1

Similar documents
Using Test Access Standards Across The Product Lifecycle

Testing Sequential Logic. CPE/EE 428/528 VLSI Design II Intro to Testing (Part 2) Testing Sequential Logic (cont d) Testing Sequential Logic (cont d)

Using the XC9500/XL/XV JTAG Boundary Scan Interface

Section 24. Programming and Diagnostics

Section 24. Programming and Diagnostics

SV1C Personalized SerDes Tester

7 Nov 2017 Testing and programming PCBA s

Ilmenau, 9 Dec 2016 Testing and programming PCBA s. 1 JTAG Technologies

Introduction to JTAG / boundary scan-based testing for 3D integrated systems. (C) GOEPEL Electronics -

Overview of BDM nc. The IEEE JTAG specification is also recommended reading for those unfamiliar with JTAG. 1.2 Overview of BDM Before the intr

BSDL Validation: A Case Study

the Boundary Scan perspective

12. IEEE (JTAG) Boundary-Scan Testing for the Cyclone III Device Family

18 Nov 2015 Testing and Programming PCBA s. 1 JTAG Technologies

Remote Diagnostics and Upgrades

Chapter 19 IEEE Test Access Port (JTAG)

C65SPACE-HSSL Gbps multi-rate, multi-lane, SerDes macro IP. Description. Features

16 Dec Testing and Programming PCBA s. 1 JTAG Technologies

SµMMIT E & LXE/DXE JTAG Testability for the SJ02 Die

Using IEEE Boundary Scan (JTAG) With Cypress Ultra37000 CPLDs

Chapter 10 Exercise Solutions

of Boundary Scan techniques.

JRC ( JTAG Route Controller ) Data Sheet

BABAR IFR TDC Board (ITB): system design

SV1C Personalized SerDes Tester. Data Sheet

Using the XSV Board Xchecker Interface

BTW03 DESIGN CONSIDERATIONS IN USING AS A BACKPLANE TEST BUS International Test Conference. Pete Collins

UNIT IV CMOS TESTING. EC2354_Unit IV 1

Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test

Unit V Design for Testability

TKK S ASIC-PIIRIEN SUUNNITTELU

A Briefing on IEEE Standard Test Access Port And Boundary-Scan Architecture ( AKA JTAG )

JTAG Test Controller

Product Update. JTAG Issues and the Use of RT54SX Devices

Comparing JTAG, SPI, and I2C

3. Configuration and Testing

Subjects. o JTAG Technologies (Rik Doorneweert, Area Manager) o JTAG Technologies B.V. activities o Introduction to (classic) Boundary Scan

Device 1 Device 2 Device 3 Device 4

Digital Integrated Circuits Lecture 19: Design for Testability

IIIHIII III. Signal in. BIST ShiftDR United States Patent (19) Tsai et al. Out Mode Signal out. mclockdr. SCOn

CMOS Testing-2. Design for testability (DFT) Design and Test Flow: Old View Test was merely an afterthought. Specification. Design errors.

Memec Spartan-II LC User s Guide

XJTAG DFT Assistant for

SERDES Eye/Backplane Demo for the LatticeECP3 Serial Protocol Board User s Guide

FPGA Design with VHDL

SµMMIT E & LXE/DXE Built-In-Self-Test Functionality for the JA01 Die

Achieving Timing Closure in ALTERA FPGAs

Debugging IDT S-RIO Gen2 Switches Using RapidFET JTAG

Y. Tsiatouhas. VLSI Systems and Computer Architecture Lab. Boundary Scan (JTAG ) 2

Combating Closed Eyes Design & Measurement of Pre-Emphasis and Equalization for Lossy Channels

Combating Closed Eyes Design & Measurement of Pre-Emphasis and Equalization for Lossy Channels

Prototyping Solutions For New Wireless Standards

University of Arizona January 18, 2000 Joel Steinberg Rev. 1.6

Document Part Number: Copyright 2010, Corelis Inc.

IEEE Standard (JTAG) in the Axcelerator Family

Logic Analysis Basics

Logic Analysis Basics

ASNT8140. ASNT8140-KMC DC-23Gbps PRBS Generator with the (x 7 + x + 1) Polynomial. vee. vcc qp. vcc. vcc qn. qxorp. qxorn. vee. vcc rstn_p.

