Final Exam CPSC/ECEN 680 May 2, Name: UIN:
|
|
|
- Theodora Morrison
- 5 years ago
- Views:
Transcription
1 Final Exam CPSC/ECEN 680 May 2, 2008 Name: UIN: Instructions This exam is closed book. Provide brief but complete answers to the following questions in the space provided, using figures as necessary. Show your work for partial credit. 1. (10 pts) In a regular SOC, a TAM is used to deliver test patterns and collect test results from the cores. Suppose you have a TAM that has 10 data lines, and all cores have MISRs so that test results do not have to be read while the test patterns are delivered. We will ignore the time to read back the MISRs. Consider an SOC with 4 cores. Core 1 has test patterns that can be delivered on 3 lines in cycles, 6 lines in 5000 cycles or 10 lines in 3000 cycles. Core 2 has test patterns that can be delivered on 3 lines in cycles, 4 lines in cycles or 5 lines in cycles. Cores 3 and 4 have test patterns that can be delivered on 2 lines in cycles or 4 lines in cycles. Draw the shortest test schedule.
2 2. PODEM Algorithm i. (12 pts) In the figure below, use the PODEM algorithm to test for a SA1 on the output of gate 6. Write on the figure and explain the sequence of decisions. ii. (3 pts) The algorithm will not select A=0 and B=0. Why not? SA1
3 3. (15 pts) For the circuit below, the flip-flops numbered 7 and 8 are connected together in a scan chain (assume the scan chain is from 7 to 8). Their D inputs can be directly observed as pseudoprimary outputs (PPOs). The flip-flop outputs Q1 and Q2 can be directly controlled as pseudoprimary inputs (PPIs). Compute the combinational SCOAP testability measures on all lines - both controllability and observability, including the clock CL. The flip-flops do not have a set/reset line. Write your SCOAP measures on the figure using standard notation. Extra copies of the circuit are attached to the exam to aid you in working out your solution. Do you need to compute the sequential SCOAP measures? Why or why not?
4 4. You have a chip with yield Y and a test set with fault coverage T. i. (3 pts) For Y=90% and T=99%, what is the defect level in DPM? ii. (4 pts) Your customer complains that the defect level is too high. They want you to reduce it to 100 DPM. What yield Y would be necessary to achieve this, given T=99%? iii. (3 pts) What fault coverage T would be necessary to achieve this 100 DPM, given Y=90%?
5 5. You wish to implement an LFSR using the characteristic polynomial x 6 + x 5 + x 3 + x i. (5 pts) Draw the schematic for a modular LFSR (XOR gates between the flip-flops). Show a signal to initialize the LFSR via the flip-flop set/reset pins. The pins are active low. ii. (5 pts) Draw the schematic for an external LFSR (XOR gates on the feedback path). Show a signal to initialize the LFSR via the flip-flop set/reset pins. The pins are active low. The starting state does not have to be the same as the internal LFSR above.
6 6. (10 pts) For a modular LFSR implementing the primitive polynomial x 6 + x 5 + x 3 + x 2 + 1, add minimal hardware to the LFSR so that it will also generate the all-zero state, while also generating all of its previous states. Between which two states will the all-zero state be inserted? Remember that the flip-flop outputs have true and complement values available. Draw the schematic of the LFSR with all-zero logic. Do not show the set/reset logic.
7 7. A test set achieves 100% toggle coverage. That is, it sets every line in the circuit to both a 0 and a 1 at least once in the test set. i. (5 pts) Does such a test set achieve 100% stuck-at fault coverage? Explain your answer. Use examples as needed. ii. (5 pts) Why will a toggle test have relatively high bridge fault coverage in an I DDQ test? Explain your answer. Use examples as needed.
8 8. (5 pts) Give an example of how scan test can have higher power dissipation than functional operation. 9. (5 pts) Suppose that the maximum data rate of a link using embedded clock to connect CPU to memory is 10 Gbps, but you need a bandwidth of 40 Gbps. How would you solve this problem?
9 10. (10 pts) Show input and line values for a delay test along one of the longest robustly-testable paths in the circuit below. Assume each gate has unit delay. Remember that a robust test is one that will detect a delay fault independent of other delays in the circuit, so it should still work correctly even if the gates have arbitrary delays.
