The Future of EMC Test Laboratory Capabilities. White Paper

Similar documents
Advanced Techniques for Spurious Measurements with R&S FSW-K50 White Paper

R&S FSW-K54 EMI Measurement Application Detecting and eliminating electromagnetic

R&S FSW-B512R Real-Time Spectrum Analyzer 512 MHz Specifications

Troubleshooting EMI in Embedded Designs White Paper

R&S FSV-K40 Phase Noise Measurement Application Specifications

R&S FSW-K160RE 160 MHz Real-Time Measurement Application Specifications

Iterative Direct DPD White Paper

Mastering Phase Noise Measurements (Part 3)

Dynamic re-referencing Microvolt-level measurements with the R&S RTO oscilloscopes

Your partner in testing the Internet of Things

Scope of the art Scope Rider Handheld digital oscilloscope

Pre-5G-NR Signal Generation and Analysis Application Note

R&S ELEKTRA EMI Test Software Easy to use software for measuring electromagnetic disturbances

R&S CA210 Signal Analysis Software Offline analysis of recorded signals and wideband signal scenarios

Oscilloscopes for debugging automotive Ethernet networks

R&S FPS-K18 Amplifier Measurements Specifications

Multi-port calibration by using a two port calibration unit. Application Note. Products: R&S ZVT R&S ZNB

R&S EFL110/EFL210 Cable TV Analyzer and Leakage Detector Detecting interference in cable TV and LTE networks

R&S FSV-K73 3G FDD UE (UL) Measurements incl. HSUPA Specifications

R&S Spectrum Rider FPH Handheld spectrum analyzer

Product Brochure Version HZ-15_16_17_bro_en_ _v0100.indd 1

Configuring the R&S BTC for ATSC 3.0 Application Note

R&S PSL3 Industrial Controller The powerful industrial controller

R&S GX465 Digital Wideband Storage Device Recording and replaying of I/Q data with up to 80 MHz bandwidth

R&S ZN-Z103 Calibration Unit Specifications. Data Sheet V02.01

R&S SMBV-Z1 Reference Frequency Converter Specifications

Analyze Frequency Response (Bode Plots) with R&S Oscilloscopes Application Note

R&S FSW-K144 5G NR Measurement Application Specifications

R&S FSW-K76/-K77 3GPP TD-SCDMA BS/UE Measurement Applications Specifications

R&S MDS-21 Absorbing Clamp Measurement of disturbance power and screening effectiveness on cables

Test Port Adapter Rohde & Schwarz Interchangeable Port Connector Application Note

Step-by-step guide Designing for EMI testing (step-by-step guide) Improve your time to market with oscilloscopes

R&S ZN-Z154 Calibration Unit Specifications

Product Brochure Version R&S RSC Step Attenuator Where precise signal levels count

R&S FSV-K76 TD-SCDMA BS (DL) Measurements Specifications

Five Reasons to Upgrade from Legacy VNAs to a R&S ZNB Vector Network Analyzer

R&S ZNrun Automated Test Software PC-based server platform for automated VNA tests

R&S SFD DOCSIS Signal Generator Signal generator for DOCSIS 3.1 downstream and upstream

R&S FSW Signal and Spectrum Analyzer Resolving Security Issues When Working in Secure Areas

R&S FSV-K8 Bluetooth /EDR Measurement Application Specifications

R&S ZN-ZTW Torque Wrench Specifications

Product Brochure Version R&S ENV A Four-Line V-Network RFI voltage measurements at high currents

R&S InstrumentView Release Notes Software Version 1.70

Meeting your needs R&S RTO2000 Digital Oscilloscope

R&S CONTEST ITS Test cases and applications

Benefits of the R&S RTO Oscilloscope's Digital Trigger. <Application Note> Products: R&S RTO Digital Oscilloscope

R&S HA-Z24E External Preamplifier 1 GHz to 85 GHz Specifications

This application note is a simple step-by-step guide that introduces a practical method to perform reliable small cell planning.

