Applying LaPO 4 Phosphor via Spinning for BetaPhotovoltaic Devices

Similar documents
RATE-ADAPTIVE VIDEO CODING (RAVC)

The State of Remote Scientific Visualization Providing Local Graphics Performance to Remote ARL MSRC Users

Search Strategies for a Wide-Field Electro-Optic Sensor

REPORT DOCUMENTATION PAGE

Advances in Telemetry Capability as Demonstrated on an Affordable Precision Mortar

A Comparison of the Temporal Characteristics of LCS, LCoS, Laser, And CRT Projectors

A Look-up-table Approach to Inverting Remotely Sensed Ocean Color Data

Remote Scientific Visualization Using the Internet Protocol

UNITED STATES AIR FORCE RESEARCH LABORATORY

Processing the Output of TOSOM

TEST WIRE FOR HIGH VOLTAGE POWER SUPPLY CROWBAR SYSTEM

REPORT DOCUMENTATION PAGE

Continued Development of the Look-up-table (LUT) Methodology for Interpretation of Remotely Sensed Ocean

RADIOGRAPHIC PERFORMANCE OF CYGNUS 1 AND THE FEBETRON 705

AFRL-RY-WP-TR

PREPARED FOR: U.S. Army Medical Research and Materiel Command Fort Detrick, Maryland

RF MEMS IMPROVEMENT PROGRAM

HIGH VOLTAGE SWITCH PERFORMANCE OF THE EIMAC X-2159 TETRODE ABSTRACT

Computational Studies of X-ray Framing Cameras for the National Ignition Facility

Award Number: W81XWH-

Multiple Target Laser Designator (MTLD)

4. TITLE AND SUBTITLE 5a. CONTRACT NUMBER. 6. AUTHOR(S) 5d. PROJECT NUMBER

The Automation of the Transonic Experimental Facility (TEF) and the Aerodynamic Experimental Facility (AEF)

w. R. Scarlett, K. R. Andrews, H. Jansen

STUDIES OF ENHANCED EDGE EMISSION OF A LARGE AREA CATHODE *

29.1 PULSED POWER BIBLIOGRAPHY. R. L. Druce and A. H. Guenther Air Force Weapons Laboratory (CA) Kirtland AFB Albuquerque, NM 87117

Reactive Ion Etching of PECVD Silicon Dioxide (SiO 2 ) Layer for MEMS Application

Current Status of the Laser Diode Array Projector Technology

Shot-Peening Sensitivity of Aerospace Materials

Designing for Compressive Sensing: Compressive Art, Camouflage, Fonts, and Quick Response Codes

PREPARED FOR: U.S. Army Medical Research and Materiel Command Fort Detrick, Maryland

THE EXPLOSIVE PULSED POWER TEST FACILITY AT AFRL

Fig. 1. Hawk switch/load vacuum section in the standard configuration.

Parts of dicing machines for scribing or scoring semiconductor wafers , , , , ,

THE LIQUID METAL PLASMA VALVE CLOSIN"G SWITCH. John R. Bayless Hughes Research Laboratories 3011 Malibu Canyon Road Malibu, California

THE WSMR TIMING SYSTEM: APPROACHING THE HORIZON. William A. Gilbert White Sands Missile Range, New Mexico. Abstract

VTA0832H Series Linear Photodiode Array (PDA) for X-ray Scanning

PICOPROJECTORS: TECHNOLOGIES AND GLOBAL MARKETS. SMC090A October Paul W. Bragulla Project Analyst ISBN:

The future of microled displays using nextgeneration

Flexible Electronics Production Deployment on FPD Standards: Plastic Displays & Integrated Circuits. Stanislav Loboda R&D engineer

VTA1216H Series Linear Photodiode Array (PDA) for X-ray Scanning

DESIGN OF VISIBLE LIGHT COMMUNICATION SYSTEM

1. Publishable summary

Size Reduction Research for the Universal Initiator CY2001 Report

A Method for Interfacing Digital Line Cameras to Field- Programmable Gate Array-Centric Data Processing Systems

APPLYING DIALECTIC TO ACQUISITION STRATEGY

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :

-REO. * This work supported by U.S. Dept. of Energy under

REPORT DOCUMENTATION PAGE

CPD LED Course Notes. LED Technology, Lifetime, Efficiency and Comparison

Chip-Scale Energy and Power... and Heat. Electrical and Computer Engineering Department, Georgia Tech University

Kingbright UNIT : MM[INCH] TOLERANCE :±0.25[± 0.01"] UNLESS OTHERWISE NOTED. Parameter Symbol Value Unit. Operating Temperature Topr -40~+85 ºC

D. Jackson Leitch Video International Inc. 10 Dyas Road Don Mills, Ontario, Canada M3B 1V5

Supplementary Figure 1. OLEDs/polymer thin film before and after peeled off from silicon substrate. (a) OLEDs/polymer film fabricated on the Si

Technology White Paper Plasma Displays. NEC Technologies Visual Systems Division

TITLE: Default, Cognitive, and Affective Brain Networks in Human Tinnitus

Scalable self-aligned active matrix IGZO TFT backplane technology and its use in flexible semi-transparent image sensors. Albert van Breemen

Case 3:18-cv K Document 1 Filed 03/02/18 Page 1 of 33 PageID 1 UNITED STATES DISTRICT COURT NORTHERN DISTRICT OF TEXAS DALLAS DIVISION

REPORT DOCUMENTATION PAGE

Color mixing or White-light LED (Light Emitting Diode) ERS-style product

Lecture 20 Optical MEMS (2)

UNITED STATES DISTRICT COURT CENTRAL DISTRICT OF CALIFORNIA

NOTICE. The above identified patent application is available for licensing. Requests for information should be addressed to:

WITH the rapid development of Gallium Nitride

Pressure sensor. Surface Micromachining. Residual stress gradients. Class of clean rooms. Clean Room. Surface micromachining

PROCESS TECHNOLOGIES FOR ADVANCED ORGANIC ELECTRONIC DEVICES: MICRODISPLAYS, LIGHTING AND SOLAR CELLS

DATA SHEET. BGY885B 860 MHz, 20 db gain push-pull amplifier DISCRETE SEMICONDUCTORS. Product specification Supersedes data of 1997 Apr 07.

HAZARD DIVISION 1.2 TESTS--INSTRUMENTATION RESULTS AND INTERPRETATION

Research & Development of Surface-Discharge Color Plasma Display Technologies. Tsutae Shinoda

The National Cryptologic Museum Library

Approaching Zero Etch Bias at Cr Etch Process

Advanced Sensor Technologies

arxiv:hep-ex/ v1 27 Nov 2003

SUPPLEMENTARY INFORMATION

Advanced Display Manufacturing Technology

Applied Materials. 200mm Tools & Process Capabilities For Next Generation MEMS. Dr Michel (Mike) Rosa

Data. X-ray Image Intensifier HIDEQ 23-3 ISP

Screen investigations for low energetic electron beams at PITZ

MONDO VIDEOSCREENS AND LED SOLUTIONS

Dynamic IR Scene Projector Based Upon the Digital Micromirror Device

Vetronics Technology Demonstrator Display Technology

Description. Table 1. Device summary. Order codes Temperature range [ C] Package Packing. LPS2HBTR -30 to +105 HLGA - 10L

2016, Amkor Technology, Inc.

9 rue Alfred Kastler - BP Nantes Cedex 3 - France Phone : +33 (0) website :

CHIMEI INNOLUX DISPLAY CORPORATION

THE DIGITAL FLAT-PANEL X-RAY DETECTORS

Sep 09, APPLICATION NOTE 1193 Electronic Displays Comparison

The use of remote phosphor technology in EVE-L series LED lighting fixtures with method of protection II 2GD Ex de IIC T6 Gb / Ex tb IIIC T85 Db IP66

Review Report of The SACLA Detector Meeting

Defense Technical Information Center Compilation Part Notice

Nano-Imprint Lithography Infrastructure: Imprint Templates

Introduction to. Micragem: A Silicon-on-Insulator Based Micromachining Process. Report ICI-138 V3.0 (Beta version)

When the Future Becomes the Past: Where will our Print Collection Be in 2050?

