Logic Analysis Basics

Similar documents
Logic Analysis Basics

Logic Analysis Fundamentals

Identifying Setup and Hold Violations with a Mixed Signal Oscilloscope APPLICATION NOTE

SignalTap Plus System Analyzer

Logic Analyzer Triggering Techniques to Capture Elusive Problems

Advanced Troubleshooting with Oscilloscopes 9000 Scope Hands-on Labs

MSO-28 Oscilloscope, Logic Analyzer, Spectrum Analyzer

Solutions to Embedded System Design Challenges Part II

Keysight Technologies U4154A AXIe-Based Logic Analyzer Module. Data Sheet

The XYZs of Logic Analyzers

Keysight U4164A Logic Analyzer Module

Quick Signal Integrity Troubleshooting with Integrated Logic Analyzers & Oscilloscopes

State and Timing Modules for Agilent Technologies Logic Analysis Systems

Experiment # 4 Counters and Logic Analyzer

Low-speed serial buses are used in wide variety of electronics products. Various low-speed buses exist in different

CAN, LIN and FlexRay Protocol Triggering and Decode for Infiniium 9000A and 9000 H-Series Oscilloscopes

Fundamentals. of Timing Analysis

Analyzing 8b/10b Encoded Signals with a Real-time Oscilloscope Real-time triggering up to 6.25 Gb/s on 8b/10b encoded data streams

EXOSTIV TM. Frédéric Leens, CEO

Chapter 2. Digital Circuits

How to Use a Mixed Signal Oscilloscope to Test Digital Circuits

Using SignalTap II in the Quartus II Software

How to Use a Mixed Signal Oscilloscope to Test Digital Circuits APPLICATION NOTE

Chapter 6. Flip-Flops and Simple Flip-Flop Applications

How to Measure Digital Baseband and IF Signals Using Agilent Logic Analyzers with Vector Signal Analysis Software

T 2 : WR = 0, AD 7 -AD 0 (μp Internal Reg.) T 3 : WR = 1,, M(AB) AD 7 -AD 0 or BDB

Tutorial 11 ChipscopePro, ISE 10.1 and Xilinx Simulator on the Digilent Spartan-3E board

RS-232/UART Triggering and Hardware-Based Decode (N5457A) for Agilent InfiniiVision Oscilloscopes

What's the SPO technology?

BUSES IN COMPUTER ARCHITECTURE

Agilent Technologies Pulse Pattern and Data Generators Digital Stimulus Solutions

Manual Supplement. This supplement contains information necessary to ensure the accuracy of the above manual.

Selecting the Right Oscilloscope for Protocol Analysis Applications

Using the XC9500/XL/XV JTAG Boundary Scan Interface

Choosing an Oscilloscope

Advanced Test Equipment Rentals ATEC (2832) Agilent Technologies 16700B and 16702B Logic Analysis Systems

HAMEG. Oscilloscopes. Innovation right from the start. Oscilloscopes

SignalTap Analysis in the Quartus II Software Version 2.0

Agilent MSO and CEBus PL Communications Testing Application Note 1352

Mixed Analog and Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope Wireless LAN Example Application

More on Flip-Flops Digital Design and Computer Architecture: ARM Edition 2015 Chapter 3 <98> 98

Flip-Flops and Related Devices. Wen-Hung Liao, Ph.D. 4/11/2001

Meeting Embedded Design Challenges with Mixed Signal Oscilloscopes

LAX_x Logic Analyzer

Combating Closed Eyes Design & Measurement of Pre-Emphasis and Equalization for Lossy Channels

Combating Closed Eyes Design & Measurement of Pre-Emphasis and Equalization for Lossy Channels

S op o e p C on o t n rol o s L arni n n i g n g O bj b e j ctiv i e v s

Evaluating Oscilloscopes to Debug Mixed-Signal Designs

MS-32. Oscilloscope Mixed Signal Option. Add 32 Digital Channels to a 4 Channel Oscilloscope

Overview. Know Your Oscilloscope. Front Panel. Rear Panel. Sharing Agilent s Resources with Engineering Educators

Application Note #63 Field Analyzers in EMC Radiated Immunity Testing

Introduction. NAND Gate Latch. Digital Logic Design 1 FLIP-FLOP. Digital Logic Design 1

Logic Analyzer Auto Run / Stop Channels / trigger / Measuring Tools Axis control panel Status Display

Timesaving Tips for Digital Debugging with a Logic Analyzer

How to Measure Digital Baseband and IF Signals Using Agilent Logic Analyzers with Vector Signal Analysis Software

HDL & High Level Synthesize (EEET 2035) Laboratory II Sequential Circuits with VHDL: DFF, Counter, TFF and Timer