XJTAG DFT Assistant for

Transmission of High-Speed Serial Signals Over Common Cable Media

SignalTap Plus System Analyzer

SERDES Eye/Backplane Demo for the LatticeECP3 Versa Evaluation Board User s Guide

Powerful Software Tools and Methods to Accelerate Test Program Development A Test Systems Strategies, Inc. (TSSI) White Paper.

In-System Programmability Guidelines

XJTAG DFT Assistant for

12-Port Serial RapidIO Switch

XJTAG DFT Assistant for

OpenOCD - Beyond Simple Software Debugging

Practical De-embedding for Gigabit fixture. Ben Chia Senior Signal Integrity Consultant 5/17/2011

Laboratory 4. Figure 1: Serdes Transceiver

Scan. This is a sample of the first 15 pages of the Scan chapter.

AMI Modeling Methodology and Measurement Correlation of a 6.25Gb/s Link

Chrontel CH7015 SDTV / HDTV Encoder

ontap BOUNDARY SCAN SOFTWARE PRODUCT FEATURES AND SCREEN TOUR FLYNN SYSTEMS CORP.

Lecture 18 Design For Test (DFT)

Extending JTAG for Testing Signal Integrity in SoCs

XJTAG. Boundary Scan Tool. diagnosys.com

V6118 EM MICROELECTRONIC - MARIN SA. 2, 4 and 8 Mutiplex LCD Driver

Performance Modeling and Noise Reduction in VLSI Packaging

K.T. Tim Cheng 07_dft, v Testability

ACS College of Engineering. Department of Biomedical Engineering. HDL pre lab questions ( ) Cycle-1

Transmission of High-Speed Serial Signals Over Common Cable Media

ASNT8142-KMC Generator of DC-to-23Gbps PRBS with Selectable Polynomials

DEPARTMENT OF ELECTRICAL &ELECTRONICS ENGINEERING DIGITAL DESIGN

10Gbps SFP+ Optical Transceiver, 10km Reach

Complete 10-Bit, 25 MHz CCD Signal Processor AD9943

Raspberry Pi debugging with JTAG

Complete 10-Bit/12-Bit, 25 MHz CCD Signal Processor AD9943/AD9944

System IC Design: Timing Issues and DFT. Hung-Chih Chiang

Complete 12-Bit 40 MHz CCD Signal Processor AD9945

Universal ByteBlaster

10-Quad RapidIO Switch

Description of the Synchronization and Link Board

ECE 372 Microcontroller Design

Ashling Product Brief APB219 v1.0.3, 12 th October 2018

Tools to Debug Dead Boards

GHz Sampling Design Challenge

Adding Analog and Mixed Signal Concerns to a Digital VLSI Course

COPYRIGHT 2011 AXON DIGITAL DESIGN BV ALL RIGHTS RESERVED

Receiver Testing to Third Generation Standards. Jim Dunford, October 2011

Transcription:

1

2

3

BOUNDARY REGISTER INIT-DATA REGISTER 0 1 ADC DAC System Reset SysReset On-chip Reset via TAP PLL Protocol Swing ECID Unique ID 0 1 AC/DC Voltage Monitor PRBS CMMV PCB Level Obstacle www.intellitech.com User Defined Chain(s) Logic BIST Memory BIST BIST Failure Data For ATE PCB Level Obstacle IC1 IR & Decode & Muxing TAP 4

5

settdi u1.mbist-csr start settdi u1.alg walk1 drscan runtest 10000 set result [gettdo status] If {$result!= pass} puts memorybist failed 6

7

8

Stable temperature Changing temp 50ohm Z T DUT card design, dedicated Std. FR4, multi-ic signals Low noise Power, DC/DC converters Commodity LDOs, DC/DC Perfect Low jitter, 50/50 duty clocks Tin Can Osc, System origin clocks BIST/Compression vectors, delay test JTAG assisted Functional/BIST On-Chip test via IEEE 1149.1 - the lowest common denominator 9

10

11

12

13

14

15

16

17

IP Block www.intellitech.com TDR 18

19

IC BIST IC Logic block TDR Register TAP 20

P1 PRBS TAP 21

IC1 IC2 IP BLOCK 22

IC2 Far End Loopback www.intellitech.com HSIO Test IP BLOCK 23

HDL www.intellitech.com EMS 24

25

2.5V INPUT ( Open0) A INPUT (Open1) B OUTPUT2 C Bidir with Pull0 D Bidir with Pull0 www.intellitech.com 1.8V POWER_POS INPUT ( PULL1) Bidir with Pull0 Control Obstacle 26

