UPDATE TO DOWNSTREAM FREQUENCY INTERLEAVING AND DE-INTERLEAVING FOR OFDM. Presenter: Rich Prodan

Similar documents
How to Predict the Output of a Hardware Random Number Generator

LFSRs as Functional Blocks in Wireless Applications Author: Stephen Lim and Andy Miller

Design and Implementation of Encoder for (15, k) Binary BCH Code Using VHDL

Design for Test. Design for test (DFT) refers to those design techniques that make test generation and test application cost-effective.

VLSI System Testing. BIST Motivation

DESIGN OF HIGH SPEED RECONFIGURABLE COPROCESSOR FOR INTERLEAVER AND DE- INTERLEAVER OPERATIONS

[Dharani*, 4.(8): August, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785

A High- Speed LFSR Design by the Application of Sample Period Reduction Technique for BCH Encoder

International Journal of Scientific & Engineering Research, Volume 6, Issue 3, March-2015 ISSN DESIGN OF MB-OFDM SYSTEM USING HDL

VLSI Test Technology and Reliability (ET4076)

V.Sorge/E.Ritter, Handout 5

Optimization of Multi-Channel BCH Error Decoding for Common Cases. Russell Dill Master's Thesis Defense April 20, 2015

LFSR stream cipher RC4. Stream cipher. Stream Cipher

On the design of turbo codes with convolutional interleavers

Design of Fault Coverage Test Pattern Generator Using LFSR

Synthesis Techniques for Pseudo-Random Built-In Self-Test Based on the LFSR

EFFICIENT IMPLEMENTATION OF RECENT STREAM CIPHERS ON RECONFIGURABLE HARDWARE DEVICES

NUMEROUS elaborate attempts have been made in the

CSE 352 Laboratory Assignment 3

Implementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters

Stream Cipher. Block cipher as stream cipher LFSR stream cipher RC4 General remarks. Stream cipher

True Random Number Generation with Logic Gates Only

Randomness analysis of A5/1 Stream Cipher for secure mobile communication

High Quality Uniform Random Number Generation Through LUT Optimised Linear Recurrences

Testing Sequential Circuits

Final Exam CPSC/ECEN 680 May 2, Name: UIN:

A Pseudorandom Binary Generator Based on Chaotic Linear Feedback Shift Register

Low Transition Test Pattern Generator Architecture for Built-in-Self-Test

Weighted Random and Transition Density Patterns For Scan-BIST

Reducing DDR Latency for Embedded Image Steganography

Fig 1. Flow Chart for the Encoder

Fault Analysis of Stream Ciphers

DESIGN and IMPLETATION of KEYSTREAM GENERATOR with IMPROVED SECURITY

A Compact and Fast FPGA Based Implementation of Encoding and Decoding Algorithm Using Reed Solomon Codes

MATHEMATICAL APPROACH FOR RECOVERING ENCRYPTION KEY OF STREAM CIPHER SYSTEM

Area-efficient high-throughput parallel scramblers using generalized algorithms

Power Problems in VLSI Circuit Testing

Solution of Linear Systems

Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory. National Central University

Bit Swapping LFSR and its Application to Fault Detection and Diagnosis Using FPGA

Overview: Logic BIST

Testing Digital Systems II

Low Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-Test

Transmission scheme for GEPOF

Fault Analysis of Stream Ciphers

Vignana Bharathi Institute of Technology UNIT 4 DLD

High Quality Uniform Random Number Generation Using LUT Optimised State-transition Matrices

Individual Project Report

1/ 19 2/17 3/23 4/23 5/18 Total/100. Please do not write in the spaces above.

NETFLIX MOVIE RATING ANALYSIS

Stream Ciphers. Debdeep Mukhopadhyay

SIC Vector Generation Using Test per Clock and Test per Scan

Logic Design. Flip Flops, Registers and Counters

Evaluation of Fibonacci Test Pattern Generator for Cost Effective IC Testing

data and is used in digital networks and storage devices. CRC s are easy to implement in binary

Segmented Leap-Ahead LFSR Architecture for Uniform Random Number Generator

Digital Design Datapath Components: Parallel Load Register

A High-Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability. Nikolaos Minas David Kinniment Keith Heron Gordon Russell

Title: Lucent Technologies TDMA Half Rate Speech Codec

Optimum Composite Field S-Boxes Aimed at AES

Sequential Logic. Analysis and Synthesis. Joseph Cavahagh Santa Clara University. r & Francis. TaylonSi Francis Group. , Boca.Raton London New York \