System IC Design: Timing Issues and DFT. Hung-Chih Chiang

VHDL Design and Implementation of FPGA Based Logic Analyzer: Work in Progress

The Measurement Tools and What They Do

Agilent I 2 C Debugging

Keysight Technologies CAN/LIN Measurements (Option AMS) for InfiniiVision Series Oscilloscopes

MS-32 OSCILLOSCOPE MIXED SIGNAL OPTION. Add 32 Digital Channels to a 4 Channel Oscilloscope

DEDICATED TO EMBEDDED SOLUTIONS

CAN/LIN Measurements (Option AMS) for Agilent s InfiniiVision Series Oscilloscopes

Tektronix Logic Analyzers

Chapter 5 Flip-Flops and Related Devices

Troubleshooting Your Design with the TDS3000C Series Oscilloscopes

Keysight Technologies Mixed Analog and Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope

1. Abstract. Mixed Signal Oscilloscope Ideal For Debugging Embedded Systems DLM2000 Series

How to overcome/avoid High Frequency Effects on Debug Interfaces Trace Port Design Guidelines

Portable Performance for Debug and Validation

Lab #5: Design Example: Keypad Scanner and Encoder - Part 1 (120 pts)

Lecture 23 Design for Testability (DFT): Full-Scan

EECS150 - Digital Design Lecture 10 - Interfacing. Recap and Topics

Debugging Memory Interfaces using Visual Trigger on Tektronix Oscilloscopes

Serial Decode I2C TEN MINUTE TUTORIAL. December 21, 2011

Oscilloscopes, logic analyzers ScopeLogicDAQ

Agilent 6000 Series Oscilloscope Demo Guide

Agilent Technologies N5454A Segmented Memory Acquisition for Agilent InfiniiVision Series Oscilloscopes

The outputs are formed by a combinational logic function of the inputs to the circuit or the values stored in the flip-flops (or both).

82C55A CHMOS PROGRAMMABLE PERIPHERAL INTERFACE

COE758 Xilinx ISE 9.2 Tutorial 2. Integrating ChipScope Pro into a project

How advances in digitizer technologies improve measurement accuracy

Logic Devices for Interfacing, The 8085 MPU Lecture 4

Laboratory 1 - Introduction to Digital Electronics and Lab Equipment (Logic Analyzers, Digital Oscilloscope, and FPGA-based Labkit)

ECT 224: Digital Computer Fundamentals Digital Circuit Simulation & Timing Analysis

Quick Reference Manual

Realizing Waveform Characteristics up to a Digitizer s Full Bandwidth Increasing the effective sampling rate when measuring repetitive signals

AI-1204Z-PCI. Features. 10MSPS, 12-bit Analog Input Board for PCI AI-1204Z-PCI 1. Ver.1.04

A dedicated data acquisition system for ion velocity measurements of laser produced plasmas

National Instruments Synchronization and Memory Core a Modern Architecture for Mixed Signal Test

PicoScope 6407 Digitizer

Digital Audio Design Validation and Debugging Using PGY-I2C

Laboratory Exercise 4

Remote Diagnostics and Upgrades

EMT 125 Digital Electronic Principles I CHAPTER 6 : FLIP-FLOP

Scan. This is a sample of the first 15 pages of the Scan chapter.

IT T35 Digital system desigm y - ii /s - iii

DIGITAL ELECTRONICS MCQs

FSM Cookbook. 1. Introduction. 2. What Functional Information Must be Modeled

Transcription:

Logic Analysis Basics September 27, 2006 presented by: Alex Dickson Copyright 2003 Agilent Technologies, Inc.

Introduction If you have ever asked yourself these questions: What is a logic analyzer? What is a timing/state analyzer? What is a trigger? When should I use a logic analyzer? Then you are in the RIGHT place!!!

Agenda Overview of a Logic Analyzer Logic Analyzer Process (Probing) Timing Analyzer State Analyzer Data Analysis Tools and Display Conclusion

Logic Analyzer is a Tool that: Gives you insight into the operation of a digital circuit by ing to your DUT (Device Under Test) Capturing and storing the digital waveforms Analyzing the stored data and displaying the results.