10 Extra sheets for Problem 3.
11 Extra sheets for Problem 3.
Instructions. Final Exam CPSC/ELEN 680 December 12, Name: UIN:
Final Exam CPSC/ELEN 680 December 12, 2005 Name: UIN: Instructions This exam is closed book. Provide brief but complete answers to the following questions in the space provided, using figures as necessary.
Overview: Logic BIST
VLSI Design Verification and Testing Built-In Self-Test (BIST) - 2 Mohammad Tehranipoor Electrical and Computer Engineering University of Connecticut 23 April 2007 1 Overview: Logic BIST Motivation Built-in
VLSI System Testing. BIST Motivation
ECE 538 VLSI System Testing Krish Chakrabarty Built-In Self-Test (BIST): ECE 538 Krish Chakrabarty BIST Motivation Useful for field test and diagnosis (less expensive than a local automatic test equipment)
Department of Electrical and Computer Engineering University of Wisconsin Madison. Fall Final Examination CLOSED BOOK
Department of Electrical and Computer Engineering University of Wisconsin Madison Fall 2014-2015 Final Examination CLOSED BOOK Kewal K. Saluja Date: December 14, 2014 Place: Room 3418 Engineering Hall
Design for Test. Design for test (DFT) refers to those design techniques that make test generation and test application cost-effective.
Design for Test Definition: Design for test (DFT) refers to those design techniques that make test generation and test application cost-effective. Types: Design for Testability Enhanced access Built-In
VLSI Test Technology and Reliability (ET4076)
VLSI Test Technology and Reliability (ET476) Lecture 9 (2) Built-In-Self Test (Chapter 5) Said Hamdioui Computer Engineering Lab Delft University of Technology 29-2 Learning aims Describe the concept and
Design of Fault Coverage Test Pattern Generator Using LFSR
Design of Fault Coverage Test Pattern Generator Using LFSR B.Saritha M.Tech Student, Department of ECE, Dhruva Institue of Engineering & Technology. Abstract: A new fault coverage test pattern generator
for Digital IC's Design-for-Test and Embedded Core Systems Alfred L. Crouch Prentice Hall PTR Upper Saddle River, NJ
Design-for-Test for Digital IC's and Embedded Core Systems Alfred L. Crouch Prentice Hall PTR Upper Saddle River, NJ 07458 www.phptr.com ISBN D-13-DflMfla7-l : Ml H Contents Preface Acknowledgments Introduction
Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory. National Central University
Chapter 3 Basics of VLSI Testing (2) Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory Department of Electrical Engineering National Central University Jhongli, Taiwan Outline Testing Process Fault
ECE 715 System on Chip Design and Test. Lecture 22
ECE 75 System on Chip Design and Test Lecture 22 Response Compaction Severe amounts of data in CUT response to LFSR patterns example: Generate 5 million random patterns CUT has 2 outputs Leads to: 5 million
Y. Tsiatouhas. VLSI Systems and Computer Architecture Lab. Built-In Self Test 2
CMOS INTEGRATE CIRCUIT ESIGN TECHNIUES University of Ioannina Built In Self Test (BIST) ept. of Computer Science and Engineering Y. Tsiatouhas CMOS Integrated Circuit esign Techniques VLSI Systems and
A clock is a free-running signal with a cycle time. A clock may be either high or low, and alternates between the two states.
Clocks A clock is a free-running signal with a cycle time. A clock may be either high or low, and alternates between the two states. 1 The length of time the clock is high before changing states is its
CMOS Testing-2. Design for testability (DFT) Design and Test Flow: Old View Test was merely an afterthought. Specification. Design errors.