Asynchronous (Ripple) Counters

Enable input provides synchronized operation with other components

PIPELINE ARCHITECTURE FOR FAST DECODING OF BCH CODES FOR NOR FLASH MEMORY

2D Interleaver Design for Image Transmission over Severe Burst-Error Environment

Contents Circuits... 1

REDUCED-COMPLEXITY DECODING FOR CONCATENATED CODES BASED ON RECTANGULAR PARITY-CHECK CODES AND TURBO CODES

Guidance For Scrambling Data Signals For EMC Compliance

LOW TRANSITION TEST PATTERN GENERATOR ARCHITECTURE FOR MIXED MODE BUILT-IN-SELF-TEST (BIST)

Final Exam review: chapter 4 and 5. Supplement 3 and 4

LFSR Based Watermark and Address Generator for Digital Image Watermarking SRAM

Built-In Self-Test (BIST) Abdil Rashid Mohamed, Embedded Systems Laboratory (ESLAB) Linköping University, Sweden

Optimization of FPGA Architecture for Uniform Random Number Generator Using LUT-SR Family

Logic Design II (17.342) Spring Lecture Outline

Understanding Cryptography A Textbook for Students and Practitioners by Christof Paar and Jan Pelzl. Chapter 2 Stream Ciphers ver.

A Reed Solomon Product-Code (RS-PC) Decoder Chip for DVD Applications

ENGINEERING COMMITTEE Digital Video Subcommittee AMERICAN NATIONAL STANDARD ANSI/SCTE Digital Transmission Standard For Cable Television

21.1. Unit 21. Hardware Acceleration

Hardware Implementation of Viterbi Decoder for Wireless Applications

Pre-5G-NR Signal Generation and Analysis Application Note

Design of Test Circuits for Maximum Fault Coverage by Using Different Techniques

Linear-Feedback Shift-Registers (cont.)

EECS 270 Midterm 2 Exam Closed book portion Fall 2014

ECE 172 Digital Systems. Chapter 2.2 Review: Ring Counter, Johnson Counter. Herbert G. Mayer, PSU Status 7/14/2018

Department of Electrical and Computer Engineering University of Wisconsin Madison. Fall Final Examination CLOSED BOOK

Understanding Cryptography A Textbook for Students and Practitioners by Christof Paar and Jan Pelzl. Chapter 2 Stream Ciphers ver.

Statistical analysis of the LFSR generators in the NIST STS test suite

ISSN:

LFSR Test Pattern Crosstalk in Nanometer Technologies. Laboratory for Information Technology University of Hannover, Germany

Exercise 4. Data Scrambling and Descrambling EXERCISE OBJECTIVE DISCUSSION OUTLINE DISCUSSION. The purpose of data scrambling and descrambling

Analysis of Different Pseudo Noise Sequences

System Identification

Analogue Versus Digital [5 M]

A New Approach to Design Fault Coverage Circuit with Efficient Hardware Utilization for Testing Applications

Cryptography CS 555. Topic 5: Pseudorandomness and Stream Ciphers. CS555 Spring 2012/Topic 5 1

LFSR Counter Implementation in CMOS VLSI

Y. Tsiatouhas. VLSI Systems and Computer Architecture Lab. Built-In Self Test 2

Digital 1 Final Project Sequential Digital System - Slot Machine

Review paper on study of various Interleavers and their significance

TERRESTRIAL broadcasting of digital television (DTV)

Transcription:

UPDATE TO DOWNSTREAM FREQUENCY INTERLEAVING AND DE-INTERLEAVING FOR OFDM Presenter: Rich Prodan 1

CURRENT FREQUENCY INTERLEAVER 2-D store 127 rows and K columns N I data subcarriers and scattered pilots K = cccc( N I 111 ) C = N I 111(K 1) subcarriers in the last column x[12:6] row address x[5:0] column address 1 2 1 2 K-1 K Multiple clock cycles per subcarrier 4K (127 by 32 ) lookup table for the de-interleaver 127 x 12 + x 11 + x 10 x 9 x 8 + x 7 x 6 x 5 x 4 x 3 x 2 x 1 x 0 α 0 α 12 2

TWO-DIMENSIONAL STORE BLOCK STRUCTURE 2-D store 2 L rows and K columns L and K are chosen depending on FFT size N I data subcarriers and scattered pilots K = cccc( N I 2 L) C = N I 2 L (K 1) subcarriers in the last column 0 1 0 1 K-2 K-1 2 L -1 3

