JTAG / Boundary Scan. Multidimensional JTAG / Boundary Scan Instrumentation. Get the total Coverage!

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1 JTAG / Boundary Scan Multdmensonal JTAG / Boundary Scan Instrumentaton IEEE IEEE IEEE Multdmensonal JTAG / Boundary Scan Instrumentaton IEEE IEEE 1532 Get the total Coverage!

2 The Company GOEPEL electronc & JTAG / Boundary Scan GOEPEL electronc GmbH GOEPEL electronc s a global company that has been developng and producng ground-breakng solutons for electronc and optcal test technologes snce the early 1990s. Already n 1991, the enterprse was the frst worldwde vendor of dedcated JTAG / Boundary Scan solutons. Today, a hghly qualfed team of more than 150 experts takes care to guarantee the best solutons for our customers test tasks. A consstent nnovaton management as well as a thorough ongong qualty approach emphasses our clam as technology poneer n the felds of electrc and optcal testng. Ths s valdated by a contnuous ISO-9000 certfcaton snce What s JTAG / Boundary Scan? The electrc test of assembles s at the crossroads. Contnuously reduced physcal test access by more and more complex board structures, the utlsaton of new housng technologes and the mnatursaton of ICs (Integrated Crcuts) stand opposed to the requrements for cost reducton but unchanged hgh qualty demands. Qualtatve trend n test access: Access Boundary Scan Access ICT / MDA More about GOEPEL electronc goepel.com/en/goepel Certfcate-Regst.-No.: Perpheral access per connector 198x 198x 199x 199x 200x 200x 201x 201x Access Flyng Prober 202x 202x JTAG / Boundary Scan complant wth IEEE 1149.x s the soluton! IEEE Integrated Boundary Scan wth ATPG tools BScan controller wth PIO, A / D, D / A Gang-Test Turbo Flash programmng Ant Ground Bounce ISO 9001 certfed DIN EN ISO 9001 Zertfkat: Plug-n card 64 MB Scan memory PXI controller Enhanced Vrtual Scan Pn TAP sg Flyng Prober ntegraton

3 The Technology Functonalty and Benefts of JTAG / Boundary Scan Ths s how t works: Smlar to In-Crcut Test (ICT), JTAG / Boundary Scan utlses thousands of test ponts wth only four test access ponts. Therefore, expensve bed-of-nal fxtures are redundant. The followng mage shows the archtecture of a typcal Boundary Scan IC. The Boundary Scan cells are ntegrated between core logc and physcal contact pns. They enable the test of connectons between the of ICs, even those wthout Boundary Scan cells. JTAG / Boundary Scan Cell Test Data In (TDI) Core logc Test Access Port Decde for the Technology Leader! Most experenced GOEPEL electronc s the JTAG / Boundary Scan poneer and hghly reputed vendor snce 1991 Global presence fve subsdares worldwde and a network of more than 350 sales and support experts Innovaton Contnuous market ntroductons of numerous awarded products Versatlty Bggest portfolo of more than 250 products for your ndvdual test soluton Market leader Over 7,000 system nstallatons Flexblty Integraton of JTAG / Boundary Scan n exstng systems of all ATE vendors More about JTAG / Boundary Scan goepel.com/en/bscan Test Clock (TCK) Test Mode Select (TMS) TAP Save money wth JTAG / Boundary Scan Test Data Out (TDO) Small nvestment and operatonal costs JTAG / Boundary Scan s very versatle and can be utlsed n the entre producton process, e.g. for emulaton, desgn verfcaton, prototype and producton test as well as on-chp and n-system programmng. Extremely short test tmes but hgh effcency / productvty Versatle applcaton across the development and producton process Future-proof and sustanable nvestment nal transmsson va great dstances More than 20 years of nnovatons a tme lne IEEE 1532 Fast Ethernet controller 0 Boundary Scan ASIC CION Boundary Scan Probe SCANFLEX Extended hardware platform VaroCore IP-based nstrumentaton LXI and PXI Express controller 20 VaroTAP Fuson of Boundary Scan test and emulaton

