustment 9,999, to 10,000, H Page 2 of 2 70

46 TEST INST (S) Racal-Dana 1991 Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time -- ck ( ) NA 72 hours A INPUT (no 50 Ω term) -- ck ( ) NA FREQ A -- ck ( ) NA mv rms 10 Hz 9.90 to Hz dbm 80 MHz ,199 to ,801 MHz dbm 160 MHz ,39 to ,61 MHz 4.2 Period and Time Interval Tests A INPUT (no 50 Ω term) -- ck ( ) NA Period A 1,000 µsec to 1, µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Time Base 10 MHz 9,999,899 to 10,000,101 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (72 blank) 71

47 TEST INST (S) Racal-Dana 1992 Electronic Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time -- ck ( ) NA 72 hours A INPUT (no 50 Ω term) -- ck ( ) NA FREQ A -- ck ( ) NA mv rms 10 Hz 9.90 to Hz dbm 80 MHz ,199 to ,801 MHz dbm 160 MHz ,39 to ,61 MHz C INPUT (no 50 Ω term) -- ck ( ) NA -- FREQ C -- ck ( ) NA dbm 40 MHz ,599 to ,401 MHz dbm 600 MHz ,99 to ,01 MHz dbm 1.3 GHz ,99 to ,01 MHz 4.2 Period and Time Interval Tests PERIOD A -- ck ( ) NA Period A 1,000 µsec to 1, µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Time Base 10 MHz 9,999,899 to 10,000,101 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (74 blank) 73

48 TEST INST (S) Racal-Dana 1992OPT04E Universal Counter With or Without OPT55, ETI (OPT04E: Oven Oscillator, <5 x /day) (OPT55: GPIB Interface) PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time -- ck ( ) NA 72 hours A INPUT (no 50 Ω term) -- ck ( ) NA FREQ A -- ck ( ) NA mv rms 10 Hz 9.90 to Hz dbm 80 MHz ,985 to ,015 MHz dbm 160 MHz ,96 to ,04 MHz C INPUT (no 50 Ω term) -- ck ( ) NA -- FREQ C -- ck ( ) NA -- MHz dbm 40 MHz ,992 to , dbm 600 MHz ,88 to , dbm 1.3 GHz 1, ,76 to 1, , Period and Time Interval Tests A INPUT (no 50 Ω term) -- ck ( ) NA Period A 1,000 µsec to 1, µsec Time Interval A to B (+,-) -- NA Record Time Interval A to B (-, +) -- NA Record Sum of and ,000 µsec to 1,001.0 µsec Time Base 10 MHz 9,999,997 to 10,000,003 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (76 blank) 75

49 TEST INST (S) Racal-Dana 1994 Universal Counter PROC. NA 17-20AF-166 MFR MODEL SER. CALIBRATION ERANCES (5) 3.3 Warm-up Time -- ck ( ) NA 72 hours A INPUT (select 50 Ω, no term required) -- ck ( ) NA mv rms 10 Hz 9.90 to Hz dbm 80 MHz ,039 to ,961 MHz dbm 160 MHz ,079 to ,921 MHz B INPUT (select 50 Ω, no term required) -- ck ( ) NA dbm 10 MHz 9.90 to Hz dbm 50 MHz ,399 to ,601 MHz dbm 100 MHz ,799 to ,201 MHz 4.2 Period and Time Interval Tests A INPUT (no 50 Ω term) -- ck ( ) NA Period A 1,000 µsec to 1, µsec Time Interval A to B (+,-) 500 µsec to µsec Time Interval A to B (-, +) 500 µsec to µsec Sum of and ,000 µsec to 1,001.0 µsec Time Base 10 MHz 9,999,879 to 10,000,121 Hz Time Base Adjustment 10 MHz 9,999, to 10,000, Hz (78 blank) 77