Testing Digital Systems II
|
|
|
- Melvin Wade
- 5 years ago
- Views:
Transcription
1 Testing Digital Systems II Lecture 5: Built-in Self Test (I) Instructor: M. Tahoori Copyright 2010, M. Tahoori TDS II: Lecture 5 1 Outline Introduction (Lecture 5) Test Pattern Generation (Lecture 5) Pseudo-Random Pseudo-Exhaustive Output Response Analysis (Lecture 6) Duplication Response Compaction Signature Analysis BIST Architectures (Lecture 7) Copyright 2010, M. Tahoori TDS II: Lecture 5 2 Lecture 5 1
2 Built-In Self Test Definition: Capability of a Product chip, multichip assembly, or system To carry out an explicit test of itself Requires Test Pattern Generation Output Response Analysis One or both integral to the product Minimal external test equipment required Copyright 2010, M. Tahoori TDS II: Lecture 5 3 A Typical Logic BIST System Test Pattern Generator (TPG) Logic BIST Controller Circuit Under Test (CUT) Output Response Analyzer (ORA) Structural off-line BIST Copyright 2010, M. Tahoori TDS II: Lecture 5 4 Lecture 5 2
3 Built-In Self Test Why BIST (Built-In Self Test)? Improved product quality Faster debug Better diagnosis Thorough test very many high-speed patterns Economical production test Improved field test and maintainability What are its drawbacks? Initial design investment Possible performance or area overhead Copyright 2010, M. Tahoori TDS II: Lecture 5 5 BIST Techniques Enhanced functional self-test software routines Exhaustive and pseudo-exhaustive Pseudo-random (PR-BIST) Copyright 2010, M. Tahoori TDS II: Lecture 5 6 Lecture 5 3
4 BIST Techniques Enhanced functional self-test software routines For field test and diagnosis Advantage: No hardware modifications Disadvantages: Low hardware fault coverage Low diagnostic resolution Slow to operate Labor intensive, low fault coverage Exhaustive and pseudo-exhaustive + Thorough test of stuck faults + Minimal simulation required - Difficult to implement for arbitrary designs Copyright 2010, M. Tahoori TDS II: Lecture 5 7 BIST Techniques Pseudo-Random (PR-BIST) Separate (Serial Scan-Loaded Test Patterns) External Pattern Generation, Response Analysis Embedded PR-BIST (System Bistables Reconfigured) BILBO - Multiple Test Configurations Circular Copyright 2010, M. Tahoori TDS II: Lecture 5 8 Lecture 5 4
5 BIST Attributes: Fault Characteristics Fault classes tested Single-stuck faults in functional circuitry Combinational faults in functional circuitry Delay faults Interchip wiring and chip I/O connections Fault coverage Percentage of faults guaranteed to be detected Copyright 2010, M. Tahoori TDS II: Lecture 5 9 BIST Attributes: Cost Characteristics Area overhead Additional active area, interconnect area Test controller Hardware pattern generator Hardware response compacter Testing of BIST hardware Pin overhead: Additional pins required for testing Performance penalty: Added path delays Yield loss: Due to increased area Reliability reduction: Due to increased area Copyright 2010, M. Tahoori TDS II: Lecture 5 10 Lecture 5 5
6 BIST Attributes: Other Characteristics Generality Degree of function dependence Time required to execute test Diagnostic resolution Engineering changes Effect on BIST structure Functional circuitry Scan path? Design changes? Copyright 2010, M. Tahoori TDS II: Lecture 5 11 BIST Attributes: Other Characteristics Test Pattern Generation Exhaustive Pseudo-Exhaustive Pseudo-Random Response Analysis LFSR Duplication Copyright 2010, M. Tahoori TDS II: Lecture 5 12 Lecture 5 6
7 Exhaustive and Pseudo-Exhaustive Test Exhaustive Test of n-input Combinational Circuit Apply all N = 2 n Patterns Pseudo-Exhaustive Test of Combinational Circuit Subdivide the Circuit into Segments Apply all Possible Inputs to each Segment Input patterns 2 m m-bit patterns binary counter Gray counter m-stage Modified ALFSR Copyright 2010, M. Tahoori TDS II: Lecture 5 13 Test Patterns Stored Off Line Patterns are generated and stored Simulation used to identify patterns for removal "Just-in-Time" Patterns are generated during test application External tester generates patterns Patterns generated on same chip or board as device under test +Easy to Generate +Detect Non- single-stuck faults -Long Coverage Expensive to Determine Copyright 2010, M. Tahoori TDS II: Lecture 5 14 Lecture 5 7