Design and test CMOS Testing- Design for testability (DFT) Scan design Built-in self-test IDDQ testing ECE 261 Krish Chakrabarty 1 Design and Test Flow: Old View Test was merely an afterthought Specification
CSE 352 Laboratory Assignment 3
CSE 352 Laboratory Assignment 3 Introduction to Registers The objective of this lab is to introduce you to edge-trigged D-type flip-flops as well as linear feedback shift registers. Chapter 3 of the Harris&Harris
Using on-chip Test Pattern Compression for Full Scan SoC Designs
Using on-chip Test Pattern Compression for Full Scan SoC Designs Helmut Lang Senior Staff Engineer Jens Pfeiffer CAD Engineer Jeff Maguire Principal Staff Engineer Motorola SPS, System-on-a-Chip Design
Design for Testability
TDTS 01 Lecture 9 Design for Testability Zebo Peng Embedded Systems Laboratory IDA, Linköping University Lecture 9 The test problems Fault modeling Design for testability techniques Zebo Peng, IDA, LiTH
UNIT IV CMOS TESTING. EC2354_Unit IV 1
UNIT IV CMOS TESTING EC2354_Unit IV 1 Outline Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan EC2354_Unit
Chapter 8 Design for Testability
電機系 Chapter 8 Design for Testability 測試導向設計技術 2 Outline Introduction Ad-Hoc Approaches Full Scan Partial Scan 3 Design For Testability Definition Design For Testability (DFT) refers to those design techniques
Testing Digital Systems II
Testing Digital Systems II Lecture 5: Built-in Self Test (I) Instructor: M. Tahoori Copyright 2010, M. Tahoori TDS II: Lecture 5 1 Outline Introduction (Lecture 5) Test Pattern Generation (Lecture 5) Pseudo-Random
SIC Vector Generation Using Test per Clock and Test per Scan
International Journal of Emerging Engineering Research and Technology Volume 2, Issue 8, November 2014, PP 84-89 ISSN 2349-4395 (Print) & ISSN 2349-4409 (Online) SIC Vector Generation Using Test per Clock
Testability: Lecture 23 Design for Testability (DFT) Slide 1 of 43
Testability: Lecture 23 Design for Testability (DFT) Shaahin hi Hessabi Department of Computer Engineering Sharif University of Technology Adapted, with modifications, from lecture notes prepared p by
Testing Digital Systems II
Testing Digital Systems II Lecture 2: Design for Testability (I) structor: M. Tahoori Copyright 2010, M. Tahoori TDS II: Lecture 2 1 History During early years, design and test were separate The final
Based on slides/material by. Topic 14. Testing. Testing. Logic Verification. Recommended Reading:
Based on slides/material by Topic 4 Testing Peter Y. K. Cheung Department of Electrical & Electronic Engineering Imperial College London!! K. Masselos http://cas.ee.ic.ac.uk/~kostas!! J. Rabaey http://bwrc.eecs.berkeley.edu/classes/icbook/instructors.html
Design of Test Circuits for Maximum Fault Coverage by Using Different Techniques
Design of Test Circuits for Maximum Fault Coverage by Using Different Techniques Akkala Suvarna Ratna M.Tech (VLSI & ES), Department of ECE, Sri Vani School of Engineering, Vijayawada. Abstract: A new
First Name Last Name November 10, 2009 CS-343 Exam 2
CS-343 Exam 2 Instructions: For multiple choice questions, circle the letter of the one best choice unless the question explicitly states that it might have multiple correct answers. There is no penalty
Implementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters
IOSR Journal of Mechanical and Civil Engineering (IOSR-JMCE) e-issn: 2278-1684, p-issn: 2320-334X Implementation of BIST Test Generation Scheme based on Single and Programmable Twisted Ring Counters N.Dilip
Bit Swapping LFSR and its Application to Fault Detection and Diagnosis Using FPGA
Bit Swapping LFSR and its Application to Fault Detection and Diagnosis Using FPGA M.V.M.Lahari 1, M.Mani Kumari 2 1,2 Department of ECE, GVPCEOW,Visakhapatnam. Abstract The increasing growth of sub-micron
Figure 1 shows a simple implementation of a clock switch, using an AND-OR type multiplexer logic.
1. CLOCK MUXING: With more and more multi-frequency clocks being used in today's chips, especially in the communications field, it is often necessary to switch the source of a clock line while the chip
Clocks. Sequential Logic. A clock is a free-running signal with a cycle time.