MODE=1 VDD www.intellitech.com + - HSIO D GND 27

BER XMIT BER RCVR 28

IC2 DC/DC Converter 3.3V www.intellitech.com BIDIR BIDIR BIDIR BIDIR A B C D POWER_POS INPUT LINKAGE_IN LINKAGE_IN LINKAGE_IN LINKAGE_IN IC1 VREF_IN VREF_OUT INPUT POWER_0 DC/DC Converter 2.5V 29

30

31

BSDL for Internal JTAG TDR registers - for BIST/PLLs/SERDES IP blocks www.intellitech.com MNEMONICS for JTAG registers - Easy to remember words Package files for on-chip Infrastructure IP blocks - self-contained definitions for IIP PDL Script files for device initialization and IIP access - operates on registers, packages, Mnemonics 32

33

BOUNDARY REGISTER INIT-DATA REGISTER 0 1 ADC DAC System Reset SysReset On-chip Reset via TAP PLL Protocol Swing ECID Unique ID 0 1 AC/DC Voltage Monitor PRBS CMMV PCB Level Obstacle www.intellitech.com User Defined Chain(s) Logic BIST Memory BIST BIST Failure Data For ATE PCB Level Obstacle IC1 IR & Decode & Muxing TAP 34

To next cell Mode www.intellitech.com G1 0 To System Logic 1 1D C1 ClockDR 1D C1 UpdateDR 35

BOUNDARY REGISTER INIT-DATA REGISTER 0 1 ADC DAC System Reset SysReset On-chip Reset via TAP PLL Protocol Swing ECID Unique ID 0 1 AC/DC Voltage Monitor PRBS CMMV PCB Level Obstacle www.intellitech.com User Defined Chain(s) Logic BIST Memory BIST BIST Failure Data For ATE PCB Level Obstacle IC1 IR & Decode & Muxing TAP 36

37

38

New standard INIT_DATA & INIT_STATUS TDRs New instructions, INIT_SETUP/INIT_RUN -Use between PRELOAD and EXTEST - Turn off PLLs -Setup I/Os (Vcm, Vswing, protocol. ) www.intellitech.com INIT_SETUP access INIT_DATA - Uses TAP, CE, power - INIT_DATA bits control the above INIT_RUN access INIT_Status register. Can clock TCK in RTI. - Pass/Fail, Done other bits as needed 39

Why can t I/O settings be delivered in BSDL? U1 PCIe U2 SRIO TypeC.BSDL IO1 U3 IO1 U4 TypeC.BSDL U3.PDL iproc init_setup {} { iwrite IO1 PCIe iapply } U4.PDL iproc init_setup {} { iwrite IO1 SRIO iapply } Board Test Engineer Developed via Software or from Templates from IC Vendor Board.PDL icall U3.init_setup icall U4.init_setup www.intellitech.com Board Test Engineer Developed via Board Test Software, Automatically, assisted or manually 40

Basic Register Fields attribute REGISTER_FIELDS of INIT_Example : entity is "init_data ( "& "(Clock[5] IS (504 DOWNTO 500) ), "& "(Protocol[3] IS (302 DOWNTO 300) ), "& "(Voltage[2] IS ( 101 DOWNTO 100) ), "& "(Reserved [20] IS ( 19 DOWNTO 0) ) "& ");" www.intellitech.com BSDL syntax for INIT_DATA and For Clause 9 user defined TDRs 41

MNEMONICS attribute REGISTER_MNEMONICS of SERDES : package is " Protocol ( & " OFF (000) <I/Os powered down>, "& " PCIe (001) <PCI Express>, "& " SATA (010) <SATA>, "& " SRIO (011) <Serial RapidIO>, "& " XAUI (100) <XAUI>, "& " Rsvd1 (101) <Undefined, do not use>"& )," & "Clockset ( " & " F125Mhz (00111), "& " F100Mhz (10101), "& " Illegal (00000) <Do not use!>)"; www.intellitech.com 42