8 Random vs Pseudorandom Random Source Patterns can occur more than once Non-reproducible Pseudorandom Source All (possibly except all-0 pattern) Patterns Occur Before Any Pattern Repeats Reproducible Copyright 2010, M. Tahoori TDS II: Lecture 5 15 Test Pattern Generator Copyright 2010, M. Tahoori TDS II: Lecture 5 16 Lecture 5 8
9 Pseudo-Random Test Pattern Generator Four-stage ALFSR Standard or External Form Autonomous Linear Feedback Shift Register Output Sequence: a(t + 4) = a(t + 3) a(t) Generating Function: f(x) = x 4 + x Feedback Vector: H = <h 4, h 3,...,h 0 > = <1,1,0,0,1> Copyright 2010, M. Tahoori TDS II: Lecture 5 17 Pseudo-Random Test Pattern Generator Operator Notation X i a(t) = a(t+i) ( X 3 + X + 1 ) a(t) = a(t+3) + a(t+1) + a(t) Copyright 2010, M. Tahoori TDS II: Lecture 5 18 Lecture 5 9
10 Standard Form ALFSR a( t + N ) = N 1 i= 0 h a( t + i) Output Sequence: Modulo 2 f ( N x ) = i= 0 Generating Function: Modulo 2 Copyright 2010, M. Tahoori TDS II: Lecture 5 19 i h i x i Four-Stage Modular ALFSR (Divider) Generating Function: f(x) = x 4 + x Feedback Vector: H = <h 4, h 3,...,h 0 > = <1,1,0,0,1> Copyright 2010, M. Tahoori TDS II: Lecture 5 20 Lecture 5 10
11 Modular ALFSR (Divider) f ( N x ) = i= 0 h i x Generating Function: Modulo 2 i Copyright 2010, M. Tahoori TDS II: Lecture stage standard and modular LFSRs 4-stage Standard LFSR 2 4 ( x) = 1+ x x f ( x) = 1+ x x f + 4-stage Modular LFSR 4 ( x ) = 1 + x x f + Copyright 2010, M. Tahoori TDS II: Lecture 5 22 Lecture 5 11
12 Primitive VS Non-Primitive Primitive Non-Primitive X 3 r= X +1 X + X + X L c = L = 4 c Copyright 2010, M. Tahoori TDS II: Lecture 5 23 Four-Stage Modified ALFSR de Bruijn Counter Period = 16 Copyright 2010, M. Tahoori TDS II: Lecture 5 24 Lecture 5 12
13 N-Stage Modified ALFSR (de Bruijn Counter): Period = 2 N Copyright 2010, M. Tahoori TDS II: Lecture 5 25 Minimized Four-Stage Modified ALFSR Copyright 2010, M. Tahoori TDS II: Lecture 5 26 Lecture 5 13
14 Test Architecture m-stage ALFSR generates L m-bit patterns L is test length M = 2 m - 1 is number of patterns generated n is number of inputs for network under test (NUT) N = 2 n is exhaustive test length for NUT Patterns generated on same chip or board as device under test Copyright 2010, M. Tahoori TDS II: Lecture 5 27 Test Architecture Pseudorandom Pattern Generator m Stages n Inputs Network Under Test Copyright 2010, M. Tahoori TDS II: Lecture 5 28 Lecture 5 14
Design for Test. Design for test (DFT) refers to those design techniques that make test generation and test application cost-effective.
Design for Test Definition: Design for test (DFT) refers to those design techniques that make test generation and test application cost-effective. Types: Design for Testability Enhanced access Built-In
Testing Digital Systems II
Testing Digital Systems II Lecture 7: Built-in Self Test (III) Instructor: M. Tahoori Copyright 206, M. Tahoori TDS II: Lecture 7 BIST Architectures Copyright 206, M. Tahoori TDS II: Lecture 7 2 Lecture
VLSI System Testing. BIST Motivation
ECE 538 VLSI System Testing Krish Chakrabarty Built-In Self-Test (BIST): ECE 538 Krish Chakrabarty BIST Motivation Useful for field test and diagnosis (less expensive than a local automatic test equipment)
Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory. National Central University
Chapter 3 Basics of VLSI Testing (2) Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory Department of Electrical Engineering National Central University Jhongli, Taiwan Outline Testing Process Fault
VLSI Test Technology and Reliability (ET4076)
VLSI Test Technology and Reliability (ET476) Lecture 9 (2) Built-In-Self Test (Chapter 5) Said Hamdioui Computer Engineering Lab Delft University of Technology 29-2 Learning aims Describe the concept and
Built-In Self-Test (BIST) Abdil Rashid Mohamed, Embedded Systems Laboratory (ESLAB) Linköping University, Sweden