CRC ADDRESS GENERATOR b 0... b m-2 b m-1 + + +... + c 0 c 1 c m-1 g m =1 g m-1 g m-2... g 1 g 0 =1 m-stage linear feedback shift register (LFSR) for calculating the CRC of each row address Defined using a primitive generator polynomial of degree m = L: G X = g m X m + g m 1 X m 1 + g m 2 X m 2 + + g 2 X 2 + g 1 X 1 + g 0 Finite (Galois) field GF[2]: g k = 0 or 1 Input sequential row address b m-1, b m-2,, b 1, b 0 Output permuted row address = CRC value c m-1, c m-2,, c 1, c 0 4

FREQUENCY INTERLEAVING PROCESS Write successive consecutive subcarriers into the 2-D store in the row given by the L bit CRC value of each L bit row address. Rotate the subcarriers in each row written by the same L bit CRC value of the row address modulo the number of columns in that row (either modulo K for a row below C or modulo K-1 for row C and higher) using a right circular shift. Rotate the subcarriers in each column by the L bit CRC value of [K- 1 minus the column address] using a downward circular shift. Note that the last column K-1 with a CRC value of 0 in not rotated. Read the subcarriers out of the 2-D store column-wise from row 0, column 0 to row C-1, column K-1. 5

ROW AND COLUMN ROTATION 0 1 2 125 126 127 Row Rotation by 2 126 127 0 123 124 125 (a) 0 1 2 126 127 0 Column Rotation by 2 125 126 127 123 124 125 (b) 6

Permuted output subcarrier number in the 2-D store in row r, column c as sc(r,c) given by: ss r, c = ss 0 r CCC K c mmm 2 L + c r CCC K c mmm 2 L mmm M, wwwww M = K, fff r CCC K c K 1, ooooooooo mmm 2 L < C sc 0 [n] is an array of 2 L elements where each element contains the cumulative number of subcarriers previously written into the 2-D store Represents the starting (i.e. lowest) subcarrier number in a permuted row Note that if the last column contains fewer subcarriers than 2 L, the cumulative value in sc 0 [n] takes into account those previously written permuted output rows that were shorter by one subcarrier Large 2-D store Lookup Table is not needed Direct calculation without variable number of clock cycles 7

FREQUENCY DE-INTERLEAVING PROCESS Write the subcarriers into the 2-D store column-wise from column 0, row 0 to column K-1, row C. Rotate the subcarriers in each column by the L bit CRC value of [K- 1 minus the column address] using an upward circular shift (reverse of interleaver). Note that the last column K-1 with a CRC value of 0 in not rotated. Rotate the subcarriers in each row written by the same L bit CRC value of the row address modulo the number of columns in that row (either modulo K for a row below C or modulo K-1 for row C and higher) using a left circular shift (reverse interleaver). Read the subcarriers out of the 2-D store row-wise in the row order given by the L bit CRC value of each L bit row address skipping the last column at or beyond row C. 8

64-Point Subcarrier Example 9

CRC ADDRESS GENERATOR b 0 b 1 b 2 + + c 0 c 1 c 2 g 3 =1 g 1 =1 g 0 =1 3-stage linear feedback shift register (LFSR) for calculating the CRC of each row address Defined using a primitive generator polynomial of degree 3: G X = X 3 + X 1 + 1 Input sequential row address b 2, b 1, b 0 Output permuted row address = CRC value c 2, c 1, c 0 10

NON-INTERLEAVED SUBCARRIERS Read Column 0 Write Column 0 COLUMN: 0 1 2 3 4 5 6 7 ROW Subcarrier ROW Subcarrier Rotation: 0 0 0 0 0 0 0 0 0 0 0 0 0 0 8 16 24 32 40 48 56 1 8 1 8 0 1 9 17 25 33 41 49 57 2 16 2 16 0 2 10 18 26 34 42 50 58 3 24 3 24 0 3 11 19 27 35 43 51 59 4 32 4 32 0 4 12 20 28 36 44 52 60 5 40 5 40 0 5 13 21 29 37 45 53 61 6 48 6 48 0 6 14 22 30 38 46 54 62 7 56 7 56 0 7 15 23 31 39 47 55 63 11

ROW-COLUMN (SYSTEMATIC) BLOCK INTERLEAVER Read Column 0 Write Column 0 COLUMN: 0 1 2 3 4 5 6 7 ROW Subcarrier ROW Subcarrier Rotation: 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 2 3 4 5 6 7 1 8 1 8 0 8 9 10 11 12 13 14 15 2 16 2 16 0 16 17 18 19 20 21 22 23 3 24 3 24 0 24 25 26 27 28 29 30 31 4 32 4 32 0 32 33 34 35 36 37 38 39 5 40 5 40 0 40 41 42 43 44 45 46 47 6 48 6 48 0 48 49 50 51 52 53 54 55 7 56 7 56 0 56 57 58 59 60 61 62 63 12

