MPPC (Multi-Pixel Photon Counter)

Similar documents
MPPC (Multi-Pixel Photon Counter) arrays

MPPC (multi-pixel photon counter)

MPPC (Multi-Pixel Photon Counter)

Short wavelength type APD. Effective photosensitive area (mm) Effective photosensitive area size* 2

Peak emission wavelength: 3.9 μm

Photosensitive area size (mm) Reverse voltage VR max (V) R to +60

Low bias operation, for 800 nm band

Parameter Symbol Specification Unit Photosensitive area - ɸ0.8 mm Package mm

MPPC modules. MPPC array modules for very-low-level light detection, 16 ch analog output. C13368/C13369 series (Analog output type)

M=100, RL=50 Ω λ=800 nm, -3 db

Parameter Specification Unit Photosensitive area mm Package Glass epoxy - Seal material Silicone resin -

Effective photosensitive area. Photosensitive area size

Photosensor with front-end IC

Photon counting module

Peak emission wavelength: 4.3 μm

Effective photosensitive area (mm)

Effective photosensitive area (mm) Photosensitive area size

Effective photosensitive* 2 area size. Storage temperature Tstg (mm) ( C) ( C) S φ0.2 φ0.5 S φ to to +100 S9075

Si photodiode. Applicable to lead-free solder reflow and wide temperature range. S9674. Absolute maximum ratings

Parameter Specification Unit Photosensitive area mm Package Glass epoxy - Seal material Epoxy resin -

Power supply for MPPC

RGB color sensor. Effective photosensitive area. Green, Red: 2.25 Blue : 4.5

Optics modules. Absorbance measurement module with built-in photodiode array, optical elements, current-tovoltage. C13398 series.

InAsSb photovoltaic detectors

Power supply for MPPC

Photo IC diode. Wide operating temperature: -40 to +105 C. S MT. Absolute maximum ratings (Ta=25 C)

These Si photodiodes have sensitivity in the UV to near IR range. They are suitable for low-light-level detection in analysis and the like.

InAsSb photovoltaic detector

16-element Si photodiode arrays

InGaAs PIN photodiode arrays

16-element Si photodiode arrays

InAsSb photovoltaic detectors

Application OCT. Dimensions (mm) Weight (g) Operating temperature* 1 Storage temperature* 1 λ=1.55 μm (V) (mw)

Photo IC diode. Plastic package shaped the same as metal package. S SB. Features. Applications

Suppressed IR sensitivity

Signal processing circuit for 2-D PSD

Si PIN photodiodes. High-speed detectors with plastic package. Structure. Absolute maximum ratings

Applications. Photosensitive area size. Storage temperature Tstg (mm) (mm 2 ) (V) ( C) ( C) S

APD modules. Operates an APD with single 5 V supply (standard type, short-wavelength type) C12702 series.

Signal processing circuit for 1-D PSD

Si PIN photodiodes. High-speed detectors with plastic package. Structure. Absolute maximum ratings

1-D PSD with small plastic package

Reverse voltage VR max. Electrical and optical characteristics (Typ. Ta=25 C, unless otherwise noted) Short. Temp. S coefficient (A/W) of

16-element Si photodiode arrays

Infrared detector modules with preamp

Driver circuit for InGaAs linear image sensor

Non-discrete position sensors utilizing photodiode surface resistance

InAsSb photovoltaic detector

Photo IC diode. Plastic package shaped the same as metal package. S SB. Absolute maximum ratings (Ta=25 C)

Driver circuit for MPPC

Between elements measure. Photosensitive area (per 1 element)

Reduced color temperature errors

Photo IC diode. COB (chip on board) type, small package. S CT. Absolute maximum ratings

Driver circuit for InGaAs linear image sensor

APD modules. APD module integrated with peripheral circuits. C12703 series. Selection guide. Block diagram

Signal processing circuit for 2-D PSD

Peak sensitivity wavelength λp (nm) Photosensitive area (mm)

Accessories for infrared detector

Driver circuit for CMOS linear image sensor

Signal processing circuit for 1-D PSD

Photodiode modules. C10439 series. Integrates photodiode for precision photometry with low-noise amp.

