Muon Trigger Flavor Board (MTFB) Design and Specifications

Size: px
Start display at page:

Download "Muon Trigger Flavor Board (MTFB) Design and Specifications"

Transcription

1 Muon Trigger Flavor Board (MTFB) Design and Specifications Issue 2.41 December 11, 1998 Prepared by: Ken Johns, Freedy Nang, Kevin Davis, Rob McCroskey, and David Fein University of Arizona Tucson, Arizona

2 1 Introduction General Description MTC CFMTC EFMTC MTC CFMTC Inputs/Outputs JTAG BST Connection FPGA Design FPGA Timing/Fitting Power Requirements Super Project CF MTC LED s FPGA Testing EFMTC Conclusions Appendix A MTCxx Card Input Appendix B Pinouts for the MTFB (P1 P6) Appendix C CF MTC10 FPGA I/O References... 45

3 Figure 1 - MTCxx Card and Flavor Board Outline... 5 Figure 2 - Possible layout of the CF MTC10 MTFB. The connectors are placed on the underside of the board. The total board space is 10 in. x 6 in. Drawing is to scale... 8 Figure 3 - How the MTFB might look on the a proposed MTCxx Card. The MTFB is shown as the grey board outline in the center of the MTCxx. Only the connectors on the MTFB are drawn. Note that there are two (2) 40-pin TFM connectors draw on the MTCxx. The extra connector (P7) is used only by the MTM board... 9 Figure 4 - Overview of the CF MTC10 MTFB FPGA Logic Figure 5 A CENT Top Level Design Figure 6 - A CENT Timing Diagram Figure 7 - B CENT Top Level Design Figure 8 B CENT Timing Diagram Figure 9 - C CENT Top Level Design Figure 10 - C CENT Timing Diagram Figure 11 - TRIG1 Top Level Design Figure 12 - TRIG1 Timing Diagram Figure 13 - TRIG2 Top Level Design Figure 14 - TRIG2 Timing Diagram Figure 15 - TRIG3 Top Level Design Figure 16 - TRIG3 Timing Diagram Figure 17 - Octant Sum Top Level Design Figure 18 - Octant Sum Timing Diagram Figure 19 - Super Project CF MCT10 Top Level Design Figure 20 - Super Project CF MTC10 Timing Diagram Table 1 - The six connectors used between the MTFB and the MTCxx... 6 Table 2 Summary of MTFB FPGA Requirements... 7 Table 3 - Package Type and Dimensions for Proposed FPGAs... 7 Table 4 - Summary of FPGA Fitting Parameters Table 5 - CF MTC10 FPGA Power Consumption Estimates Table 6 - CF MTC05 Card Input (Octants 0,1,2,3,4,7) Table 7 - CF MTC05 Card Input (Octants 5,6) Table 8 - CF MTC10 Card Input (Octants 0,1,2,3,4,7) Table 9 - CF MTC10 Card Input (Octants 5,6) Table 10 - EF MTC05 Card Input Table 11 - EF MCT10 Card Input Table 12 - Summary of CF MTC10 FPGA Signals... 28

4

5 1 Introduction The actual trigger functions of the Level 1 Muon Trigger (L1MU) system are performed by the Muon Trigger Cards (MTCxx s) and their associated Muon Trigger Flavor Boards (MTFB s). The L1MU system is divided into eight octants for each of the three geographical regions (CF, EFN, and EFS). Further, there are two MTCxx cards for each octant. Generally, one MTCxx card makes use of L1 Central Fiber Tracking Trigger (L1CFT) tracks and scintillator counter hits (called 05 logic) while the other MTCxx card makes use of wire chamber hits (CF) or mini-drift tubes (EF) and scintillator counter hits (called 10 logic). The L1MU system is described further in Refs. [1] and [2]. To maximize flexibility and to minimize the engineering effort, the MTCxx card is uniform throughout the L1MU system. Different logic inputs, outputs, and algorithms are accommodated by the use of a MTFB, which connects to a MTCxx. Thus, the MTFB changes the flavor of each MTCxx. Distinct MTFB s are needed for different regions (e.g. CF versus EFN), different trigger algorithms (e.g. 05 versus 10 ), and perhaps even different octants (e.g. top and sides versus bottom octants). Figure 1 shows the overall design of the MTCxx and MTFB. See Ref. [3] for a full description of the MTCxx card. This document describes the design and logic of each flavor of the MTFB. Figure 1 - MTCxx Card and Flavor Board Outline 5

6 2 General Description The MTFBs reside on the MTCxx cards, which are 9u x 400-mm VME cards with 16 available serial inputs (and receiver cards) along with a complete VME interface. While the MTCxx cards will all be identical, the serial inputs to these boards will differ depending on which flavor board the MTCxx is housing. For instance, the CF MTC05 cards only require 13 serial inputs of which 10 are from the CFT, 2 from the APHI counters, and one for the CMSC C hits. A complete list of the serial inputs for each flavor card is given in Appendix A. While not all flavors of the MTFB use all the possible inputs and outputs to the MTCxx, the total number of I/O pins on the MTFB is determined by the maximum number of I/O pins needed by any flavor of MTFB (since the I/O specifications are the same for all MTFBs). Below is a description of the total number of I/O pins requires to satisfy any flavor of MTFB: Serial Inputs = 16 x 16 = 256 lines 53 MHz RF Clock Start FLEX Chip Download = 13 lines Power GND Additional Timing Signals (i.e. BC, DAV) Output Trigger Decision = 36 lines Output Supplemental Data = 16 lines Test Points = 29 lines With up to 16 serial inputs required per MTCxx, many pins are needed to connect the MTCxx and the MTFB. One connector that fills our requirements is the SAMTEC MOLC/FOLC family of connectors. These are 4 row, x micro strip connectors which have up to 50 rows (for a total of 200 pins). In addition, the mating height for these connectors is from PCB-to-PCB (for SMD). The connectors also have a current rating of 1A per pin. (The MOLC connectors go on the MTFB while the FOLC are on the MTCxx cards.) In addition, we have added P6 to transfer the test point data. P6 is from the SAMTEC TFM/SFM family of connectors which has two rows of pins. Appendix B shows the complete pin outs for the MTCxx to MTFB connection. See also Reference [3]. To facilitate the large number of pins, we are using six SAMTEC connectors. Table 1 shows the characteristics of each of these connectors. CONNECTOR LABEL ROWS PINS/ROW TOTAL # PINS P/N P MOLC S-Q-LC P MOLC S-Q-LC P MOLC S-Q-LC P MOLC S-Q-LC P MOLC S-Q-LC P TFM S-D-LC Table 1 - The six connectors used between the MTFB and the MTCxx This gives a total of 580 pins. P1 P4 are used for the deserialized data. Each P1 P4 connector carries four serial cables worth of data. P5 is used for timing, trigger decisions, FPGA downloading, and other I/O functions. P6 is used to transfer the test point signals from the MTFB to the MTCxx and then to the front panel connector (p/n 3M 3433). 6

7 To determine the maximum area needed to facilitate the FPGAs, passive devices, and connectors used on the MTFB (all flavors of the MTFB have the same dimensions), the size and number of each type of FPGA needs to be determined. Table 2 gives preliminary estimates for the number of each type of FPGA used on each flavor of the MTFB. MTFB Name Altera FPGA Part # Quantity CF MTC05 Same as EF MTC05 7 Total CF MTC10 10K50VRC K30ATC EF MTC05 10K30AQC K30AQC K100ARC K10AQC EF MTC10 Same as CF MTC10 7 Total Table 2 Summary of MTFB FPGA Requirements From Table 2, we see that the total number of FPGAs needed on each flavor of MTFB is the same. In addition, the total space requirements of the FPGAs are approximately the same for each flavor. Given this, an estimate of the dimensions of the MTFB can be made. Table 3 gives the dimensions and package types of the proposed FPGAs. Altera Device # Package Name Description Dimensions(WxLxD)(in) 10K50V/100ARC240 QFP Power Quad Flat Pack x x K30ATC144 TQFP Thin Plastic Quad Flat Pack x x K10AQC208 QFP Power Quad Flat Pack x x Table 3 - Package Type and Dimensions for Proposed FPGAs Figure 2 shows an example layout of the CF MTC10 MTFB, while Figure 3 shows how the MTFB would sit on the MTCxx card. Both of these figures are drawn to scale, where the dimensions of the MTFB are 12 x 6. The connectors in Figures 2 and 3 are located on the underside of the board. Finally, we see that because of the relatively small size of the MTFB, any delays on signals between FPGAs should be small. (If we assume 2 ns/foot, then a 3 inch trace between FPGAs results in a delay of 500 ps.) The loading of the FPGA s on the MTFBs will be done in the same way as the FPGAs are loaded on the Muon Trigger Crate Manager (MTCM). This involves using flash memory on the MTCxx cards to store the FPGA programs and then use the passive serial download (see Ref.[3]). This method uses four (4) control lines that are chained amongst all the FPGAs, and one unique enable line for each FPGA on the board. Using the information from Table 2 and the size of each FPGA program 1, the total memory needed to store the FPGA programs is 0.5Mb for the CFMTC10 and 0.61Mb for the EFMTC05. The total memory dedicated to the FPGA download on the MTCxx card is 1Mb. 1 See 7

8 Figure 2 - Layout of the CF MTC10 MTFB. The connectors are placed on the underside of the board. The total board space is 10 in. x 6 in. Drawing is to scale. 8

