Power Optimization of Linear Feedback Shift Register (LFSR) using Power Gating

Similar documents
DESIGN OF LOW POWER TEST PATTERN GENERATOR

Design of Fault Coverage Test Pattern Generator Using LFSR

A Novel Low Power pattern Generation Technique for Concurrent Bist Architecture

ISSN:

Analysis of Low Power Test Pattern Generator by Using Low Power Linear Feedback Shift Register (LP-LFSR)

LFSR Counter Implementation in CMOS VLSI

DIFFERENTIAL CONDITIONAL CAPTURING FLIP-FLOP TECHNIQUE USED FOR LOW POWER CONSUMPTION IN CLOCKING SCHEME

International Journal of Scientific & Engineering Research, Volume 5, Issue 9, September ISSN

A New Approach to Design Fault Coverage Circuit with Efficient Hardware Utilization for Testing Applications

Design of Test Circuits for Maximum Fault Coverage by Using Different Techniques

Bit Swapping LFSR and its Application to Fault Detection and Diagnosis Using FPGA

LOW POWER LEVEL CONVERTING FLIP-FLOP DESIGN BY USING CONDITIONAL DISCHARGE TECHNIQUE

CMOS Testing-2. Design for testability (DFT) Design and Test Flow: Old View Test was merely an afterthought. Specification. Design errors.

Implementation of Low Power Test Pattern Generator Using LFSR

DESIGN AND IMPLEMENTATION OF SYNCHRONOUS 4-BIT UP COUNTER USING 180NM CMOS PROCESS TECHNOLOGY

Modifying the Scan Chains in Sequential Circuit to Reduce Leakage Current

SIC Vector Generation Using Test per Clock and Test per Scan

Power Optimization by Using Multi-Bit Flip-Flops

A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application

POWER AND AREA EFFICIENT LFSR WITH PULSED LATCHES

Design and Implementation of Uart with Bist for Low Power Dissipation Using Lp-Tpg

Design of a High Frequency Dual Modulus Prescaler using Efficient TSPC Flip Flop using 180nm Technology

TEST PATTERN GENERATION USING PSEUDORANDOM BIST

INTERNATIONAL JOURNAL OF PURE AND APPLIED RESEARCH IN ENGINEERING AND TECHNOLOGY

LOW POWER AND HIGH PERFORMANCE SHIFT REGISTERS USING PULSED LATCH TECHNIQUE

Test Pattern Generator (TPG) for Low Power Logic Built In Self Test (BIST )

LOW POWER BASED DUAL MODE LOGIC GATES USING POWER GATING TECHNIQUE

Low Power Approach of Clock Gating in Synchronous System like FIFO: A Novel Clock Gating Approach and Comparative Analysis

Dynamic Power Reduction in Sequential Circuits Using Look Ahead Clock Gating Technique R. Manjith, C. Muthukumari

Design and Simulation of a Digital CMOS Synchronous 4-bit Up-Counter with Set and Reset

nmos transistor Basics of VLSI Design and Test Solution: CMOS pmos transistor CMOS Inverter First-Order DC Analysis CMOS Inverter: Transient Response

DESIGN AND TESTING OF HIGH SPEED MULTIPLIERS BY USING LINER FEEDBACK SHIFT REGISTER

Modified Ultra-Low Power NAND Based Multiplexer and Flip-Flop

Design and Analysis of Modified Fast Compressors for MAC Unit

Comparative Analysis of Stein s. and Euclid s Algorithm with BIST for GCD Computations. 1. Introduction

[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785

Gated Driver Tree Based Power Optimized Multi-Bit Flip-Flops

DETERMINISTIC SEED RANGE AND TEST PATTERN DECREASE IN LOGIC BIST

Leakage Current Reduction in Sequential Circuits by Modifying the Scan Chains

Random Access Scan. Veeraraghavan Ramamurthy Dept. of Electrical and Computer Engineering Auburn University, Auburn, AL

Improve Performance of Low-Power Clock Branch Sharing Double-Edge Triggered Flip-Flop

DESIGN AND ANALYSIS OF ADDER CIRCUITS USING LEAR SLEEP TECHNIQUE IN CMOS TECHNOLOGIES

DESIGN AND SIMULATION OF A CIRCUIT TO PREDICT AND COMPENSATE PERFORMANCE VARIABILITY IN SUBMICRON CIRCUIT

Implementation of UART with BIST Technique

Dual Edge Triggered Flip-Flops Based On C-Element Using Dual Sleep and Dual Slack Techniques

data and is used in digital networks and storage devices. CRC s are easy to implement in binary