Product Brochure Version R&S TSML-CW Radio Network Analyzer Powerful scanner for CW applications

R&S ZN-Z85 Switch Matrix Specifications

R&S HF907DC SHF Downconverter Specifications

Efficient analysis of power and signal integrity and EMC

R&S GX460 Digital Wideband Storage Device Recording and replaying device for I/Q data with up to 40 MHz bandwidth

LabVIEW driver history for the R&S RTH Handheld Digital Oscilloscope Driver Documentation

R&S TS-BCAST DVB-H IP Packet Inserter Compact DVB H signal generator with integrated IP packet inserter

R&S RT-ZM Modular Probe System

R&S FS-Z60/75/90/110 Harmonic Mixers for the R&S FSP/FSU/ FSQ/FSUP/FSV

Test and Communications Antennas for the R&S TS8991 OTA Performance Test System Specifications

R&S ZN-Z151/-Z152/-Z153 Calibration Unit Specifications

Implementation of Real- Time Spectrum Analysis

R&S RSC Step Attenuator Where precise signal levels count

R&S ETH Handheld TV Analyzer Portable DVB-T/H signal analysis up to 3.6/8 GHz

RF amplifier testing from wafer to design-in

R&S ZV-Z81 Multiport Test Set, models.05/.09/.29 Specifications

R&S FPC1000 Spectrum Analyzer Specifications

R&S WMS32 Wireless Measurement System Software Specifications

Test and measurement solutions for electronics manufacturers

Rohde & Schwarz Service that adds value

R&S ZVA-Zxx Millimeter-Wave Converters Specifications

R&S ZVA-Zxx Millimeter-Wave Converters Specifications

History for R&S Spectrum Analyzer IVI-COM Driver. Driver Documentation

R&S ADMC8 Multicoupler Active UHF multicoupler for 8-port ATC signal distribution

R&S RT-Zxx High-Voltage and Current Probes Specifications

Test and Communications Antennas for the R&S TS8991 OTA Performance Test System Specifications

Rohde & Schwarz Service that adds value

R&S TS-PMB Switch Matrix Module High-density, 90-channel, full matrix relay multiplexer module

R&S FSQ-K91/K91n/K91ac WLAN a/b/g/j/n/ac Application Firmware Specifications

R&S NESTOR-FOR Crime Scene Investigation

Concise NFC Demo Guide using R&S Test Equipment Application Note

Correlated Receiver Diversity Simulations with R&S SFU

DOCSIS 3.1 Full channel loading Maximizing data throughput

R&S VENICE On air. 24/7.

Product Brochure Version R&S AdVISE Visual Inspection Software A new way to eliminate human inattention

The Impact of Digital Oscilloscope Blind Time on Your Measurements Application Note

R&S ZVA110 Vector Network Analyzer Specifications

R&S RT-Zxx High-Bandwidth Probes Specifications

Fast. Accurate. USB-capable. Power sensors from Rohde & Schwarz

R&S ZN-Z32/-Z33 Automatic In-line Calibration Modules Ensuring high accuracy with thermal vacuum testing and multiport measurements

Fast. Accurate. USB-capable. Power sensors from Rohde & Schwarz

Coherence Measurement between two Signals regarding Timing, Phase and Gain Application Note

EMI Automotive Band Evaluation

Radar signal interception moves into the digital age. Innovative ELINT solution from Rohde & Schwarz. Radar signal interception

Using R&S NRP Series Power Sensors with Android TM Handheld Devices. Application Note. Products: R&S NRP Series. R&S NRP-Zxx Series

R&S GU221 Filter Control Unit Specifications

LabWindows/CVI, VXIpnp driver history for the R&S Directional Power Sensors

R&S VSE Vector Signal Explorer Base Software Specifications

Automatic Spectrum Analysis for Band Refarming and Network Rollout Application Note

EMI/EMC diagnostic and debugging

<EDGE Looped based BER and TX measurements using ARB files on the R&S CMW 500> Products: R&S CMW500 R&S CMW- KW200 R&S CMW- KM200. <Application Note>

How to use Rohde & Schwarz Instruments in MATLAB Application Note

Transcription:

The Future of EMC Test Laboratory Capabilities White Paper The complexity of modern day electronics is increasing the EMI compliance failure rate. The result is a need for better EMI diagnostic capabilities at EMC test laboratories, as well as test speed improvements associated with iterative testing. Real-time mode enables a visualization of the spectrum that in turn provides valuable insight into identifying the sources of failing EMI emissions. White Paper Bill Wangard 4.2015-01.00

Table of Contents Table of Contents 1 Introduction... 3 2 The Increase in Failure Rate of EMI Compliance Testing... 4 3 Traditional Methods of EMC Spectrum Analysis... 5 4 The Need For, and Evolution of, Speed: Time Domain Scan... 6 5 EMI Diagnostics: Real-time... 7 5.1... 8 5.2 The Persistence Display...12 6 Summary... 16 01.00 Rohde & Schwarz 2