Driver circuit for CCD linear image sensor

PbSe photoconductive detectors

Photo IC for optical switch

MCT photoconductive detectors

Photosensitive area (mm) 4 4. Peak sensitivity wavelength (nm) Supply voltage Dark state. Max. Vcc max. Tstg Min. Max. (ma) (V)

16-element Si photodiode arrays

MCT photoconductive detectors

NMOS linear image sensor

Mini-spectrometer. SMD series C14384MA-01. High sensitivity in the near infrared region (to 1050 nm), ultra-compact grating type spectrometer

Driver circuits for CCD image sensor

S P. Ultra-miniature, high performance Electromagnetically driven laser scanning MEMS mirror. Features.

High-speed photodiodes (S5973 series: 1 GHz)

12-bit digital output

Driver circuit for CMOS linear image sensor

Distance linear image sensor

InGaAs multichannel detector head

APD module. Variable gain, stable detection even at high gain. C Applications. Features. Sensitivity vs.

MPPC modules. Photon counting module with built-in MPPC. C series C10751 series. Selection guide

CMOS linear image sensors

Driver circuit for CCD linear image sensor

MPPC and MPPC module for precision measurement

CMOS linear image sensor

InGaAs linear image sensors

Driver circuit for CCD linear image sensor

CMOS linear image sensor

LCOS-SLM (Liquid Crystal on Silicon - Spatial Light Modulator)

InGaAs linear image sensors

CMOS linear image sensor

Driver circuits for photodiode array with amplifier

CMOS linear image sensor

CMOS linear image sensors

Artisan Technology Group is your source for quality new and certified-used/pre-owned equipment

TM series TM-UV/VIS-MOS

Driver circuit for CCD image sensor

Applications. l Image input devices l Optical sensing devices

Variable gain and stable detection even at high gains

mini-spectrometer TG series Long-wavelength type (to 2.55 μm) nearinfrared C11118GA Optical characteristics (Ta=25 C)

Mini-spectrometer. TF series. Compact and thin, built-in high-sensitivity CMOS image sensor for Raman spectroscopy C14214MA. Applications.

CMOS linear image sensors

Transcription:

MPPC (Multi-Pixel Photon Counter) MPPCs in a chip size package miniaturized through the adoption of TSV structure The are MPPCs for precision measurement miniaturized by the use of TSV (through-silicon via) and CSP (chip size package) technologies. The adoption of a TSV structure made it possible to eliminate wiring on the photosensitive area side, resulting in a compact structure with little dead space compared with previous products. The fourside buttable structure allows multiple devices to be arranged side by side to fabricate large-area devices. They are suitable for applications, such as medical, non-destructive inspection, environmental analysis, and high energy physics experiment, that require photon counting measurement. Features Applications Low crosstalk Low afterpulse Outstanding photon counting capability (outstanding photon detection efficiency versus numbers of incident photons) Compact chip size package with little dead space Low voltage (VBR=53 V typ.) operation High gain: 10 5 to 10 6 Astro physical application High energy physics experiment Nuclear medicine PET Environmental analysis Lower noise When an MPPC detects photons, the output may contain spurious pulses, namely afterpulse and crosstalk, that are separate from the output pulses of the incident photons. Afterpulses are output later than the timing at which the incident light is received. Crosstalk is output from other pixels at the same time as the detection of light. Previous products achieved lower afterpulse through the improvement of material and wafer process technology, but with the S13360-2050VE/-3050VE/-6050VE, low crosstalk has been achieved in addition to low afterpulse. Pulse waveform comparison (typical example) Previous product Improved product (reference data: S13360-3050VE) (M=5 10 6 ) (M=5 10 6 ) 50 mv 50 mv 10 ns 10 ns www.hamamatsu.com 1

