SJTAG Meeting at EBTW 2006

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SJTAG Meeting at EBTW 2006 SJTAG Fringe Meeting at EBTW 06 Wednesday 24 May, 2005 1:00 PM 3:45 PM Tanners Room Chilworth Manor, Southampton, UK Slide 1 EBTW 2006: Agenda Ben Bennetts, SJTAG Chairman: Introduction/status of SJTAG. Views from the industry Test manager vendors. Adam Ley, ASSET InterTech, USA Systems industry. Steve Harrison and Steve Lakin, Motorola, UK Scan support device vendors. Peter Horwood, Firecron, UK Slide 2 SJTAG Core Group, 2006 Page 1

Who s in the Room? Mick Austin, JTAG Technologies, FI Jan Heiber, Goepel, DE Erik Larsson, Linköpings Universitet, Sweden Ben Bennetts, Bennetts Associates (SJTAG Chairman), UK Steve Harrison, Motorola Networks, UK Bill Eklow, Cisco Systems, USA Peter Horwood, Firecron, UK Eugene Mullen, Firecron, UK Jim Webster, Consultant (ex-bae Systems), UK Thomas Kronqvist, Saab Test Systems, SW Markku Moilanen, Oulu University, FI Adam Ley, ASSET InterTech, USA Artur Jutman, Technical University Tallinn, Estonia Anthony Sparks, JTAG Technologies, USA Jukka Antila, Nokia Networks, FI Bernard Sutton, Robat, UK Billy Fenton, International Test Technologies, IR Pete Collins, ASTER Ingenerie, FR James Stanbridge, JTAG Technologies, UK Chris Day, Abracad, UK Larry Osborn, ASSET InterTech Christophe Lotz, ASTER Ingenerie, FR Franc Novak, Josef Stefan inst., Slovenia Reg Waller, ASSET InterTech, UK Kevin Fotheringham, ASSET InterTech, UK Patrick Au, IBM, UK Gunnar Carlsson, Ericsson, Sweden Frans de Jong, Philips, NL Thomas Wenzel, Goepel Electronic, DE Ville Hassinen, Ericsson, Sweden Steve Okell, Tandberg TV, UK Slide 3 : SJTAG Initiative System JTAG Supporting external and Embedded Boundary Scan Test (XBST, EBST) Extracted from a white paper from the SJTAG group Ben Bennetts, SJTAG Chairman Slide 4 SJTAG Core Group, 2006 Page 2

Background to SJTAG Kick-off meeting at the May 2005 European Board Test Workshop, Tallinn, Estonia: 14 attendees Representatives from ASSET InterTech, BAE Systems, Cisco, Ericsson, Firecron, Goepel, ITT, JTAG Technologies, National Semiconductor, Nokia, Saab Test + Independent Consultants Follow-on meetings at ITC 2005 and EBTW 2006 Presentations available at www.dft.co.uk/sjtag Slide 5 What Are We Talking About? Bus Protocol Interface Device Motherboard (Backplane) 4 Connection to a dedicated backplane test bus or to an Ethernet/USB port. Prototype system debug. Manufacturing test, On-site customer installation. In-service field-service calls. Repair depots. Test Bus Device Slide 6 SJTAG Core Group, 2006 Page 3

We Are Still Defining Terms.. UUT System Test and Configuration external Boundary Scan Test Embedded Boundary Scan Test : program development and runtime controller Embedded Test Controller JTAG Protocol Manager Device Not Not an an easy easy job, job, Maisie. Maisie. I I know, know, I I know. know. Slide 7 Embedded Test Controller Embedded Embedded Test Test Controller Controller with with separate separate JTAG JTAG Protocol Protocol Manager Manager 1532 cpld RAM RAM RAM RAM 1149.1 µproc 1149.6 LVDS 1149.1 PROM 1149.6 LVDS DIMM Socket FPGA Flash 1532 cpld RAM RAM RAM RAM 1149.1 µproc 1149.6 LVDS 1149.6 LVDS DIMM Socket Embedded Embedded Test Test Controller 1149.1 Controller with with direct direct IO FPGA PROM IO TAP TAP signals signals Flash Test Manager JTAG Protocol Manager Path Select B 1 Path Select B 2 TDO TDI TCK TMS1 TRST Test Bus System Backplane Slide 8 SJTAG Core Group, 2006 Page 4

System Test Use Scenarios Bus Protocol Interface Device Motherboard (Backplane) 4 Connection to a dedicated backplane test bus or to an Ethernet/USB port. Prototype system debug. Manufacturing test, On-site customer installation, In-service field-service calls. Repair depots. Test Bus Device Slide 9 external Boundary Scan Test (XBST) Bus Protocol Interface Device Motherboard (Backplane) 4 Standard or Proprietary WAN Communication Protocol provides: Learning the configuration of the system: what UUTs are present, in what slots, etc Creating (off-line) and applying (on-line) an overall UUT and system test plan Response capture and analysis Overall control of all test and config operations Test Bus Device Bare bones implementation Backplane access (Ethernet, USB, etc) UUT addressing scheme for multi-drop e.g. a gateway device. Slide 10 SJTAG Core Group, 2006 Page 5

Embedded Boundary Scan Test (EBST) Bus Protocol Interface Device Motherboard (Backplane) 4 Standard or Proprietary WAN Communication Protocol provides: Overall control of embedded test and configuration sequences: data load, start, results capture, logging, analysis and display Test Bus Device Fully-loaded implementation Backplane access (Ethernet, USB, etc) UUT addressing scheme for multi-drop e.g. a gateway device Embedded Test Controller with or without a separate JTAG Protocol Manager On-board path selection, if required. Slide 11 The Questions Question: should I I have an an external Test Manager do do all all the work and just have bare-bones additions to to the system, or or should I I have a fully-loaded Embedded Test Controller system and just use the as as an an overall test runtime and configuration controller? And, whichever way I I go, what are the implications: tradeoffs, benefits, ability to to leverage what already exists, invocation procedures, data formats and languages, etc.? Slide 12 SJTAG Core Group, 2006 Page 6

The Goal of SJTAG - 1 Vector and configuration data Response data Log and status data Commands Vector management Execution conditions set-up Execution control Response data retrieval Log and status data retrieval UUT recovery from a test (External or Embedded) JTAG Module JTAG Module Chains JTAG Module Chains µp Chains µp µp Chain JTAG Chain Selector JTAG Master Selector Chain Master Selector JTAG Master Multi-Board System Slide 13 The Goal of SJTAG - 2 The goal for for SJTAG is: is: for for all all variants of of XBST and EBST, to to define the data contents and formats communicated: between external platforms and internal Embedded Test Controllers, and between Embedded Test Controllers and the UUTs they serve in in an an open-standard vendor-independent and non-proprietary way. Slide 14 SJTAG Core Group, 2006 Page 7

The SJTAG Players Scan Support Device Vendors Firecron NatSemi Texas Inst Etc Vendors ASSET Goepel JTAG Tech Etc Slide 15 SJTAG Core Group, 2006 Page 8

To Become Involved in SJTAG Send e-mail to Ben Bennetts at ben@dft.co.uk Reminder: go to www.dft.co.uk/sjtag to download the current version of the white paper. Slide 17 EBTW 2006: Agenda Ben Bennetts, SJTAG Chairman: Introduction/status of SJTAG. Views from the industry Test manager vendors. Adam Ley, ASSET InterTech, USA Systems industry. Steve Harrison and Steve Lakin, Motorola, UK Scan support device vendors. Peter Horwood, Firecron, UK Slide 18 SJTAG Core Group, 2006 Page 9