UniMCO 4.0: A Unique CAD Tool for LED, OLED, RCLED, VCSEL, & Optical Coatings

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UniMCO 4.0: A Unique CAD Tool for LED, OLED, RCLED, VCSEL, & Optical Coatings 1 Outline Physics of LED & OLED Microcavity LED (RCLED) and OLED (MCOLED) UniMCO 4.0: Unique CAD tool for LED-Based Devices Key Features Extensive Material Database Automatic EL0 Extraction from Experimental Data Built-in Device Structure Library Device Optimization Optical Function Calculations Comprehensive 2D and 3D Post-Processor Case Studies Using UniMCO 4.0 Why UniMCO? 2 1

Physics of LED & OLED Device Structures (Multi-layers): Cathode Electron transport layer V Emissive layer Hole transport layer Hole injection layer Anode Light A Typical OLED Structure A Typical RCLED (or VCSEL) Structure 3 Physics of LED & OLED External quantum efficiency of LED & OLED: η ext = η inj η rad η extr η inj : Fraction of carriers injected in active region (charge balance between anode & cathode). η rad : Radiative fraction of spontaneous recombination (singlet-triplet ratio, impurities, ) η extr : Extraction efficiency of generated photons (complete internal reflection, emitting zone location, microcavity effect, ) 4 2

Physics of LED & OLED Electrons to photons conversion in LED & OLED (display application) Injected carriers Carriers in active region Generated photons η extr Extracted photons Photons in outside V η rad η inj Light Not injected in active region Non-radiative recombination Not extracted Light coupled to wide view angle 5 Physics of LED & OLED Electrons to photons conversion in LED coupled to waveguide or fiber (communication applications) Injected carriers Carriers in active region Generated photons η extr Extracted photons η coupl Photons in waveguide Waveguide or fiber η inj η rad Only coupled to a small N.A. Not injected in active region Non-radiative recombination Not extracted Not coupled in waveguide 6 3

Physics of LED & OLED Charge Injection Efficiency η inj OLED: improve anode & cathode materials to enhance charge balance (limited room to improve) Semiconductor LED: ~ 100% (very little room to improve) Light Radiation Efficiency η rad OLED: doping leads to triplets to radiate light, (limited room to improve) Semiconductor LED: ~ 70% - 99% (little room to improve) Light Extraction Efficiency η extr OLED: < 20% for most OLED structures (more room to improve) Semiconductor LED < 10% in most case because of the large refractive index of the active layer (more room to improve) Light Coupling Efficiency η coupl RCLED: ~ fraction of η extr, coupled to optical fiber (more room to improve) Extraction efficiency is the most important factor. The devices, if carefully designed, can increase η extr greatly. UniMCO 4.0 can optimize the OLED & LED devices to enhance η extr & η coupl 7 RCLED & MCOLED Microcavity can change spontaneous emission (SE): - Purcell Effect: Total Emission Enhancement r = +1: perfect DBR mirror r = -1: perfect metallic mirror r = - 1 Top mirror L Emissive layer r = + 1 Bottom mirror 8 4

RCLED & MCOLED Microcavity can improve extraction efficiency: Bare in medium Far from mirror Close to mirror In big cavity In small cavity θc η ~ 1/4n 2 = 8% for n = 1.7 = 2% for n = 3.55 η ~ 1/(2n 2 ) = 16% for n = 1.7 = 4% for n = 3.55 η ~ 1/(n 2 ) = 32% for n = 1.7 = 8% for n = 3.55 η ~ 1/(2n 2 ) = 16% for n = 1.7 = 4% for n = 3.55 η ~ 1/m c Low order (small) microcavity is a key! L ~ λ 9 RCLED & MCOLED Difficult to get low order for DBR cavity: Penetration depth ( ~ λ): Optical field penetrates into DBR layers, increasing the effective cavity length DBR1 DBR2 10 5

RCLED & MCOLED Approaches to reduce the penetration depth: Metal-DBR Microcavity (almost no penetration to the metallic mirror) Metal-Metal Microcavity (almost no penetration to both metallic mirrors DBR Metal Metal Thin transparent metal layer 11 UniMCO 4.0: Key Features Advanced and easy to use CAD tool Extensive built-in material database for over 250 materials, Built-in library, including DBR-DBR cavity, Metal-DBR cavity, DBR-RCR cavity, Metal-RCR cavity, etc. Easy to build customized device structures using the built-in structure blocks, including substrate, DBR, spacer, emitter, and metal. Automatic light input (EL0) extraction from experimental data of a test structure Device layer thickness optimization by calculating optical field distribution. (Continued next slide) 12 6