9 Figure 3 - How the MTFB might look on the a proposed MTCxx Card. The MTFB is shown as the grey board outline in the center of the MTCxx. Only the connectors on the MTFB are drawn. Note that there are two (2) 40-pin TFM connectors draw on the MTCxx. The extra connector (P7) is used only by the MTM board. 9

10 3 MTC05 Some introduction here explaining what the inputs are to the MTC05 cards (ef = pix + cft, cf=scint+cft). 3.1 CFMTC EFMTC05 10

11 4 MTC10 Some general comments in here on the inputs to the mtc10 (cf = scint + pdt, ef = pixel + mdt). 4.1 CFMTC Inputs/Outputs The specific inputs and outputs of the CF MTC10 Flavor board and each of the FPGAs are shown in Figure 4 and listed in Appendix B. Also included in Appendix B are descriptions of the input and output of each of the FPGAs shown in Figure 4. Figure 4 - Overview of the CF MTC10 MTFB FPGA Logic The inputs to the CF MTC10 MTFB are broken down into the following components: PDTA = 16x3 = 48 lines PDTB = 16x5 = 80 lines PDTC = 16x5 = 80 lines CMSCA = 16x2 = 32 lines CMSCC = 16 lines CLOCK START 11

12 FLEX Chip Download = 11 lines. The total number of output lines from the CF MTC10 MTFB is 24 and is broken down into the following components: Six 2-bit Counters = 6x2 = 12 lines ACENT(Supplemental Data) = 12 lines JTAG BST Connection The total number of interconnects between the FPGA s on the CF MTC10 MTFB is rather large (>500). In order to test the connectivity between these pins, the JTAG IEEE boundary-scan architecture is incorporated for each of the FPGA s. The boundary-scan test (BST) uses four signals brought in through the external connector J1. J1 is a 10-pin (2 x 5) female plug (i.e. standard JTAG connector). More details will be provided in future revisions as the software for developing this testing is brought online FPGA Design We are using Altera field programmable gate arrays (FPGAs) to form the trigger decisions. From Figure 4, we see that the CF MTC10 MTFB utilizes 7 FPGAs. The function of each of these FPGAs is described below. The complete listing of all the inputs and outputs to each FPGA is given in Appendix C. A CENT - Receives A-layer PDT hits and APHI counter hits and calculates A-layer centroids with APHI confirmation. B CENT - Receives B-layer PDT hits and APHI counter hits and calculates B-layer centroids with APHI confirmation. C CENT - Receives C-layer PDT hits and CMSC C (Cosmic Cap) hits and calculates C-layer centroids with CMSC C confirmation. TRIG1 - Finds A, AB.or.AC, and AB.or.AC.or.BC triggers using centroid information that correspond to the A-centroid range [1,48]. Also or s A-centroids by 12 to give 4 bits of A-cent. The triggers are all 2-bit counters. TRIG2 - Finds A, AB.or.AC, and AB.or.AC.or.BC triggers using centroid information that correspond to the A-centroid range [49,96]. Also or s A-centroids by 12 to give 4 bits of A-cent. The triggers are all 2-bit counters. TRIG3 - Finds A, AB.or.AC, and AB.or.AC.or.BC triggers using centroid information that correspond to the A-centroid range [97,144]. Also or s A-centroids by 12 to give 4 bits of A-cent. The triggers are all 2-bit counters. OCTANT SUM - Receives input from TRIG1, TRIG2, and TRIG3 and calculates the final 2-bit counters for the A, AB.or.AC, and AB.or.AC.or.BC triggers. Also forms final 12-bit counter for A- centroids FPGA Timing/Fitting Given the current trigger logic and CF MTC10 FPGA design, we have calculated the timing and available logic cells (LC s) for each of the FPGAs. The overall L1 muon trigger design specifies that the CF MTC10 has at most 7 ticks (1 tick = 132 ns) to form its trigger decision. Using the simulator supplied with the MAX-plus II (V9.01) Altera package, we can calculate the time required for each FPGA to form a 12

13 decision. We find that the centroid finding FPGAs (A CENT, B CENT, and C CENT) only require 2 ticks (264 ns) to form their centroids. The trigger finding FPGAs (TRIG1, TRIG2, and TRIG3) also require 3 ticks (396 ns) to form the trigger decisions. Finally, the summing FPGA (OCTANT SUM) requires 1 tick (132 ns) to form the final trigger decision that is passed to the MTC Mother board. This gives a total time of only 6 ticks, or 792 ns, to form the CF MCT10 trigger. As a side note, the multiplexers and demultiplexers take up a large fraction of the time spent in the FPGAs. The actual centroid finding and trigger finding routines tend to be very fast ( 40 ns). Included at the end of this document are sample timing diagrams of each FPGA along with the top level design sheet. Because the centroid finding and trigger forming routines are quite large, we have to use larger FPGAs. Table 2 summarizes which Altera FPGAs are used and what percentage of their logic cells (LC s) are occupied. We see that none of the FPGAs use more than 64% of available logic cells. All FPGAs were optimized for speed (optimization value = 10). FPGA Name Altera Part # # of Input Pins # of Output Pins % of Logic Cells Used A CENT 10K50VRC B CENT 10K50VRC C CENT 10K50VRC TRIG1 10K50VRC TRIG2 10K50VRC TRIG3 10K50VRC OCTANT SUM 10K30ATC Table 4 - Summary of FPGA Fitting Parameters Also shown in Table 4 are the required number of input and output pins for each FPGA. The centroid and trigger finding FPGAs have an available 189 user I/O pins while the summing FPGA has an available 68 user I/O pins. In all cases we still have many unused I/O pins. Because of this fact, along with the relative amount of free LC s available on each FPGA, we feel that we have good flexibility in any possible changes that may occur to the logic without having to make changes to the flavor board Power Requirements We can estimate the current requirements of each of the FPGA s used on the CF MTC10 MTFB (operating at +3.3V). Using the formula from Ref. [4], where P = P INT + P IO = (I STANDBY + I ACTIVE ) x V CC + P IO, P IO = I/O power (not determined yet depends on load characteristics), I STANDBY = 10 ma, and I ACTIVE = K * freq * N * tog LC. Here, K is a constant depending on the device (K=45 (10K50V), K=32(10K30A)), freq is the maximum frequency used in MHz, N is the total number of logic cells used, and tog LC is the fraction of logic cells that change level during each clock cycle. This is typically 12.5% according to [4]. Using this formula, we derive the estimates for power consumption for each of the FPGA s used on the CF MTC10 MTFB shown in Table 4. 13

14 FPGA Name Altera Part # Power, P(mW) A CENT 10K50VRC B CENT 10K50VRC C CENT 10K50VRC TRIG1 10K50VRC TRIG2 10K50VRC TRIG3 10K50VRC OCTANT SUM 10K30ATC Table 5 - CF MTC10 FPGA Power Consumption Estimates This gives us a total power consumption of approximately 9.2W for the CF MTC10 MTFB Super Project CF MTC10 The MAX+PLUS II application allows for the simulation of multiple projects. That is, we are able to simulate all seven of the FPGA s in one project. Thus, the timing for the entire CF MTC10 MTFB can be simulated. The multiple project simulation combines the timing from each of the individual FPGA s into an overall timing for the MTFB, where the delay time for signals that migrate between FPGA s is zero. This should not be a problem as we anticipate the delay time to be on the order of a few hundred ps. Figure 20 shows the timing for the entire CF MTC10 MTFB for a given set of inputs. More test vectors are needed to fully test the timing. Figure 20 shows that the final output from the CF MTC10 MTFB arrives in 6 ticks (6 x 132 ns). The top-level design of the CF MTC10 MTFB is shown in Figure 19. This figure also shows the paths of all the signals in-between each FPGA LED s The LED s used to monitor the MTFB functions are mounted on the MTCxx front panel. A description of these LEDs can be found in the MTCxx functional description note FPGA Testing To produce the timing diagrams of each of the FPGAs shown at the end of this document, test vectors were created to simulate the inputs to the FPGAs. The test vectors are comprised of all possible combinations of TRUE logic found in the logic AND/OR network of each FPGA. For each 132ns bunch, one logic element was tested to see if it produced a TRUE output at the correct time. Note that only one TRUE logic element was tested at a time. Given that all the TRUE logic elements were tested, any combination of these elements that may occur within the same 132ns bunch crossing, should give the desired result. 4.2 EFMTC10 14

15 5 Conclusions 15

16 6 Appendix A MTCxx Card Input Cables Strobes Definition 10 6 x 16 6 CFT tracks from each of 10 sectors 2 6 x APHI counter hits per cable 1 6 x 16 40x2 CMSC C counter hits (from MCEN) Table 6 - CF MTC05 Card Input (Octants 0,1,2,3,4,7) Cables Strobes Definition 10 6 x 16 6 CFT tracks from each of 10 sectors 1 6 x APHI counter hits 1 6 x 16 36x2 CMSC B counter hits (from MCEN) 1 6 x 16 18x2 CMSC C counter hits (from MCEN) Table 7 - CF MTC05 Card Input (Octants 5,6) Cables Strobes Definition 3 6 x A PDT hits 5 6 x B PDT hits 5 6 x C PDT hits 1 6 x APHI counter hits 1 6 x 16 40x2 CMSC C counter hits (from MCEN) Table 8 - CF MTC10 Card Input (Octants 0,1,2,3,4,7) Cables Strobes Definition 3 6 x A PDT hits 5 6 x B PDT hits 5 6 x C PDT hits 1 6 x APHI counter hits 1 6 x 16 36x2 CMSC B counter hits (from MCEN) 1 6 x 16 18x2 CMSC C counter hits (from MCEN) Table 9 - CF MTC10 Card Input (Octants 5,6) Cables Strobes Definition 10 6 x 16 6 CFT tracks from each of 10 sectors 1 6 x 16 48x2 A PIXEL hits per cable (from MCEN) 1 6 x 16 48x2 B PIXEL hits per cable (from MCEN) 1 6 x 16 48x2 C PIXEL hits per cable (from MCEN) Table 10 - EF MTC05 Card Input 16