Structure Parameter Symbol S13360-2050VE -3050VE -6050VE Unit Effective photosensitive area - 2 2 3 3 6 6 mm Pixel pitch - 50 μm Number of pixels - 1584 3584 14336 - Fill factor - 74 % Package - Surface mount type - Window - Epoxy resin - Refractive index of window material - 1.55 - Absolute maximum ratings (Ta=25 C) Parameter Symbol Value Unit Operating temperature* 1 Topr -20 to +60 C Storage temperature* 1 Tstg -20 to +80 C Reflow soldering conditions* 2 Tsol Peak temperature: 240 C, twice (see P.6) - *1: No dew condensation When there is a temperature difference between a product and the surrounding area in high humidity environment, dew condensation may occur on the product. Dew condensation on the product may cause deterioration in characteristics and reliability. *2: JEDEC level 5a Note: Exceeding the absolute maximum ratings even momentarily may cause a drop in product quality. Always be sure to use the product within the absolute maximum ratings. Electrical and optical characteristics (Ta=25 C, Vover=3 V, unless otherwise noted) Parameter Symbol S13360-2050VE -3050VE -6050VE Unit Spectral response range λ 320 to 900 nm Peak sensitivity wavelength λp 450 nm Photon detection efficiency (λ=λp)* 3 PDE 40 % Dark count* 4 Typ. 0.3 0.5 2 - Max. 0.9 1.5 6 Mcps Terminal capacitance Ct 140 320 1300 pf Gain M 1.7 10 6 - Breakdown voltage* 5 VBR 53 ± 5 V Recommended operating voltage Vop VBR + 3 V Temperature coefficient of recommended operating voltage ΔTVop 54 mv/ C *3: Photon detection efficiency does not include crosstalk or afterpulses. *4: Threshold=0.5 p.e. *5: If you have any requests of breakdown voltage selection, please feel free to contact us. Note: The above characteristics were measured at the operating voltage that yields the listed gain. (See the data attached to each product.) 2

Connection example +V Photon detection efficiency vs. wavelength (typical example) 1 kω 50 (Ta=25 C) μf MPPC Amplifier Signal Photon detection efficiency (%) 40 30 20 10 KAPDC0024EB 0 200 300 400 500 600 700 800 900 1000 Wavelength (nm) KAPDB0317EA Photon detection efficiency does not include crosstalk or afterpulses. Overvoltage specifications of gain, crosstalk probability, photon detection efficiency (typical example) Gain 6 10 6 5 10 6 4 10 6 3 10 6 2 10 6 1 10 6 Gain Crosstalk probability Photon detection efficiency (λ=450 nm) (Ta=25 C) 60 0 0 0 2 4 6 8 10 50 40 30 20 10 Crosstalk probability, photon detection efficiency (%) Overvoltage (V) KAPDB0324EA MPPC characteristics vary with the operating voltage. Although increasing the operating voltage improves the photon detection efficiency and time resolution, it also increases the dark count and crosstalk at the same time, so an optimum operating voltage must be selected to match the application. 3

Dimensional outlines (unit: mm) S13360-2050VE 2.0 area 2.0 2.0 1.35 ± 0.2 Anode (2 ) ɸ0.5 2.4 2.4 2.0 Epoxy resin Cathode (2 ) ɸ0.5 Tolerance unless otherwise noted: ± KAPDA0174EA S13360-3050VE area 3.0 3.0 3.4 3.0 3.4 3.0 1.35 ± 0.2 Epoxy resin Cathode (common) (4 ) ϕ0.7 Anode ϕ0.7 Tolerance unless otherwise noted: ± KAPDA0175EA S13360-6050VE 6.4 area 6.0 6.0 6.0 6.4 6.0 Epoxy resin 1.35 Cathode (outer pads) (4 ) ϕ0.7 Anode (inner pads) (4 ) ϕ0.7 Tolerance unless otherwise noted: ± KAPDA0176EA 4

Cross section detail (unit: mm) Package edge to photosensitive area 0.2 Resin Chip Electrode Solder bump Substrate KAPDC0059EA Recommended land pattern (Unit: mm) S13360-2050VE S13360-3050VE (4 ) ɸ0.5 (5 ) ɸ0.7 KAPDC0053EB KAPDC0054EA S13360-6050VE (8 ) ɸ0.7 KAPDC0055EA 5