CRC ROW ADDRESS WRITE AND ROTATE Read Column 0 Write Column 0 COLUMN: 0 1 2 3 4 5 6 7 ROW Subcarrier ROW Subcarrier Rotation: 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 2 3 4 5 6 7 1 40 6 8 6 47 40 41 42 43 44 45 46 2 56 3 16 3 62 63 56 57 58 59 60 61 3 16 5 24 5 21 22 23 16 17 18 19 20 4 48 7 32 7 52 53 54 55 48 49 50 51 5 24 1 40 1 27 28 29 30 31 24 25 26 6 8 4 48 4 10 11 12 13 14 15 8 9 7 32 2 56 2 33 34 35 36 37 38 39 32 13

CRC ROW ADDRESS WRITE AND ROTATE PLUS COLUMN ROTATE Read Column 0 Write Column 0 COLUMN: 0 1 2 3 4 5 6 7 ROW Subcarrier ROW Subcarrier Rotation: 2 4 1 7 5 3 6 0 0 0 0 0 0 10 53 35 42 17 24 60 7 1 40 6 8 6 33 28 2 57 48 15 19 46 2 56 3 16 3 0 11 41 16 31 38 50 61 3 16 5 24 5 47 34 56 55 14 5 25 20 4 48 7 32 7 62 1 23 30 37 44 8 51 5 24 1 40 1 21 40 54 13 4 59 39 26 6 8 4 48 4 52 63 29 36 43 18 6 9 7 32 2 56 2 27 22 12 3 58 49 45 32 14

EPoC Frequency Interleaver 15

CRC ADDRESS GENERATOR b 0 +... b 4 b 5 c 0 c 1 c 2 c 3 c 4 + c 5 g 6 =1 g 1 =1 g 0 =1 6-stage linear feedback shift register (LFSR) for calculating the CRC of each row address Defined using a primitive generator polynomial of degree 6: G X = X 6 + X 1 + 1 Input sequential row address b 5, b 4, b 3, b 2, b 1, b 0 Output permuted row address = CRC value c 5, c 4, c 3, c 2, c 1, c 0 16

EPoC INTERLEAVER OUTPUT (PARTIAL) # Subcarriers 3745 # Rows 64 # Columns 59 Last Column 33 Read Column 0 Write Column 0 COLUMN: 0 1 2 3 4 5 6 7 8 ROW Subcarrier ROW Subcarrier Rotation: 44 4 52 22 38 14 62 26 42 0 0 0 0 0 390 350 283 2944 3020 2821 2870 3186 3262 1 1930 48 59 48 2319 2162 2212 1130 1089 1007 939 1372 1331 2 2866 24 117 24 3254 3097 3147 3410 3486 3287 3336 201 160 3 936 40 176 40 1323 1283 1216 1596 1555 1473 1405 2013 2089 4 3334 12 234 12 152 1 3731 659 618 536 468 2948 3024 5 1404 60 293 1 2081 1930 1799 2471 2547 2348 2456 1134 1093 6 468 20 351 20 3016 2924 862 72 3658 3517 3625 3414 3490 7 2398 36 410 36 1085 993 2791 1884 1843 1703 1694 1600 1559 8 3568 6 468 6 3482 3390 392 2819 906 766 757 663 622 9 1638 54 527 54 1551 1459 2321 1005 2718 2578 2686 2475 2551 10 702 30 585 30 614 522 3256 3285 436 296 287 76 3662 11 2632 46 644 46 2543 2451 1325 1471 2248 2108 2216 1888 1847 12 234 10 702 10 3654 3620 154 534 3183 3043 3151 2823 910 13 2164 58 761 58 1839 1689 2083 2346 1369 1229 1220 1009 2722 14 3100 18 819 18 902 752 3018 3515 198 5 3735 3289 440 15 1170 34 878 34 2714 2681 1087 1701 2010 1934 1803 1475 2252 17

CONCLUSION Complexity, timing and large memory size issues in the current frequency interleaver implementation Variable number of multiple clock cycles per subcarrier address Large 4K (127 by 32 ) element lookup table for the de-interleaver A new random (non-systematic) frequency interleaver shown CRC value of each L bit row input address for row write address permutation Rotation of both rows and columns to prevent periodicity Pseudo-random subcarrier frequency dispersion Non-systematic random ordering of subcarriers across entire spectrum Significantly lower complexity implementation Large lookup table avoided with direct calculation Time varying address generation avoided with direct calculation 18

Thank You 19