17 Cables Strobes Definition 3 6 x 16 A MDT Centroids (from MCEN) 4 6 x 16 B MDT Centroids (from MCEN) 4 6 x 16 C MDT Centroids (from MCEN) 1 6 x 16 48x2 A PIXEL hits per cable (from MCEN) 1 6 x 16 48x2 B PIXEL hits per cable (from MCEN) 1 6 x 16 48x2 C PIXEL hits per cable (from MCEN) Table 11 - EF MCT10 Card Input 17

18 7 Appendix B Pinouts for the MTFB (P1 P6) MTFB Connector P1 Pin Label Pin Label Pin Label Pin Label A1 +3.3V B1 +3.3V C1 +3.3V D1 +3.3V A2 GND B1 GND C2 GND D2 GND A3 IN1-0 B3 IN2-0 C3 IN3-0 D3 IN4-0 A4 IN1-1 B4 IN2-1 C4 IN3-1 D4 IN4-1 A5 IN1-2 B5 IN2-2 C5 IN3-2 D5 IN4-2 A6 IN1-3 B6 IN2-3 C6 IN3-3 D6 IN4-3 A7 GND B7 GND C7 GND D7 GND A8 IN1-4 B8 IN2-4 C8 IN3-4 D8 IN4-4 A9 IN1-5 B9 IN2-5 C9 IN3-5 D9 IN4-5 A10 IN1-6 B10 IN2-6 C10 IN3-6 D10 IN4-6 A11 IN1-7 B11 IN2-7 C11 IN3-7 D11 IN4-7 A12 GND B12 GND C12 GND D12 GND A13 IN1-8 B13 IN2-8 C13 IN3-8 D13 IN4-8 A14 IN1-9 B14 IN2-9 C14 IN3-9 D14 IN4-9 A15 IN1-10 B15 IN2-10 C15 IN3-10 D15 IN4-10 A16 IN1-11 B16 IN2-11 C16 IN3-11 D16 IN4-11 A17 GND B17 GND C17 GND D17 GND A18 IN1-12 B18 IN2-12 C18 IN3-12 D18 IN4-12 A19 IN1-13 B19 IN2-13 C19 IN3-13 D19 IN4-13 A20 IN1-14 B20 IN2-14 C20 IN3-14 D20 IN4-14 A21 IN1-15 B21 IN2-15 C21 IN3-15 D21 IN4-15 A22 GND B22 GND C22 GND D22 GND A23 Spare B23 Spare C23 Spare D23 Spare A V B V C V D V A25 RF-CLK B25 GND C25 BC-CLK D25 GND 18

19 MTFB Connector P2 Pin Label Pin Label Pin Label Pin Label A1 +3.3V B1 +3.3V C1 +3.3V D1 +3.3V A2 GND B1 GND C2 GND D2 GND A3 IN5-0 B3 IN6-0 C3 IN7-0 D3 IN8-0 A4 IN5-1 B4 IN6-1 C4 IN7-1 D4 IN8-1 A5 IN5-2 B5 IN6-2 C5 IN7-2 D5 IN8-2 A6 IN5-3 B6 IN6-3 C6 IN7-3 D6 IN8-3 A7 GND B7 GND C7 GND D7 GND A8 IN5-4 B8 IN6-4 C8 IN7-4 D8 IN8-4 A9 IN5-5 B9 IN6-5 C9 IN7-5 D9 IN8-5 A10 IN5-6 B10 IN6-6 C10 IN7-6 D10 IN8-6 A11 IN5-7 B11 IN6-7 C11 IN7-7 D11 IN8-7 A12 GND B12 GND C12 GND D12 GND A13 IN5-8 B13 IN6-8 C13 IN7-8 D13 IN8-8 A14 IN5-9 B14 IN6-9 C14 IN7-9 D14 IN8-9 A15 IN5-10 B15 IN6-10 C15 IN7-10 D15 IN8-10 A16 IN5-11 B16 IN6-11 C16 IN7-11 D16 IN8-11 A17 GND B17 GND C17 GND D17 GND A18 IN5-12 B18 IN6-12 C18 IN7-12 D18 IN8-12 A19 IN5-13 B19 IN6-13 C19 IN7-13 D19 IN8-13 A20 IN5-14 B20 IN6-14 C20 IN7-14 D20 IN8-14 A21 IN5-15 B21 IN6-15 C21 IN7-15 D21 IN8-15 A22 GND B22 GND C22 GND D22 GND A23 Spare B23 Spare C23 Spare D23 Spare A V B V C V D V A25 RF-CLK B25 GND C25 BC-CLK D25 GND 19

20 MTFB Connector P3 Pin Label Pin Label Pin Label Pin Label A1 +3.3V B1 +3.3V C1 +3.3V D1 +3.3V A2 GND B1 GND C2 GND D2 GND A3 IN9-0 B3 IN10-0 C3 IN11-0 D3 IN12-0 A4 IN9-1 B4 IN10-1 C4 IN11-1 D4 IN12-1 A5 IN9-2 B5 IN10-2 C5 IN11-2 D5 IN12-2 A6 IN9-3 B6 IN10-3 C6 IN11-3 D6 IN12-3 A7 GND B7 GND C7 GND D7 GND A8 IN9-4 B8 IN10-4 C8 IN11-4 D8 IN12-4 A9 IN9-5 B9 IN10-5 C9 IN11-5 D9 IN12-5 A10 IN9-6 B10 IN10-6 C10 IN11-6 D10 IN12-6 A11 IN9-7 B11 IN10-7 C11 IN11-7 D11 IN12-7 A12 GND B12 GND C12 GND D12 GND A13 IN9-8 B13 IN10-8 C13 IN11-8 D13 IN12-8 A14 IN9-9 B14 IN10-9 C14 IN11-9 D14 IN12-9 A15 IN9-10 B15 IN10-10 C15 IN11-10 D15 IN12-10 A16 IN9-11 B16 IN10-11 C16 IN11-11 D16 IN12-11 A17 GND B17 GND C17 GND D17 GND A18 IN9-12 B18 IN10-12 C18 IN11-12 D18 IN12-12 A19 IN9-13 B19 IN10-13 C19 IN11-13 D19 IN12-13 A20 IN9-14 B20 IN10-14 C20 IN11-14 D20 IN12-14 A21 IN9-15 B21 IN10-15 C21 IN11-15 D21 IN12-15 A22 GND B22 GND C22 GND D22 GND A23 Spare B23 Spare C23 Spare D23 Spare A V B V C V D V A25 RF-CLK B25 GND C25 BC-CLK D25 GND 20

21 MTFB Connector P4 Pin Label Pin Label Pin Label Pin Label A1 +3.3V B1 +3.3V C1 +3.3V D1 +3.3V A2 GND B1 GND C2 GND D2 GND A3 IN13-0 B3 IN14-0 C3 IN15-0 D3 IN16-0 A4 IN13-1 B4 IN14-1 C4 IN15-1 D4 IN16-1 A5 IN13-2 B5 IN14-2 C5 IN15-2 D5 IN16-2 A6 IN13-3 B6 IN14-3 C6 IN15-3 D6 IN16-3 A7 GND B7 GND C7 GND D7 GND A8 IN13-4 B8 IN14-4 C8 IN15-4 D8 IN16-4 A9 IN13-5 B9 IN14-5 C9 IN15-5 D9 IN16-5 A10 IN13-6 B10 IN14-6 C10 IN15-6 D10 IN16-6 A11 IN13-7 B11 IN14-7 C11 IN15-7 D11 IN16-7 A12 GND B12 GND C12 GND D12 GND A13 IN13-8 B13 IN14-8 C13 IN15-8 D13 IN16-8 A14 IN13-9 B14 IN14-9 C14 IN15-9 D14 IN16-9 A15 IN13-10 B15 IN14-10 C15 IN15-10 D15 IN16-10 A16 IN13-11 B16 IN14-11 C16 IN15-11 D16 IN16-11 A17 GND B17 GND C17 GND D17 GND A18 IN13-12 B18 IN14-12 C18 IN15-12 D18 IN16-12 A19 IN13-13 B19 IN14-13 C19 IN15-13 D19 IN16-13 A20 IN13-14 B20 IN14-14 C20 IN15-14 D20 IN16-14 A21 IN13-15 B21 IN14-15 C21 IN15-15 D21 IN16-15 A22 GND B22 GND C22 GND D22 GND A23 Spare B23 Spare C23 Spare D23 Spare A V B V C V D V A25 RF-CLK B25 GND C25 BC-CLK D25 GND 21

