Luminance-Current-Voltage Measurement System (LIV)

Transcription

1 Luminance-Current-Voltage Measurement System (LIV) 發光度 - 電流 - 電壓量測系統 IV Test System is designed for in-depth functionality testing of OLEDs and organic photovoltaics (OPVs). Broad voltage range and high current measurement accuracy. The system is PC controlled and is operated with dedicated software for IV testing. PC control allows for directly recording all measurements. OLED IV 測試系統, 是一套設計用以深入測試 OLED 和有機太陽能電池功能性的設備, 它擁有大驅動電壓範圍, 以及高準確度的電流量測 這套系統是由 PC 控制, 並內含專門的軟體, 進行 IV 量測 可直接紀錄所有的量測值 For OLED testing a broad variety of optical sensors, including photodiodes, color sensors, or luminance cameras can be used as detectors. Allow to extend luminance-current-voltage measurements to color-luminance-current-voltage dependencies. The system can also be run as source-measure-unit with high current and voltage stability. 對於 OLED 測試, 本系統擁有光二極體, 或彩色感測元件的光學感測器, 也可由外部的發光度量測照相機來當成光學感測器 因此可擴充發光度 - 電流 - 電壓量測成色彩 - 發光度 - 電流 - 電壓量測 本系統也可只單純當成電性驅動與量測單元 (SMU) 使用 The typical characteristics, such as the dependence of photo current-voltage, emitted luminance-voltage, luminous efficiency-oled current density, and power efficiency-oled current density can be realized. 一般性的特性量測皆可實現, 例如 : 光電流與偏壓特性量測 發光強度與偏壓特性量測 發光效率與 OLED 電流密度特性量測 及功率效率與 OLED 電流密度特性量測

2 [Feature] 1. Integrated Solution 光電整合方案 Driving and measuring electronics, sample holder, and software are coordinated with each other. 電性驅動與量測單元 樣品承載台 以及光電量測控制軟體 2. Customized Sample Holder 客製化樣品承載台 Adaptation to specific requirements regarding sample size, sample layout, number of devices per sample, etc. 適用於特殊需求, 例如 : 樣品大小 樣品圖樣 每個樣品含多少元件 ( 畫素 ) 等 3. Electrical SMU (Source Measure Unit) Operation 電性驅動與量測單元 (1) Voltage range 電壓範圍 : -20V ~ 40V Current range 電流範圍 : 50nA ~ 1A Low current noise 低電流雜訊 (2) 2 wire or 4 wire measurement 兩線式或四線式量測 (3) PC controlled parameter setting with automatic data recording during operation 電腦控制參數的輸入, 與自動資料紀錄 4. Optical Measurement 光學量測 (1) Wide dynamic with several amplification ranges, and high sensitivity with low noise range 寬動態範圍 各種訊號增益放大範圍, 低雜訊高靈敏度 (2) Using the interface for external equipment luminance cameras can be used for optical measurements, too. (3) Additionally, it allows for easy calibration of the photodiode or color sensor signal with external chroma meter by using the build-in calibration procedure in the LIV control software. 5. Various Modes of Operation 操作模式 (1) Separate software modes for different applications of organic semiconductors 各種有機半導體應用軟體模組 (2) No hardware changes required 無需更換硬體 6. Customizable Control Software 可客製化控制軟體

3 User defined data file format, sample configuration, on-line data display, and defined formulas. 使用者自定資料型態 樣品組態 線上顯示資料, 使用者 亦可自定公式 7. Plug and Play Test System for hardware and software expansion 隨插即用的測試系統, 方便軟硬體擴充執行 8. Test Examples 測試範例 (1) Testing of OLEDS OLEDs 測試 (a) IVL characteristics (LIV, UIL) IVL 特性測試 (b) Lifetime tests in constant voltage or constant current mode 定電壓 定電流模式, 或壽命週期測試 (2) Testing of Organic Solar Cells 有機太陽能電池測試 (a) IV characteristics IV 特性測試 (b) Lifetime tests at different bias 不同偏壓下, 壽命週期測試 (c) Optional HB white or RGB LED tunable-colored illumination module with optical sensor for light intensity monitoring 選配的高亮度白光或 RGB LED 的發光模組, 它的色彩可調變 光強度, 可經光感測器監控 (d) Optional light intensity monitoring for external light sources (sun simulator or similar) 選配用以監控外部輸入光源 ( 例如太陽能光源模擬器, 或類似光源 ) 的光強 度 9. Sample Holder with Heating Unit 加熱裝置的樣品承載台 (1) Developed for accelerated lifetime tests at elevated temperature. Temperature range 40 ~100 ±1 開發用以進行某特定溫度的加速老化測試 溫度範圍 40 ~100 ±1 (2) Continuous monitoring of temperature stability or temperature changes during testing 測試中連續監控溫度的穩定性與變化

4 [Specification] Source Measure Unit for IV Functionality Test (1). Voltage range: -20V~ 40V (2). Current range: +/-500mA (3). Ethernet connection to control PC (4). Possibility for operation as standard SMU (5). Serial interface for optical calibration with external chroma meter Driving parameter Driving range Setting step size Voltage -20 ~ +40V 1 mv Current 100 ma 100 na 10 ma 10 na 1 ma 5 na High power option 1000 ma 1 ma Measurement Parameter Measurement Range Measurement Resolution Voltage -20 ~ +40V 1 mv 2 mv Current 100 ma 100 na 200 na 10 ma 10 na 20 na* 1 ma 5 na 10 na* Measurement Precision High power option 1000 ma 1 ma 2 ma * lower current limit 50nA SMU Rear

5 Current and voltage stability is exceptionally high allowing use of the system even for long time lifetime tests. Sample holder (1). For substrate size up to 50x50 mm² (2). Contacts adapted to customer device layout (3). Design for transparent substrates / bottom emitting devices (4). Possibility for simultaneous contact of up to 8 devices (pixels) per sample in customized sample holder Sensor cover (1). Photodiode for optical measurements in IVL characterization of OLEDs (2). Connector interface to sample holder (3). Design for bottom emitting devices Si photodiode with amplifier Eye correction filter to adapt to sensitivity of human eye On-board measurement micro controller for A/D conversion at the Si photodiode Active Area 100 mm 2 Spectral sensitivity 350 ~ 730 nm Responsivity 60 na/lux

6 (1).RGB TrueColor sensor for optical color measurements in IVL characterization of OLEDs (CIVL characterization of OLED, such CIE x,y) (2). Connector interface to sample holder (3). Design for bottom emitting devices V(λ) corrected Photodiode RGB True Color Sensors Main control software (1). For parallel control of several SMUs (2). For specific test module of OLED LIV (3). Data file format: CSV or TXT

7 Option (1). With this option of RGB TrueColor sensor the LIV Functionality Test System offers the benefit for advanced device characterization including color-luminance-current-voltage characteristics (CLIV, CIVL or CUIL measurements)

8 (2). An interface for connecting a fiber optical spectrometer to the LIV sample holder is also available as an option. The spectrometer can be selected as an alternative optical sensor to run the test modes of the LIV Functionality Test System and to record voltage or lifetime dependent changes of the emission spectra.