Clocks A clock is a free-running signal with a cycle time. A clock may be either high or low, and alternates between the two states. The length of time the clock is high before changing states is its high
I. INTRODUCTION. S Ramkumar. D Punitha
Efficient Test Pattern Generator for BIST Using Multiple Single Input Change Vectors D Punitha Master of Engineering VLSI Design Sethu Institute of Technology Kariapatti, Tamilnadu, 626106 India punithasuresh3555@gmail.com
K.T. Tim Cheng 07_dft, v Testability
K.T. Tim Cheng 07_dft, v1.0 1 Testability Is concept that deals with costs associated with testing. Increase testability of a circuit Some test cost is being reduced Test application time Test generation
International Journal of Scientific & Engineering Research, Volume 5, Issue 9, September ISSN
International Journal of Scientific & Engineering Research, Volume 5, Issue 9, September-2014 917 The Power Optimization of Linear Feedback Shift Register Using Fault Coverage Circuits K.YARRAYYA1, K CHITAMBARA
MULTI-CYCLE AT SPEED TEST. A Thesis MALLIKA SHREE POKHAREL
MULTI-CYCLE AT SPEED TEST A Thesis by MALLIKA SHREE POKHAREL Submitted to the Office of Graduate and Professional Studies of Texas A&M University in partial fulfillment of the requirements for the degree
Design for Testability Part II
Design for Testability Part II 1 Partial-Scan Definition A subset of flip-flops is scanned. Objectives: Minimize area overhead and scan sequence length, yet achieve required fault coverage. Exclude selected
Department of Electrical and Computer Engineering Mid-Term Examination Winter 2012
1 McGill University Faculty of Engineering ECSE-221B Introduction to Computer Engineering Department of Electrical and Computer Engineering Mid-Term Examination Winter 2012 Examiner: Rola Harmouche Date:
Testing Sequential Circuits
Testing Sequential Circuits 9/25/ Testing Sequential Circuits Test for Functionality Timing (components too slow, too fast, not synchronized) Parts: Combinational logic: faults: stuck /, delay Flip-flops:
VLSI Technology used in Auto-Scan Delay Testing Design For Bench Mark Circuits
VLSI Technology used in Auto-Scan Delay Testing Design For Bench Mark Circuits N.Brindha, A.Kaleel Rahuman ABSTRACT: Auto scan, a design for testability (DFT) technique for synchronous sequential circuits.
A Novel Low Power pattern Generation Technique for Concurrent Bist Architecture
A Novel Low Power pattern Generation Technique for Concurrent Bist Architecture Y. Balasubrahamanyam, G. Leenendra Chowdary, T.J.V.S.Subrahmanyam Research Scholar, Dept. of ECE, Sasi institute of Technology
Scan. This is a sample of the first 15 pages of the Scan chapter.
Scan This is a sample of the first 15 pages of the Scan chapter. Note: The book is NOT Pinted in color. Objectives: This section provides: An overview of Scan An introduction to Test Sequences and Test
Lecture 18 Design For Test (DFT)
Lecture 18 Design For Test (DFT) Xuan Silvia Zhang Washington University in St. Louis http://classes.engineering.wustl.edu/ese461/ ASIC Test Two Stages Wafer test, one die at a time, using probe card production
CPE 628 Chapter 5 Logic Built-In Self-Test. Dr. Rhonda Kay Gaede UAH. UAH Chapter Introduction
Chapter 5 Logic Built-In Self-Test Dr. Rhonda Kay Gaede UAH 1 5.1 Introduction Introduce the basic concepts of BIST BIST Rules Test pattern generation and output techniques Fault Coverage Various BIST
Design and Implementation OF Logic-BIST Architecture for I2C Slave VLSI ASIC Design Using Verilog
Design and Implementation OF Logic-BIST Architecture for I2C Slave VLSI ASIC Design Using Verilog 1 Manish J Patel, 2 Nehal Parmar, 3 Vishwas Chaudhari 1, 2, 3 PG Students (VLSI & ESD) Gujarat Technological
VLSI Design Verification and Test BIST II CMPE 646 Space Compaction Multiple Outputs We need to treat the general case of a k-output circuit.