Introduction 1 Introduction The growing complexity of electronic devices within both military and commercial products has lead to a significant increase in failure rate of EMC conformance testing. Product design cycle times continue to decrease due to competitive pressure in the market. Product design companies are spending more money on multiple iterations of product EMI compliance testing at EMC test laboratories, and this comes at a significant financial cost. Product launch delays caused by EMI compliance failure further increases costs. Many companies calculate ROI (return on investment) based on the average number of times they must pay for a product to be repeatedly tested at an EMC test laboratory, but it often makes more financial sense for companies to invest in their own pre-compliance test solutions. Therefore there is a trend for companies to invest more in their own pre-compliance test equipment solutions. What these companies need is an EMI test equipment suite/system that is better equipped to help them troubleshoot their failures. They can then quickly iterate the fullcompliance testing and finish within the allocated time, even if failures occur. More and more, the market will expect the EMC test laboratories to help them troubleshoot failures discovered during testing, and fast iterative testing maximizes the chances of products passing within the initial budgeted time. EMC test laboratories that are able to meet the changing needs of their customers will be well-positioned for future growth. This white paper describes the cause of the shift in failure rate that many companies are experiencing, the need for increased speed in testing, and the revolutionary EMI diagnostic capability built into modern EMI receivers. 01.00 Rohde & Schwarz 3

The Increase in Failure Rate of EMI Compliance Testing 2 The Increase in Failure Rate of EMI Compliance Testing The growing complexity of the electronics within both military and commercial products in causing a significant increase in failure rate of EMC conformance testing. The question is why? There is on ongoing tendency to integrate predesigned "OEM" subassemblies into products that traditionally did not make use of this type of technology. From microelectronics in toilets to digital controls in motors to embedded wireless modules in almost every imaginable product, companies are integrating new types of circuits that fall outside of their traditional area of experience/expertise. This trend will only continue. As the semiconductor industry continues to implement higher clock frequencies and shorter edge times, test failures caused by radiated emissions are recorded at everincreasing rates. Switching power supplies are one example: in order to reduce the size of the power supply the clock rates of the switchers continues to increase The most common radiated emissions test failures observed at EMI compliance testing at EMC test laboratories are caused by broadband periodic and broadband intermittent/pulsed sources. These types of failures are not typically found in the precompliance phase of testing, largely because of the limited ability of the measurement system to adequately visualize the resulting spectral signature. Most EMC test laboratories use some combination of a) swept-tuned spectrum analyzers, b) steptuned test receivers, and/or c) a non real-time FFT based spectrum analyzer. The measurement challenge of visualizing and measuring broadband intermittent sources is finding the optimal balance between speed of testing (shorter dwell times) and high probability of intercept (longer dwell times). Shorter dwell times enable faster product EMI testing, but decrease the probability that each and every intermittent signal will be captured and properly measured. In contrast, longer dwell times greatly increase the probability of signal interception, but at the expense of longer overall test times. 01.00 Rohde & Schwarz 4

Traditional Methods of EMC Spectrum Analysis 3 Traditional Methods of EMC Spectrum Analysis The spectrum analyzer has been the traditional instrument of choice of the EMC community. There has been a shift from spectrum analyzers to EMI receivers whose architectures are optimized for EMI measurements. Although the detailed architectural differences between spectrum analyzers and EMI receivers are beyond the scope of this white paper, one main difference is pre-selection, which is necessary to comply with CISPR 16-1-1 2010 for low pulse repetition rates. It is becoming increasingly common for EMC test laboratories to support their customers in identifying failing emissions and performing short cycle iterative testing within the budgeted time constraints. Traditional test laboratory EMI debug capability is often limited to frequency and max-hold amplitude reports. Max hold sweeping consists of setting the trace to max-hold and continuously sweeping the desired frequency range. Care must be taken to keep the sweep time long enough to not compromise the output of the resolution bandwidth filter. Sweeping too fast results in lower amplitude and slightly higher frequency measurements. Zero-span time sweeping is commonly used after a problematic frequency has been identified as shown in Fig. 3-1. Here a pulse repetition rate can be measured for an emission at a constant frequency and pulse repetition rate. However, zero-span time sweeping is of limited use when the source varies with frequency. This is because the energy may enter and leave a resolution bandwidth filter set to a single constant frequency. Furthermore, in zero span mode, broadband noise superimposed with narrowband interferers will produce Fig. 3-1 a display that gives little insight to understanding what is actually happening in the spectrum. As discussed later in this paper, the spectrogram display in real-time mode solves this frequency dependence problem. 01.00 Rohde & Schwarz 5