Basic Register Fields with Mnemonics attribute REGISTER_FIELDS of INIT_Example : entity is "init_data ( "& "(Clock[5] IS (504 DOWNTO 500) Default(Clockset(100Mhz) ), "& "(Protocol[3] IS (302 DOWNTO 300) Default(Protocol (off) ), "& "(Voltage[2] IS ( 101 DOWNTO 100) RESETVAL(11) ), "& "(Reserved [20] IS ( 19 DOWNTO 0))"& ")" & mytdr ( "& "(Addr[64] IS (163 DOWNTO 100) ), "& (Data[64] IS (227 DOWNTO 164) ), "& (WE[1] IS (228) RESETVAL(1) ), "& (TempMON[7] IS (236 DOWNTO 229)) "& ); www.intellitech.com 43

44

Device PDL (Procedure Definition Language) - Board specific Proc init_setup {} { iwrite Clock F125Mhz # use of mnemonics iwrite Voltage 0H01 # use of values iwrite Protocol PCIe iapply } www.intellitech.com Proc init_status {} { iread Status(1) Pass iapply } # use of mnemonics 45

Some PDL Commands iwrite <reg> <value> mnemonic iread <reg> <expected> mnemonic iapply iprefix <dotted path> ireset iendstate RTI PDR irunloop <TCK-Count> icall <iproc name> itarget <instance> www.intellitech.com # perform DR scan RTI-RTI # iprefix bank0.serdes # Test Logic Reset # set end state # Loop in RTI 46

iprefix U1 # U1.LBIST # run some basic tests on registers iwrite LBIST RUN # bit-position independent regs iapply irunloop 300000 iread LBISTSTATUS PASS # check that LBIST passed iapply iwrite SWING S400MV # set differential Swing to 400mv iwrite PROTOCOL1 SRIO # set protocol to SRIO iapply iwrite CAMBIST RUN # execute CAM BIST iapply iread CAMSTATUS DONE www.intellitech.com 47

attribute REGISTER_PORT_ASSOCIATION ("& www.intellitech.com "SerDes00_PRBS (SD_RX(0), SD_RX_B(0), SD_TX(0), SD_TX_B(0)),"& "SerDes01 (SD_RX(1), SD_RX_B(1), SD_TX(1), SD_TX_B(1)) ; 48

3 SERDES with init_data Registers Common PLL www.intellitech.com 49

---------------------------------------------------------- -- Package file including single SERDES segment -- and a 3 SERDES plus clock segment. -- Copywrong of the XYZ corp. ---------------------------------------------------------- PACKAGE XYZ_IO IS USE Std_1149_1_2013.all; www.intellitech.com attribute REGISTER_MNEMONICS of XYZ_IO : package IS "SerDes_Protocol (off (000) <Powered down>, "& " PCIe (001) <PCIExpress>, "& " SATA (010) <SATA>, "& " SRIO (011) <Serial RapidIO>, "& " XAUI (101) <XAUI>, "& " Resvd1 (100) <Undefined behavior - Do Not Use>, "& " Resvd2 (11X) <Undefined behavior - Do Not Use>), "& "SerDes_TX_Outputs (off (00) <Powered down>, "& -- Output driver swing level " Full_Swing (01) <100% Swing>, "& " Swing_p75 (10) <75% Swing>, "& " Swing_p527 (11) <52.7% Swing - Not legal if XAUI is protocol>), "& 50

attribute REGISTER_FIELDS of XYZ_IO : package IS "Channel [5] ( "& "Protocol[3] (2, 0, 1) IS DEFAULT (SerDes_Protocol (PCIe)) "& RESETVAL(SerDes_Protocol (off)), "& "TX_Swing [2] (3, 4) IS DEFAULT (SerDes_TX_Outputs (off)) "& "), "& www.intellitech.com END XYZ_IO; ----------------------------------------------------------------------------- --- PACKAGE BODY XYZ_IO IS USE Std_1149_1_2013.all; END XYZ_IO; 51

Register assembly bits predefined defined length calculated by BSDL reader Use XYZ_IO.all; Use XYZ_PLL.all; -- stuff removed for brevity www.intellitech.com attribute REGISTER_ASSEMBLY of INIT_Example : entity is "init_data ( "& (USING XYZ_PLL), & ( P1 is Settings), & ( USING XYZ_IO ), & ( Array SerDes(1 TO 2) is Channel), & ( dummy[1] ), & ( SerDes( 0) is Channel ), & ( reserved[105] ) & "); TDI Rsrvd SERDES SERDES SERDES PLL TDO 52

53

54