22 MTFB Connector P5 Pin Label Pin Label Pin Label Pin Label A1 +5V B1 +5V C1 +5V D1 +5V A2 GND B1 GND C2 GND D2 GND A3 OTB1 B3 OTB10 C3 OTB19 D3 OTB28 A4 OTB2 B4 OTB11 C4 OTB20 D4 OTB29 A5 OTB3 B5 OTB12 C5 OTB21 D5 OTB30 A6 OTB4 B6 OTB13 C6 OTB22 D6 OTB31 A7 OTB5 B7 OTB14 C7 OTB23 D7 OTB32 A8 OTB6 B8 OTB15 C8 OTB24 D8 OTB33 A9 OTB7 B9 OTB16 C9 OTB25 D9 OTB34 A10 OTB8 B10 OTB17 C10 OTB26 D10 OTB35 A11 OTB9 B11 OTB18 C11 OTB27 D11 OTB36 A12 +5V B12 +5V C12 +5V D12 +5V A13 GND B13 GND C13 GND D13 GND A14 SD1 B14 SD5 C14 SD9 D14 SD13 A15 SD2 B15 SD6 C15 SD10 D15 SD14 A16 SD3 B16 SD7 C16 SD11 D16 SD15 A17 SD4 B17 SD8 C17 SD12 D17 SD16 A18-12V B18-12V C18-12V D18-12V A19 GND B19 GND C19 GND D19 GND A20 RF-CLOCK B20 GND C20 BC-CLOCK D20 GND A21 NCE1 B21 NCE2 C21 NCE3 D21 NCE4 A22 INIT B22 GAP C22 1 st _XING D22 SYNCH-GAP A23 1 st _CLOCK B23 DAV C23 TOR D23 START A24 GND B24 GND C24 GND D24 GND A25 NCONFIG B25 NSTATUS C25 DCLOCK D25 ECLOCK A26 DATA0 B26 CONF C26 D26 EDATA A27 TDI B27 TDO C27 TCK D27 TMS A28 INT_D0 B28 INT_D1 C28 INT_D2 D28 INT_D3 A29 INT_D4 B29 INT_D5 C29 INT_D6 D29 INT_D7 A30 INT_READ B30 INT_WR C30 EN-A D30 EN-B A31 GND B31 GND C31 GND D31 GND A32 INT_A0 B32 INT_A1 C32 INT_A2 D32 INT_A3 A33 INT_A4 B33 INT_A5 C33 INT_A6 D33 INT_A7 22

23 Pin Label Pin Label Pin Label Pin Label A34 GND B34 GND C34 GND D34 GND A35 NCE5 B35 NCE6 C35 NCE7 D35 NCE8 23

24 MTFB Connector P6 Pin Label Pin Label 1 TP1 2 TP2 3 TP3 4 TP4 5 GND 6 GND 7 TP5 8 TP6 9 TP7 10 TP8 11 GND 12 GND 13 TP9 14 TP10 15 TP11 16 TP12 17 TP13 18 TP14 19 TP15 20 TP16 21 GND 22 GND 23 TP17 24 TP18 25 TP19 26 TP20 27 TP21 28 TP22 29 TP23 30 TP24 31 GND 32 GND 33 TP25 34 TP26 35 TP27 36 TP28 37 GND 38 GND 39 NCE_OUT 40 GND 24

25 Description of Pins IN1-[0..15] through IN16-[0..15] - Deserialized serial daughter card inputs RF-CLK 53 MHz accelerator clock START Start signal (Clock slice 6 of 6) OTB[1..36] Output Trigger Decision SD[1..16] Supplemental Data BC-CLOCK Bunch Crossing Clock INIT Initialize GAP Gap 1 st _XING First Crossing SYNCH-GAP Synch Gap 1 st _CLOCK -?? DAV - Data Available TOR -?? NCONFIG, NSTATUS, DCLOCK, DATA0, CONF - FPGA Download Signals NCE[1..8] - FPGA Download Signals (These enable each FPGA) ECLOCK, EDATA Serial EPROM Download Lines TDI, TDO, TCK, TMS JTAG Download Lines INT_D[0..7] - Internal Data Lines INT_A[0..7] - Internal Address Lines INT_READ, INT_WR - Internal Read and Write 25

26 8 Appendix C CF MTC10 FPGA I/O FPGA Name Signal Name Signal Description Line Description A CENT INPUTS PDTA1 A-Layer PDT hits 16 lines x 6 strobes = 96 hits PDTA2 A-Layer PDT hits 16 lines x 6 strobes = 96 hits PDTA3 A-Layer PDT hits 16 lines x 6 strobes = 96 hits CMSCA1 APHI counters 16 lines x 6 strobes = 45 hits CMSCA2 APHI counters 16 lines x 6 strobes = 45 hits CLOCK 53 MHz accelerator clock 1 line START Clock which strobes during the last of the seven 18.8ns ticks which make up the 132 ns bunch crossing. This signal is used to latch data. 1 line OUTPUTS A1 A-centroids(1-96) 16 lines x 6 strobes = 96 cents A2 A-centroids(97-144) 8 lines x 6 strobes = 48 cents Total of 144 A-centroids B CENT INPUTS PDTB1 B-layer PDT hits 16 lines x 6 strobes = 48 hits PDTB2 B-layer PDT hits 16 lines x 6 strobes = 72 hits PDTB3 B-layer PDT hits 16 lines x 6 strobes = 72 hits PDTB4 B-layer PDT hits 16 lines x 6 strobes = 72 hits PDTB5 B-layer PDT hits 16 lines x 6 strobes = 48 hits CMSCA1 CMSCA2 CLOCK START See above See above See above See above OUTPUTS B1 B-centroids(1-96) 16 lines x 6 strobes = 96 cents B2 B-centroids(97-192) 16 lines x 6 strobes = 96 cents B3 B-centroids( ) 8 lines x 6 strobes = 16 cents Total of 208 B-centroids C CENT INPUTS PDTC1 C-layer PDT hits 16 lines x 6 strobes = 72 hits PDTC2 C-layer PDT hits 16 lines x 6 strobes = 72 hits PDTC3 C-layer PDT hits 16 lines x 6 strobes = 72 hits PDTC4 C-layer PDT hits 16 lines x 6 strobes = 72 hits PDTC5 C-layer PDT hits 16 lines x 6 strobes = 72 hits CMSCC CPHI counters(cosmic cap) 16 lines x 6 strobes = 40 hits CLOCK See above START See above OUTPUTS C1 C-centroids(1-96) 16 lines x 6 strobes = 96 cents C2 C-centroids(97-192) 16 lines x 6 strobes = 96 cents C3 C-centroids( ) 8 lines x 6 strobes = 48 cents Total of 240 C-centroids 26

27 TRIG1 INPUTS A1 A-cent(1-96) from A CENT 16 lines x 6 strobes = 96 cents B1 B-cent(1-96) from B CENT 16 lines x 6 strobes = 96 cents B2 B-cent(97-192) from B CENT 16 lines x 6 strobes = 96 cents C1 C-cent(1-92) from C CENT 16 lines x 6 strobes = 96 cents C2 C-cent(97-192) from C CENT 16 lines x 6 strobes = 96 cents CLOCK START See above See above OUTPUTS ACENT[4..1] A-cents(1-48) or d by 12 4 bits A 2-bit counter for A-cent trig 2 bits AB.or.AC 2-bit counter for ABAC trig 2 bits AB.or.AC.or.BC 2-bit counter for ABACBC trig 2 bits TRIG2 INPUTS A1 A-cent(1-96) from A CENT 16 lines x 6 strobes = 96 cents B1 B-cent(1-96) from B CENT 16 lines x 6 strobes = 96 cents B2 B-cent(97-192) from B CENT 16 lines x 6 strobes = 96 cents C1 C-cent(1-92) from C CENT 16 lines x 6 strobes = 96 cents C2 C-cent(97-192) from C CENT 16 lines x 6 strobes = 96 cents C3 C-cent( ) from C CENT 8 lines x 6 strobes = 48 cents CLOCK START See above See above OUTPUTS ACENT[8..5] A-cents(49-96) or d by 12 4 bits A 2-bit counter for A-cent trig 2 bits AB.or.AC 2-bit counter for ABAC trig 2 bits AB.or.AC.or.BC 2-bit counter for ABACBC trig 2 bits TRIG3 INPUTS A2 A-cent(97-144) from A CENT 8 lines x 6 strobes = 48 cents B2 B-cent(97-192) from B CENT 16 lines x 6 strobes = 96 cents B3 B-cent( ) from B CENT 8 lines x 6 strobes = 16 cents C1 C-cent(1-92) from C CENT 16 lines x 6 strobes = 96 cents C2 C-cent(97-192) from C CENT 16 lines x 6 strobes = 96 cents C3 C-cent( ) from C CENT 8 lines x 6 strobes = 48 cents CLOCK START See above See above OUTPUTS ACENT[12..9] A-cents(97-144) or d by 12 4 bits A 2-bit counter for A-cent trig 2 bits AB.or.AC 2-bit counter for ABAC trig 2 bits AB.or.AC.or.BC 2-bit counter for ABACBC trig 2 bits OCTANT SUM INPUTS A 3 2-bit counters for A trig 6 bits AB.or.AC 3 2-bit counters for ABAC trig 6 bits AB.or.AC.or.BC 3 2-bit counters for ABACBC trig 6 bits ACENT[12..1] 12 bits of or d A-centroids 12 bits START See above 27

28 OUTPUTS A 2-bit counter for A trig 2 bits AB.or.AC 2-bit counter for ABAC trig 2 bits AB.or.AC.or.BC 2-bit counter for ABACBC trig 2 bits ACENT[12..1] 12 bits of or d A-centroids 12 bits Table 12 - Summary of CF MTC10 FPGA Signals 28