VHDL Implementation of Logic BIST (Built In Self Test) Architecture for Multiplier Circuit for High Test Coverage in VLSI Chips

Implementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters

LFSR TEST PATTERN FOR FAULT DETECTION AND DIAGNOSIS FOR FPGA CLB CELLS

VLSI System Testing. BIST Motivation

AN EFFICIENT LOW POWER DESIGN FOR ASYNCHRONOUS DATA SAMPLING IN DOUBLE EDGE TRIGGERED FLIP-FLOPS

Power Efficient Design of Sequential Circuits using OBSC and RTPG Integration

Reduction of Clock Power in Sequential Circuits Using Multi-Bit Flip-Flops

DESIGN OF TEST PATTERN OF MULTIPLE SIC VECTORS FROM LOW POWER LFSR THEORY AND APPLICATIONS IN BIST SCHEMES

New Single Edge Triggered Flip-Flop Design with Improved Power and Power Delay Product for Low Data Activity Applications

INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATION ENGINEERING & TECHNOLOGY (IJECET)

IN DIGITAL transmission systems, there are always scramblers

Instructions. Final Exam CPSC/ELEN 680 December 12, Name: UIN:

Final Exam CPSC/ECEN 680 May 2, Name: UIN:

A NOVEL DESIGN OF COUNTER USING TSPC D FLIP-FLOP FOR HIGH PERFORMANCE AND LOW POWER VLSI DESIGN APPLICATIONS USING 45NM CMOS TECHNOLOGY

ANALYSIS OF POWER REDUCTION IN 2 TO 4 LINE DECODER DESIGN USING GATE DIFFUSION INPUT TECHNIQUE

Low Power D Flip Flop Using Static Pass Transistor Logic

CMOS DESIGN OF FLIP-FLOP ON 120nm

A CHARGE RECYCLING THREE-PHASE DUAL-RAIL PRE-CHARGE LOGIC BASED FLIP-FLOP

140 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 12, NO. 2, FEBRUARY 2004

VLSI Design: 3) Explain the various MOSFET Capacitances & their significance. 4) Draw a CMOS Inverter. Explain its transfer characteristics

CMOS Design Analysis of 4 Bit Shifters 1 Baljot Kaur, M.E Scholar, Department of Electronics & Communication Engineering, National

DESIGN OF DOUBLE PULSE TRIGGERED FLIP-FLOP BASED ON SIGNAL FEED THROUGH SCHEME

Available online at ScienceDirect. Procedia Computer Science 46 (2015 ) Aida S Tharakan a *, Binu K Mathew b

University College of Engineering, JNTUK, Kakinada, India Member of Technical Staff, Seerakademi, Hyderabad

Fpga Implementation of Low Complexity Test Circuits Using Shift Registers

Fully Static and Compressed Topology Using Power Saving in Digital circuits for Reduced Transistor Flip flop

A Novel Method for UVM & BIST Using Low Power Test Pattern Generator

Parametric Optimization of Clocked Redundant Flip-Flop Using Transmission Gate

Area Efficient Pulsed Clock Generator Using Pulsed Latch Shift Register

Design And Analysis of Clocked Subsystem Elements Using Leakage Reduction Technique

Figure.1 Clock signal II. SYSTEM ANALYSIS

DESIGN OF RANDOM TESTING CIRCUIT BASED ON LFSR FOR THE EXTERNAL MEMORY INTERFACE

P.Akila 1. P a g e 60

Diagnosis of Resistive open Fault using Scan Based Techniques

Performance Driven Reliable Link Design for Network on Chips

A High- Speed LFSR Design by the Application of Sample Period Reduction Technique for BCH Encoder

A Low-Power CMOS Flip-Flop for High Performance Processors

Design of BIST with Low Power Test Pattern Generator

Design for Test. Design for test (DFT) refers to those design techniques that make test generation and test application cost-effective.

Abstract 1. INTRODUCTION. Cheekati Sirisha, IJECS Volume 05 Issue 10 Oct., 2016 Page No Page 18532

Design And Analysis Of Implicit Pulsed Double Edge Triggered Clocked Latch For Low Power Applications

Built-In Proactive Tuning System for Circuit Aging Resilience

ELEC 4609 IC DESIGN TERM PROJECT: DYNAMIC PRSG v1.2

Doctor of Philosophy

LOW-POWER CLOCK DISTRIBUTION IN EDGE TRIGGERED FLIP-FLOP

An Efficient Reduction of Area in Multistandard Transform Core

Design of Low Power D-Flip Flop Using True Single Phase Clock (TSPC)

International Journal of Computer Trends and Technology (IJCTT) volume 24 Number 2 June 2015