4 The Software Easy Applcaton Development wth SYSTEM CASCON SYSTEM CASCON Platform nucleus Software that sets Qualty Standards The key for successfully utlsng JTAG / Boundary Scan s determned by the qualty of the appled software today more than ever. Grown wthn the nnovatons across nearly two decades, SYSTEM CASCON s the most utlsed JTAG / Boundary Scan software platform worldwde. More than 1,000 desgn and test engneers, qualty managers, servce techncans and system dagnostcans use ths unque ntegrated software envronment every day. In recognton of the hgh technologcal level, GOEPEL electronc s SYSTEM CASCON was honoured wth the prestgous Best n Test Award of the nternatonal magazne Test & Measurement World. Detals about SYSTEM CASCON features and packages goepel.com/en/cascon Debugger Vsualser External nstruments Flash / PLD / MCU programmng Features that make the Dfference Scalable hgh-performance platform wth more Interactve Boundary Scan vsualsaton on layout, than 40 ntegrated tools, central project data schematc and logc level for graphcal analysng Powerful base and ntutve user nterface Vsual and debuggng Smple, fast and goal-orented project Support of test and programmng strateges for development by ntellgent tools and automated nternal and external nstrumentatons beyond Intellgent system processes Unversal Boundary Scan Integrated safety functons avod hardware Extended test coverage and precse fault damagng scan vectors and guarantee safe test dagnostc by complete ncluson of non-boundary Safe Test programs Coverage Scan crcuts

5 The Software JTAG / Boundary Scan Software from GOEPEL electronc Graphcal hardware verfcaton by means of nteractve Pn Toggler wth logc vsualsaton n the layout Boundary Scan test Graphcal cross debuggng of test program source codes and Boundary Scan logc VaroTAP ncreases Test Coverage by Emulaton Tests Graphcal analyss and fault coverage optmsaton avalable after schematc and subsequent vsualsaton n the layout More about VaroTAP goepel.com/en/varotap JTAG emulaton test test coverage Boundary Scan + VaroTAP Boundary Scan At-speed functonal test Ggabt connecton Dynamc memory access Hghly complex cluster Infrastructure Interconnectons Statc memory access Complex clusters project progress Unlmted Applcatons SYSTEM CASCON enables more than 50 dfferent utlsatons for example Extended Boundary Scan Test Standard tests (nfra, ntercon, cluster, memory) Advanced AC network test (IEEE ) Advanced algorthmc cluster test (Waveform, HLL) Test and dagnoss through smulaton (IEEE 1445) Bult-n self-test (BIST) for chps / boards / systems Analogue network test (IEEE ) Advanced algorthmc mxed sgnal test (scrpts) Interactve tests for sensors and actors Control of FPGA based test nstruments Detals about SYSTEM CASCON applcatons goepel.com/en/cascon Dynamc Emulaton Test (ET) For memores (sram, dram) For bus devces For system nterfaces Flash / PLD / MCU Programmng Boundary Scan hgh-speed Flash programmng Emulaton based Flash programmng On-chp Flash programmng of MCUs Seral Flash programmng by external access PLD programmng (JAM / STAPL / SVF) Parallel PLD programmng (IEEE 1532) Control of External Instruments Interactve test wth In-Crcut Tester pns Interactve test wth Flyng Probes Interactve test wth Functonal Test I/O Interactve control of software nterfaces Graphcal Analysng and Debuggng BSDL verfcaton va graphcal devce lbrary Adaptve analyss of fault coverage n layout Cross debuggng n schematc and layout Test program debuggng wth hardware montorng Hardware analyss per nteractve layout Pn Toggler