What Can a Logic Analyzer Do for Me? Record a circuit s logic levels over time, and let you examine the record Show whether or not a particular event happens (the trigger) Provide a precise measure of time between events Inverse-assemble a microprocessor s logic levels to tell you what code was running Analyze complex buses and protocols

Logic Analysis Process Critical Factors Probing Logic Analysis Process Features & Tools Soft Touch orless Samtec Mictor Analysis Probes Flying Leads FPGA Dynamic Probe

Logic Analysis Process Critical Factors Probing Accurate & robust measurements Logic Analysis Process Features & Tools Soft Touch orless Samtec Mictor Analysis Probes Flying Leads FPGA Dynamic Probe Bus Speeds Depth Card Configuration

Logic Analysis Process Critical Factors Probing Accurate & robust measurements Data analysis and signal integrity insight Logic Analysis Process Data Features & Tools Soft Touch orless Samtec Mictor Analysis Probes Flying Leads FPGA Dynamic Probe Bus Speeds Depth Card Configuration Software Analysis Protocol Analysis Inverse Assembly State Display Timing Display Eye Diagrams

It Begins At The Probe General-purpose probing Designed into the target Application-specific probes

Electrical Probing Considerations How can I connect to my signals? Design-in connector Flying leads Low loading System tolerance Impact on DUT

Mechanical Probing Considerations What can I fit on my board? Footprint size Signal routing Low profile Usable Easy to attach Reliable, repeatable

Understanding Logic Analyzer Specifications Memory Depth: specifies how many samples can be stored in a single trace. From target 1 0...... External (state) > CLK Internal (timing)... 1 0 1 1 0... 1 0 Channel Count (Width): How many signals can be stored per sample Max Timing Rate: The fastest speed of the internal sampling clock Max State Clock Rate: The fastest, externally input, state clock allowed

Logic Analyzer Setup Assign bus/signal names Assign channels to buses/signals Assign voltage threshold

- Two Measurement Modes Timing Analysis (Logic Timing) State Analysis (Logic Events)

- Two Measurement Modes Timing Analysis (Logic Timing) State Analysis (Logic Events)

Timing Mode (Asynchronous) Tells when the event happened Displays signal edge timing relationships Trigger across multiple channels Analogous to an oscilloscope with 1-bit resolution Useful for hardware debug Asynchronous Sampling clock comes from internal logic analyzer

Timing Mode How it Works V Input V Threshold Output (0 or 1) Latch VOutput Comparator Internal Analyzer Clock V Input VThreshold Internal Analyzer Clock V Output

Timing Waveform

When to Use an Oscilloscope Parametric Measurements Precise Time vs. Voltage Relationships Overshoot Rise Droop Valid Logic 1 Ringing Pulse Width Valid Logic 0 Rise Time Fall Time

When to Use a Logic Analyzer Cause and effect timing relationships Many channels simultaneously Multiple bus correlation measurements INPUTS 1 2 X/Y 0 1 2 3 OUTPUTS INPUTS OUTPUTS X1 X2 Y0 Y1 Y2 Y3

High Speed Timing Zoom Efficiently characterize hardware with 250ps resolution Useful at high speeds Capture simultaneously with traditional timing or state measurements Provides a window of visibility around the trigger Up to 4 GHz timing speeds at 64k memory depth

Transitional Sampling Only stores transitions Utilize memory efficiently Two memory locations per transition Signal being acquired Sampling points 200ns 10s 200ns Memory Full Transitional storage

- Two Measurement Modes Timing Analysis (Logic Timing) State Analysis (Logic Events)

State Analysis (Synchronous) Useful for determining what happened sequence of operations Trace values on a bus Track functional problems and code flow Useful for software debug and hardware/software integration Synchronous Sampling clock comes from device under test (DUT)

State Analysis: Data Valid Window Definition: Period of time in which data is stable Setup time the time data is stable prior to clock edge Hold time the time data is stable following clock edge Data is stable Data is transitioning

State Analysis: Setup and Hold Example Hold Time D Flip Flop DUT Clock Setup Time

State Analysis: State Domain DATA AA 0C 61 B3 CLOCK Clock 1 2 3 Data AA 0C B3

State Analysis: Eye Finder Immediate confirmation and confidence in sampled data! Automatic placement of sample position in the data valid region Easy to modify manually Quick overview of target signal skew Data valid region Sampling point

State Analysis: Synchronous Measurement V Input Threshold Output (0 or 1) Latch VOutput Comparator External DUT Clock DUT

State Analysis: State Listing Trace values on a bus (see data values your device sees) Track functional problems and code flow ADDR 16 Label> Base> ADDR HEX DATA HEX STAT SYMB CPU DATA 8 STAT 8 MEMORY -0003-0002 -0001 +0000 +0001 +0002 +0003 +0004 0436 0BB6 0BB5 0024 0025 0026 0008 0009 15 04 37 C3 00 08 22 D3 OPCOD MEMWR MEMWR OPCOD MEMRD MEMRD OPCOD MEMRD Circuit Measurement

State Analysis: Displaying State Measurements

State Analyzers Ideal for Analyzing the Execution of Microprocessor Programs Start Measurement Channel Clock Signal n = 0 n = n + 1 n > 15 No End Yes

Triggering

The Conveyor Belt Analogy Trigger Sample Newest Sample Stop Oldest Sample Trace Memory Depth One Sample d Samples Memory Depth Trigger Position = One box = Boxes on the belt = Number of boxes that will fit on the belt = Position of special box when Stop button is pressed

What is a Trigger? Linear Model 15 14 13 12 11 10 9 8 16 7 17 Ring Model 6 18 19 20 21 22 5 4 3 Trigger Trigger 3 Beginning 18 Pre-Store Post-store Post-store 22 End A Trigger is an event that, when detected, allows the logic analyzer to fill its trace memory and complete the measurement.