29 Figure 5 A CENT Top Level Design 29

30 Figure 6 - A CENT Timing Diagram 30

31 Figure 7 - B CENT Top Level Design 31

32 Figure 8 B CENT Timing Diagram 32

33 Figure 9 - C CENT Top Level Design 33

34 Figure 10 - C CENT Timing Diagram 34

35 Figure 11 - TRIG1 Top Level Design 35

36 Figure 12 - TRIG1 Timing Diagram 36

37 Figure 13 - TRIG2 Top Level Design 37

38 Figure 14 - TRIG2 Timing Diagram 38

39 Figure 15 - TRIG3 Top Level Design 39

40 Figure 16 - TRIG3 Timing Diagram 40

41 Figure 17 - Octant Sum Top Level Design 41

42 Figure 18 - Octant Sum Timing Diagram 42

43 Figure 19 - Super Project CF MCT10 Top Level Design 43

44 Figure 20 - Super Project CF MTC10 Timing Diagram 44

45 8 References [1] D0 Note #2780, The D0 Muon System Upgrade, January [2] K. Johns, Level 1 Muon Trigger Technical Design Report, V1.0, June [3] K. Johns and J. Steinberg, Muon Trigger Card (MTCxx): Functional Description, V1.0, September [4] Altera Flex 10K Embedded Programmable Logic Family Data Sheet, V3, January 1998, p

Muon Trigger Card (MTCxx)

Muon Trigger Card (MTCxx) Muon Trigger Card (MTCxx) Functional Specification Version 4.44 August 31, 2004 Ken Johns Joel Steinberg Physics Department University of Arizona Table of Contents 1. INPUTS/OUTPUTS... 7 1.1 VME BUS (J1

More information

University of Arizona January 18, 2000 Joel Steinberg Rev. 1.6

University of Arizona January 18, 2000 Joel Steinberg Rev. 1.6 I/O Specification for Serial Receiver Daughter Board (PCB-0140-RCV) (Revised January 18, 2000) 1.0 Introduction The Serial Receiver Daughter Board accepts an 8b/10b encoded serial data stream, operating

More information

3. Configuration and Testing

3. Configuration and Testing 3. Configuration and Testing C51003-1.4 IEEE Std. 1149.1 (JTAG) Boundary Scan Support All Cyclone devices provide JTAG BST circuitry that complies with the IEEE Std. 1149.1a-1990 specification. JTAG boundary-scan

More information

SignalTap Plus System Analyzer

SignalTap Plus System Analyzer SignalTap Plus System Analyzer June 2000, ver. 1 Data Sheet Features Simultaneous internal programmable logic device (PLD) and external (board-level) logic analysis 32-channel external logic analyzer 166

More information

Using the XC9500/XL/XV JTAG Boundary Scan Interface

Using the XC9500/XL/XV JTAG Boundary Scan Interface Application Note: XC95/XL/XV Family XAPP69 (v3.) December, 22 R Using the XC95/XL/XV JTAG Boundary Scan Interface Summary This application note explains the XC95 /XL/XV Boundary Scan interface and demonstrates

More information

Memec Spartan-II LC User s Guide

Memec Spartan-II LC User s Guide Memec LC User s Guide July 21, 2003 Version 1.0 1 Table of Contents Overview... 4 LC Development Board... 4 LC Development Board Block Diagram... 6 Device... 6 Clock Generation... 7 User Interfaces...

More information

Concurrent Programming through the JTAG Interface for MAX Devices

Concurrent Programming through the JTAG Interface for MAX Devices Concurrent through the JTAG Interface for MAX Devices February 1998, ver. 2 Product Information Bulletin 26 Introduction Concurrent vs. Sequential In a high-volume printed circuit board (PCB) manufacturing

More information

V6118 EM MICROELECTRONIC - MARIN SA. 2, 4 and 8 Mutiplex LCD Driver

V6118 EM MICROELECTRONIC - MARIN SA. 2, 4 and 8 Mutiplex LCD Driver EM MICROELECTRONIC - MARIN SA 2, 4 and 8 Mutiplex LCD Driver Description The is a universal low multiplex LCD driver. The version 2 drives two ways multiplex (two blackplanes) LCD, the version 4, four

More information

Why FPGAs? FPGA Overview. Why FPGAs?

Why FPGAs? FPGA Overview. Why FPGAs? Transistor-level Logic Circuits Positive Level-sensitive EECS150 - Digital Design Lecture 3 - Field Programmable Gate Arrays (FPGAs) January 28, 2003 John Wawrzynek Transistor Level clk clk clk Positive

More information

Product Update. JTAG Issues and the Use of RT54SX Devices

Product Update. JTAG Issues and the Use of RT54SX Devices Product Update Revision Date: September 2, 999 JTAG Issues and the Use of RT54SX Devices BACKGROUND The attached paper authored by Richard B. Katz of NASA GSFC and J. J. Wang of Actel describes anomalies

More information

M89 FAMILY In-System Programmable (ISP) Multiple-Memory and Logic FLASH+PSD Systems for MCUs

M89 FAMILY In-System Programmable (ISP) Multiple-Memory and Logic FLASH+PSD Systems for MCUs In-System Programmable (ISP) Multiple-Memory and Logic FLASH+PSD Systems for MCUs DATA BRIEFING Single Supply Voltage: 5V±10% for M9xxFxY 3 V (+20/ 10%) for M9xxFxW 1 or 2 Mbit of Primary Flash Memory

More information

CSE140L: Components and Design Techniques for Digital Systems Lab. CPU design and PLDs. Tajana Simunic Rosing. Source: Vahid, Katz

CSE140L: Components and Design Techniques for Digital Systems Lab. CPU design and PLDs. Tajana Simunic Rosing. Source: Vahid, Katz CSE140L: Components and Design Techniques for Digital Systems Lab CPU design and PLDs Tajana Simunic Rosing Source: Vahid, Katz 1 Lab #3 due Lab #4 CPU design Today: CPU design - lab overview PLDs Updates

More information

K.T. Tim Cheng 07_dft, v Testability

K.T. Tim Cheng 07_dft, v Testability K.T. Tim Cheng 07_dft, v1.0 1 Testability Is concept that deals with costs associated with testing. Increase testability of a circuit Some test cost is being reduced Test application time Test generation

More information

BABAR IFR TDC Board (ITB): system design

BABAR IFR TDC Board (ITB): system design BABAR IFR TDC Board (ITB): system design Version 1.1 12 december 1997 G. Crosetti, S. Minutoli, E. Robutti I.N.F.N. Genova 1. Introduction TDC readout of the IFR will be used during BABAR data taking to

More information

BTW03 DESIGN CONSIDERATIONS IN USING AS A BACKPLANE TEST BUS International Test Conference. Pete Collins

BTW03 DESIGN CONSIDERATIONS IN USING AS A BACKPLANE TEST BUS International Test Conference. Pete Collins 2003 International Test Conference DESIGN CONSIDERATIONS IN USING 1149.1 AS A BACKPLANE TEST BUS Pete Collins petec@jtag.co.uk JTAG TECHNOLOGIES BTW03 PURPOSE The purpose of this presentation is to discuss

More information

Configuring FLASHlogic Devices

Configuring FLASHlogic Devices Configuring FLASHlogic s April 995, ver. Application Note 45 Introduction The Altera FLASHlogic family of programmable logic devices (PLDs) is based on CMOS technology with SRAM configuration elements.

More information

EL302 DIGITAL INTEGRATED CIRCUITS LAB #3 CMOS EDGE TRIGGERED D FLIP-FLOP. Due İLKER KALYONCU, 10043

EL302 DIGITAL INTEGRATED CIRCUITS LAB #3 CMOS EDGE TRIGGERED D FLIP-FLOP. Due İLKER KALYONCU, 10043 EL302 DIGITAL INTEGRATED CIRCUITS LAB #3 CMOS EDGE TRIGGERED D FLIP-FLOP Due 16.05. İLKER KALYONCU, 10043 1. INTRODUCTION: In this project we are going to design a CMOS positive edge triggered master-slave

More information

Remote Diagnostics and Upgrades

Remote Diagnostics and Upgrades Remote Diagnostics and Upgrades Tim Pender -Eastman Kodak Company 10/03/03 About this Presentation Motivation for Remote Diagnostics Reduce Field Maintenance costs Product needed to support 100 JTAG chains

More information

Drift Tubes as Muon Detectors for ILC

Drift Tubes as Muon Detectors for ILC Drift Tubes as Muon Detectors for ILC Dmitri Denisov Fermilab Major specifications for muon detectors D0 muon system tracking detectors Advantages and disadvantages of drift chambers as muon detectors

More information

GFT Channel Slave Generator

GFT Channel Slave Generator GFT1018 8 Channel Slave Generator Features 8 independent delay channels 1 ps time resolution < 100 ps rms jitter for optical triggered delays 1 second range Electrical or optical output Three trigger modes

More information

MSP430 JTAG / BSL connectors

MSP430 JTAG / BSL connectors MSP430 JTAG / BSL connectors (PD010A05 Rev-4: 23-Nov-2007) FAQ: Q: I have a board with the standard TI-JTAG pinhead. Can I use your programmer to flash my MSP430Fxx device? A: Yes. You can use any of our

More information

JTAG Test Controller

JTAG Test Controller Description JTAG Test Controller The device provides an interface between the 60x bus on the Motorola MPC8260 processor and two totally independent IEEE1149.1 interfaces, namely, the primary and secondary

More information

Document Part Number: Copyright 2010, Corelis Inc.

