TRM Module. l TRM = Transmitter Receiver Module. l Communication to the module is essential. l Each module is individually tested

Transcription

1 T/R Module Test

2 TRM Module l TRM = Transmitter Receiver Module l Communication to the module is essential l Each module is individually tested l Test equipment must be protected due to high Tx power l All Tx tests are pulsed l Example designs:

3 Typical Tests General l EEPROM programming l Sensor temperatur l 1,024 to 65,536 states per frequency Rx l S-parameter for all attenuation and phase values l Noise figure l Compression point l Intermodulation l Out of band rejection l Spurious l Tx l S-parameter for all attenuation and phase values l Output power vs. input power l Saturated output power l Pulse parameters l Power added efficiency l Spurious and harmonics l Intermodulation Typically measurement values for full characterization of one TRM module

4 Manual or Automated Test l Full characterization of 1 TRM requires 1 week or more l Automatic full characterization can easily take 12 hours and requires SW test routines RF measurement data Antenna connector TX in / RX out Communication Trigger RX enable / TX enable DUT TR Module TRM Control Interface control of gain / phase PC with TRM control SW Voltage / current monitoring DUT power lines

5 T/R Module manual Test Solution for R&D ZVA+ZVAX-TRM ı Device from the shelf ı Ideal for R&D application ı TX and RX tests can be performed sequentially ı Complete control via ZVA GUI

6 ZVAX-TRM Meas 2 Out Ref 2 Out Src 2 In Port 2 Ref 4 In Ref 4 Out Src 4 In Src 4 Out ZVAX-TRM Meas 1 Out Ref 1 Out Src 1 In Port 1 Ref 3 In Ref 3 Out Src 3 In Src 3 Out pulse modulator amplifier combiner path access high power coupler

7 Special Features of R&S ZVAX-TRM ı 3 pulse modulators in 3 source paths Bidirectional pulsed measurements ı Two combiners Intermodulation measurements in two directions, pulsed intermodulation measurements ı Internal LNA for noise figure test ı Internal power amplifier High output power under all conditions ı Switchable access to source and receiver paths Additional power amplifiers for high power applications Additional LNA for noise figure measurement ı R&S ZVA with 4 sources Fast intermodulation and mixer measurements

8 Intuitive User Interface

9 TRM Test Solution for Production R&S ZVA24: 24GHz Network Analyzer R&S OSP-TRM Multiplexing, Pulse Modulator, Switching, Combiner, LNA... R&S TSVP PXI Platform: Communication to Device Under Test (DUT), trigger generation, system controller DUT power supply e.g. HMP4040 TS6710 (Low Rack Height) Customer Specific Test Sequencer

10 Automated Test e.g. TS6710

11 OSP-TRM High Customization ı Platform for high flexibility ı Combiners ı Pulse modulators ı Amplifiers ı Filters ı Multiport switches ı Controlled via sequencer

12 T/R Module Test Solution for Production ı ZVA + OSP-TRM ı Customization according to the requirements ı TX and RX test without reconnection of the T/R module ı Control Software with prepared test cases ı Control via external PC ı Digital control of the DUT ı Test of several DUTs in parallel

13 Test Suite TRM-LIB Features

14 Test Suite TRM-LIB DUT Control ı Support of devices without and with control (e.g. different DUT states) ı Digital control plugin programmed in C# for Communication with DUT Trigger generation ı Example C# source code enclosed, Adaptation by customer to his DUT Programming of the DUT actions to be carried out at each step Adaptation by customer or R&S

15 Requirements for the RF Equipment

16 High Performance for Intermodulation Trc1 b2 db Mag 15 db / Ref 0 dbm 1 b2 0 Mkr 2 Mkr Mkr GHz dbm Mkr MHz dbm Mkr MHz dbm Mkr GHz dbm >90 dbc IP3 40 dbm Mkr 3 Mkr Ch1 Arb Center 1 GHz Pwr 10 dbm Span 5 MHz

17 Typical Measurement Tasks for TR-Module Test ı Transmitter (TX) Transmission / reflection Low power Saturated power Pulse profile Harmonics Spurs ı Receiver (RX) Transmission / reflection Low power Saturated power Spurs Intermodulation Noise figure ı Number of states to be tested All combinations of phase and attenuator settings referred to basic setting Up to 1024 (5 bit) or (8 bit) combinations