The Need For, and Evolution of, Speed: Time Domain Scan 4 The Need For, and Evolution of, Speed: Time Domain Scan Product design companies typically pay for a full day of testing in a full-compliance EMC test laboratory. If the product passes the first time, measurement speed is not an issue for either the customer or especially for the EMC test laboratory, since it now enjoys the revenue for a full day s work even though only a few hours were actually spent testing. However, once a failure occurs, the need to troubleshoot the failure and iteratively test within the allocated day is of the utmost importance, both to the customer and increasingly so to the EMC test laboratory. Why to the EMC test laboratory? If one EMC test laboratory can provide a significantly better chance of quickly performing the EMI diagnostics and then provide an increased measurement speed more iterations of EMI troubleshooting can performed. Time domain scan can drastically reduce the measurement time and maximize the number of troubleshooting test iterations. The end result is maximizing the chance of customer success within the allocated time frame. Time Domain Scan, which is relatively new to the EMC community, involves calculating the spectrum from a time series of ADC (analog-to-digital converter) samples using an FFT (Fast Fourier Transform). Integrity of the measured frequency amplitude is assured by the proper choice of windowing as described in CISPR 16-1-1. Although a thorough description of Time Domain Scan is beyond the scope of this white paper, more detailed information can be found in the Rohde & Schwarz Application Note Comparison of Time Domain Scans and Stepped Frequency Scans in EMI Test Receivers. Fig. 4-1 Time Domain Scan provides a measurement speed significantly greater than the traditional frequency swept method typically used in the EMC community, particularly at lower frequencies where smaller resolution bandwidths are specified. This increase in speed is necessary when time is limited due to failures that may consume the limited time remaining within the budgeted day. 01.00 Rohde & Schwarz 6

5 EMI Diagnostics: Real-time Swept spectrum analyzers sweep through the spectrum continuously measuring the energy in the resolution bandwidth filter. However, this also means that one measurement point/frequency is taken at a single point in time and activity in other parts of the spectrum are not detected. In receiver mode, the receiver steps through the frequencies one at a time in discreet steps defined in the configuration. The benefit is increased accuracy since the exact frequency of the measurement is known and the receiver can dwell at that frequency for the configured dwell / measurement time. As discussed in the prior section, a significant advantage of time domain scan is the speed improvement over receiver mode due to many frequencies being measured simultaneously, in parallel. Another major advantage of time domain scan is the ability to monitor the entire FFT measurement bandwidth simultaneously such that all events within the real-time bandwidth are detected / captured, greatly increasing the probability of detecting an intermittent emission or emissions. As per the CISPR standard, time domain scan must continuously sample the input signal for the entire duration of the dwell or measurement time such that no data is lost, resulting in gap-free acquisition and processing. This is necessary to avoid drop-outs which may result in missing intermittent or pulsed signals. "Real-time" refers to the ability of the measurement equipment to continuously acquire and process the data without loss by means of gap-free acquisition and processing. The enhanced processing power in modern EMI receivers that enables real-time operation also enables the display of the real-time spectrum capture in new graphical formats. These new graphical formats provide a visualization of the spectrum yielding a revolutionary EMI diagnostic capability. The two main displays are the spectrogram and persistence mode. 01.00 Rohde & Schwarz 7

5.1 Traditional measurements provide the peak spectrum measurements, but do not provide the time nature of the signal causing the failure. Spectrogram displays show the history of the spectrum, and this yields valuable insights into the nature of the emission. Fig. 5-1 shows the traditional instantaneous spectrum in the upper plot and a spectrogram in the lower plot. Fig. 5-1 Instantaneous Spectrum and Spectrogram Displays The spectrogram display shows all three dimensions of frequency, signal level, and time. Frequency is displayed on the x axis and corresponds directly to the frequency axis in the traditional upper display. The color of the spectrogram indicates the signal level - red is higher signal level and deep blue to black is lower signal level. The color setting is user-configurable to optimize the visual display. Each row in the spectrogram represents the spectrum at a slice in time. The next row indicates the spectrum at the next slice in time*. The spectrum continues to move down and hence the spectrum has an appearance similar to a waterfall (another common term for spectrogram). The result is an intuitive graphical representation of the signal over time. * This is true only in a real-time mode of operation, not traditional spectrum analyzer frequency swept mode or EMI receiver frequency stepped mode where there can be gaps in time between successive rows in the spectrogram. 01.00 Rohde & Schwarz 8