Built-In Self-Test (BIST) Abdil Rashid Mohamed, abdmo@ida ida.liu.se Embedded Systems Laboratory (ESLAB) Linköping University, Sweden Introduction BIST --> Built-In Self Test BIST - part of the circuit
ECE 715 System on Chip Design and Test. Lecture 22
ECE 75 System on Chip Design and Test Lecture 22 Response Compaction Severe amounts of data in CUT response to LFSR patterns example: Generate 5 million random patterns CUT has 2 outputs Leads to: 5 million
Y. Tsiatouhas. VLSI Systems and Computer Architecture Lab. Built-In Self Test 2
CMOS INTEGRATE CIRCUIT ESIGN TECHNIUES University of Ioannina Built In Self Test (BIST) ept. of Computer Science and Engineering Y. Tsiatouhas CMOS Integrated Circuit esign Techniques VLSI Systems and
Overview: Logic BIST
VLSI Design Verification and Testing Built-In Self-Test (BIST) - 2 Mohammad Tehranipoor Electrical and Computer Engineering University of Connecticut 23 April 2007 1 Overview: Logic BIST Motivation Built-in
Bit Swapping LFSR and its Application to Fault Detection and Diagnosis Using FPGA
Bit Swapping LFSR and its Application to Fault Detection and Diagnosis Using FPGA M.V.M.Lahari 1, M.Mani Kumari 2 1,2 Department of ECE, GVPCEOW,Visakhapatnam. Abstract The increasing growth of sub-micron
UNIT IV CMOS TESTING. EC2354_Unit IV 1
UNIT IV CMOS TESTING EC2354_Unit IV 1 Outline Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan EC2354_Unit
Testing Digital Systems II
Testing Digital Systems II Lecture 2: Design for Testability (I) structor: M. Tahoori Copyright 2010, M. Tahoori TDS II: Lecture 2 1 History During early years, design and test were separate The final
CPE 628 Chapter 5 Logic Built-In Self-Test. Dr. Rhonda Kay Gaede UAH. UAH Chapter Introduction
Chapter 5 Logic Built-In Self-Test Dr. Rhonda Kay Gaede UAH 1 5.1 Introduction Introduce the basic concepts of BIST BIST Rules Test pattern generation and output techniques Fault Coverage Various BIST
Design of Fault Coverage Test Pattern Generator Using LFSR
Design of Fault Coverage Test Pattern Generator Using LFSR B.Saritha M.Tech Student, Department of ECE, Dhruva Institue of Engineering & Technology. Abstract: A new fault coverage test pattern generator
CMOS Testing-2. Design for testability (DFT) Design and Test Flow: Old View Test was merely an afterthought. Specification. Design errors.
Design and test CMOS Testing- Design for testability (DFT) Scan design Built-in self-test IDDQ testing ECE 261 Krish Chakrabarty 1 Design and Test Flow: Old View Test was merely an afterthought Specification
[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785
![[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785](/thumbs/84/89645202.jpg "[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785")
IJESRT INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY DESIGN AND IMPLEMENTATION OF BIST TECHNIQUE IN UART SERIAL COMMUNICATION M.Hari Krishna*, P.Pavan Kumar * Electronics and Communication
Unit 8: Testability. Prof. Roopa Kulkarni, GIT, Belgaum. 29
Unit 8: Testability Objective: At the end of this unit we will be able to understand Design for testability (DFT) DFT methods for digital circuits: Ad-hoc methods Structured methods: Scan Level Sensitive
VLSI Design Verification and Test BIST II CMPE 646 Space Compaction Multiple Outputs We need to treat the general case of a k-output circuit.
Space Compaction Multiple Outputs We need to treat the general case of a k-output circuit. Test Set L m CUT k LFSR There are several possibilities: Multiplex the k outputs of the CUT. M 1 P(X)=X 4 +X+1
International Journal of Scientific & Engineering Research, Volume 5, Issue 9, September ISSN
International Journal of Scientific & Engineering Research, Volume 5, Issue 9, September-2014 917 The Power Optimization of Linear Feedback Shift Register Using Fault Coverage Circuits K.YARRAYYA1, K CHITAMBARA
Chapter 5. Logic Built-In Self-Test. VLSI EE141 Test Principles and Architectures Ch. 5 - Logic BIST - P. 1
Chapter 5 Logic Built-In Self-Test VLSI EE141 Test Principles and Architectures Ch. 5 - Logic BIST - P. 1 1 What is this chapter about? Introduce the basic concepts of logic BIST BIST Design Rules Test
Scan. This is a sample of the first 15 pages of the Scan chapter.