18 High Output Power under all Conditions with Preamplifier No_OPTION a1(p1s) db Mag 5 db / Ref 0 dbm PCai Smo1 a1(p1s) M GHz dbm M GHz dbm no option Pumo a1(p1s) db Mag 5 db / Ref 0 dbm PCai Smo2 a1(p1s) GHz dbm M GHz dbm M2 pulse mod only Up to GHz with pulse modulator and combiner Ch1 fb Start 500 MHz a1(p1s) Pb 20 dbm Stop 20 GHz Ch2 fb Start 500 MHz Pb 20 dbm Stop 20 GHz Preamp_Pumo a1(p1s) db Mag 5 db / Ref 0 dbm PCai Sm 3 Pumo_Comb_PA a1(p1s) db Mag 5 db / Ref 0 dbm 4P GHz dbm M GHz dbm pulse mod + preamp M2 a1(p1s) GHz dbm M GHz dbm pulse mod + 0preamp + combiner M2 Ch3 fb Start 500 MHz Pb 10 dbm Stop 20 GHz Ch4 fb Start 500 MHz Pb 10 dbm Stop 20 GHz

19 Pulsed Measurement Capabilities ı Average pulse measurements Measurement versus power and frequency Receiver sampling time > pulse period Measures the average power of several pulses Measurement time / point time ı Point in pulse measurement (more accurate) Measurement versus power and frequency Receiver sampling time < pulse width Measures the peak power during one pulse ı Pulse profile measurement Measurement of the pulse versus time Receiver sampling time << pulse width (ZVA-K7) Measures the time dependent behavior during one pulse trigger delay trigger delay Measurement time / point data points Measurement time / point time time

20 Point in Pulse Measurement ı Frequency or power swept measurements ı Pulse width > sampling time ı Accurate power measurements during On time of the pulse ı Sampling time = (1..2) / IFBw ı Sampling MHz IFBw abt. 420 ns A t f 1 f 2 f 3 f 4 f 5 t τ f 1 f 2 f 3 f 4 f 5

21 Pulse Profile with R&S ZVA s Fast RAM-Mode

22 Pulse Profile with R&S ZVA s Fast RAM-Mode ı Measurement on one pulse with high sampling rate of 80 MHz and up to 30 MHz of bandwidth ı Time resolution 12.5 ns ı No loss of dynamic range by desensitization ı No re-calibration required, when pulse parameters are changed ı Measurements with single, double pulses and pulse trains possible ı Correction for delay caused by DUT with high electrical length

23 Internal Pulse Generators 2 independent pulse generators Minimum pulse width 12,5 ns Single pulse and pulse trains Individual delay, pulse width and polarity

24 Noise Figure Measurement with R&S ZVA Noise Figure Calculation: NF DUT SNR = 10log SNR input output P signal P input signaloutput = 10log 10log P noise P input noiseoutput : = CALdata : = NFmeas

25 Tests of the RX Path LNA for noise figure test 2 nd source for intermodulation combiner to generate 2-tone signal

26 Measurement Results RX Path S-parameters vs. frequency Intermodulation parameters vs. power S21 vs power Trc11 Trc12 Trc13 Trc14 S S21 S11 S22 S21 db Mag db Mag db Mag Phase 10 db / 10 db / 10 db / 1 / Ch1 fb Start 2 P1 GHz -30 dbm Trc8 Trc9 Trc10 Trc15 S Ref 0 db Ref 0 db Ref 0 db Ref C C C C GHz db UTO IM3UO IP3MO S21 db Mag db Mag db Mag db Mag Ch4 P1 Start -15 dbm 20 db / 20 db / 20 db / 1 db / Stop 3 GHz Ref 0 dbm Ref 0 dbm Ref 0 dbm Ref 30 db fb 2 GHz Trc2 UTO Trc4 IM3LO Trc7 IP3MO IP3MO Trc3 LTO Trc5 IM3UO Ch2 fb Start 2 P1 GHz -10 dbm PCal Off PCal Off PCal Off Ca? PCal Off dbm dbm 4 Stop 2 dbm NF Stop 3 GHz Trc6 b2(p1s) db Mag 15 db / Re 3 b2(p1s) Trc1 NF21 db Mag 2 db / Ref 0 db Ch5 fb Start 2 GHz P1-30 dbm Ch3 Arb Rec P1 Start -10 Stop dbm MHz GHz Cal NCal PCal Sm GHz db Stop 3 GHz Intermodulation parameters vs. frequency Intermodulation spectrum Noise figure