Altman Lighting Spectra Cyc 50 Specification

Illumination Challenges in Non- Industrial Vision Applications. Simon Stanley Managing Director ProPhotonix IRL Ltd

High Density Optical Connector with Unibody Lensed Resin Ferrule

*Please note that although this product has been approved in Japan, its launch in other countries has not yet been confirmed.

HIGH COURT OF BOMBAY AT GOA

Structure, Process & Cost Analysis

Transcription:

ARL-TR-7269 JUN 2015 US Army Research Laboratory Applying LaPO 4 Phosphor via Spinning for BetaPhotovoltaic Devices by Muhammad R Khan, Joshua R Smith, Kevin Kirchner, and Kenneth A Jones Approved for public release; distribution unlimited.

NOTICES Disclaimers The findings in this report are not to be construed as an official Department of the Army position unless so designated by other authorized documents. Citation of manufacturer s or trade names does not constitute an official endorsement or approval of the use thereof. Destroy this report when it is no longer needed. Do not return it to the originator.

ARL-TR-7269 JUN 2015 US Army Research Laboratory Applying LaPO 4 Phosphor via Spinning for BetaPhotovoltaic Devices by Muhammad R Khan, Joshua R Smith, Kevin Kirchner, and Kenneth A Jones Sensors and Electron Devices Directorate, ARL Approved for public release; distribution unlimited.

REPORT DOCUMENTATION PAGE Form Approved OMB No. 0704-0188 Public reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing the collection information. Send comments regarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing the burden, to Department of Defense, Washington Headquarters Services, Directorate for Information Operations and Reports (0704-0188), 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302. Respondents should be aware that notwithstanding any other provision of law, no person shall be subject to any penalty for failing to comply with a collection of information if it does not display a currently valid OMB control number. PLEASE DO NOT RETURN YOUR FORM TO THE ABOVE ADDRESS. 1. REPORT DATE (DD-MM-YYYY) Jun 2015 4. TITLE AND SUBTITLE 2. REPORT TYPE 3. DATES COVERED (From - To) Applying LaPO 4 Phosphor via Spinning for BetaPhotovoltaic Devices 5a. CONTRACT NUMBER 5b. GRANT NUMBER 5c. PROGRAM ELEMENT NUMBER 6. AUTHOR(S) Muhammad R Khan, Joshua R Smith, Kevin Kirchner, and Kenneth A Jones 5d. PROJECT NUMBER 5e. TASK NUMBER 5f. WORK UNIT NUMBER 7. PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES) US Army Research Laboratory ATTN: RDRL-SED-E 2800 Powder Mill Road Adelphi, MD 20783-1138 8. PERFORMING ORGANIZATION REPORT NUMBER ARL-TR-7269 9. SPONSORING/MONITORING AGENCY NAME(S) AND ADDRESS(ES) 10. SPONSOR/MONITOR'S ACRONYM(S) 11. SPONSOR/MONITOR'S REPORT NUMBER(S) 12. DISTRIBUTION/AVAILABILITY STATEMENT Approved for public release; distribution unlimited. 13. SUPPLEMENTARY NOTES 14. ABSTRACT The semiconductor fabrication technique of spinning photoresist was modified and applied to the problem of creating a uniform coating of phosphor on a betaphotovoltaic (BPV) device. A mixture of phosphor was applied to 3 samples (Si, GaN, and a GaN die with devices fabricated on its surface), and all 3 samples were spun at various speeds using a spinner. A uniform coating of phosphor was not achieved for 2 reasons: the phosphor does not fully dissolve in water, and the phosphor mixture does not stick well to the samples. 15. SUBJECT TERMS Betaphotovoltaic, LaPO 4 phosphor, spinning 16. SECURITY CLASSIFICATION OF: a. REPORT b. ABSTRACT c. THIS PAGE Unclassified Unclassified Unclassified 17. LIMITATION OF ABSTRACT UU 18. NUMBER OF PAGES 14 19a. NAME OF RESPONSIBLE PERSON Muhammad R Khan 19b. TELEPHONE NUMBER (Include area code) 301-394-3725 Standard Form 298 (Rev. 8/98) Prescribed by ANSI Std. Z39.18 ii