Scan This is a sample of the first 15 pages of the Scan chapter. Note: The book is NOT Pinted in color. Objectives: This section provides: An overview of Scan An introduction to Test Sequences and Test
ISSN (c) MIT Publications
MIT International Journal of Electronics and Communication Engineering, Vol. 2, No. 2, Aug. 2012, pp. (83-88) 83 BIST- Built in Self Test A Testing Technique Alpana Singh MIT, Moradabad, UP, INDIA Email:
Synthesis Techniques for Pseudo-Random Built-In Self-Test Based on the LFSR
Volume 01, No. 01 www.semargroups.org Jul-Dec 2012, P.P. 67-74 Synthesis Techniques for Pseudo-Random Built-In Self-Test Based on the LFSR S.SRAVANTHI 1, C. HEMASUNDARA RAO 2 1 M.Tech Student of CMRIT,
Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test
Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test Mark McDermott Electrical and Computer Engineering The University of Texas at Austin Agenda Introduction to testing Logical
DESIGN FOR TESTABILITY
DESIGN FOR TESTABILITY Raimund Ubar raiub@pld.ttu.ee Design for Testability Lectures Testability of Digital Systems Design for Testability Methods BIST/BISD Practical Works Two laboratory works Course
Testing Sequential Circuits
Testing Sequential Circuits 9/25/ Testing Sequential Circuits Test for Functionality Timing (components too slow, too fast, not synchronized) Parts: Combinational logic: faults: stuck /, delay Flip-flops:
Department of Electrical and Computer Engineering University of Wisconsin Madison. Fall Final Examination CLOSED BOOK
Department of Electrical and Computer Engineering University of Wisconsin Madison Fall 2014-2015 Final Examination CLOSED BOOK Kewal K. Saluja Date: December 14, 2014 Place: Room 3418 Engineering Hall
Diagnosis of Resistive open Fault using Scan Based Techniques
Diagnosis of Resistive open Fault using Scan Based Techniques 1 Mr. A. Muthu Krishnan. M.E., (Ph.D), 2. G. Chandra Theepa Assistant Professor 1, PG Scholar 2,Dept. of ECE, Regional Office, Anna University,
Final Exam CPSC/ECEN 680 May 2, Name: UIN:
Final Exam CPSC/ECEN 680 May 2, 2008 Name: UIN: Instructions This exam is closed book. Provide brief but complete answers to the following questions in the space provided, using figures as necessary. Show
LFSR TEST PATTERN FOR FAULT DETECTION AND DIAGNOSIS FOR FPGA CLB CELLS
LFSR TEST PATTERN FOR FAULT DETECTION AND DIAGNOSIS FOR FPGA CLB CELLS Fazal Noorbasha, K. Harikishore, Ch. Hemanth, A. Sivasairam, V. Vijaya Raju Department of ECE, KL University, Vaddeswaram, Guntur
VHDL Implementation of Logic BIST (Built In Self Test) Architecture for Multiplier Circuit for High Test Coverage in VLSI Chips
VHDL Implementation of Logic BIST (Built In Self Test) Architecture for Multiplier Circuit for High Test Coverage in VLSI Chips Pushpraj Singh Tanwar, Priyanka Shrivastava Assistant professor, Dept. of
Unit V Design for Testability
Unit V Design for Testability Outline Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan Slide 2 Testing
ECE 407 Computer Aided Design for Electronic Systems. Testing and Design for Testability. Instructor: Maria K. Michael. Overview
407 Computer Aided Design for Electronic Systems Testing and Design for Testability Instructor: Maria K. Michael MKM - 1 Overview VLSI realization process Role of testing, related cost Basic Digital VLSI
This Chapter describes the concepts of scan based testing, issues in testing, need
Chapter 2 AT-SPEED TESTING AND LOGIC BUILT IN SELF TEST 2.1 Introduction This Chapter describes the concepts of scan based testing, issues in testing, need for logic BIST and trends in VLSI testing. Scan
Digital Integrated Circuits Lecture 19: Design for Testability
Digital Integrated Circuits Lecture 19: Design for Testability Chih-Wei Liu VLSI Signal Processing LAB National Chiao Tung University cwliu@twins.ee.nctu.edu.tw DIC-Lec19 cwliu@twins.ee.nctu.edu.tw 1 Outline
Using on-chip Test Pattern Compression for Full Scan SoC Designs
Using on-chip Test Pattern Compression for Full Scan SoC Designs Helmut Lang Senior Staff Engineer Jens Pfeiffer CAD Engineer Jeff Maguire Principal Staff Engineer Motorola SPS, System-on-a-Chip Design
Instructions. Final Exam CPSC/ELEN 680 December 12, Name: UIN:
Final Exam CPSC/ELEN 680 December 12, 2005 Name: UIN: Instructions This exam is closed book. Provide brief but complete answers to the following questions in the space provided, using figures as necessary.