27 Test of the TX Path

28 Measurement Results TX Path S-parameter vs. frequency (pulsed ) Trc1 Trc2 Trc7 Trc8 S21 S21 S11 S22 S db Mag Phase db Mag db Mag 10 db / 3 / 10 db / 10 db / Ref 0 db Ref 25.6 Ref 0 db Ref 0 db Ca? Offs Ca? Smo Offs Ca? Offs Ca? Smo Offs GHz db GHz GHz db GHz db 1 Trc3 S21 Trc4 S21 Trc9 b2(p1s) S db Mag Phase db Mag 0.5 db / 1 / 2 db / Ref 28.5 db Ref Ref 18 dbm Cal Off Offs 2 Cal Off Smo O Offs S- parameter vs. power (pulsed ) Trc5 Trc10 Trc11 b2(p1s) S21 S21 db Mag db Mag Phase 10 db / 10 db / 45 / Ref 0 dbm Ref 0 db Ref 0 Cal Off Cal Off 3 Trc12 UTO Trc13 IM3UO Trc15 IP3MO db Mag db Mag db Mag 15 db / 15 db / 5 db / Ref -40 dbm Ref -40 dbm Ref 35 dbm 4 S21 vs time (pulse profile ) S21 TRG IM3UO Intermod. vs power

29 Measurement of complete DUT RX Path TX Path S21, S11 Trc11 Trc12 Trc14 S S21 S11 S21 db Mag db Mag Phase 10 db / 10 db / 2 / Ref 0 db Ref 0 db Ref 74 Ca? PCao Offs 1 Ca? PCao Offs Ca? PCao Smo Offs GHz db Trc2 Trc20 Trc21 S S12 S22 S12 db Mag 5 db / Ref 0 db db Mag 10 db / Ref 0 db db Mag 0.3 db / Ref 12.9 db Ch2 Ch2 Ch8 Ca? PCal Off 2 Ca? PCal Off Cal Off S12, S22 Intermod. Trc6 b2(p1s) db Mag 15 db / Ref 0 dbm Ch6 Trc9 IM3UO db Mag 20 db / Ref 0 dbm Ch PCal Off 3 PCal Off Trc4 S12 Phase 45 / Ref 0 Trc19 S12 db Mag 10 db / Ref 0 db S12 30 TRG Cal Off Cal Off µs Pulse profile Noise Fig Trc1 NF21 db Mag 2 db / Ref 5.5 db NF Cal NCal PCal Smo GHz db Trc17 b1(p4s) db Mag 10 db / Ref -50 dbm b1(p4s) GHz Intermod

30 T/R Module Test - Need for Accuracy and Speed ı Measurement of S-parameters acc. mag & phase ı Reason is test of accuracy of attenuator and phase shifter ı Required accuracy depends on resolution e.g. of digital phase shifter ı Phase shifters with 4..8 bits of resolution 6-bit phase shifter 360 / 64 = 5,625 resolution 8-bit phase shifter 360 / 256 = 1,4 resolution ı Typical T/R modules work with 5- or 6-bit phase shifters, new designs use 8-bit phase shifters ı Attenuator typ db resolution

31 Testing with high Speed Two different test approaches Performing CW Sweeps and switching the gain and attenuation states Used when frequency switching takes longer than switching DUT states Widely used so far Disadvantage: parameters have to be rearranged for documentation Performing frequency sweeps and switch after every sweep the DUT states Used when frequency switching time is shorter than switching DUT states Advantage: easy documentation of test results Prefered solution for the customer

