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PRODUCT/PROCESS CHANGE NOTIFICATION PCN MMS-SNV/07/2327 Notification Date 02/22/2007 STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I2C Bus Based Serial EEPROM Memories (replaces PCN 1663) SNV - MEMORY 1/13

PCN MMS-SNV/07/2327 - Notification Date 02/22/2007 Table 1. Change Identification Product Identification (Product Family/Commercial Product) Type of change Reason for change Description of the change M24C64 Product family Waferfab location change Second source and production capacity increase ST AMK (Singapore) new and additional wafer diffusion plant Product Line(s) and/or Part Number(s) Description of the Qualification Plan Change Product Identification See attached See attached Process and fab ID Manufacturing Location(s) Table 2. Change Implementation Schedule Forecasted implementation date for change Forecasted availabillity date of samples for customer Forecasted date for STMicroelectronics change Qualification Plan results availability Estimated date of changed product first shipment 15-Feb-2007 15-Feb-2007 15-Feb-2007 24-May-2007 2/13

PCN MMS-SNV/07/2327 - Notification Date 02/22/2007 Table 3. List of Attachments Customer Part numbers list Qualification Plan results Customer Acknowledgement of Receipt PCN MMS-SNV/07/2327 Please sign and return to STMicroelectronics Sales Office Notification Date 02/22/2007 Qualification Plan Denied Qualification Plan Approved Name: Title: Company: Change Denied Change Approved Date: Signature: Remark 3/13

PCN MMS-SNV/07/2327 - Notification Date 02/22/2007 DOCUMENT APPROVAL Name Poli, Christian Rodrigues, Benoit Yackowlew, Nicolas Function Division Marketing Manager Division Product Manager Division Q.A. Manager 4/13

PRODUCT / PROCESS CHANGE NOTIFICATION STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories This PCN replaces NVM06/1663 from March 2006 What is the change? The M24C64, I²C bus based EEPROM, will now also be diffused in the ST AMK (Singapore) 6 inch wafer diffusion plant using the same CMOSF6DP 26% DM Process Technology already in production in the Chartered (Singapore) 8 inch wafer diffusion plant. Why? The strategy of the STMicroelectronics Memories division is to support the growth of our customers on a long-term basis. In line with this commitment, the qualification of the ST AMK (Singapore) 6 inch wafer diffusion plant will secure a second source. It will also increase the Serial EEPROM memory production capacity and throughput, reduce the lead-time and consequently improve the service to our customers. When? The production of the M24C64 in the ST AMK (Singapore) 6 inch wafer diffusion plant will ramp up in February 2007 and shipments could start from May 2007 onward. How will the change be qualified? The M24C64 family is qualified using the standard STMicroelectronics Corporate Procedures for Quality and Reliability, the Qualification Report QREE0604 is now available. Memories Division 1/8

STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories How can the change be seen? - BOX LABEL MARKING On the BOX LABEL MARKING, the change is visible inside the Finished Good Part Number: The Process Technology identifier is C for ST AMK (Singapore), the identifier being P for Chartered 8 (Singapore). The change is also visible inside the Trace Code: The Wafer diffusion plant identifier is V6 for ST AMK (Singapore), the identifier being F2 for Chartered 8 (Singapore). Example for M24C64-WMN6P (64Kbit, 2.5V to 5.5V Vcc range, SO8 RoHS* compliant package) Commercial Part Number (CP) Finished Good Part Number (FG) M24C64-WMN6P M24C64-WMN6P/C x x x Process Technology: C for ST AMK (Singapore) P for Chartered 8 (Singapore) Mask revision and/or Wafer diffusion plant Assembly and Test & Finishing plants Combined to one digit when same plants Trace Code: PPYWWLLL WX TF PP = Assembly country & plant Y = Year of Assembly WW = Assembly Week code LLL = chronological sequence WX = Wafer diffusion plant: V6 for ST AMK (Singapore) F2 for Chartered 8 (Singapore) TF = Test & Finishing country & plant *RoHS: Restriction of the use of certain Hazardous Substances in electrical and electronic equipments Memories Division 2/8

STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories How can the change be seen? - DEVICE MARKING On the DEVICE MARKING, the change is visible on the top side marking, inside the second line of the trace code (COO YWWT): The Process Technology identifier is C for ST AMK (Singapore), the identifier being P for Chartered 8 (Singapore). Chartered 8 (Singapore) ST AMK 6 (Singapore) SO8 Example: M24C64-RMN6TP 24C64RP PYWWP 24C64RP PYWWC PDIL8 M24C64-WBN6P E COO P 24C64WP PLLYWW E COO C 24C64WP PLLYWW TSSOP8 (Amkor) Example: M24C64-WDW6TP TOP SIDE BACK SIDE 2464 WP PPYWW LLL P 2464 WP PPYWW LLL C The traceability for each device is as follows: P (or PP) = Assembly country and plant Y = Last digit of the Year of Assembly WW = Assembly Week code T = Process Technology code/ Wafer fab ID: C for ST AMK (Singapore) P for Chartered 8 (Singapore) LLL = Chronological sequence COO = Country-of-Origin E = ECOPACK identifier Memories Division 3/8

STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories APPENDIX A - Product / Process Change Notification Product family / Commercial products: Customer(s): Type of change: Reason for the change: Description of the change: M24C64 Product family All Additional wafer diffusion plant Second source and production capacity increase ST AMK (Singapore) new and additional wafer diffusion plant Forecast date of the change: February 2007 Forecast availability date of qualification sample for the customer(s): Forecast date for the internal STMicroelectronics change, Qualification report availability: Marking to identify the changed product: Description of the qualification program: Product Line(s) and/or Part Number(s): Manufacturing location: Estimated date of first shipment: Available Available Process and fab ID Standard ST Microelectronics Corporate Procedures for Quality and Reliability See appendix B STMicroelectronics AMK (Singapore) 6 inch wafer diffusion plant May 2007 (or earlier upon customer approval) Division Product Manager: B. RODRIGUES Date: Group QA Manager: N. YACKOWLEW Date: Memories Division 4/8

STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories APPENDIX B: Concerned Products M24C64 Commercial sales types M24C64-RDW6TP M24C64-RMN6P M24C64-RMN6TP M24C64-WBN6P M24C64-WDW6TP M24C64-WMN6P M24C64-WMN6TP Memories Division 5/8

STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories PRODUCT DESCRIPTION APPENDIX C: Qualification Plan Product name Device to qualify M24C64 (C24641CA) Qualified similar device none Memory size 64K none Bus protocol I2C none Process CMOSF6DP26% DM none SIMILARITY The CMOSF6DP26% Process Technology is already qualified in ST Rousset (France) 6 wafer diffusion plant for standard products and being transferred to AMK 6 fab. CHARACTERIZATION Table 1. Characterization requirements. Number of lots Parameters Vcc range Temperature range 3 All According to Datasheet -40 C/85 C RELIABILITY Table 2. Product qualification. Die-related reliability tests Sub Test Procedure group 1 High Temperature Operating Life 2 Low Temperature Operating Life 3 High Temperature Bake 4 Erase/Write Cycles and Bake 5 High Temperature Bake 6 Electrostatic Discharge Method AEC- Q100-005 JESD22 - A 108 AEC- Q100-005 JESD22- A103 AEC Q100-002 & 003 7 Latch-Up AEC Q100-004 Test Conditions 1 Million cycles at 25 C or 100K cycles at 125 C, then HTOL 150 C, 6V (VCC + 20%), 1000 hrs Num of lots Criteria 3 0/77 40 C, 6V (VCC + 20%), 504 hrs 3 0/77 1 Million cycles at 25 C or 100K cycles at 125 C, then Bake 150 C, 1000 hrs 1,000,000 E/W cycles Bake: 150 C, 168 hrs or 200 C, 48 hrs 3 0/77 3 0/77 Retention bake 200 C, 1,000 hrs 3 0/77 Human body model: 1.5k, 100pF Machine Model 0, 200pF 1 0/9 Max. operating temperature 1 0/6 Memories Division 6/8

Table 3. Product qualification. Package-related reliability tests Test Procedure Electrostatic Discharge CDM Method Test Conditions Num of lots Criteria Preconditioning AEC - Q100 - J STD-020C Level 1 3 0 fail Pressure Pot AEC Q100 - JA 102 121 C, 2atm, 100% RH, 96hr 3 0/77 Temperature and Humidity AEC Biase Q100 - JA 101 85 C, 85% RH, 5.5V, 1008hr 3 0/77 Temperature Cycling AEC Q100 - JA 104-65 C / 150 C, 1000 cycles 3 0/77 Thermal Shock JESD22-A106B -55 C / 125 C, 500 shocks 3 0/25 AEC- Charge Device Model Q100-011 (Field Induced Charge CDM) 1 0/9 High Temperature Bake AEC Q100 - JA 103 150 C, 1000hrs 3 0/77 Memories Division 7/8

PRODUCT / PROCESS CHANGE NOTIFICATION STMicroelectronics AMK (Singapore) new and additional Wafer diffusion plant for the 64Kbit I²C Bus Based Serial EEPROM Memories Document Revision History Document Revision History Date Rev. Description of the Revision Dec. 19, 2006 1.00 Draft Document creation (C. POLI) Used Source Documents Source document Title Rev.: Date:

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