Document Part Number: Copyright 2010, Corelis Inc. CORELIS Low Voltage Adapter Low Voltage Adapter Boundary-Scan Interface User s Manual Document Part Number: 70398 Copyright 2010, Corelis Inc. Corelis, Inc. 12607 Hiddencreek Way Cerritos, CA 90703-2146

More information

12. IEEE (JTAG) Boundary-Scan Testing for the Cyclone III Device Family

12. IEEE (JTAG) Boundary-Scan Testing for the Cyclone III Device Family December 2011 CIII51014-2.3 12. IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family CIII51014-2.3 This chapter provides guidelines on using the IEEE Std. 1149.1 boundary-scan test

More information

RF Characterization Report

RF Characterization Report BNC7T-J-P-xx-ST-EMI BNC7T-J-P-xx-RD-BH1 BNC7T-J-P-xx-ST-TH1 BNC7T-J-P-xx-ST-TH2D BNC7T-J-P-xx-RA-BH2D Mated with: RF179-79SP1-74BJ1-0300 Description: 75 Ohm BNC Board Mount Jacks Samtec, Inc. 2005 All

More information

Overview of BDM nc. The IEEE JTAG specification is also recommended reading for those unfamiliar with JTAG. 1.2 Overview of BDM Before the intr

Overview of BDM nc. The IEEE JTAG specification is also recommended reading for those unfamiliar with JTAG. 1.2 Overview of BDM Before the intr Application Note AN2387/D Rev. 0, 11/2002 MPC8xx Using BDM and JTAG Robert McEwan NCSD Applications East Kilbride, Scotland As the technical complexity of microprocessors has increased, so too has the

More information

University Program Design Laboratory Package

University Program Design Laboratory Package University Program Design Laboratory Package August 1997, ver. 1 User Guide Introduction The University Program Design Laboratory Package was designed to meet the needs of universities teaching digital

More information

Testability: Lecture 23 Design for Testability (DFT) Slide 1 of 43

Testability: Lecture 23 Design for Testability (DFT) Slide 1 of 43 Testability: Lecture 23 Design for Testability (DFT) Shaahin hi Hessabi Department of Computer Engineering Sharif University of Technology Adapted, with modifications, from lecture notes prepared p by

More information

the Boundary Scan perspective

the Boundary Scan perspective the Boundary Scan perspective Rik Doorneweert, JTAG Technologies rik@jtag.com www.jtag.com Subjects Economics of testing Test methods and strategy Boundary scan at: Component level Board level System level

More information

University Program Design Laboratory Package

University Program Design Laboratory Package University Program Design Laboratory Package November 1999, ver. 1.02 User Guide Introduction The University Program Design Laboratory Package was designed to meet the needs of universities teaching digital

More information

DT9834 Series High-Performance Multifunction USB Data Acquisition Modules

DT9834 Series High-Performance Multifunction USB Data Acquisition Modules DT9834 Series High-Performance Multifunction USB Data Acquisition Modules DT9834 Series High Performance, Multifunction USB DAQ Key Features: Simultaneous subsystem operation on up to 32 analog input channels,

More information

ELECTRICAL PERFORMANCE REPORT

ELECTRICAL PERFORMANCE REPORT CIRCUITS & DESIGN ELECTRICAL PERFORMANCE REPORT DENSIPAC 4 ROW Date: 06-12-2006 Circuits & Design EMEA Circuits & Design 1/21 06/12/2006 1 INTRODUCTION... 3 2 CONNECTORS, TEST BOARDS AND TEST EQUIPMENT...

More information

Large Area, High Speed Photo-detectors Readout

Large Area, High Speed Photo-detectors Readout Large Area, High Speed Photo-detectors Readout Jean-Francois Genat + On behalf and with the help of Herve Grabas +, Samuel Meehan +, Eric Oberla +, Fukun Tang +, Gary Varner ++, and Henry Frisch + + University

More information

Features of the 745T-20C: Applications of the 745T-20C: Model 745T-20C 20 Channel Digital Delay Generator

Features of the 745T-20C: Applications of the 745T-20C: Model 745T-20C 20 Channel Digital Delay Generator 20 Channel Digital Delay Generator Features of the 745T-20C: 20 Independent delay channels - 100 ps resolution - 25 ps rms jitter - 10 second range Output pulse up to 6 V/50 Ω Independent trigger for every

More information

IE1204 Digital Design. F11: Programmable Logic, VHDL for Sequential Circuits. Masoumeh (Azin) Ebrahimi

IE1204 Digital Design. F11: Programmable Logic, VHDL for Sequential Circuits. Masoumeh (Azin) Ebrahimi IE1204 Digital Design F11: Programmable Logic, VHDL for Sequential Circuits Masoumeh (Azin) Ebrahimi (masebr@kth.se) Elena Dubrova (dubrova@kth.se) KTH / ICT / ES This lecture BV pp. 98-118, 418-426, 507-519

More information

Chapter 10 Exercise Solutions

Chapter 10 Exercise Solutions VLSI Test Principles and Architectures Ch. 10 oundary Scan & Core-ased Testing P. 1/10 Chapter 10 Exercise Solutions 10.1 The following is just an example for testing chips and interconnects on a board.

More information

Testing Sequential Logic. CPE/EE 428/528 VLSI Design II Intro to Testing (Part 2) Testing Sequential Logic (cont d) Testing Sequential Logic (cont d)

Testing Sequential Logic. CPE/EE 428/528 VLSI Design II Intro to Testing (Part 2) Testing Sequential Logic (cont d) Testing Sequential Logic (cont d) Testing Sequential Logic CPE/EE 428/528 VLSI Design II Intro to Testing (Part 2) Electrical and Computer Engineering University of Alabama in Huntsville In general, much more difficult than testing combinational

More information

IE1204 Digital Design F11: Programmable Logic, VHDL for Sequential Circuits

IE1204 Digital Design F11: Programmable Logic, VHDL for Sequential Circuits IE1204 Digital Design F11: Programmable Logic, VHDL for Sequential Circuits Elena Dubrova KTH/ICT/ES dubrova@kth.se This lecture BV pp. 98-118, 418-426, 507-519 IE1204 Digital Design, HT14 2 Programmable

More information

12-bit Wallace Tree Multiplier CMPEN 411 Final Report Matthew Poremba 5/1/2009

12-bit Wallace Tree Multiplier CMPEN 411 Final Report Matthew Poremba 5/1/2009 12-bit Wallace Tree Multiplier CMPEN 411 Final Report Matthew Poremba 5/1/2009 Project Overview This project was originally titled Fast Fourier Transform Unit, but due to space and time constraints, the

More information

Entry Level Tool II. Reference Manual. System Level Solutions, Inc. (USA) Murphy Avenue San Martin, CA (408) Version : 1.0.

Entry Level Tool II. Reference Manual. System Level Solutions, Inc. (USA) Murphy Avenue San Martin, CA (408) Version : 1.0. Entry Level Tool II Reference Manual, Inc. (USA) 14100 Murphy Avenue San Martin, CA 95046 (408) 852-0067 http://www.slscorp.com Version : 1.0.3 Date : October 7, 2005 Copyright 2005-2006,, Inc. (SLS) All

More information

Using the XSV Board Xchecker Interface

Using the XSV Board Xchecker Interface Using the XSV Board Xchecker Interface May 1, 2001 (Version 1.0) Application Note by D. Vanden Bout Summary This application note shows how to configure the XC9510 CPLD on the XSV Board to enable the programming

More information

Datasheet SHF A Multi-Channel Error Analyzer

Datasheet SHF A Multi-Channel Error Analyzer SHF Communication Technologies AG Wilhelm-von-Siemens-Str. 23D 12277 Berlin Germany Phone +49 30 772051-0 Fax +49 30 7531078 E-Mail: sales@shf.de Web: http://www.shf.de Datasheet SHF 11104 A Multi-Channel

More information

Global Trigger Trigger meeting 27.Sept 00 A.Taurok

Global Trigger Trigger meeting 27.Sept 00 A.Taurok Global Trigger Trigger meeting 27.Sept 00 A.Taurok Global Trigger Crate GT crate VME 9U Backplane 4 MUONS parallel CLOCK, BC_Reset... READOUT _links PSB 12 PSB 12 24 4 6 GT MU 6 GT MU PSB 12 PSB 12 PSB

More information

GFT Channel Digital Delay Generator

GFT Channel Digital Delay Generator Features 20 independent delay Channels 100 ps resolution 25 ps rms jitter 10 second range Output pulse up to 6 V/50 Ω Independent trigger for every channel Fours Triggers Three are repetitive from three

More information

L11/12: Reconfigurable Logic Architectures

L11/12: Reconfigurable Logic Architectures L11/12: Reconfigurable Logic Architectures Acknowledgements: Materials in this lecture are courtesy of the following people and used with permission. - Randy H. Katz (University of California, Berkeley,

More information

EEM Digital Systems II

EEM Digital Systems II ANADOLU UNIVERSITY DEPARTMENT OF ELECTRICAL AND ELECTRONICS ENGINEERING EEM 334 - Digital Systems II LAB 3 FPGA HARDWARE IMPLEMENTATION Purpose In the first experiment, four bit adder design was prepared

More information

L12: Reconfigurable Logic Architectures

L12: Reconfigurable Logic Architectures L12: Reconfigurable Logic Architectures Acknowledgements: Materials in this lecture are courtesy of the following sources and are used with permission. Frank Honore Prof. Randy Katz (Unified Microelectronics