Single-Shot View of System Display Tool Trace Memory Trigger Captured Activity System Activity More memory provides longer acquisition window (seconds)

Trigger Positions Trigger Position Use of Trigger Start Center (Default) End Observe code execution View time shortly before/after event Trace cause of system halt Root cause analysis (uncorrelated symptoms) 0-100% Variable, custom selection

Defining Trigger Events Measurement Channel Input Acquisition Buffer Trigger Event D 4... D 0 D 4... D 0 1 0 0 0 1 0 0 0 1 0 0 0 1 0 1 1 0 0 0 1 0 0 0 1 0 0 0 1 0 1 Display Buffer Trigger Enable Function Logic Analyzer Control

Defining Simple Trigger Events Trigger on Bus values Trigger on Signal values

Defining Advanced Trigger Events

The Complete Measurement Comparator Latch Clock Signal Trigger Event D 6.... D 0 D 6... D 0 Display Buffer Acquisition Buffer Trigger Enable Function Logic Analyzer Control

Displaying the Data There are a number of ways to display the 1 s and 0 s to make sense of your digital design Waveform Listing View Scope Inverse Assembly, Source Correlation Protocol Debug / Packet Viewer Eye Diagrams Eye Scan Custom Views with custom VBA Views Digital VSA

View Scope Import oscilloscope waveforms with time-correlated global markers Track errors through analog and digital Analyze analog characteristics of digital anomalies

View Scope Distorted D/A output as measured by scope Scope triggered to find max distortion with G1 and G2 markers positioned at start and end of first flat distortion.

Inverse Assembly: Listing Correlated to Waveform at G1 State listing reveals code branching just prior to G1.

Source Correlation: Interrupt Service Routine Source Code Between G1 and G2 D/A execution is interrupted when code goes to interrupt service routine. Line 55 correlated to G1 marker in state listing and waveform.

Protocol Analysis: Packet Viewer Displays parallel bus data at protocol level Protocol trigger macro allows easy trigger setup, eliminates manual configuration of complex measurements Time correlation with other system buses Coverage includes: Rapid IO PCIE Express USB Serial ATA Proprietary/Custom Protocols

Eye Diagrams: Eye Scan What is Eye Scan? Provides signal integrity validation measurements of entire high-speed buses. Uses high resolution comparators to scan across specified time and voltage range. Provides up to 5mV and 10ps resolution. Can be used as a tool of first attack to reveal tough signal integrity problems.

FPGA Dynamic Probe FPGA Dynamic Probe SW application supported by 1680/1690/16900 Probe core output Parallel PC Board FPGA Insert ATC2 core with Xilinx Core Inserter ATC2 Control access to new signals via JTAG JTAG

Summary

Using a Logic Analyzer vs. an Oscilloscope Use a Logic Analyzer to: See many signals at once Look at signals the same way your hardware does (State Mode) Trigger on a pattern of highs and lows on several lines and see the result Use an Oscilloscope: To get precise time interval information To look at the analog characteristics of a signal Verify timing relationships among several or hundreds of lines (Timing Mode)

State vs. Timing Timing Analysis When the event happened Edge relationships Hardware debug State Analysis What sequence of operations executed Monitor execution of processor Software and System Integration

Common Applications for Logic Analyzers Intel FSB DDR/DDR2/DDR3 Fully Buffered DIMM PCI Express Digital Radio Digital I&Q SATA/SAS InfiniBand RapidIO SPI 4.2 Fibre Channel USB 2.0 IEEE 1394 FPGA Functional Verification Other µp

Multiple Views Provide the Right Level of Insight System Performance Eye Scan Listing & IA Oscilloscope Waveform Digital VSA Packet Decode Source Code

Introducing Agilent 16800 series Logic Analyzer 4 GHz Timing Zoom @ 64K deep Up to 1 GHz timing with deep memory Up to 450 MHz state clock rate Up to 500 Mb/s state data rate Up to 32 M deep memory compatible with 19 years of legacy probing + newest connectorless probing innovations Pattern Generator: 48 channels Up to 16 M vectors deep, Up to 300 Mb/s

Q & A