EE241 - Spring 2001 Advanced Digital Integrated Circuits. References
EE241 - Spring 2001 Advanced Digital Integrated Circuits Lecture 28 References Rabaey, Digital Integrated Circuits and EE241 (1998) notes Chapter 25, ing of High-Performance Processors by D.K. Bhavsar
Available online at ScienceDirect. Procedia Computer Science 46 (2015 ) Aida S Tharakan a *, Binu K Mathew b
Available online at www.sciencedirect.com ScienceDirect Procedia Computer Science 46 (2015 ) 1409 1416 International Conference on Information and Communication Technologies (ICICT 2014) Design and Implementation
SIC Vector Generation Using Test per Clock and Test per Scan
International Journal of Emerging Engineering Research and Technology Volume 2, Issue 8, November 2014, PP 84-89 ISSN 2349-4395 (Print) & ISSN 2349-4409 (Online) SIC Vector Generation Using Test per Clock
TEST PATTERN GENERATION USING PSEUDORANDOM BIST
TEST PATTERN GENERATION USING PSEUDORANDOM BIST GaneshBabu.J 1, Radhika.P 2 PG Student [VLSI], Dept. of ECE, SRM University, Chennai, Tamilnadu, India 1 Assistant Professor [O.G], Dept. of ECE, SRM University,
for Digital IC's Design-for-Test and Embedded Core Systems Alfred L. Crouch Prentice Hall PTR Upper Saddle River, NJ
Design-for-Test for Digital IC's and Embedded Core Systems Alfred L. Crouch Prentice Hall PTR Upper Saddle River, NJ 07458 www.phptr.com ISBN D-13-DflMfla7-l : Ml H Contents Preface Acknowledgments Introduction
Lecture 23 Design for Testability (DFT): Full-Scan (chapter14)
Lecture 23 Design for Testability (DFT): Full-Scan (chapter14) Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Scan design system Summary
Lecture 18 Design For Test (DFT)
Lecture 18 Design For Test (DFT) Xuan Silvia Zhang Washington University in St. Louis http://classes.engineering.wustl.edu/ese461/ ASIC Test Two Stages Wafer test, one die at a time, using probe card production
Design and Implementation OF Logic-BIST Architecture for I2C Slave VLSI ASIC Design Using Verilog
Design and Implementation OF Logic-BIST Architecture for I2C Slave VLSI ASIC Design Using Verilog 1 Manish J Patel, 2 Nehal Parmar, 3 Vishwas Chaudhari 1, 2, 3 PG Students (VLSI & ESD) Gujarat Technological
Based on slides/material by. Topic 14. Testing. Testing. Logic Verification. Recommended Reading:
Based on slides/material by Topic 4 Testing Peter Y. K. Cheung Department of Electrical & Electronic Engineering Imperial College London!! K. Masselos http://cas.ee.ic.ac.uk/~kostas!! J. Rabaey http://bwrc.eecs.berkeley.edu/classes/icbook/instructors.html
Fpga Implementation of Low Complexity Test Circuits Using Shift Registers
Fpga Implementation of Low Complexity Test Circuits Using Shift Registers Mohammed Yasir, Shameer.S (M.Tech in Applied Electronics,MG University College Of Engineering,Muttom,Kerala,India) (M.Tech in Applied
DETERMINISTIC SEED RANGE AND TEST PATTERN DECREASE IN LOGIC BIST
DETERMINISTIC SEED RANGE AND TEST PATTERN DECREASE IN LOGIC BIST PAVAN KUMAR GABBITI 1*, KATRAGADDA ANITHA 2* 1. Dept of ECE, Malineni Lakshmaiah Engineering College, Andhra Pradesh, India. Email Id :pavankumar.gabbiti11@gmail.com
Design of Test Circuits for Maximum Fault Coverage by Using Different Techniques
Design of Test Circuits for Maximum Fault Coverage by Using Different Techniques Akkala Suvarna Ratna M.Tech (VLSI & ES), Department of ECE, Sri Vani School of Engineering, Vijayawada. Abstract: A new
I. INTRODUCTION. S Ramkumar. D Punitha
Efficient Test Pattern Generator for BIST Using Multiple Single Input Change Vectors D Punitha Master of Engineering VLSI Design Sethu Institute of Technology Kariapatti, Tamilnadu, 626106 India punithasuresh3555@gmail.com
Testability: Lecture 23 Design for Testability (DFT) Slide 1 of 43
Testability: Lecture 23 Design for Testability (DFT) Shaahin hi Hessabi Department of Computer Engineering Sharif University of Technology Adapted, with modifications, from lecture notes prepared p by
Implementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters
IOSR Journal of Mechanical and Civil Engineering (IOSR-JMCE) e-issn: 2278-1684, p-issn: 2320-334X Implementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters N.Dilip
Design and Implementation of Uart with Bist for Low Power Dissipation Using Lp-Tpg
IOSR Journal of VLSI and Signal Processing (IOSR-JVSP) Volume 6, Issue 3, Ver. II (May. -Jun. 2016), PP 26-31 e-issn: 2319 4200, p-issn No. : 2319 4197 www.iosrjournals.org Design and Implementation of
Random Access Scan. Veeraraghavan Ramamurthy Dept. of Electrical and Computer Engineering Auburn University, Auburn, AL