Here Fig. 5-2, Fig. 5-3, and Fig. 5-4 show a sequence of three consecutive screen shots depicting the waterfall nature of the spectrogram display. The spectrogram display provides the ability to detect broadband intermittent emissions. Notice that the change in spectrum over time indicates an intermittent (possibly periodic) broadband emission. Traditional spectrum analyzers utilizing max-hold sweeping will only detect the maximum emission, with no ability to display the spectrum over time. Viewing the time history of the spectrum yields valuable clues in determining the source of the emission. Fig. 5-2 Fig. 5-4 Fig. 5-3 01.00 Rohde & Schwarz 9

Fig. 5-5, Fig. 5-6, and Fig. 5-7show a valuable capability of the spectrogram display, the ability to measure the pulse repetition rate, especially in the presence of multiple types of emissions. Fig. 5-5 shows spectrum and spectrogram data in receiver mode, not real-time mode. It is clear that both intermittent broadband noise as well as an intermittent narrowband emission are present. Often EMC engineers will use the zero span mode of a spectrum analyzer at the frequency where an intermittent emission is detected. The resulting display is shown in Fig. 5-6. Notice there are multiple emissions with an inconsistent pulse repetition rate. This is because there are actually two signals present, a condition that cannot be properly characterized using a spectrum analyzer zero span mode. Fig. 5-5 The real-time mode spectrogram display solves this problem. The entire spectrum can be measured simultaneously with accurate data on the time axis due to gap-free acquisition and processing. The display in Fig. 5-7 clearly shows the two separate signals. Markers can be set on the display to measure pulse repetition rate of each signal. Also, the measurement is not dependent on the signal remaining within the resolution bandwidth filter at a single measurement frequency, as is the case when using spectrum analyzer zero span mode. Fig. 5-6 Fig. 5-7 01.00 Rohde & Schwarz 10

The ability to store and post-process the real-time captured spectrogram data is of great importance. The ability to zoom in and out in time adds additional useful EMI diagnostic capability. Below Fig. 5-8, Fig. 5-9, and Fig. 5-10 show the same spectrogram recording with the time axis further zoomed in to provide better time resolution. Note the importance of real-time capture to guarantee the validity of the data with respect to the time axis. Fig. 5-8 Fig. 5-9 Fig. 5-10 01.00 Rohde & Schwarz 11

The Persistence Display 5.2 The Persistence Display Traditional spectrum measurements provide the peak spectrum levels, but do not provide the time nature of the signal causing the failure. The spectrogram display provides value insight on the time nature of the signal. However, it is of limited use when there are multiple signals causing failures on the same frequencies. What is needed is the ability to recognize signals on the same frequency that may appear both at different times as well as the same time. Real-time mode persistence display provides this capability. Fig. 5-11 shows how the persistence display is calculated. As in traditional spectrum displays, the x axis represents frequency and the y axis represents amplitude. The added dimension of time is conveyed in the color coded display. The user configures a measurement time which corresponds to the total display time. Each pixel represents the percentage of the total measurement time during which the signal was at that frequency and amplitude. The pixel on the far left indicates the amplitude was constantly at the same level as the noise floor throughout the entire measurement. The center column indicates that 80% of the time the signal was at the maximum amplitude, 10% of the time the signal was at a slightly lower amplitude, and 10% of the time the signal was off, or in the noise floor. This calculated data is used to create the grid/plot on the right where color now indicates the percentage of time the signal was at that amplitude. The coloring is user-configurable, but usually red indicates the highest time percentage. Fig. 5-11 01.00 Rohde & Schwarz 12

The Persistence Display Real-time mode persistence display is critical in identifying multiple simultaneous sources of failing emissions. Traditionally, EMC test laboratories provide the plot shown in Fig. 5-12, showing a broadband interference created using a max hold sweep. The blue trace shows a max hold and outlines the broadband signal. In the past, the EMC test laboratory provided the plot to the customer, the customer fixed the broadband source of information, and then returned to the EMC test laboratory for another round of expensive testing. Fig. 5-12 As can be seen in Fig. 5-13, there is an additional narrowband signal that is hidden under the traditional spectrum peak plots and this signal may cause an EMI compliance failure. Real-time persistence display provides the capability to see multiple undesired emissions simultaneously. This allows designers to see multiple issues simultaneously, as opposed to sequentially finding and solving one problem at a time. Seeing all undesired signals at once greatly increases chances of passing EMI compliance testing. Fig. 5-13 01.00 Rohde & Schwarz 13