6 The Hardware Performance and Relablty wth SCANFLEX and SCANBOOSTER Hardware Solutons wthout Compromse Just lke the software, GOEPEL electronc s hardware tradtonally meets hghest qualty and performance demands throughout the entre product lfe cycle. The avalable product lnes of SCANFLEX and SCANBOOSTER are the fourth generaton of GOEPEL electronc s Boundary Scan hardware solutons. Coupled wth ntutve software, they enable applcatons far exceedng standard Boundary Scan to be quckly realsed. The support of external nstrumentatons plays a key role. SCANFLEX receved the prestgous Best n Test Award, rewarded by Test & Measurement World magazne, for ts outstandng archtecture concept. Detals about SCANFLEX and other hardware products goepel.com/en/scanflex Hardware Examples CION Module /FXT114s For testng dfferental IEEE and sngle ended IEEE sgnals SFX/ASL1149-x SCANFLEX controller for Ggabt-LAN, USB 2.0 and Cabled PCIe SCANFLEX redefnes Boundary Scan SFX-TAP6 & SFX-5296 SCANFLEX TAP transcever wth sx ndependent ports and assocated I/O module Scalable hgh-performance platform for scan Broad support of a multtude of test, emulaton operatons of 80 MHz parallel at up to eght and programmng strateges complementng Powerful ndependent TAP nterfaces Unversal Boundary Scan Separately controlled I/O modules wth Freely confgurable controller, I/O modules, TAP VaroCore technology for reconfgurable transcever and TAP Interface Cards (TIC) enable Flexble analogue, dgtal and Mxed-Sgnal functons Modular scalable system confguratons Best TAP sgnal transmsson qualty also over Specal front-end hardware ensures seamless long dstances of up to ten metres at full runtme ntegraton nto In-Crcut Testers, Flyng Probe Adaptve compensaton ATE ready Testers, Functonal Testers and other ATE

7 The Hardware JTAG / Boundary Scan Hardware by GOEPEL electronc New to SCANFLEX Archtecture: Bus Access Cables (BACs) are able to functonally test varous nterfaces at speed. The BACs are controlled by commands embedded n the normal Boundary Scan test program by means of a SCANFLEX multport module wth VaroCore technology. BACs are avalable for the followng nterfaces: RS232, RS422, RS485 10/100-Mbt-LAN More about BACs CAN, LIN goepel.com/en/bac USB 2.0 Master / Slave, Bluetooth Addtonal BACs are under development. SFX/PXI1149/C4-x SCANFLEX controller for PXI wth ntegrated TAP transcever for four ndependent ports SCANBOOSTER /USB Controller for USB 2.0 wth two ndependent Test Access Ports Multport module SFX-9305 Platform of hghest Flexblty SCANFLEX offers the unque opportunty to use varous knds of nstrumentaton based on a flexble platform. In-System Instrumentaton 1 Dgtal Boundary Scan test (IEEE /6) Hgh-speed Flash programmng va IEEE PLD programmng (JAM / STAPL, SVF, IEEE 1532) Analogue Boundary Scan test (IEEE ) Functonal emulaton test va JTAG debug port Hgh-speed Flash programmng va emulaton Control of on-chp verfcaton and test IP Control of Bult-n self test (BIST) 1 Partly support also n the SCANBOOSTER economy product lne goepel.com/en/scanbooster In-system nstrumentaton wth external nstrumentaton s the key for hghest fault coverage and nearly unlmted flexblty wthn the defnton of a test strategy. External Instrumentaton 2 Dgtal I/O (statc / dynamc) Dgtal functonal modules Analogue I/O (statc / dynamc) Analogue functonal modules Programmer for seral Flash (SPI / I2C) Protocol based bus nterface tester Control of reconfgurable IP (VaroCore ) Control of thrd-party I/O (ICT, FPT, FCT) 2 Partly support also n the CION Module economy product lne goepel.com/en/conmodule