A Power Efficient Flip Flop by using 90nm Technology

FP 12.4: A CMOS Scheme for 0.5V Supply Voltage with Pico-Ampere Standby Current

I. INTRODUCTION. S Ramkumar. D Punitha

Design and Analysis of a Linear Feedback Shift Register with Reduced Leakage Power

Overview: Logic BIST

POWER OPTIMIZED CLOCK GATED ALU FOR LOW POWER PROCESSOR DESIGN

Transcription:

Power Optimization of Linear Feedback Shift Register (LFSR) using Rebecca Angela Fernandes 1, Niju Rajan 2 1Student, Dept. of E&C Engineering, N.M.A.M Institute of Technology, Karnataka, India 2Assistant Professor, Dept. of E&C Engineering, N.M.A.M Institute of Technology, Karnataka, India ---------------------------------------------------------------------***--------------------------------------------------------------------- Abstract - In this paper a method to reduce the power consumption of the popular Linear Feedback Shift Register is presented. A traditional 16-bit Linear Feedback Shift Register (LFSR) without power gating technique is implemented and the leakage power report is then compared with LFSR designed using different power gating techniques. In the circuit as the scaling increase the leakage power increases. Out of all the available solutions to reduce leakage power dissipation, power-gating has proved to be efficient in reducing stand-by leakage currents in the idle mode. Power gating is a technique used to reduce the power consumption in integrated circuit design, by shutting off the current to blocks of the circuit that are not in use. The basic element used for shutting down the power in power gating technique is a sleep transistor. The basic idea of power gating is to separate the VDD or GND power supply from the standard cells of the specific design hierarchy. Appropriate sized PMOS or NMOS transistors are used as sleep transistor. Key Words: Power gating, Linear Feedback Shift Register (LFSR), Fine Grain (FGPG), Coarse Grain Power (CGPG), Leakage power. 1. INTRODUCTION Electronic circuits are confronted with the problem of delivering high performance with limited power consumption. Low power consumption is required to increase the battery life of various components and also to reduce many impacts like induced noise cooling and heat dissipation. Electronic circuits are made up of heterogeneous components and at different interval of time they may consume power from the power budget. Dynamic Power Management methodology will reconfigure the system to provide the requested services with minimum number of active components by turning-off components in sleep mode [1]. easier to reduce the leakage power during idle or sleep mode of the circuit [2]. In power gating technique a NMOS sleep transistor is inserted between the virtual and actual ground rail and a PMOS sleep transistor is inserted between the virtual and actual V DD. The input to the sleep transistor can be through a gate control or by a source. The sleep transistor will be turned-on when the circuit is in active mode and in order to reduce the leakage path the sleep transistor will be turnedoff during the sleep mode [3]. 2. TRADITIONAL LFSR The Linear Feedback Shift Register (LFSR) is a shift register which sequences through (2 n -1) states, where n is the total number of shift registers used in designing the LFSR [7]. This is achieved by an array of D flip-flops where, XOR or XNOR gates are used for performing linear functions, as given in Fig.1[4], [6].They are described by the polynomial, (1) Where the coefficients denoted as represents the polynomial characteristic. LFSR exhibits high-speed bit generation and used in pseudo Noise sequences, digital counters etc. High power utilization is the disadvantage of these generators [4], [5]. LFSRs are frequently used as pseudorandom pattern generators to generate a random number of 1s and 0s. There are two types of LFSR s-external feedback LFSR s and internal feedback LFSR s. The maximum-length of an LFSR sequence is 2n-1. Power dissipation can be mainly classified into dynamic power dissipation and static power dissipation. Dynamic power dissipation is due to switching activity and it contributes to the major power dissipation in VLSI circuits. Various clock gating techniques are used to reduce dynamic power dissipation in circuits. Static power dissipation is due to leakage current and it is very small in VLSI circuits. Power gating techniques are used to reduce leakage power in circuits. Reducing both these power dissipation can reduce the power in circuits. It is difficult to reduce leakage power when the circuit is working or operating. Therefore it is Fig. -1: Traditional n-bit LFSR 3. POWER GATING TECHNIQUES 3.1 Fine Grain (FGPG) Fine Grain (FGPF) [8] is a process of inserting a sleep transistor to each cell as shown in Fig.2. Sleep 2018, IRJET Impact Factor value: 6.171 ISO 9001:2008 Certified Journal Page 3124