UniMCO 4.0: Key Features Optimization of emitting zone location by calculating extracted EL spectrum Optical field distribution over whole device Optical functions as a function of various variables, including wavelength, view angle, and layer thickness. EL spectra for extracted, leaky, and guided modes Integrated EL and efficiency for extracted, leaky, and guided modes EL contributed from various polarization components: S-wave, P-wave, and vertical-wave. CIE XYZ 1931 and CIE LUV 1976 color coordinates for visible light and the color variation with view angle. Comprehensive 2D and 3D post-processors. 13 New feature of UniMCO 4.0 Optical properties for over 250 materials Most commonly used materials in LED, RCLED, OLED, VCSEL, and optical coatings Intricate models that incorporate the effects of temperature and composition variations. Allows users to import material data through table or ASCII data UniMCO 4.0: Material Database 14 7

UniMCO 4.0: EL0 Extraction The accurate EL simulation depends on how good the input EL0 is UniMCO requires the bare EL0 as input light spectrum Even the experimental EL0 data from a specially designed test structure is still affected by the weak microcavity effect due to interfaces. EL0 extraction module can automatically remove the weak microcavity effect. The figure shows the extracted EL0 (red curve) from the experimental data (blue curve) of a test structure as illustrated in the top of the figure. 15 UniMCO 4.0: Built-In Structures UniMCO 4.0 has a built-in device structure library: DBR-DBR structure DBR-RCR structure (or double cavity structure) Metal-DBR structure Metal-non-DBR structrue Metal-RCR (double-cavity) structure From these 5 basic structures, we can build over 20 deduced structure by removing corresponding spacer layers. 16 8

UniMCO 4.0: Device Optimization Layer Thickness Optimization Thickness variation affects EL output Thickness variation results in color shift The emitting layer thickness optimization for a GaAs/AlAs RCLED device at wavelength = 1300 nm and view angle = 10 degree. The optimized thickness is 383.9 nm. 17 UniMCO 4.0: Device Optimization Emitting Zone Location Optimization Emitting zone location affects EL output To enhance EL, emitting zone must be at the anti-node of optical field UniMCO 4.0 optimization module can predict the right emitting zone location Emitting zone location optimization for a GaAs/AlAs RCLED device at wavelength = 1300 nm and view angle = 10 degree. The optimized emitting zone is at 205.6 nm. 18 9

UniMCO 4.0: Device Optimization Example: OLED Optimization: Construct a device structure Optimize ITO layer thickness and emitting zone location Construct a microcavity OLED using optimized non-cavity device Optimize HTL layer thickness and emitting zone 19 Optical function calculations Optical Field Distribution: Optical field distribution provides the detailed information about the device structure 20 10

Reflectivity Transmittance Absorption Phase shift Optical function calculations 21 Optical function calculations Light Output: EL for extraction, leaky, guided modes EL for various polarized dipole models: s-wave, p-wave, & vertical Integrated EL over wavelength or view angle EL efficiency for extraction, leaky, guided modes Color coordinates for visible EL 22 11

Comprehensive 2D and 3D Post-Processor Post-Processor Main Window (can display simulation results) Optical field (λ, x) or (θ, x) Reflectivity (λ, θ), or (λ, d) or (θ, d) Transmittance (λ, θ), or (λ, d) or (θ, d) Absorption (λ, θ), or (λ, d) or (θ, d) Phase Shift (λ, θ), or (λ, d) or (θ, d) EL (λ, θ), or (λ, d) or (θ, d) 23 Comprehensive 2D and 3D Post-Processor 2D Plots: 2D x-yplot Polar plot Linear or log scale Display multiple results on one plot 24 12

Comprehensive 2D and 3D Post-Processor 3D Plots Surface plot Contour plot Linear or log scale Color map control 25 Case Studies Using UniMCO 4.0 Case Study 1: Multi-Wavelength Microcavity OLED Develop multi-wavelength white microcavity OLED device Enhance EL output Modify EL color Material Parameters: All material parameters are included in UniMCO s material database except for CuPc. We use refractive index data for CuPc from literature: n = 1.5 0.8 i. Al (150 nm) ETL (59 nm) EML (20 nm) HTL (48 nm) CuPc (15 nm) ITO (64 nm) Glass Substrate Non-cavity device (Ref 2) Al (150 nm) ETL (59 nm) EML (20 nm) HTL (48 nm) CuPc (15 nm) ITO (64 nm) SiO2 (553 nm) TiO2 (188 nm) Glass Substrate Cavity device (Cavity) 26 13