The Persistence Display Fig. 5-14 and Fig. 5-15 show another example of how real-time mode persistence display shows a hidden signal not visible with traditional spectrum measurement capability. Fig. 5-14 shows a narrowband signal hidden within a broadband signal. Fig. 5-14: Fig. 5-15: Fig. 5-16: shows a WiFi (Wireless LAN) signal with a narrowband signal hidden underneath. This is extremely difficult to detect with traditional spectrum measurement techniques and demonstrates the powerful capability to see 'signals under signals' by coloring coding the signal to indicate the time nature of the spectrum. Fig. 5-16: WiFi Signal with Bluetooth Signal 01.00 Rohde & Schwarz 14

The Persistence Display The use of a frequency mask trigger is very helpful in capturing an emission once a problem frequency is detected. The trigger mask can be set as a function of frequency and level. Masks are critical for triggering on an undesired emission in the presence of intentional radiators. The ability to capture the spectrum of a short duration emission provides valuable information in determining the source of the emission. The combination of a frequency mask trigger with persistence display yields a level of fast and powerful diagnostic capability. Fig. 5-17: Frequency Mask Trigger An EMI receiver with the processing power to simultaneously calculate and display the both traditional spectrum with the real-time mode spectrogram as well as persistence displays represents the future of EMI receiver capability. This capability will grow in importance with the increased difficulty of passing EMI compliance tests and in turn will become an important capability for EMC test laboratories to provide for their customers. Fig. 5-18: Enhanced EMI Diagnostics 01.00 Rohde & Schwarz 15

Summary The Persistence Display 6 Summary The increasing percentage of EMI compliance failures necessitates an improved capability not only in detecting emissions, but also characterizing the failing emissions. Iterative experimentation of EMC design fixes requires fast spectrum measurement. Analysis of the spectrum over time yields important information about the source of the failure and facilitates quick redesigns that suppress failing emissions below the defined limits. Time Domain Scan can provide spectrum feedback thousands of times faster than traditional spectrum analyzer measurements. Real-time mode spectrogram displays show a color coded representation of signal strength over time. This is extremely useful when examining the time nature of signals and when measuring pulse repetition rates without resorting to the zero span mode in a swept spectrum analyzer. Real-time mode persistence displays amplitude as a function of the percentage of time the signal was at that amplitude. This gives the EMC designer the ability to visualize time-multiplexed signals, or signals under signals, eliminating costly multiple rounds of full EMC testing. Combining the traditional spectrum plot with the real-time mode spectrogram and persistence displays provides the user with a variety of tools that can be used to identify the root cause failed EMC tests. As this technology continues to become more broadly used by EMC engineers, this capability will also be expected in EMC test laboratories. 01.00 Rohde & Schwarz 16

About Rohde & Schwarz The Rohde & Schwarz electronics group is a leading supplier of solutions in the fields of test and measurement, broadcasting, secure communications, and radiomonitoring and radiolocation. Founded more than 80 years ago, this independent global company has an extensive sales network and is present in more than 70 countries. The company is headquartered in Munich, Germany. Regional contact Europe, Africa, Middle East +49 89 4129 12345 customersupport@rohde-schwarz.com North America 1 888 TEST RSA (1 888 837 87 72) customer.support@rsa.rohde-schwarz.com Latin America +1 410 910 79 88 customersupport.la@rohde-schwarz.com Asia Pacific +65 65 13 04 88 customersupport.asia@rohde-schwarz.com China +86 800 810 82 28 +86 400 650 58 96 customersupport.china@rohde-schwarz.com Sustainable product design ı ı ı Environmental compatibility and eco-footprint Energy efficiency and low emissions Longevity and optimized total cost of ownership This white paper and the supplied programs may only be used subject to the conditions of use set forth in the download area of the Rohde & Schwarz website. R&S is a registered trademark of Rohde & Schwarz GmbH & Co. KG; Trade names are trademarks of the owners. PAD-T-M: 3573.7380.02/02.02/EN/ Rohde & Schwarz GmbH & Co. KG Mühldorfstraße 15 D - 81671 München Phone + 49 89 4129-0 Fax + 49 89 4129 13777 www.rohde-schwarz.com