transistor is added to every cell that is to be turned off imposes a large area penalty and individually gating the power of every cluster of cells creates timing issues introduced by inter-cluster voltage variation, these are very difficult to resolve. Fig. -4: Schematic of 2-input and 3-inputt NAND gate Fig.5 shows the schematic of D flip-flop without using power gating. Fig.6 shows the transient response of D flip-flop which is obtained by launching ADEL. Fig. -2: Fine Grain 3.2 Coarse Grain (CGPG) The CGPG [8] Process implements the grid style sleep transistors which drives cells locally through shared virtual ground and virtual V DD networks. This technique introduces less sensitive to PVT variation & imposes a smaller area overhead than the implementations based on cell- or cluster. In Fig.3 one sleep transistor is added to a cluster of cells. Fig. -5: Schematic of D flip-flop Fig. -3: Coarse Grain 4. IMPLEMENTATION AND RESULTS D flip-flop and Linear Feedback Shift Register (LFSR) circuits are designed using Cadence Virtuoso tool with 90nm CMOS technology. The transient analysis is done by launching ADEL for verification of schematic results. The power report is obtained for D flip-flop, 16-bit and 32-bit Linear Feedback Shift Register (LFSR) with and without using power gating technique. 4.1 D Flip-Flop Fig. -6: Transient response of D flip-flop Fig.7 shows the schematic of 2-input NAND gate and 3-input NAND gate where one PMOS and one NMOS sleep transistor is inserted in each NAND circuit respectively. These circuits are used to design the D flip-flop with Fine Grain Power (FGPG). Fig.4 shows the schematic of 2-input NAND gate and 3-input NAND gate respectively. These circuits are used to design the D flip-flop without using power gating. 2018, IRJET Impact Factor value: 6.171 ISO 9001:2008 Certified Journal Page 3125

Fig. -7: 2-input and 3-input NAND gate used in D flip-flop with FGPG Fig.8 shows the schematic of D flip-flop using Fine Grain (FGPG), where one NMOS sleep transistor is inserted between the virtual and actual ground rail of each NAND gate and one PMOS sleep transistor is inserted between the virtual and actual VDD. Fig.9 shows the transient response of D flip-flop which is obtained by launching ADEL. Fig. -10: 2-input and 3-input NAND gates used in D flipflop with CGPG Fig.11 shows the schematic of D flip-flop using Coarse Grain (CGPG), where one NMOS sleep transistor is inserted between the virtual and actual ground rail of all the NAND gates and one PMOS sleep transistor is inserted between the actual and virtual VDD. Fig.12 shows the transient response of D flip-flop which is obtained by launching ADEL. Fig. -8: Schematic of a D flip-flop with Fine Grain Power Fig. -11: Schematic of D flip-flop with Coarse Grain Power Fig. -9: Transient response of D flip-flop with Fine Grain Fig.10 shows the schematic of 2-input NAND gate and 3- input NAND gate, where only one NMOS and PMOS sleep transistor needs to be inserted between all the NAND circuits used to design the D flip-flop. These circuits are used to design the D flip-flop with Coarse Grain (CGPG). Fig. -12: Transient response of D flip-flop with Coarse Grain From Fig.6, Fig.9 and Fig.12 it can be observed that the D flip-flop captures the value of the D-input at a definite portion of the clock cycle (such as the rising edge of the clock). That captured value becomes the Q output. At other times, the output Q does not change. The advantage of the D flip-flop is that the signal on the D input pin is taken the moment the flip-flop is clocked, and 2018, IRJET Impact Factor value: 6.171 ISO 9001:2008 Certified Journal Page 3126

subsequent changes on the D input will be ignored until the next clock event. 4.2 16-bit Linear Feedback Shift Register The 16-bit LFSR is designed for the polynomial. Fig.13 shows the schematic for 16-bit LFSR, where the 16-bit LFSR is designed using D flip-flop without using power gating as shown in Fig.5. Fig.14 shows the transient response of 16-bit LFSR. Fig. -16: Transient response of 16-bit LFSR with Fine Grain Fig.17 shows the schematic for 16-bit LFSR with Coarse Grain (CGPG) technique, where the LFSR is designed using power gated D flip-flops as shown in Fig.11 and XOR gates. Fig.18 shows the transient response of 16-bit LFSR using CGPG. Fig. -13: Schematic of 16-bit LFSR Fig. -14: Transient response of 16-bit LFSR Fig. -17: Schematic of 16-bit LFSR with Coarse Grain Fig.15 shows the schematic for 16-bit LFSR with Fine Grain (FGPG) technique, where the16-bit LFSR is designed using power gated D flip-flop as shown in Fig.8 and XOR gates. Fig.16 shows the transient response of 16-bit LFSR using FGPG. Fig. -18: Transient response of 16-bit LFSR with Coarse Grain Fig. -15: Schematic of 16-bit LFSR with Fine Grain Power The 16-bit Linear Feedback Shift Register (LFSR) sequences through (216-1) states, where 16 is the total number of shift registers used in designing the LFSR. This is achieved by an array of D flip-flop where, XOR gates are used to perform linear functions. The maximum-length of an LFSR sequence is 216-1.It can be observed from Fig.14, Fig.16 and 2018, IRJET Impact Factor value: 6.171 ISO 9001:2008 Certified Journal Page 3127