More information

INTEGRATED CIRCUITS. PZ macrocell CPLD. Product specification 1997 Mar 05 IC27 Data Handbook

INTEGRATED CIRCUITS. PZ macrocell CPLD. Product specification 1997 Mar 05 IC27 Data Handbook INTEGRATED CIRCUITS 1997 Mar 05 IC27 Data Handbook FEATURES Industry s first TotalCMOS PLD both CMOS design and process technologies Fast Zero Power (FZP ) design technique provides ultra-low power and

More information

Designing for High Speed-Performance in CPLDs and FPGAs

Designing for High Speed-Performance in CPLDs and FPGAs Designing for High Speed-Performance in CPLDs and FPGAs Zeljko Zilic, Guy Lemieux, Kelvin Loveless, Stephen Brown, and Zvonko Vranesic Department of Electrical and Computer Engineering University of Toronto,

More information

Paul Rubinov Fermilab Front End Electronics. May 2006 Perugia, Italy

Paul Rubinov Fermilab Front End Electronics. May 2006 Perugia, Italy Minerva Electronics and the Trip-T Paul Rubinov Fermilab Front End Electronics May 2006 Perugia, Italy 1 Outline Minerva Electronics and the TriP-t Minerva TriP-t The concept for Minerva Overview and status

More information

JRC ( JTAG Route Controller ) Data Sheet

JRC ( JTAG Route Controller ) Data Sheet JRC ( JTAG Route Controller ) Data Sheet ATLAS TGC Electronics Group September 5, 2002 (version 1.1) Author : Takashi Takemoto Feature * JTAG signal router with two inputs and seven outputs. * Routing

More information

Lecture 23 Design for Testability (DFT): Full-Scan

Lecture 23 Design for Testability (DFT): Full-Scan Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence) Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads

More information

University Program Design Laboratory Package

University Program Design Laboratory Package University Program Design Laboratory Package October 2001, ver. 2.0 User Guide Introduction The University Program (UP) Design Laboratory Package was designed to meet the needs of universities teaching

More information

Final Exam review: chapter 4 and 5. Supplement 3 and 4

Final Exam review: chapter 4 and 5. Supplement 3 and 4 Final Exam review: chapter 4 and 5. Supplement 3 and 4 1. A new type of synchronous flip-flop has the following characteristic table. Find the corresponding excitation table with don t cares used as much

More information

Using SignalTap II in the Quartus II Software

Using SignalTap II in the Quartus II Software White Paper Using SignalTap II in the Quartus II Software Introduction The SignalTap II embedded logic analyzer, available exclusively in the Altera Quartus II software version 2.1, helps reduce verification

More information

CHAPTER 3 EXPERIMENTAL SETUP

CHAPTER 3 EXPERIMENTAL SETUP CHAPTER 3 EXPERIMENTAL SETUP In this project, the experimental setup comprised of both hardware and software. Hardware components comprised of Altera Education Kit, capacitor and speaker. While software

More information

UNIT IV CMOS TESTING. EC2354_Unit IV 1

UNIT IV CMOS TESTING. EC2354_Unit IV 1 UNIT IV CMOS TESTING EC2354_Unit IV 1 Outline Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan EC2354_Unit

More information

7 Nov 2017 Testing and programming PCBA s

7 Nov 2017 Testing and programming PCBA s 7 Nov 207 Testing and programming PCBA s Rob Staals JTAG Technologies Email: robstaals@jtag.com JTAG Technologies The importance of Testing Don t ship bad products to your customers, find problems before

More information

CoLinkEx JTAG/SWD adapter USER MANUAL

CoLinkEx JTAG/SWD adapter USER MANUAL CoLinkEx JTAG/SWD adapter USER MANUAL rev. A Website: www.bravekit.com Contents Introduction... 3 1. Features of CoLinkEX adapter:... 3 2. Elements of CoLinkEx programmer... 3 2.1. LEDs description....

More information

Lecture 23 Design for Testability (DFT): Full-Scan (chapter14)

Lecture 23 Design for Testability (DFT): Full-Scan (chapter14) Lecture 23 Design for Testability (DFT): Full-Scan (chapter14) Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Scan design system Summary

More information

PICOSECOND TIMING USING FAST ANALOG SAMPLING

PICOSECOND TIMING USING FAST ANALOG SAMPLING PICOSECOND TIMING USING FAST ANALOG SAMPLING H. Frisch, J-F Genat, F. Tang, EFI Chicago, Tuesday 6 th Nov 2007 INTRODUCTION In the context of picosecond timing, analog detector pulse sampling in the 10

More information

Unit V Design for Testability

Unit V Design for Testability Unit V Design for Testability Outline Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan Slide 2 Testing

More information

SuperB- DCH. Servizio Ele<ronico Laboratori FrascaA

SuperB- DCH. Servizio Ele<ronico Laboratori FrascaA 1 Outline 2 DCH FEE Constraints/Estimate & Main Blocks front- end main blocks Constraints & EsAmate Trigger rate (150 khz) Trigger/DAQ data format I/O BW Trigger Latency Minimum trigger spacing. Chamber

More information

Ilmenau, 9 Dec 2016 Testing and programming PCBA s. 1 JTAG Technologies

Ilmenau, 9 Dec 2016 Testing and programming PCBA s. 1 JTAG Technologies Ilmenau, 9 Dec 206 Testing and programming PCBA s JTAG Technologies The importance of Testing Don t ship bad products to your customers, find problems before they do. DOA s (Death On Arrival) lead to huge

More information

TTC Interface Module for ATLAS Read-Out Electronics: Final production version based on Xilinx FPGA devices

TTC Interface Module for ATLAS Read-Out Electronics: Final production version based on Xilinx FPGA devices Physics & Astronomy HEP Electronics TTC Interface Module for ATLAS Read-Out Electronics: Final production version based on Xilinx FPGA devices LECC 2004 Matthew Warren warren@hep.ucl.ac.uk Jon Butterworth,

More information

Data Sheet. Electronic displays

Data Sheet. Electronic displays Data Pack F Issued November 0 029629 Data Sheet Electronic displays Three types of display are available; each has differences as far as the display appearance, operation and electrical characteristics

More information

PIXEL2000, June 5-8, FRANCO MEDDI CERN-ALICE / University of Rome & INFN, Italy. For the ALICE Collaboration

PIXEL2000, June 5-8, FRANCO MEDDI CERN-ALICE / University of Rome & INFN, Italy. For the ALICE Collaboration PIXEL2000, June 5-8, 2000 FRANCO MEDDI CERN-ALICE / University of Rome & INFN, Italy For the ALICE Collaboration CONTENTS: Introduction: Physics Requirements Design Considerations Present development status

More information

UltraLogic 128-Macrocell ISR CPLD

UltraLogic 128-Macrocell ISR CPLD 256 PRELIMINARY Features 128 macrocells in eight logic blocks In-System Reprogrammable (ISR ) JTAG-compliant on-board programming Design changes don t cause pinout changes Design changes don t cause timing

More information

Enhanced JTAG to test interconnects in a SoC

Enhanced JTAG to test interconnects in a SoC Enhanced JTAG to test interconnects in a SoC by Dany Lebel and Sorin Alin Herta 1 Enhanced JTAG to test interconnects in a SoC Dany Lebel (1271766) and Sorin Alin Herta (1317418) ELE-6306, Test de systèmes

More information

Description of the Synchronization and Link Board

Description of the Synchronization and Link Board Available on CMS information server CMS IN 2005/007 March 8, 2005 Description of the Synchronization and Link Board ECAL and HCAL Interface to the Regional Calorimeter Trigger Version 3.0 (SLB-S) PMC short

More information

Chapter 7 Memory and Programmable Logic

Chapter 7 Memory and Programmable Logic EEA091 - Digital Logic 數位邏輯 Chapter 7 Memory and Programmable Logic 吳俊興國立高雄大學資訊工程學系 2006 Chapter 7 Memory and Programmable Logic 7-1 Introduction 7-2 Random-Access Memory 7-3 Memory Decoding 7-4 Error

More information

3/5/2017. A Register Stores a Set of Bits. ECE 120: Introduction to Computing. Add an Input to Control Changing a Register s Bits

3/5/2017. A Register Stores a Set of Bits. ECE 120: Introduction to Computing. Add an Input to Control Changing a Register s Bits University of Illinois at Urbana-Champaign Dept. of Electrical and Computer Engineering ECE 120: Introduction to Computing Registers A Register Stores a Set of Bits Most of our representations use sets

More information

An Efficient High Speed Wallace Tree Multiplier

An Efficient High Speed Wallace Tree Multiplier Chepuri satish,panem charan Arur,G.Kishore Kumar and G.Mamatha 38 An Efficient High Speed Wallace Tree Multiplier Chepuri satish, Panem charan Arur, G.Kishore Kumar and G.Mamatha Abstract: The Wallace

More information

Design for Testability

Design for Testability TDTS 01 Lecture 9 Design for Testability Zebo Peng Embedded Systems Laboratory IDA, Linköping University Lecture 9 The test problems Fault modeling Design for testability techniques Zebo Peng, IDA, LiTH

More information

CSE140L: Components and Design Techniques for Digital Systems Lab. FSMs. Tajana Simunic Rosing. Source: Vahid, Katz