8 Producton Get the total Coverage! Flexbly defnng Producton Tests Nowadays, testng s an mportant ntegral part of a qualty assurance strategy. But each producton envronment and every product make dfferent demands to the test equpment. We have consstently taken up ths challenge and developed flexble system solutons, whch adapt to the producton process and can be ntegrated n exstng envronments wthout performance loss. Tests, already developed n the lab, can be drectly taken over nto the producton process for a fast New Product Introducton (NPI). Detals about our producton stage solutons and ntegrated packages goepel.com/en/ntegraton Perfectly equpped by all Means Shortest test tme and hgh-speed programmng Standard nterface control va LabVIEW, of Flash / PLD provde full n-lne capablty also at TestStand, C / C++, Basc, Tcl / Tck, Python etc. Throughput very hgh beat rate Integraton down to vector level Detecton, pn accurate dagnoss and layout Effcent system utlsaton by means of Floatng dsplay of all defects such as shorts or open BGA Lcense, fast project transfer through archve fles Precson solder jonts wthn one applcaton Modular and onlne fault data tracng Complete nteracton of Boundary Scan patterns Avalablty of customsed JTAG / Boundary Scan wth test vectors of other ATE or AOI systems for systems ncl. adaptaton based on platforms such Synchronous hghest fault coverage Turn-key as PXI or JULIET Graphcal fault vsualsaton n the layout by ScanVson Producton Inspector ntegraton n the Batch Mode of SYSTEM CASCON TM

9 Integraton Integrated Productvty on Command Stand-alone or Integraton? It doesn t matter what varant you decde for: our product portfolo covers t. Wth the help of our powerful software and hardware, every PC can be transformed nto a JTAG / Boundary Scan tester wth extended fault coverage. However, ready-made testers lke JULIET nclude Unt Under Test (UUT) power supply and are preconfgured professonal solutons for adaptng the UUT. As far as the analogue crcut parts are concerned, the hghest possble fault coverage can be acheved by combnng JTAG / Boundary Scan wth other methodologes. Numerous ntegraton packages of varous performance classes are avalable for such purposes. Typcally, they have been developed n close cooperaton wth, and are authorsed, by the respectve ATE vendor. Increased Test Coverage by Combnaton of New to the product lne: JULIET JULIET (JTAG Unlmted Tester) s sutable for the testng of small producton batches and prototypes. All electroncs are ntegrated nsde the system. The system s based on exchangeable adaptors and can be quckly converted n a few steps to handle dfferent projects. More about JULIET goepel.com/en/julet Boundary Scan and Flyng Probe Hgh flexblty wthout bed-of-nals for hgh-mx Boundary Scan and In-Crcut Test Hgh throughput wth best dagnoss for hgh-volume Boundary Scan and Functonal Test Hgh fault coverage also n dynamc area Boundary Scan and AOI Assembly test and optoelectronc tests Boundary Scan and HASS / HALT 1 Dynamc montorng for tests n envronmental chamber Boundary Scan and Gang Test Parallel programmng and test of several boards 1 - Hgh Accelerated Stress Screenng / Hgh Accelerated Lfe Test Our ATE Partners (excerpt)

10 Support & Servce World-Class Support Support from the very Begnnng The credo of excellent customer and product support has been part of GOEPEL electronc s overall corporate phlosophy snce the very start. Fve technology centres n Europe, the USA and Asa as well as a global network of hghly qualfed and experenced applcaton engneers are avalable for support and servce at any tme. The scope of servces extends from pure Boundary Scan applcatons to turn-key solutons, complete process ntegratons and hardware/software developments. Our GATE allance partners (GOEPEL Assocated Techncal Experts) also play a decsve role n technology transfer. They nclude desgn and test houses as well as system ntegrators wth specal knowledge that supply valuable complementary servces for successful project mplementatons. In summary, we are well postoned to ndvdually support anyknd of supply chan management such as OEM, ODM or EMS. Detals about GATE goepel.com/en/gate Product Lfe Cycle Support Desgn Prototype Producton Feld Competence s our Passon Servces at a Glance Knowledge transfer n workshops, semnars and tranng on-ste, n our technology centres, at our partners premses, or va nternet Performance transfer by project engneerng n our technology centres or our partners premses Detals about support and servce goepel.com/en/support Boundary Scan bascs Advanced JTAG / Boundary Scan (ncl. emulaton) Desgn-for-Testablty / n-system programmng Test strateges n practce (ncl. AOI, AXI, ICT) Project related applcaton tranng System tranng for test and repar personnel Herarchc Desgn-for-Testablty analyss BSDL fle development / verfcaton Development of complete test programs Defnton of test strateges (ncl. AOI, AXI) System ntegratons for ICT, FPT, MDA and FCT Customsed developments (hardware, software)