Random Access Scan Veeraraghavan Ramamurthy Dept. of Electrical and Computer Engineering Auburn University, Auburn, AL ramamve@auburn.edu Term Paper for ELEC 7250 (Spring 2005) Abstract: Random Access
Design for Testability
TDTS 01 Lecture 9 Design for Testability Zebo Peng Embedded Systems Laboratory IDA, Linköping University Lecture 9 The test problems Fault modeling Design for testability techniques Zebo Peng, IDA, LiTH
Design and Implementation of Low Power Linear Feedback Shift Segisters for Vlsi Application
24 Design and Implementation of Low Power Linear Feedback Shift Segisters for Vlsi Application 1. A.V.PRABU 2.T.APPA RAO 3. TUSHAR KANT PANDA 4.PADMINI MISHRA 5. L.SIVA PRASAD 6.R.DHAMODHARAN ABSTRACT:
Implementation of UART with BIST Technique
Implementation of UART with BIST Technique Mr.S.N.Shettennavar 1, Mr.B.N.Sachidanand 2, Mr.D.K.Gupta 3, Mr.V.M.Metigoudar 4 1, 2, 3,4Assistant Professor, Dept. of Electronics Engineering, DKTE s Textile
Lecture 23 Design for Testability (DFT): Full-Scan
Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence) Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads
Design of BIST with Low Power Test Pattern Generator
IOSR Journal of VLSI and Signal Processing (IOSR-JVSP) Volume 4, Issue 5, Ver. II (Sep-Oct. 2014), PP 30-39 e-issn: 2319 4200, p-issn No. : 2319 4197 Design of BIST with Low Power Test Pattern Generator
Optimization of Multi-Channel BCH Error Decoding for Common Cases. Russell Dill Master's Thesis Defense April 20, 2015
Optimization of Multi-Channel BCH Error Decoding for Common Cases Russell Dill Master's Thesis Defense April 20, 2015 Bose-Chaudhuri-Hocquenghem (BCH) BCH is an Error Correcting Code (ECC) and is used
Cell-Aware Fault Analysis and Test Set Optimization in Digital Integrated Circuits
Southern Methodist University SMU Scholar Computer Science and Engineering Theses and Dissertations Computer Science and Engineering Spring 5-19-2018 Cell-Aware Fault Analysis and Test Set Optimization
ISSN:
191 Low Power Test Pattern Generator Using LFSR and Single Input Changing Generator (SICG) for BIST Applications A K MOHANTY 1, B P SAHU 2, S S MAHATO 3 Department of Electronics and Communication Engineering,
Sharif University of Technology. SoC: Introduction
SoC Design Lecture 1: Introduction Shaahin Hessabi Department of Computer Engineering System-on-Chip System: a set of related parts that act as a whole to achieve a given goal. A system is a set of interacting
Design of BIST Enabled UART with MISR
International Journal of Emerging Engineering Research and Technology Volume 3, Issue 8, August 2015, PP 85-89 ISSN 2349-4395 (Print) & ISSN 2349-4409 (Online) ABSTRACT Design of BIST Enabled UART with
Bit-Serial Test Pattern Generation by an Accumulator behaving as a Non-Linear Feedback Shift Register
Bit-Serial Test Pattern Generation by an Accumulator behaving as a Non-Linear Feedbac Shift Register G Dimitraopoulos, D Niolos and D Baalis Computer Engineering and Informatics Dept, University of Patras,
Based on slides/material by. Topic Testing. Logic Verification. Testing
Based on slides/material by Topic 4 K. Masselos http://cas.ee.ic.ac.uk/~kostas J. Rabaey http://bwrc.eecs.berkeley.edu/classes/icbook/instructors.html igital Integrated Circuits: A esign Perspective, Prentice
國立清華大學電機系 EE-6250 超大型積體電路測試. VLSI Testing. Chapter 7 Built-In Self-Test. Design-for-Testability
1 國立清華大學電機系 EE-6250 超大型積體電路測試 VLSI Testing Chapter 7 Built-In Self-Test esign-for-testability esign activities for generating a set of test patterns with a high fault coverage. Methodology Logic Automatic
Transactions Brief. Circular BIST With State Skipping
668 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 10, NO. 5, OCTOBER 2002 Transactions Brief Circular BIST With State Skipping Nur A. Touba Abstract Circular built-in self-test
E-Learning Tools for Teaching Self-Test of Digital Electronics
E-Learning Tools for Teaching Self-Test of Digital Electronics A. Jutman 1, E. Gramatova 2, T. Pikula 2, R. Ubar 1 1 Tallinn University of Technology, Raja 15, 12618 Tallinn, Estonia 2 Institute of Informatics,
Changing the Scan Enable during Shift
Changing the Scan Enable during Shift Nodari Sitchinava* Samitha Samaranayake** Rohit Kapur* Emil Gizdarski* Fredric Neuveux* T. W. Williams* * Synopsys Inc., 700 East Middlefield Road, Mountain View,
DESIGN OF LOW POWER TEST PATTERN GENERATOR
International Journal of Electronics, Communication & Instrumentation Engineering Research and Development (IJECIERD) ISSN(P): 2249-684X; ISSN(E): 2249-7951 Vol. 4, Issue 1, Feb 2014, 59-66 TJPRC Pvt.