Fig.18 that the sequence repeats after every 65,535 clock cycles. 5. POWER ANALYSISP The Leakage power dissipation is calculated using Cadence tool Calculator. D flip-flop Table -1: Power analysis of D Flip-Flop D flip-flop without power gating D flip-flop with Fine Grain Power D flip-flop with Coarse Grain Maximum Leakage Power Dissipation 35.60 uw 27.09 uw 15.92 uw Table 1 shows the leakage power of a normal D flip-flop and also power gated D flip-flop s with Fine Grain (FGPG) and Coarse Grain (CGPG) techniques. There is 23.90% leakage power reduction in D flip-flop implemented using Fine Grain (FGPG) technique and 55.20% leakage power reduction in D flip-flop implemented using Coarse Grain (CGPG) technique compared to the normal D flip-flop. 16-bit LFSR Table -2: Power analysis of 16-bit LFSR 16-bit LFSR without power gating 16-bit LFSR with Fine Grain Power 16-bit LFSR with Coarse Grain Maximum Leakage Power Dissipation 688.2 uw 425.6 uw 177.5 uw Table 2 shows the leakage power of a normal 16-bit LFSR and also power gated 16-bit LFSR implemented using D flipflop s with Fine Grain (FGPG) and Coarse Grain (CGPG) techniques. There is 38.15% leakage power reduction in 16-bit LFSR implemented using Fine Grain (FGPG) technique and 74.2% leakage power reduction in 16-bit LFSR implemented using Coarse Grain (CGPG) technique compared to the normal 16-bit LFSR. 6. CONCLUSION The 16-bit Linear Feedback Shift Register (LFSR) has been designed for the polynomial.the D- flip flop, XOR gate and LFSR were designed using Cadence Virtuoso tool. The leakage power of normal D flip-flop and 16-bit LFSR has been compared with the power gated D flipflop and 16- bit LFSR, it is observed that there is leakage power reduction in the power gated circuits when compared to the normal circuits. Linear Feedback Shift Register with higher order bits can be used to generate pseudorandom test vectors. High fault coverage can be obtained by using more test vectors. Hardware used for LFSR is less and hence it is a preferable for BIST pattern generation. REFERENCES [1] Saraswathi T., Ragini. K. and Ganapathy Reddy Ch, A Review on Power optimization of Linear Feedback Shift Register (LFSR) for Low Power Built In Self Test (BIST), Electronics Computer Technology (ICECT), 3 rd International Conference, pp. 172-176, 2011. [2] Balwinder Singh, Arun Khosla and Sukhleen Bindra, Power Optimization of Linear Feedback Shift Register (LFSR) for Low Power BIST, Advance Computing Conference, IEEE International, pp. 311-314, 2009. [3] Chi-Yi Yeh, Hung-Ming Chen, Li-Da Huang, Wei-Ting Wei, Chao-Hung Lu and Chien-Nan Liu, Using Power Techniques in Area-Array SoC Floorplan Design, SOC Conference, IEEE International, pp. 233-236, 2007. [4] Madhushree K. and Niju Rajan, Dynamic Power Optimization of LFSR Using Clock, International Conference on Innovations in Information, Embedded and Communication Systems (ICIIECS), vol. 5, pp. 429-432, 2017. [5] Madhushree K. and Niju Rajan, Dynamic Power Optimization Using Look-Ahead Clock Technique, IEEE International Conference On Recent Trends In Electronics Information Communication Technology, pp. 258-262, 2017. [6] Amit Kumar Panda, Praveena Rajput and Bhawna Shukla, FPGA Implementation of 8, 16 and 32 bit LFSR with Maximum Length Feedback Polynomial Using vhdl, International Conference System and Network Technology, 2012. [7] Kawal.K, Saluja, Linaer Feedback Shift Register Theory and Application, Department of Electronics and Communication Engineering, University of Wisconsin, Madison, Oct 1988. [8] Akhila Abba and K Amarender, Improved Power Technique for Leakage Power Reduction, International Journal Of Engineering And Science, Volume 4, Issue 10, pp. 06-10, October 2014. 2018, IRJET Impact Factor value: 6.171 ISO 9001:2008 Certified Journal Page 3128