Contents List of Figures iv 1. Introduction 5 2. Experiment 5 3. Results 6 4. Conclusions 10 Distribution List 11 iii

List of Figures Fig. 1 Fig. 2 Optical microscope image of sample 20141120_si before phosphor spin (20141120-1116_20141120_si_om_mrk.png)...6 Optical microscope image of sample 20141120_si after phosphor spin (20141120-1208_20141120_si_om_mrk.png)...7 Fig. 3 Secondary electron image of sample 20141120_si (20141124-1532_sei_20141120_si_kwk.png)...7 Fig. 4 Fig. 5 Fig. 6 Fig. 7 Fig. 8 Optical microscope image of sample g3123p-2 before the phosphor application (20141120_1409_g3123p-2_OM_mrk.tif...8 Optical microscope image of the sample g3123p-2 after phosphor application (20141120_1415_g3123P-2_OM_mrk.tif)...8 Optical microscope image of sample g3138a-13 before the phosphor application (20141120_1350_g3138a_13_OM_mrk.tif)...9 Optical microscope image of sample g3138a-13 after phosphor application (20141120_1407_g3138a_13_OM_mrk.tif)...9 Optical microscope image of the sample (g3123p-2) after phosphor spin using HMDS and slower speed [20141120_1423_g3123p_2_OM_mrk.tif]...10 iv

1. Introduction Demand is increasing for microscale energy systems that are lightweight and have a capability to produce electricity over long periods of time. Applications of such power systems include micro-electro-mechanical systems (MEMS), sensors in remote and hostile environmental conditions, medical devices (e.g., a pacemaker), among others. The US Army has need to ease the burden on Soldiers in small units by providing lighter, wearable, and more compact power. The working principle of a betaphotovoltaic (BPV) device is similar to a solar cell, except that the electron hole pairs (EHPs) are generated in a BPV by photons emitted from a phosphor instead of natural light. The phosphor emits photons when beta rays, emitted by a beta source material, are incident on it. In order to generate maximum EHPs, it is important to have a uniform coating of phosphor so beta rays are incident on a smooth surface of phosphor for a maximum photon generation. In semiconductor device fabrication, uniform coatings of photoresist are routinely achieved via the technique of spinning. Our objective was to modify this technique to apply a uniform coating of phosphor on our devices. The general process steps of this technique are: mix phosphor and water, apply mixture to the sample, spin, and bake. The details of this experiment are discussed below. 2. Experiment A mixture was made with LaPO4 phosphor and water (0.15 g of LaPO4 was added to 2.35 g of water). The mixture was sonicated and stirred for 2 min. I observed that the phosphor does not fully dissolve in water. If the solution is not stirred for approximately 2 min, the phosphor powder settles on the bottom of the beaker. The mixture was applied to the sample with a dropper and the sample was spun using a spinner. The sample was baked on a hot plate to dry off the water. I performed the following experiments to see if a uniform coating of phosphor is achieved via the spinning technique: 1. Mixture applied to a silicon sample, spun at 2000 rpm for 30 s, and baked at 110 ºC for 30 s. 2. Mixture applied to a gallium nitride sample with fabricated devices on the surface. Spun at 2000 rpm for 30 s and baked at 110 ºC for 30 s. 5

3. Mixture applied to a gallium nitride sample with no devices on the surface, spun at 1000 rpm for 20 s, and baked at 110 ºC for 15 s. 4. Hexamethyl disilizane (HMDS) solution applied to the sample (g3123p- 2), spun the sample at 1000 rpm for 15 s and baked at 110 ºC for 15 s. The phosphor mixture is applied to the sample, spun at 1000 rpm for 15 s and baked at 110 ºC for 15 s. The parameters of the experiment were changed because we wanted to observe how the uniformity of phosphor is affected when the substrate is changed, how the sample is spun with or without fabricated devices on the surface, the spinner speed, or the use of HMDS (adhesion promoter) before phosphor application. The results of this experiment are discussed below. 3. Results Figure 1 depicts the optical microscope image of the silicon surface before the phosphor was applied, while Fig. 2 shows the surface after phosphor application. As shown in Fig. 2, a uniform coverage of phosphor was not observed on the surface. Fig. 1 Optical microscope image of sample 20141120_si before phosphor spin (20141120-1116_20141120_si_om_mrk.png) 6