Tools to Debug Dead Boards
Tools to Debug Dead Boards Hardware Prototype Bring-up Ryan Jones Senior Application Engineer Corelis 1 Boundary-Scan Without Boundaries click to start the show Webinar Outline What is a Dead Board? Prototype
Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction
Low Illinois Scan Architecture for Simultaneous and Test Data Volume Anshuman Chandra, Felix Ng and Rohit Kapur Synopsys, Inc., 7 E. Middlefield Rd., Mountain View, CA Abstract We present Low Illinois
Fault Detection And Correction Using MLD For Memory Applications
Fault Detection And Correction Using MLD For Memory Applications Jayasanthi Sambbandam & G. Jose ECE Dept. Easwari Engineering College, Ramapuram E-mail : shanthisindia@yahoo.com & josejeyamani@gmail.com
Response Compaction with any Number of Unknowns using a new LFSR Architecture*
Response Compaction with any Number of Unknowns using a new LFSR Architecture* Agilent Laboratories Palo Alto, CA Erik_Volkerink@Agilent.com Erik H. Volkerink, and Subhasish Mitra,3 Intel Corporation Folsom,
Efficient Test Pattern Generation Scheme with modified seed circuit.
Efficient Test Pattern Generation Scheme with modified seed circuit. PAYEL MUKHERJEE, Mrs. N.SARASWATHI Abstract This paper proposes a modified test pattern generator which produces single bit change vectors
Nodari S. Sitchinava
Dynamic Scan Chains A Novel Architecture to Lower the Cost of VLSI Test by Nodari S. Sitchinava Submitted to the Department of Electrical Engineering and Computer Science in partial fulfillment of the
Why FPGAs? FPGA Overview. Why FPGAs?
Transistor-level Logic Circuits Positive Level-sensitive EECS150 - Digital Design Lecture 3 - Field Programmable Gate Arrays (FPGAs) January 28, 2003 John Wawrzynek Transistor Level clk clk clk Positive
A New Approach to Design Fault Coverage Circuit with Efficient Hardware Utilization for Testing Applications
A New Approach to Design Fault Coverage Circuit with Efficient Hardware Utilization for Testing Applications S. Krishna Chaitanya Department of Electronics & Communication Engineering, Hyderabad Institute
Weighted Random and Transition Density Patterns For Scan-BIST
Weighted Random and Transition Density Patterns For Scan-BIST Farhana Rashid Intel Corporation 1501 S. Mo-Pac Expressway, Suite 400 Austin, TX 78746 USA Email: farhana.rashid@intel.com Vishwani Agrawal
Module 8. Testing of Embedded System. Version 2 EE IIT, Kharagpur 1
Module 8 Testing of Embedded System Version 2 EE IIT, Kharagpur Lesson 40 Built-In-Self-Test (BIST) for Embedded Systems Version 2 EE IIT, Kharagpur 2 Instructional Objectives After going through this
IMPLEMENTATION OF X-FACTOR CIRCUITRY IN DECOMPRESSOR ARCHITECTURE
IMPLEMENTATION OF X-FACTOR CIRCUITRY IN DECOMPRESSOR ARCHITECTURE SATHISHKUMAR.K #1, SARAVANAN.S #2, VIJAYSAI. R #3 School of Computing, M.Tech VLSI design, SASTRA University Thanjavur, Tamil Nadu, 613401,
An Application Specific Reconfigurable Architecture Diagnosis Fault in the LUT of Cluster Based FPGA
International Journal of Innovative Research in Electronics and Communications (IJIREC) Volume 2, Issue 5, July 2015, PP 1-7 ISSN 2349-4042 (Print) & ISSN 2349-4050 (Online) www.arcjournals.org An Application
A Novel Low Power pattern Generation Technique for Concurrent Bist Architecture
A Novel Low Power pattern Generation Technique for Concurrent Bist Architecture Y. Balasubrahamanyam, G. Leenendra Chowdary, T.J.V.S.Subrahmanyam Research Scholar, Dept. of ECE, Sasi institute of Technology
Department of Information Technology and Electrical Engineering. VLSI III: Test and Fabrication of VLSI Circuits L.