32 Gain versus Frequency and Attenuation States

33 Switching Times of ZVA Switching Time ZVA CW Sweep Settings: ı CW frequency ı Meas bandwidth 10 MHz ı Time/Pt 2,5 us 5 GHz Switching time ZVA freq. sweep Settings: ı Start 6 GHz Stop 10 GHz ı Step width 1 MHz ı Meas bandwidth 100 khz ı Freq. switching time + sampling time 24 us

34 Proposed Scenario Example ı Switching time CW sweep ı Switching time freq. sweep ı Sampling time (100 khz) ı State switching time (sst) 3 us 12 us x us 12 us ı Test time CW sweep Tswcw (sst) + tsampl = 3 us + 12 us = 15 us ı Test time freq sweep tswfreq (sst) + tsmpl = 12 us +12 us = 24 us Frequency sweep is faster as soon as state switching time > 12 us Bottleneck for pulse measurements is pulse period

35 Typical Pulse Scenarios ı RX test in un-pulsed mode ı TX test in pulsed mode (point in pulse) ı Pulse width typically 10 us or wider Wide enough for measurement bandwidth of 100 khz When pulse width is wider, meas.-bandwdith can be reduced ı Duty cycle 10% or less Otherwise DUT will heat up Typically test time / point > 100 us in most cases VNA - switching time of frequency sweep is much faster than DUT - state switching time + pulse period state switching was a typical scenario in the past when VNA synthesizers were slow

36 Increase of Test Speed Multiple Measurements during one Pulse Problem: Long measurement time due to low pulse repetition rate and long ON - time Solution: Several measurements can happen during one pulse with pulse width of e.g.100 us ı Test time = switching time + sampling time ı Sampling time 100 khz IFBw 12 us; ı Freq switching time 12 us ı Frequency sweep: 12 us + 12 us = 24 us => 4 measurements during one pulse

37 Multiple Measurements during one Pulse ı Trigger signal for ZVA stops tsmapl before pulse modulator ON time stops ı Ensures data sampling during ON-time of the pulse ı Takes several ponts during one pulse ı Speeds up measurement in this example by factor 4

38 Tests of the TX Path Typical measurements tasks Low input power (..-20 dbm) for small signal High input power (5..10 dbm) for saturated power High output power e.g. 43 dbm Measurements under pulsed conditions Measurement in pulsed mode versus frequency, power and time Transmission (mag / phase) & reflection Different phase and gain settings, linear and saturated output power Pout versus Pin Intermodulation test with 2-tone signal

39 18.5 Test of TX Path small Signal special Challenges ı Forward S21 and S11 measurement in pulsed mode ı High accuracy specs (especially for 8 bit resolution) S21 < 1, < 0,1 db ı Pin for small signal test typically -20 dbm or even less ı Problem: High trace noise of S21 mag & phase ı Trace noise more critical than absolute accuracy ı Relative accuracy is necessary to compare the phase and magnitude states; ı Trace noise typically is the bottleneck Trc1 S21 db Mag 0.5 db / Ref 22 db 1 (Max) Trc2 b2(p1s) db Mag 0.5 db / Ref -0.5 dbm Trc3 a1(p1s) db Mag 0.5 db / Ref dbm Trc4 S21 Phase 1 / Ref S Trac Stat: Trc1 S21 Min: db 22.0 Max: db Pk-Pk: db 21.5 Trac Stat: Trc4 S21 Min: Max: Pk-Pk: Ch1 fb 1.7 GHz Pb -20 dbm Stop 801

40 Trace Noise without Optimazation ı Low power level on reference receiver, -20 dbm and lower for small signal measurement ı Meas. bandwidth 100 khz or higher for point in pulse measurement (depends on pulse width) ı Trace noise due to low power at reference receiver a1 wave at reference receiver Trc1 Trc2 Trc3 Trc4 S S21 b2(p1s) a1(p1s) S21 db Mag db Mag db Mag Phase 0.5 db / Ref 22 db 0.5 db / 0.5 db / 1 / 1 Ref -0.5 dbm Ref dbm Ref (Max) Trac Stat: Min: Max: Pk-Pk: Trac Stat: Min: Max: Pk-Pk: Trc1 S db db db Trc4 S b2 wave at reference receiver Ch1 fb 1.7 GHz Pb -20 dbm Stop 801