Space Compaction Multiple Outputs We need to treat the general case of a k-output circuit. Test Set L m CUT k LFSR There are several possibilities: Multiplex the k outputs of the CUT. M 1 P(X)=X 4 +X+1
Diagnosis of Resistive open Fault using Scan Based Techniques
Diagnosis of Resistive open Fault using Scan Based Techniques 1 Mr. A. Muthu Krishnan. M.E., (Ph.D), 2. G. Chandra Theepa Assistant Professor 1, PG Scholar 2,Dept. of ECE, Regional Office, Anna University,
Diagnostic Test Generation for Path Delay Faults in a Scan Circuit. Zeshi Luo
Diagnostic Test Generation for Path Delay Faults in a Scan Circuit by Zeshi Luo A thesis submitted to the Graduate Faculty of Auburn University in partial fulfillment of the requirements for the Degree
DIGITAL SYSTEM FUNDAMENTALS (ECE421) DIGITAL ELECTRONICS FUNDAMENTAL (ECE422) LATCHES and FLIP-FLOPS
COURSE / CODE DIGITAL SYSTEM FUNDAMENTALS (ECE421) DIGITAL ELECTRONICS FUNDAMENTAL (ECE422) LATCHES and FLIP-FLOPS In the same way that logic gates are the building blocks of combinatorial circuits, latches
DESIGN FOR TESTABILITY
DESIGN FOR TESTABILITY Raimund Ubar raiub@pld.ttu.ee Design for Testability Lectures Testability of Digital Systems Design for Testability Methods BIST/BISD Practical Works Two laboratory works Course
Design and Implementation of Uart with Bist for Low Power Dissipation Using Lp-Tpg
IOSR Journal of VLSI and Signal Processing (IOSR-JVSP) Volume 6, Issue 3, Ver. II (May. -Jun. 2016), PP 26-31 e-issn: 2319 4200, p-issn No. : 2319 4197 www.iosrjournals.org Design and Implementation of
Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test
Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test Mark McDermott Electrical and Computer Engineering The University of Texas at Austin Agenda Introduction to testing Logical
Cell-Aware Fault Analysis and Test Set Optimization in Digital Integrated Circuits
Southern Methodist University SMU Scholar Computer Science and Engineering Theses and Dissertations Computer Science and Engineering Spring 5-19-2018 Cell-Aware Fault Analysis and Test Set Optimization
Strategies for Efficient and Effective Scan Delay Testing. Chao Han
Strategies for Efficient and Effective Scan Delay Testing by Chao Han A thesis submitted to the Graduate Faculty of Auburn University in partial fulfillment of the requirements for the Degree of Master
1. Convert the decimal number to binary, octal, and hexadecimal.
1. Convert the decimal number 435.64 to binary, octal, and hexadecimal. 2. Part A. Convert the circuit below into NAND gates. Insert or remove inverters as necessary. Part B. What is the propagation delay
DETERMINISTIC SEED RANGE AND TEST PATTERN DECREASE IN LOGIC BIST
DETERMINISTIC SEED RANGE AND TEST PATTERN DECREASE IN LOGIC BIST PAVAN KUMAR GABBITI 1*, KATRAGADDA ANITHA 2* 1. Dept of ECE, Malineni Lakshmaiah Engineering College, Andhra Pradesh, India. Email Id :pavankumar.gabbiti11@gmail.com
6.S084 Tutorial Problems L05 Sequential Circuits
Preamble: Sequential Logic Timing 6.S084 Tutorial Problems L05 Sequential Circuits In Lecture 5 we saw that for D flip-flops to work correctly, the flip-flop s input should be stable around the rising
Simulation Mismatches Can Foul Up Test-Pattern Verification
1 of 5 12/17/2009 2:59 PM Technologies Design Hotspots Resources Shows Magazine ebooks & Whitepapers Jobs More... Click to view this week's ad screen [ D e s i g n V i e w / D e s i g n S o lu ti o n ]
Doctor of Philosophy
LOW POWER HIGH FAULT COVERAGE TEST TECHNIQUES FOR D IGITAL VLSI CIRCUITS By Abdallatif S. Abuissa A thesis submitted to The University of Birmingham for the Degree of Doctor of Philosophy School of Electronic,
Experiment 8 Introduction to Latches and Flip-Flops and registers
Experiment 8 Introduction to Latches and Flip-Flops and registers Introduction: The logic circuits that have been used until now were combinational logic circuits since the output of the device depends