Temperature profile measurement example using our experimental hot-air reflow oven 300 C 240 C max. 220 C Temperature 190 C 170 C Preheat 70 to 90 s Soldering 40 s max. Time KPICB0171EA This mount type package product supports lead-free soldering. After unpacking, store it in an environment at a temperature of 25 C or less and a humidity of 60% or less, and perform soldering within 24 hours. The effect that the product is subject to during reflow soldering varies depending on the circuit board and reflow furnace that are used. Before actual reflow soldering, check for any problems by testing out the reflow soldering methods in advance. When three or more months have passed or if the packing bag has not been stored in an environment described above, perform baking. For the baking method, see the related information Precautions of Surface mount type products. Precautions If necessary, incorporate appropriate protective circuits in power supplies, devices, and measuring instruments to prevent overvoltage and overcurrent. 6

Related product Power supply for MPPC C11204 series The C11204 series is a high voltage power supply that is optimized for driving MPPCs. Since it has a temperature compensation function, MPPCs can be driven stably even in environments subject to temperature changes. C11204-02 C11204-01 Power supplies for MPPC lineup Type no. Package type Temperature stability (ppm/ C) Voltage boost circuit MR (magnetic resonance) compatibility Features C11204-01 With leads ±10 Yes - C11204-02 Surface mount ±10 Yes - C11204-03 With leads ±10 - Yes C11204-04 Surface mount ±30 - Yes High precision Low ripple noise High precision Low ripple noise Compact: 11.5 x 11.5 mm MR compatible Low price MR compatible Low price Compact: 11.5 x 11.5 mm Related information www.hamamatsu.com/sp/ssd/doc_en.html Precautions Disclaimer Metal, ceramic, plastic package products Surface mount type products Technical information MPPC MPPC is a registered trademark of Hamamatsu Photonics K.K. Information described in this material is current as of June, 2016. Product specifications are subject to change without prior notice due to improvements or other reasons. This document has been carefully prepared and the information contained is believed to be accurate. In rare cases, however, there may be inaccuracies such as text errors. Before using these products, always contact us for the delivery specification sheet to check the latest specifications. The product warranty is valid for one year after delivery and is limited to product repair or replacement for defects discovered and reported to us within that one year period. However, even if within the warranty period we accept absolutely no liability for any loss caused by natural disasters or improper product use. Copying or reprinting the contents described in this material in whole or in part is prohibited without our prior permission. www.hamamatsu.com HAMAMATSU PHOTONICS K.K., Solid State Division 1126-1 Ichino-cho, Higashi-ku, Hamamatsu City, 435-8558 Japan, Telephone: (81) 53-434-3311, Fax: (81) 53-434-5184 U.S.A.: Hamamatsu Corporation: 360 Foothill Road, Bridgewater, N.J. 08807, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218, E-mail: usa@hamamatsu.com Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 8152-375-0, Fax: (49) 8152-265-8, E-mail: info@hamamatsu.de France: Hamamatsu Photonics France S.A.R.L.: 19, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10, E-mail: infos@hamamatsu.fr United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777, E-mail: info@hamamatsu.co.uk North Europe: Hamamatsu Photonics Norden AB: Torshamnsgatan 35 16440 Kista, Sweden, Telephone: (46)8-509 031 00, Fax: (46)8-509 031 01, E-mail: info@hamamatsu.se Italy: Hamamatsu Photonics Italia S.r.l.: Strada della Moia, 1 int. 6, 20020 Arese (Milano), Italy, Telephone: (39)02-93 58 17 33, Fax: (39)02-93 58 17 41, E-mail: info@hamamatsu.it China: Hamamatsu Photonics (China) Co., Ltd.: B1201, Jiaming Center, No.27 Dongsanhuan Beilu, Chaoyang District, Beijing 100020, China, Telephone: (86) 10-6586-6006, Fax: (86) 10-6586-2866, E-mail: hpc@hamamatsu.com.cn Taiwan: Hamamatsu Photonics Taiwan Co., Ltd.: 8F-3, No. 158, Section2, Gongdao 5th Road, East District, Hsinchu, 300, Taiwan R.O.C. Telephone: (886)03-659-0080, Fax: (886)03-659-0081, E-mail: info@tw.hpk.co.jp Cat. No.KAPD1053E02 Jun. 2016 DN 7