CSE140L: Components and Design Techniques for Digital Systems Lab. FSMs. Tajana Simunic Rosing. Source: Vahid, Katz CSE140L: Components and Design Techniques for Digital Systems Lab FSMs Tajana Simunic Rosing Source: Vahid, Katz 1 Flip-flops Hardware Description Languages and Sequential Logic representation of clocks

More information

of Boundary Scan techniques.

of Boundary Scan techniques. SMT TEHNOLOGY Boundary Scan Techniques for Test Coverage Improvement When discussing the JTAG protocol, most engineers immediately think of In System Programming procedures. Indeed, there are numerous

More information

Sharif University of Technology. SoC: Introduction

Sharif University of Technology. SoC: Introduction SoC Design Lecture 1: Introduction Shaahin Hessabi Department of Computer Engineering System-on-Chip System: a set of related parts that act as a whole to achieve a given goal. A system is a set of interacting

More information

DNA-STP-SYNC Synchronization and Screw Terminal Panel. User Manual

DNA-STP-SYNC Synchronization and Screw Terminal Panel. User Manual DNA-STP-SYNC Synchronization and Screw Terminal Panel User Manual Accessory Panel for PowerDNA Cube (DNA) Systems February 2009 Edition PN Man-DNA-STP-SYNC-0209 Version 1.2 Copyright 1998-2009 All rights

More information

In-System Programmability Guidelines

In-System Programmability Guidelines In-System Programmability Guidelines May 1999, ver. 3 Application Note 100 Introduction As time-to-market pressures increase, design engineers require advanced system-level products to ensure problem-free

More information

GT Dual-Row Nano Vertical Thru-Hole High Speed Characterization Report For Differential Data Applications

GT Dual-Row Nano Vertical Thru-Hole High Speed Characterization Report For Differential Data Applications GT-16-97 Dual-Row Nano Vertical Thru-Hole For Differential Data Applications 891-007-15S Vertical Thru-Hole PCB 891-001-15P Cable Mount Revision History Rev Date Approved Description A 8/31/2016 R. Ghiselli/G.

More information

Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test

Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test Lecture 17: Introduction to Design For Testability (DFT) & Manufacturing Test Mark McDermott Electrical and Computer Engineering The University of Texas at Austin Agenda Introduction to testing Logical

More information

EN2911X: Reconfigurable Computing Topic 01: Programmable Logic. Prof. Sherief Reda School of Engineering, Brown University Fall 2014

EN2911X: Reconfigurable Computing Topic 01: Programmable Logic. Prof. Sherief Reda School of Engineering, Brown University Fall 2014 EN2911X: Reconfigurable Computing Topic 01: Programmable Logic Prof. Sherief Reda School of Engineering, Brown University Fall 2014 1 Contents 1. Architecture of modern FPGAs Programmable interconnect

More information

Status of the CSC Track-Finder

Status of the CSC Track-Finder Status of the CSC Track-Finder D. Acosta, S.M. Wang University of Florida A.Atamanchook, V.Golovstov, B.Razmyslovich PNPI CSC Muon Trigger Scheme Strip FE cards Strip LCT card CSC Track-Finder LCT Motherboard

More information

VGA Controller. Leif Andersen, Daniel Blakemore, Jon Parker University of Utah December 19, VGA Controller Components

VGA Controller. Leif Andersen, Daniel Blakemore, Jon Parker University of Utah December 19, VGA Controller Components VGA Controller Leif Andersen, Daniel Blakemore, Jon Parker University of Utah December 19, 2012 Fig. 1. VGA Controller Components 1 VGA Controller Leif Andersen, Daniel Blakemore, Jon Parker University

More information

16 Dec Testing and Programming PCBA s. 1 JTAG Technologies

16 Dec Testing and Programming PCBA s. 1 JTAG Technologies 6 Dec 24 Testing and Programming PCBA s JTAG Technologies The importance of Testing Don t ship bad products to your customers, find problems before they do. DOA s (Death On Arrival) lead to huge costs

More information

Tools to Debug Dead Boards

Tools to Debug Dead Boards Tools to Debug Dead Boards Hardware Prototype Bring-up Ryan Jones Senior Application Engineer Corelis 1 Boundary-Scan Without Boundaries click to start the show Webinar Outline What is a Dead Board? Prototype

More information

US CMS Endcap Muon. Regional CSC Trigger System WBS 3.1.1

US CMS Endcap Muon. Regional CSC Trigger System WBS 3.1.1 WBS Dictionary/Basis of Estimate Documentation US CMS Endcap Muon Regional CSC Trigger System WBS 3.1.1-1- 1. INTRODUCTION 1.1 The CMS Muon Trigger System The CMS trigger and data acquisition system is

More information

Interfacing the TLC5510 Analog-to-Digital Converter to the

Interfacing the TLC5510 Analog-to-Digital Converter to the Application Brief SLAA070 - April 2000 Interfacing the TLC5510 Analog-to-Digital Converter to the TMS320C203 DSP Perry Miller Mixed Signal Products ABSTRACT This application report is a summary of the

More information

Innovative Fast Timing Design

Innovative Fast Timing Design Innovative Fast Timing Design Solution through Simultaneous Processing of Logic Synthesis and Placement A new design methodology is now available that offers the advantages of enhanced logical design efficiency

More information

Users Manual FWI HiDef Sync Stripper

Users Manual FWI HiDef Sync Stripper Users Manual FWI HiDef Sync Stripper Allows "legacy" motion control and film synchronizing equipment to work with modern HDTV cameras and monitors providing Tri-Level sync signals. Generates a film-camera

More information

... A COMPUTER SYSTEM FOR MULTIPARAMETER PULSE HEIGHT ANALYSIS AND CONTROL*

... A COMPUTER SYSTEM FOR MULTIPARAMETER PULSE HEIGHT ANALYSIS AND CONTROL* I... A COMPUTER SYSTEM FOR MULTIPARAMETER PULSE HEIGHT ANALYSIS AND CONTROL* R. G. Friday and K. D. Mauro Stanford Linear Accelerator Center Stanford University, Stanford, California 94305 SLAC-PUB-995

More information

Digital Integrated Circuits Lecture 19: Design for Testability

Digital Integrated Circuits Lecture 19: Design for Testability Digital Integrated Circuits Lecture 19: Design for Testability Chih-Wei Liu VLSI Signal Processing LAB National Chiao Tung University cwliu@twins.ee.nctu.edu.tw DIC-Lec19 cwliu@twins.ee.nctu.edu.tw 1 Outline

More information

Efficient Architecture for Flexible Prescaler Using Multimodulo Prescaler

Efficient Architecture for Flexible Prescaler Using Multimodulo Prescaler Efficient Architecture for Flexible Using Multimodulo G SWETHA, S YUVARAJ Abstract This paper, An Efficient Architecture for Flexible Using Multimodulo is an architecture which is designed from the proposed

More information

EECS150 - Digital Design Lecture 2 - CMOS

EECS150 - Digital Design Lecture 2 - CMOS EECS150 - Digital Design Lecture 2 - CMOS January 23, 2003 John Wawrzynek Spring 2003 EECS150 - Lec02-CMOS Page 1 Outline Overview of Physical Implementations CMOS devices Announcements/Break CMOS transistor

More information

An Overview of Beam Diagnostic and Control Systems for AREAL Linac

An Overview of Beam Diagnostic and Control Systems for AREAL Linac An Overview of Beam Diagnostic and Control Systems for AREAL Linac Presenter G. Amatuni Ultrafast Beams and Applications 04-07 July 2017, CANDLE, Armenia Contents: 1. Current status of existing diagnostic

More information

CPC (Cosmics Personality Card) for the L3+Cosmics experiment.

CPC (Cosmics Personality Card) for the L3+Cosmics experiment. NIK HEF Check for most recent version: http://www.nikhef.nl/pub/departments/et/l3/cosmics NATIONAL INSTITUTE FOR NUCLEAR AND HIGH ENERGY PHYSICS ETR 99-02 version: March 1999 CPC (Cosmics Personality Card)

More information

WBS Trigger. Wesley Smith, U. Wisconsin CMS Trigger Project Manager. DOE/NSF Review April 11, 2000

WBS Trigger. Wesley Smith, U. Wisconsin CMS Trigger Project Manager. DOE/NSF Review April 11, 2000 WBS 3.1 - Trigger Wesley Smith, U. Wisconsin CMS Trigger Project Manager DOE/NSF Review April 11, 2000 US CMS DOE/NSF Review, April 11-13, 2000 1 Outline Overview of Calorimeter Trigger Calorimeter Trigger

More information

Field Programmable Gate Arrays (FPGAs)

Field Programmable Gate Arrays (FPGAs) Field Programmable Gate Arrays (FPGAs) Introduction Simulations and prototyping have been a very important part of the electronics industry since a very long time now. Before heading in for the actual

More information

A pixel chip for tracking in ALICE and particle identification in LHCb

A pixel chip for tracking in ALICE and particle identification in LHCb A pixel chip for tracking in ALICE and particle identification in LHCb K.Wyllie 1), M.Burns 1), M.Campbell 1), E.Cantatore 1), V.Cencelli 2) R.Dinapoli 3), F.Formenti 1), T.Grassi 1), E.Heijne 1), P.Jarron

More information

FPGA Laboratory Assignment 4. Due Date: 06/11/2012

FPGA Laboratory Assignment 4. Due Date: 06/11/2012 FPGA Laboratory Assignment 4 Due Date: 06/11/2012 Aim The purpose of this lab is to help you understanding the fundamentals of designing and testing memory-based processing systems. In this lab, you will

More information