41 Solution for low Trace Noise for S21 Measurement ı Improve of sensitivity of reference receiver ı Optimize power level at the reference receivers Add attenuation in the source path e.g. by switchable attenuator and by using the loss of the modulator with increased source power

42 Setup for small Signal TX Measurement

43 Setup for small Signal TX Measurement - optimized

44 Optimized Trace Noise reference receiver low noise + optimized power level reference receiver low noise 1 1

45 Solution with OSP-TRM OSP-TRM

46 Phase Measurement ı Uncertainty ± 0,5 ı Total error (trace noise + systematic error) 1

47 TX path - saturated Power Measurement ı Trace noise uncritical compared to small signal Output power increased -> increase of step attenuation in b2 receiver Input power increased -> Removal of attenuation in reference path Use of reference arm of ZVAX coupler Reference power sufficient for good S/N ı Relative accuracy e.g. for 8-bit phase shifter better 1

48 Power Protection for 43 dbm ı ZVAX-TRM as well as OSP-TRM have high power couplers ı Receiver and source protection e.g. by isolators or attenuators required ı 43 dbm = 20 Watts ı Duty cycle 10 % ı Average power 23 dbm or 0,2 Watt ı 5 W attenuators (37 dbm) are sufficient

49 TX path - saturated Power Measurement

50 Solution with OSP-TRM OSP-TRM

51 Pulse Profile Measurement ı Use of averages for better S/N because of wide measurement bandwidth (>10 MHz)

52 TX Harmonics

53 Solution with OSP-TRM OSP-TRM

54 TX Spur Emission ı Harmonic measurement at specific frequencies ı Spur search over wide frequency range 10 GHz..20 GHz ı Typical settings Source in CW mode Receiver measures 2nd and 3rd harmonic and spurs Typically also pulsed with wide IF bandwidth

55 TX - Spur Emission ı SA functionlity of ZVA with software preselector Search range e.g. 7 GHz 15 GHz IFBW 200 khz 80 dbc dynamic range Meas time 9 sec

56 RX Path Small Signal Gain ı Test under un-pulsed conditions ı Switching of states ı Reflection, gain (mag&phase) ı Small signal input power -30 dbm and below ı High accuracy specs S12 < 0,5, < 0,05 db ı Full two port calibration necessary ı Problem: ı Low input power, high gain ı Low reference signal ı Low power in reverse direction due to high isolation. Trc2 Trc9 Trc a1(p1s) a2(p2s) a1(p1s) S21 db Mag db Mag db Mag 0.1 db / 0.1 db / 1 db / Ref dbm Ref dbm Ref db PCal Offs PCai Offs Ca? PCao Offs Trac Stat: Min: Max: Pk-Pk: Trc10 S Ch1 fb 2 GHz Pb -40 dbm Stop 801 Trc1 Trc8 S S12 S12 db Mag Phase 0.05 db / 0.5 / Ref db Ref 35.1 Ca? PCao Offs Ca? PCao Offs Trac Stat: Min: Max: Pk-Pk: Trac Stat: Min: Max: Pk-Pk: Trc1 S Trc8 S Ch1 fb 2 GHz Pb -40 dbm Stop db db db db db db dbm dbm db db 1 3

57 RX Path Small Signal Gain Solution ı Improvement of sensitivity by setting AGC amplifiers for a waves to low noise mode B wave receiver for forward direction has to remain in auto mode ı Increase of source power in the reference channel ı Use of internal coupler of ZVA ı Increase of power level for reverse measurement by 20 db or more.