Institut für Integrierte Systeme Integrated Systems Laboratory Department of Information Technology and Electrical Engineering VLSI III: Test and Fabrication of VLSI Circuits 227-0148-00L Exercise 7 Speed
Power Problems in VLSI Circuit Testing
Power Problems in VLSI Circuit Testing Farhana Rashid and Vishwani D. Agrawal Auburn University Department of Electrical and Computer Engineering 200 Broun Hall, Auburn, AL 36849 USA fzr0001@tigermail.auburn.edu,
FOR A DISSERTATION SUBMITTED TO THE DEPARTMENT OF ELECTRICAL ENGINEERING AND THE COMMITTEE ON GRADUATE STUDIES OF STANFORD UNIVERSITY
DETERMINISTIC BUILT-IN SELF TEST FOR DIGITAL CIRCUITS A DISSERTATION SUBMITTED TO THE DEPARTMENT OF ELECTRICAL ENGINEERING AND THE COMMITTEE ON GRADUATE STUDIES OF STANFORD UNIVERSITY IN PARTIAL FULFILLMENT
Chapter 8 Design for Testability
電機系 Chapter 8 Design for Testability 測試導向設計技術 2 Outline Introduction Ad-Hoc Approaches Full Scan Partial Scan 3 Design For Testability Definition Design For Testability (DFT) refers to those design techniques
An Application Specific Reconfigurable Architecture Diagnosis Fault in the LUT of Cluster Based FPGA
An Application Specific Reconfigurable Architecture Diagnosis Fault in the LUT of Cluster Based FPGA Abstract: The increased circuit complexity of field programmable gate array (FPGA) poses a major challenge
Strategies for Efficient and Effective Scan Delay Testing. Chao Han
Strategies for Efficient and Effective Scan Delay Testing by Chao Han A thesis submitted to the Graduate Faculty of Auburn University in partial fulfillment of the requirements for the Degree of Master
Testing of UART Protocol using BIST
Testing of UART Protocol using BIST Abstract: Testing of VLSI chips is changing into significantly complicated day by day as a result of increasing exponential advancement of NANO technology. BIST may
DESIGN OF TEST PATTERN OF MULTIPLE SIC VECTORS FROM LOW POWER LFSR THEORY AND APPLICATIONS IN BIST SCHEMES
DESIGN OF TEST PATTERN OF MULTIPLE SIC VECTORS FROM LOW POWER LFSR THEORY AND APPLICATIONS IN BIST SCHEMES P. SANTHAMMA, T.S. GHOUSE BASHA, B.DEEPASREE ABSTRACT--- BUILT-IN SELF-TEST (BIST) techniques
Doctor of Philosophy
LOW POWER HIGH FAULT COVERAGE TEST TECHNIQUES FOR D IGITAL VLSI CIRCUITS By Abdallatif S. Abuissa A thesis submitted to The University of Birmingham for the Degree of Doctor of Philosophy School of Electronic,
At-speed Testing of SOC ICs
At-speed Testing of SOC ICs Vlado Vorisek, Thomas Koch, Hermann Fischer Multimedia Design Center, Semiconductor Products Sector Motorola Munich, Germany Abstract This paper discusses the aspects and associated
GLFSR-Based Test Processor Employing Mixed-Mode Approach in IC Testing
ULAB JOURNAL OF SCIENCE AND ENGINEERING VOL. 3, NO. 1, NOVEMBER 2012 (ISSN: 2079-4398) 30 GLFSR-Based Test Processor Employing Mixed-Mode Approach in IC Testing Mohammod Akbar Kabir, Md. Nasim Adnan, Lutful
Analysis of Low Power Test Pattern Generator by Using Low Power Linear Feedback Shift Register (LP-LFSR)
Analysis of Low Power Test Pattern Generator by Using Low Power Linear Feedback Shift Register (LP-LFSR) Nelli Shireesha 1, Katakam Divya 2 1 MTech Student, Dept of ECE, SR Engineering College, Warangal,
Low Transition Test Pattern Generator Architecture for Built-in-Self-Test
American Journal of Applied Sciences 9 (9): 1396-1406, 2012 ISSN 1546-9239 2012 Science Publication Low Transition Test Pattern Generator Architecture for Built-in-Self-Test 1 Sakthivel, P., 2 A. NirmalKumar
Low Cost Fault Detector Guided by Permanent Faults at the End of FPGAs Life Cycle Victor Manuel Gonçalves Martins
Universidade Federal de Santa Catarina Dept. de Automação e Sistemas, CTC Low Cost Fault Detector Guided by Permanent Faults at the End of FPGAs Life Cycle (Victor Martins, Frederico Ferlini, Djones Lettnin
CSE 352 Laboratory Assignment 3
CSE 352 Laboratory Assignment 3 Introduction to Registers The objective of this lab is to introduce you to edge-trigged D-type flip-flops as well as linear feedback shift registers. Chapter 3 of the Harris&Harris
Controlled Transition Density Based Power Constrained Scan-BIST with Reduced Test Time. Farhana Rashid
Controlled Transition Density Based Power Constrained Scan-BIST with Reduced Test Time by Farhana Rashid A thesis submitted to the Graduate Faculty of Auburn University in partial fulfillment of the requirements