11 Support & Servce... throughout the entre Product Lfe Cycle! BSDL Fle Verfcaton n the Focus Benefts as a Customer: BSDL (Boundary Scan Descrpton Language) descrbes the Boundary Scan structures n a chp and hence s of fundamental mportance. Unfortunately, these fles are not always correct. For ths purpose, GOEPEL electronc provdes a specal servce to verfy the BSDL fles aganst the chp, utlsng standard products such as SFX Board Grabber, Boundary Scan Probe or our CION ASIC for specfc test adapters. Have you already purchased our JTAG / Boundary Scan equpment? Then you have full access to all customer benefts such as GENESIS, our support webste wth lbrary models, manuals, applcaton notes, software updates and much more Lbrary model development for new flash, RAM and addtonal non-boundary Scan devces Support hotlne va phone, vdeo va nternet (Skype), desktop sharng (WebEx) and emal Attendance at our worldwde organsed Boundary Scan Days Informaton about product roadmap and nfluence on new developments Specal mantenance contracts for hardware and software Extended hardware warranty of 36 months Detals about Accessores goepel.com/en/accessores What do satsfed Customers say about GOEPEL electronc s Support? We have been applyng GOEPEL electronc Boundary Scan snce a couple of years n the development as well as manufacturng department. Thus, we are able to essentally ncrease the test coverage for several products and to shorten the test tme. A specal feature for MSC s the combned applcaton of Boundary Scan wth a Flyng Prober. Slvano Gessler MSC Vertrebs GmbH Snce 1999 I have been usng GOEPEL electronc s Boundary Scan systems to test and on-board program our electroncs products n the AVIONIK dvson of EADS n Fredrchshafen/Germany. I am always very satsfed wth products and support. Because of the long-term contact to GOEPEL employees, a pleasant atmosphere has developed. They have never left me alone wth my test problems! Wll Gröber EADS Deutschland GmbH Up to now we are very satsfed wth ths Boundary Scan equpment (we have been usng t n the seres producton): because of the applcaton of Boundary Scan we were able to reduce the ntaton tme for the control electroncs of our latest prnter model by more than 30%. That s why we wll use ths technology for new developments. The man crteron to decde n favour of GOEPEL electronc was the possblty to extend the tests by self-programmed parts. Jörg Falkenberg cab Produkttechnk GmbH & Co. KG We have been successfully applyng GOEPEL electronc s Boundary Scan test systems n our producton snce September The performance of the systems and the support by GOEPEL electronc have mpressed us. We are able to process the test applcaton regardng the techncal and tme specfcatons to the complete satsfacton of our customers. Ernst Neppel Zollner Elektronk AG

12 Contact Global Presence Branch Offce Germany GOEPEL electronc GmbH Goeschwtzer Straße 58 / Jena Germany Phone: +49 (0) Fax: +49 (0) sales@goepel.com Dstrbutor GATE Partner USA GOEPEL electroncs LLC 9737 Great Hlls Tral Sute 170 Austn, TX / USA Phone: Fax: sales@goepelusa.com Unted Kngdom & Ireland GOEPEL electroncs Ltd Unt 1A, The Old Granary Westwck, Cambrdge CB24 3AR / UK Phone: +44 (0) Fax: +44 (0) sales@goepel.co.uk Chna GOEPEL electroncs Asa Ltd 15/F OTB Buldng 160 Gloucester Road Hong Kong / Chna Phone: +852 (0) Fax: +852 (0) sales@goepel.asa You wll fnd your local contact for product avalablty and support: goepel.com/en/contact JTAG / Boundary Scan Support contact us drectly: Germany USA Unted Kngdom & Ireland Chna Hotlne Toll-free +49 (0) GOEPEL +44 (0) (0) Emal bscan_support@goepel.com support@goepelusa.com bscan.support@goepel.co.uk support@goepel.asa Authorsed Dstrbutor: Get the total Coverage! ISO 9001 certfed BS / E /