超大型積體電路測試 國立清華大學電機系 EE VLSI Testing. Chapter 5 Design For Testability & Scan Test. Outline. Introduction
1 國立清華大學電機系 EE-6250 超大型積體電路測試 VLSI Testing Chapter 5 esign For Testability & Scan Test Outline Introduction Why FT? What is FT? Ad-Hoc Approaches Full Scan Partial Scan ch5-2 2 Why FT? irect Testing is
Unit V Design for Testability
Unit V Design for Testability Outline Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan Slide 2 Testing
Czech Technical University in Prague Faculty of Information Technology Department of Digital Design
Czech Technical University in Prague Faculty of Information Technology Department of Digital Design Digital Circuits Testing Based on Pattern Overlapping and Broadcasting by Ing. Martin Chloupek A dissertation
Test Compression for Circuits with Multiple Scan Chains
Test Compression for Circuits with Multiple Scan Chains Ondřej Novák, Jiří Jeníček, Martin Rozkovec Institute of Information Technologies and Electronics Technical University in Liberec Liberec, Czech
Design for test methods to reduce test set size
University of Iowa Iowa Research Online Theses and Dissertations Summer 2018 Design for test methods to reduce test set size Yingdi Liu University of Iowa Copyright 2018 Yingdi Liu This dissertation is
VHDL Implementation of Logic BIST (Built In Self Test) Architecture for Multiplier Circuit for High Test Coverage in VLSI Chips
VHDL Implementation of Logic BIST (Built In Self Test) Architecture for Multiplier Circuit for High Test Coverage in VLSI Chips Pushpraj Singh Tanwar, Priyanka Shrivastava Assistant professor, Dept. of
Unit 8: Testability. Prof. Roopa Kulkarni, GIT, Belgaum. 29
Unit 8: Testability Objective: At the end of this unit we will be able to understand Design for testability (DFT) DFT methods for digital circuits: Ad-hoc methods Structured methods: Scan Level Sensitive
problem maximum score 1 28pts 2 10pts 3 10pts 4 15pts 5 14pts 6 12pts 7 11pts total 100pts
University of California at Berkeley College of Engineering Department of Electrical Engineering and Computer Sciences EECS150 J. Wawrzynek Spring 2002 4/5/02 Midterm Exam II Name: Solutions ID number:
Lecture 23 Design for Testability (DFT): Full-Scan (chapter14)
Lecture 23 Design for Testability (DFT): Full-Scan (chapter14) Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Scan design system Summary
Lecture 23 Design for Testability (DFT): Full-Scan
Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence) Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads
This Chapter describes the concepts of scan based testing, issues in testing, need
Chapter 2 AT-SPEED TESTING AND LOGIC BUILT IN SELF TEST 2.1 Introduction This Chapter describes the concepts of scan based testing, issues in testing, need for logic BIST and trends in VLSI testing. Scan
CS 110 Computer Architecture. Finite State Machines, Functional Units. Instructor: Sören Schwertfeger.
CS 110 Computer Architecture Finite State Machines, Functional Units Instructor: Sören Schwertfeger http://shtech.org/courses/ca/ School of Information Science and Technology SIST ShanghaiTech University
A Novel Method for UVM & BIST Using Low Power Test Pattern Generator
A Novel Method for UVM & BIST Using Low Power Test Pattern Generator Boggarapu Kantha Rao 1 ; Ch.swathi 2 & Dr. Murali Malijeddi 3 1 HOD &Assoc Prof, Medha Institute of Science and Technology for Women
LFSR TEST PATTERN FOR FAULT DETECTION AND DIAGNOSIS FOR FPGA CLB CELLS
LFSR TEST PATTERN FOR FAULT DETECTION AND DIAGNOSIS FOR FPGA CLB CELLS Fazal Noorbasha, K. Harikishore, Ch. Hemanth, A. Sivasairam, V. Vijaya Raju Department of ECE, KL University, Vaddeswaram, Guntur
Sequential Logic. E&CE 223 Digital Circuits and Systems (A. Kennings) Page 1
Sequential Logic E&CE 223 igital Circuits and Systems (A. Kennings) Page 1 Sequential Circuits Have considered only combinational circuits in which circuit outputs are determined entirely by current circuit