Fig. 2 Optical microscope image of sample 20141120_si after phosphor spin (20141120-1208_20141120_si_om_mrk.png) Secondary electron images were captured on the sample (20141120_si) using the scanning electron microscope (SEM). When an SEM image is taken at a higher resolution, the grains of LaPO4 are visible on the surface. Grain size is on the order of 100s of nm, as shown in Fig. 3. Fig. 3 Secondary electron image of sample 20141120_si (20141124-1532_sei_20141120_si_kwk.png) I observed that the LaPO4 phosphor does not stick well to the surface. When the sample is baked to dry off the water, the powder remains on the surface but it comes off easily during handling. This is akin to what would have happened had 7

we not had the mixture and just applied the LaPO4 phosphor directly to the surface. To test uniformity of phosphor application to a sample with devices fabricated on the surface, I performed the same experiment as above on sample g3123p-2. Sample g3123p-2 was fabricated with betavoltaic devices on the surface, similar to the device structures for the betaphotovoltaic project. Figure 4 depicts the optical microscope image of the surface before the phosphor was applied, while Fig. 5 shows the surface after phosphor application. As shown on Fig. 5, a nonuniform patchy coverage of phosphor was observed. Fig. 4 Optical microscope image of sample g3123p-2 before the phosphor application (20141120_1409_g3123p-2_OM_mrk.tif Fig. 5 Optical microscope image of the sample g3123p-2 after phosphor application (20141120_1415_g3123P-2_OM_mrk.tif) To test the uniformity of phosphor application at a slower speed, I applied the LaPO4 phosphor mixture to sample, g3138a-13, and spun it at 1000 rpm for 20 s. Figure 6 shows the optical microscope image of sample before phosphor 8

application, while Fig. 7 shows the optical microscope image after phosphor application. Spinning at a slower speed didn t change anything. The same nonuniform patchy coverage of phosphor was observed, as shown in Fig. 7. Fig. 6 Optical microscope image of sample g3138a-13 before the phosphor application (20141120_1350_g3138a_13_OM_mrk.tif) Fig. 7 Optical microscope image of sample g3138a-13 after phosphor application (20141120_1407_g3138a_13_OM_mrk.tif) I stripped off the patchy phosphor mixture from the g3123p-2 sample using acetone and applied HMDS on the surface before applying the phosphor mixture. HMDS is an adhesion promoter (helps in a better adhesion of photoresist to a substrate) and it is widely used in semiconductor fabrication. The use of HMDS before phosphor application did not help, either, as the same non-uniform patchy coverage of LaPO4 phosphor was observed, as shown in Fig. 8. 9

Fig. 8 Optical microscope image of the sample (g3123p-2) after phosphor spin using HMDS and slower speed [20141120_1423_g3123p_2_OM_mrk.tif] 4. Conclusions The typical photoresist spinning technique used in semiconductor fabrication does not yield a uniform coverage of phosphor on the devices and, therefore, is unsuited for this application. We experimented with several matrix parameters: changed the substrate, spun the sample at a slower speed with and without devices on the surface, and applied HMDS before the phosphor application. A uniform coating of phosphor was not achieved under any of these circumstances. Applying a uniform coating of phosphor is one of the most critical steps in the betaphotovoltaics project. The technique of spinning does not appear to be suitable for this purpose. 10

1 DEFENSE TECHNICAL (PDF) INFORMATION CTR DTIC OCA 2 DIRECTOR (PDF) US ARMY RESEARCH LAB RDRL CIO LL IMAL HRA MAIL & RECORDS MGMT 1 GOVT PRINTG OFC (PDF) A MALHOTRA 3 DIRECTOR (PDF) US ARMY RESEARCH LAB JOSHUA SMITH KENNETH JONES MUHAMMAD R KHAN 11

INTENTIONALLY LEFT BLANK. 12