58 RX small Signal Gain with and without Optimization ı Identical forward and reverse power ı 20 db higher reverse power Trc2 Trc9 Trc10 a2(p2s) db Mag 0.1 db / Ref dbm a1(p1s) db Mag 0.1 db / Ref dbm S21 db Mag 1 db / Ref db a1(p1s) PCal Offs PCai Offs Ca? PCao Offs Trac Stat: Min: Max: Pk-Pk: dbm dbm db Trc10 S db db db Trc2 Trc9 Trc10 a2(p2s) db Mag 0.1 db / Ref dbm a1(p1s) db Mag 0.1 db / Ref dbm S21 db Mag 1 db / Ref db a1(p1s) PCal Offs PCai Offs Ca? Pca? Offs Trac Stat: Min: Max: Pk-Pk: dbm dbm db Trc10 S db db db Ch1 fb 2 GHz Pb -40 dbm Stop 801 Trc1 Trc8 S S12 db Mag 0.05 db / Ref db S12 Phase 0.5 / Ref 35.1 Ca? PCao Offs Ca? PCao Offs Trac Stat: Min: Max: Pk-Pk: Trac Stat: Min: Max: Pk-Pk: Trc1 S db db db Trc8 S Ch1 fb 2 GHz Pb -40 dbm Stop db Ch1 fb 2 GHz Pb -40 dbm Stop 801 Trc1 Trc8 S S12 db Mag 0.05 db / Ref db S12 Phase 0.5 / Ref 35.1 Ca? Pca? Offs Ca? Pca? Offs Trac Stat: Min: Max: Pk-Pk: Trac Stat: Min: Max: Pk-Pk: Trc1 S db db db Trc8 S Ch1 fb 2 GHz Pb -40 dbm Stop db

59 RX Path - small Signal Gain Ref 2 In Meas 2 In Ref 1 In Port 2-40 dbm Ref 4 Out Ref 4 In 20 db Src 4 Out Src 4 In 20 db Rx Meas 1 In Ref 1 In 10 db Src 1Out Ref 3 Out Ref 3 In Src 3 Out Port 1-20 dbm -10 dbm Src 3 In ZVAX- TRM

60 ZVAX-TRM setup Use of internal ZVA coupler attenuator to boost output power

61 Solution with OSP-TRM OSP-TRM

62 RX Path Noise Figure

63 Solution with OSP-TRM OSP-TRM

64 End

65 Test Suite TRM-LIB Functionality ı For solutions PC with ZVA + ZVAX-TRM or ZVA + OSP-TRM ı All main tests for TRMs of active devices covered: Test case Direction Tx Rx SW-Options: S-parameter over DUT states with Excel report x x TS6-K20 Compression point x x Pulse profile (rise time, fall time, power droop) x Spurious emissions x x TS6-K22 Noise figure x Out of band rejection x x TS6-PK20 Intermodulation (4 port ZVA) x x Power added efficiency TS6-K25 (with power supplies HMP4040 or TDK Lambda x Genesys) Harmonics x x or

66 R&S Test Sequencer for individual Test Plans Customer specific test sequences including Control of TRM module Implementation of required scope of tests Time optimization of test routines Test adaptations by customer or R&S Program code for test sequences delivered with the system Test Sequencer Test Report Generation

67 Real life test time: RX S-Parameter Measurement: DUT: RFcore core chip module TrmTxSParameter: Parameters StartFrequency: 9000 MHz StopFrequency: MHz Points: gain-phase-combinations Power: -30 dbm Bandwidth: 5 khz Measurement time: 12 seconds Resust files: Pass / fail analysis in report Statistical analysis Fast analysis by Excel graphics and measurement data (Gain vs Freq./ Phase vs. Freq. / Gain vs Phase / Phase vs Gain)

68 Real life test time: TX S-Parameter Measurement DUT: RFcore core chip module TrmTxSParameter: Parameters StartFrequency: 9000 MHz StopFrequency: 9500 MHz Points: phase states / 32 attenuation states all combinations Power: -17 dbm Bandwidth: 200 khz Resust files: Pass / fail analysis in report Statistical analysis Fast analysis by 4 Excel files with data and graphics (Gain vs Freq./ Phase vs. Freq. / Gain vs Phase / Phase vs Gain) Freqency = 9500 Att Phase Gain , , , ,9 4 14, , , ,4

69 R&S ctsvp: Fast programming of the Module DUT control: High Speed Digital Module up to 40 MHz pattern rate and programmable level for DUT control Large on board memory to save all DUT commands in advance. PXI LVDS digital waveform generator / analyzer Very fast setup of gain / phase, e.g. < 300us Real time evaluation of DUT response messages. Trigger of R&S ZVA24 for real time test. DMM