A New Approach to Design Fault Coverage Circuit with Efficient Hardware Utilization for Testing Applications
A New Approach to Design Fault Coverage Circuit with Efficient Hardware Utilization for Testing Applications S. Krishna Chaitanya Department of Electronics & Communication Engineering, Hyderabad Institute
LFSRs as Functional Blocks in Wireless Applications Author: Stephen Lim and Andy Miller
XAPP22 (v.) January, 2 R Application Note: Virtex Series, Virtex-II Series and Spartan-II family LFSRs as Functional Blocks in Wireless Applications Author: Stephen Lim and Andy Miller Summary Linear Feedback
Design of BIST with Low Power Test Pattern Generator
IOSR Journal of VLSI and Signal Processing (IOSR-JVSP) Volume 4, Issue 5, Ver. II (Sep-Oct. 2014), PP 30-39 e-issn: 2319 4200, p-issn No. : 2319 4197 Design of BIST with Low Power Test Pattern Generator
Logic and Computer Design Fundamentals. Chapter 7. Registers and Counters
Logic and Computer Design Fundamentals Chapter 7 Registers and Counters Registers Register a collection of binary storage elements In theory, a register is sequential logic which can be defined by a state
YEDITEPE UNIVERSITY DEPARTMENT OF COMPUTER ENGINEERING. EXPERIMENT VIII: FLIP-FLOPS, COUNTERS 2014 Fall
YEDITEPE UNIVERSITY DEPARTMENT OF COMPUTER ENGINEERING EXPERIMENT VIII: FLIP-FLOPS, COUNTERS 2014 Fall Objective: - Dealing with the operation of simple sequential devices. Learning invalid condition in
Transactions Brief. Circular BIST With State Skipping
668 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 10, NO. 5, OCTOBER 2002 Transactions Brief Circular BIST With State Skipping Nur A. Touba Abstract Circular built-in self-test
Power Optimization of Linear Feedback Shift Register (LFSR) using Power Gating
Power Optimization of Linear Feedback Shift Register (LFSR) using Rebecca Angela Fernandes 1, Niju Rajan 2 1Student, Dept. of E&C Engineering, N.M.A.M Institute of Technology, Karnataka, India 2Assistant
Based on slides/material by. Topic Testing. Logic Verification. Testing
Based on slides/material by Topic 4 K. Masselos http://cas.ee.ic.ac.uk/~kostas J. Rabaey http://bwrc.eecs.berkeley.edu/classes/icbook/instructors.html igital Integrated Circuits: A esign Perspective, Prentice
Computer Science 324 Computer Architecture Mount Holyoke College Fall Topic Notes: Sequential Circuits
Computer Science 324 Computer Architecture Mount Holyoke College Fall 2007 opic Notes: Sequential Circuits Let s think about how life can be bad for a circuit. Edge Detection Consider this one: What is
Weighted Random and Transition Density Patterns For Scan-BIST
Weighted Random and Transition Density Patterns For Scan-BIST Farhana Rashid Intel Corporation 1501 S. Mo-Pac Expressway, Suite 400 Austin, TX 78746 USA Email: farhana.rashid@intel.com Vishwani Agrawal
CHAPTER 4: Logic Circuits
CHAPTER 4: Logic Circuits II. Sequential Circuits Combinational circuits o The outputs depend only on the current input values o It uses only logic gates, decoders, multiplexers, ALUs Sequential circuits
More Digital Circuits
More Digital Circuits 1 Signals and Waveforms: Showing Time & Grouping 2 Signals and Waveforms: Circuit Delay 2 3 4 5 3 10 0 1 5 13 4 6 3 Sample Debugging Waveform 4 Type of Circuits Synchronous Digital
EE 109 Homework 6 State Machine Design Name: Score:
EE 9 Homework 6 State Machine esign Name: Score: ue: See Blackboard Blackboard ONLY Submission. While the Blackboard submission may not require you to go through all the design steps (such as drawing out
2.6 Reset Design Strategy
2.6 Reset esign Strategy Many design issues must be considered before choosing a reset strategy for an ASIC design, such as whether to use synchronous or asynchronous resets, will every flipflop receive
CHAPTER 4 RESULTS & DISCUSSION