Case Studies Using UniMCO 4.0 Case Study 1: Multi-Wavelength Microcavity OLED Experiment CIE Color Coordinates: Ref2 Cavity Exp. (0.321, 0.402) (0.323, 0.400) Simulation (0.330, 0.409) (0.349, 0.401) Simulation Reference: T. Shiga, H. Fujikawa, and Y. Taga, Design of Multiwavelength resonant cavities for white organic light-emitting diodes, J. Appl. Phys. Vol. 93, 19 (2003). 27 Case Studies Using UniMCO 4.0 Case Study 2: Microcavity OLED Pure RGB Emissions Develop microcavity OLED Control cavity mode Control position of the resonance wavelength Narrow EL spectrum Enhance EL output Control EL directionality Obtain pure red, green, & blue color Devices Red Green Blue Metal ETL EML HTL ITO Glass Substrate Layer thickness (nm) ITO HTL EML ETL 162 139 90 80 70 70 20 20 40 70 47 20 Metal ETL EML HTL ITO (TiO2/SiO2) x 3 Glass Substrate Reference wavelength (nm) 660 580 520 28 14

Case Studies Using UniMCO 4.0 Case Study 2: Microcavity OLED Pure RGB Emissions Compare with Exp: Match well with experimental data Slight deviation from experiment might be due to that the experimental error of layer thicknesses 29 Case Studies Using UniMCO 4.0 Case Study 2: Microcavity OLED Pure RGB Emissions Reference: S. Tokito, T. Tsutsui, and Y. Taga, Microcavity organic light-emitting diodes for strongly directed pure red, green, and blue emissions, J. Appl. Phys. Vol. 86, 2407 (1999). 30 15

Case Studies Using UniMCO 4.0 Case Study 3: Dual-Wavelength Bragg Reflectors (DWBR) Demonstrate dual-wavelength reflectivity bands Wide application in optoelectronic devices Reference wavelength = 1050 nm Each Q.W. GaAs layer = 75 nm Each Q.W. AlAs layer = 89 nm Set emitting layer (red) Set substrate (gray Surface STRUCTURE A AlAs GaAs AlAs GaAs Surface STRUCTURE B 31 Case Studies Using UniMCO 4.0 Case Study 3: Dual-Wavelength Bragg Reflectors (DWBR) Reference: C.P Lee, C.M. Tsai, and J.S. Tsang, Dual-wavelength Bragg reflectors using GaAs/AlAs multilayers, Electronics Lett. Vol. 29, 1980 (1993). 32 16

Case Studies Using UniMCO 4.0 Case Study 4: Thickness Effect on EL of Polymer PPV OLED Thickness variation of MEH-DOO-PPV: 100, 86, 62, and 55 nm. Assumption: the emitting zone (red) is 5 nm thick and located at the center of the PPV layer Ca (150 nm) MEH-DOO-PPV PEDOT-PSS (60 nm) ITO (50 nm) Glass Substrate The imaginary part of the refractive index of the PPV within the emitting zone is neglected because UniMCO requires the refractive index of the emitting layer be real From this example, the users show know how to simulate the devices with a complex refractive index emitting layer. Material Parameters: ITO: from UniMCO material database PEDOT-PSS: n = 1.53 PPV: from the data file ppv_nk.txt Calcium: from the data ca_nk.txt 33 Case Studies Using UniMCO 4.0 Case Study 4: Thickness Effect on EL of Polymer PPV OLED Result Comparison: Wavelength (nm) The above results shows that the simulation results very closely match the experimentally determined spectra. Please note that the thickness of the ITO and the cathode material were not specified in the reference. Here we just pick the 50 nm as the ITO layer thickness and Ca as the cathode. These arbitrary choices might affect the simulation accuracy. Reference: J.M. Leger, et. al. Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes, Phys. Rev. B 68, 54209 (2003). 34 17

UniMCO Can Do More UniMCO can be used to design, optimization, and simulate: LED and OLED Microcavity OLED Semiconductor RCLED VCSEL laser Optical multilayer film coating and optical filters 35 Why UniMCO? Main features of UniMCO: UniMCO is easy to use UniMCO is a first ever commercial tool for MCOLED & RCLED UniMCO has the features that Microcavity LED and VCSEL designers need UniMCO has many features for modeling unusual microcavity designs including double-cavity (or RCR) structures UniMCO has powerful color-brightness simulation capabilities, which allow user to compare color and brightness between microcavity device and non-cavity device UniMCO provides a cost-effective solution 36 18