CHAPTER 4 RESULTS & DISCUSSION 3.2 Introduction This project aims to prove that Modified Baugh-Wooley Two s Complement Signed Multiplier is one of the high speed multipliers. The schematic of the multiplier
Testing of Cryptographic Hardware
Testing of Cryptographic Hardware Presented by: Debdeep Mukhopadhyay Dept of Computer Science and Engineering, Indian Institute of Technology Madras Motivation Behind the Work VLSI of Cryptosystems have
Built-In Self-Testing of Micropipelines
Built-In Self-Testing of Micropipelines O. A. Petlin, S. B. Furber Department of Computer Science University of Manchester Manchester, M13 9PL, UK email: {oleg, sfurber}@cs.man.ac.uk tel. +44 (0161) 275-3547
Synthesis Techniques for Pseudo-Random Built-In Self-Test Based on the LFSR
Volume 01, No. 01 www.semargroups.org Jul-Dec 2012, P.P. 67-74 Synthesis Techniques for Pseudo-Random Built-In Self-Test Based on the LFSR S.SRAVANTHI 1, C. HEMASUNDARA RAO 2 1 M.Tech Student of CMRIT,
At-speed testing made easy
At-speed testing made easy By Bruce Swanson and Michelle Lange, EEdesign.com Jun 03, 2004 (5:00 PM EDT) URL: http://www.eedesign.com/article/showarticle.jhtml?articleid=21401421 Today's chip designs are
[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785
![[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785](/thumbs/84/89645202.jpg "[Krishna*, 4.(12): December, 2015] ISSN: (I2OR), Publication Impact Factor: 3.785")
IJESRT INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY DESIGN AND IMPLEMENTATION OF BIST TECHNIQUE IN UART SERIAL COMMUNICATION M.Hari Krishna*, P.Pavan Kumar * Electronics and Communication
Power Problems in VLSI Circuit Testing
Power Problems in VLSI Circuit Testing Farhana Rashid and Vishwani D. Agrawal Auburn University Department of Electrical and Computer Engineering 200 Broun Hall, Auburn, AL 36849 USA fzr0001@tigermail.auburn.edu,
Digital Integrated Circuits Lecture 19: Design for Testability
Digital Integrated Circuits Lecture 19: Design for Testability Chih-Wei Liu VLSI Signal Processing LAB National Chiao Tung University cwliu@twins.ee.nctu.edu.tw DIC-Lec19 cwliu@twins.ee.nctu.edu.tw 1 Outline
FOR A DISSERTATION SUBMITTED TO THE DEPARTMENT OF ELECTRICAL ENGINEERING AND THE COMMITTEE ON GRADUATE STUDIES OF STANFORD UNIVERSITY
DETERMINISTIC BUILT-IN SELF TEST FOR DIGITAL CIRCUITS A DISSERTATION SUBMITTED TO THE DEPARTMENT OF ELECTRICAL ENGINEERING AND THE COMMITTEE ON GRADUATE STUDIES OF STANFORD UNIVERSITY IN PARTIAL FULFILLMENT
Built-In Self-Test (BIST) Abdil Rashid Mohamed, Embedded Systems Laboratory (ESLAB) Linköping University, Sweden
Built-In Self-Test (BIST) Abdil Rashid Mohamed, abdmo@ida ida.liu.se Embedded Systems Laboratory (ESLAB) Linköping University, Sweden Introduction BIST --> Built-In Self Test BIST - part of the circuit
Random Access Scan. Veeraraghavan Ramamurthy Dept. of Electrical and Computer Engineering Auburn University, Auburn, AL
Random Access Scan Veeraraghavan Ramamurthy Dept. of Electrical and Computer Engineering Auburn University, Auburn, AL ramamve@auburn.edu Term Paper for ELEC 7250 (Spring 2005) Abstract: Random Access
Module 8. Testing of Embedded System. Version 2 EE IIT, Kharagpur 1
Module 8 Testing of Embedded System Version 2 EE IIT, Kharagpur 1 Lesson 39 Design for Testability Version 2 EE IIT, Kharagpur 2 Instructional Objectives After going through this lesson the student would
Chip-Level DFT: Some New, And Not So New, Challenges
2004 Southwest DFT Symposium B A DFT Open Day Chip-Level DFT: Some New, And Not So New, Challenges Ben Bennetts, DFT Consultant Bennetts Associates, UK Tel: +44 1489 581276 E-mail: ben@dft.co.uk http://www.dft.co.uk/
data and is used in digital networks and storage devices. CRC s are easy to implement in binary
Introduction Cyclic redundancy check (CRC) is an error detecting code designed to detect changes in transmitted data and is used in digital networks and storage devices. CRC s are easy to implement in